CN215263588U

CN215263588U - Sample in-situ heating clamp for atomic force microscope

Info

Publication number: CN215263588U
Application number: CN202121114600.2U
Authority: CN
Inventors: 陈逸强; 马飞越
Original assignee: Shenzhen Purui Material Technology Co ltd
Current assignee: Shenzhen Purui Material Technology Co ltd
Priority date: 2021-05-21
Filing date: 2021-05-21
Publication date: 2021-12-21
Anticipated expiration: 2031-05-21

Abstract

The utility model relates to a sample normal position heating anchor clamps for atomic force microscope, include: the device comprises a base, a supporting table and a clamping device, wherein the clamping device is arranged on the base or the supporting table and used for clamping and fixing the sample to be detected on the supporting table. The utility model discloses a sample normal position adds hot-holding anchor clamps carries out the thermal treatment through the heater to a supporting bench, and a supporting bench is to the sample that awaits measuring with the produced heat transfer of heater to promote the temperature of the sample that awaits measuring to preset the temperature, then utilize atomic force microscope to carry out the scanning test analysis to the sample that awaits measuring after heaing up, so can realize controlling the temperature of the sample that awaits measuring, and then be convenient for study the direct influence of temperature to the sample material performance that awaits measuring.

Description

Sample in-situ heating clamp for atomic force microscope

Technical Field

The utility model belongs to the technical field of test fixture, especially, relate to a sample normal position heating anchor clamps for atomic force microscope.

Background

With the progress of the times, consumer electronic devices gradually become thinner and lighter, flexible electronic devices such as flexible solar cells, flexible lithium batteries, flexible sensors and flexible displays appear in the life of people, and the flexible electronic materials forming the devices can change the physical states of the surfaces and the interiors of the materials along with self-heating or the change of the environmental temperature in the using process, so that the electrical properties of the materials are influenced.

An atomic force microscope has been a powerful tool for characterizing the electrical properties of the surface of a material, but in a sample clamping device in the existing atomic force microscope, simulation functions at different environmental temperatures cannot be provided for a sample, and when the atomic force microscope is used for scanning, testing and analyzing the surface characteristics of the sample in various deformation states, the atomic force microscope cannot perform scanning, testing and analyzing at different temperatures, which is not beneficial to the research and development of products.

SUMMERY OF THE UTILITY MODEL

The utility model aims to at least solve not enough among the prior art to a certain extent, provide a sample normal position heating anchor clamps for atomic force microscope.

In order to achieve the above object, the present invention provides a sample in-situ heating clamp for atomic force microscope, including:

a base;

the supporting table is arranged on the base and used for bearing a sample to be tested, and a heater is arranged between the supporting table and the base;

and the clamping device is arranged on the base or the supporting platform and is used for clamping and fixing the sample to be detected on the supporting platform.

Preferably, the clamping device comprises a pressing component, the pressing component comprises a plurality of clamping pieces, and the clamping pieces surround the supporting platform and are arranged on the base and used for pressing and fixing the sample to be detected on the supporting platform.

Preferably, the pressing assembly further comprises a first mounting seat, the mounting seat is provided with a mounting hole and fixed on the base around the supporting table, and the clamping pieces are uniformly distributed on the top surface of the first mounting seat along the circumference of the mounting hole in a cantilever state.

Preferably, the top of the first mounting seat is provided with an annular step connected with the mounting hole, and the step surface of the annular step is flush with the upper surface of the support table.

Preferably, the base includes bottom plate and fixing base, a through-hole has been seted up in the middle part of bottom plate through, the fixing base is fixed in the through-hole, the brace table is fixed in on the fixing base, first mount pad be fixed in on the bottom plate and with the through-hole is in same central axis.

Preferably, the center of the fixing seat protrudes upwards to form a fixing column, the bottom of the supporting table is provided with a groove, the groove covers the fixing column and forms an accommodating cavity, and the heater is arranged in the accommodating cavity.

Preferably, the fixing column protrudes upwards to form a positioning portion, the heater is of an annular structure, and the heater is positioned on the fixing column through the positioning portion.

Preferably, the side wall of the supporting table is provided with a first wire passing groove communicated with the accommodating cavity, the fixing seat is provided with a second wire passing groove corresponding to the first wire passing groove, a third wire passing groove is formed between the first mounting seat and the bottom plate, and an electric connection wire of the heater sequentially passes through the first wire passing groove, the second wire passing groove and the third wire passing groove and is electrically connected with an external power supply.

Preferably, clamping device still includes the centre gripping subassembly, the centre gripping subassembly includes demountable installation at the second mount pad on the brace table and installs second clamping piece on the second mount pad, the second mount pad has vertical clamping face, the one end of second clamping piece is fixed on the second mount pad, the other end to the clamping face direction extends and is formed with a clamping part in the tip, the clamping part is used for the cooperation the clamping face is the centre gripping of vertical state with the sample that awaits measuring fixed.

Preferably, the second clamping piece one end is served and has been seted up rectangular shape hole, the second clamping piece passes through rectangular shape hole cooperation retaining member is fixed in on the second mount pad.

The utility model discloses a sample normal position adds hot-holding anchor clamps carries out the thermal treatment through the heater to a supporting bench, and a supporting bench is to the sample that awaits measuring with the produced heat transfer of heater to promote the temperature of the sample that awaits measuring to preset the temperature, then utilize atomic force microscope to carry out the scanning test analysis to the sample that awaits measuring after heaing up, so can realize controlling the temperature of the sample that awaits measuring, and then be convenient for study the direct influence of temperature to the sample material performance that awaits measuring.

Drawings

In order to illustrate the embodiments of the present invention or the technical solutions in the prior art more clearly, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.

FIG. 1 is a schematic structural view of a first embodiment of a sample in-situ heating fixture according to the present invention;

FIG. 2 is a cross-sectional view of FIG. 1;

FIG. 3 is a first exploded view of FIG. 1;

FIG. 4 is a second exploded view of FIG. 1;

FIG. 5 is a schematic structural view of a second embodiment of the in-situ heating fixture of the present invention;

fig. 6 is an exploded view of fig. 5.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention, and all other embodiments obtained by those skilled in the art without creative efforts based on the embodiments of the present invention belong to the protection scope of the present invention.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "circumferential", "radial", and the like, indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.

Example one

Referring to fig. 1 and 2, an embodiment of the present invention provides a sample in-situ heating fixture for an atomic force microscope, including a base 10, a supporting platform 20 and a clamping device, wherein the supporting platform 20 is disposed on the base 10 for bearing a sample to be measured, and a heater 21 is disposed between the supporting platform 20 and the base 10; the clamping device in this embodiment includes a pressing component, the pressing component 30 includes a plurality of first clamping pieces 31, and the plurality of first clamping pieces 31 are disposed on the base 10 around the supporting platform 20, and are used for pressing and fixing the sample to be tested on the supporting platform 20.

The support table 20 is made of a metal alloy material having high thermal conductivity, such as copper and aluminum, and the surface thereof is subjected to sand blasting oxidation treatment, so that the structure thereof is not easily deformed; in practical application, sample normal position heating anchor clamps are installed in atomic force microscope, the sample that will await measuring supports and places on brace table 20, compress tightly the sample that awaits measuring through a plurality of first clamping pieces 31 that compress tightly subassembly 30 and fix on brace table 20, it makes it carry out the heat treatment to brace table 20 to open heater 21, brace table 20 transmits the sample that awaits measuring with the produced heat of heater 21, thereby promote the temperature of the sample that awaits measuring to preset the temperature, then utilize atomic force microscope to carry out scanning test analysis to the sample that awaits measuring after the intensification, so can realize controlling the temperature of the sample that awaits measuring, and then be convenient for study the direct influence of temperature to the sample material performance that awaits measuring.

In one embodiment, as shown in fig. 3 and 4, the pressing assembly 30 of this embodiment further includes a first mounting seat 32, the first mounting seat 32 has a mounting hole 321 and is fixed on the base 10 around the supporting platform 20, and a plurality of first clamping pieces 31 are uniformly distributed along the circumference of the mounting hole 321 on the top surface of the first mounting seat 32 in a cantilever manner. It should be noted that the top surface of the first mounting seat 32 is slightly higher than the upper surface of the supporting platform 20, the outer end of the first clamping piece 31 is fixed on the top surface of the first mounting seat 32, the inner end of the first clamping piece 31 points to the center of the mounting hole 321 and is located above the supporting platform 20, and when a sample to be measured is placed on the surface of the supporting platform 20, the inner end of the first clamping piece 31 presses the sample to be measured onto the supporting platform 20 under the action of its own elasticity to fix the sample.

Preferably, the top of the first mounting seat 32 is provided with an annular step 322 connected to the mounting hole 321, and the step surface of the annular step 322 is flush with the upper surface of the support table 20. Therefore, the size range of the sample to be measured applicable to the sample in-situ heating clamp of the embodiment can be improved through the annular step 322, so as to adapt to different sizes of the sample to be measured.

In addition, the first clamping piece 31 is a long strip-shaped structure, the outer end of the first clamping piece is provided with a long strip-shaped hole 311, and the first clamping piece 31 is fixed on the top surface of the first mounting seat 32 through the long strip-shaped hole 311 in cooperation with the locking member. When specifically using, through this rectangular shape hole 311 adjustable first clamping piece 31 stretches into the length of mounting hole 321 to the sample that awaits measuring of adaptation not unidimensional size makes more convenient and fast when the sample clamping that awaits measuring.

In one embodiment, to facilitate the processing and assembling of the base 10, the base 10 in this embodiment includes a bottom plate 11 and a fixing seat 12, a through hole 111 is formed through a middle portion of the bottom plate 11, the fixing seat 12 is fixed in the through hole 111, the supporting platform 20 is fixed on the fixing seat 12, and the first mounting seat 32 is fixed on the bottom plate 11 and is located on the same central axis with the through hole 111. Wherein, fixing base 12 is cylindric structure, and its top and the upper surface parallel and level of bottom plate 11 to sunken being formed with holding tank 121, support bench 20 is fixed in this holding tank 121, thereby has reduced the whole height of anchor clamps, in order to adapt to the narrow and small space in atomic force microscope sample district.

Preferably, the fixing base 12 protrudes upward from the center of the accommodating groove 121 to form a fixing post 122, the bottom of the supporting platform 20 is provided with a groove 22 covering the fixing post 122 and forming an accommodating cavity, so that the heater 21 is fixedly accommodated in the accommodating cavity, and thus the mounting structure of the fixing base 12, the heater 21 and the supporting platform 20 is more compact and firm.

Further, in order to make the heater 21 more convenient and faster during assembly, the fixing column 122 protrudes upwards to form the positioning portion 123, the heater 21 is of an annular structure, and during actual installation, the heater 21 can be positioned on the fixing column 122 through the positioning portion 123, and then the fixing support 20 can be conveniently covered on the fixing column 122.

In addition, in order to realize the power supply and temperature control of the heater 21, a first wire passing groove 23 communicated with the accommodating cavity is formed in the side wall of the supporting platform 20, a second wire passing groove 124 corresponding to the first wire passing groove 23 is formed in the fixing base 12, a third wire passing groove 323 is formed between the first mounting base 32 and the bottom plate 11, an electric connection wire 211 of the heater 21 sequentially passes through the first wire passing groove 23, the second wire passing groove 124 and the third wire passing groove 323 to be electrically connected with an external power supply, and receives a control signal through the electric connection wire 211 so as to adjust the heating temperature of the sample.

In order to facilitate the positioning and installation of the in-situ heating fixture for the sample, a positioning boss 112 is protruded from the bottom of the bottom plate 11 around the periphery of the through hole 111, and correspondingly, an annular flange 125 is protruded from the bottom of the fixing base 12, and the annular flange 125 is fixed to the positioning boss 112 by a fastener, so that the fixing base 12 and the bottom plate 11 are fixed to each other. Preferably, the bottom of the two opposite ends of the bottom plate 11 are respectively provided with a magnet 113, so that the clamp is more convenient to mount in a magnetic attraction manner, and is stable and reliable after positioning.

Example two

Referring to fig. 5 and fig. 6, in order to expand the clamping manner of the present invention, the clamping device of the present embodiment further includes a clamping assembly 40, and the clamping assembly 40 can clamp and fix the sample to be tested in a vertical state, so as to realize the detection and analysis of the cross section of the sample to be tested by the atomic force microscope.

Wherein, the clamping assembly 40 includes a second mounting seat 41 detachably mounted on the supporting platform 20 and a second clamping piece 42 mounted on the second mounting seat 41, the second mounting seat 41 has a vertical clamping surface 411, one end of the second clamping piece 42 is fixed on the second mounting seat 41, the other end extends towards the clamping surface 411 and is formed with a clamping portion 421 at the end, and the clamping portion 421 is used for cooperating with the clamping surface 411 to clamp and fix the sample to be tested in a vertical state.

During the concrete application, when the cross-section of the sample that awaits measuring needs to be detected and analyzed, can pull down a plurality of first clamping pieces in above-mentioned embodiment one from first fixing base 32, then install second mount pad 41 in this embodiment and fix on brace table 20, can utilize clamping part 421 of second clamping piece 42 to compress tightly the sample that awaits measuring on clamping face 411 to it is fixed to make the sample that awaits measuring be vertical state.

It should be noted that the second clamping piece 42 includes a main body portion 422 connected to the second fixing seat, and a connecting portion 423 connected to the main body portion 422 and the holding portion 421, the main body portion 422, the connecting portion 423 and the holding portion 421 are integrally formed, and the holding portion 421 is substantially perpendicular to the main body portion 422, when the second clamping piece 42 has no external force, the holding portion 421 is substantially parallel to the holding surface 411 and abuts against the holding surface 411 or is disposed adjacent to the holding surface 411, when a sample to be tested needs to be held, the holding portion 421 is snapped and the sample to be tested is placed between the holding surface 411 and the holding portion 421, and the holding portion 421 presses and fixes the sample to be tested on the holding surface 411 under the action of the second clamping piece 42 itself.

Further, the main body 422 of the second clamping piece 42 is provided with an elongated hole 423, and the second clamping piece 42 is fixed on the second mounting seat 41 through the elongated hole 423 in cooperation with the locking member; thus, the distance between the holding portion 421 and the holding surface 411 of the second clamping piece 42 can be adjusted through the elongated hole 423, so as to adapt to holding samples to be measured with different thicknesses.

In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

Above is the description to the technical scheme that the utility model provides, to technical personnel in the field, according to the utility model discloses the thought of embodiment all has the change part on concrete implementation and range of application, to sum up, this description content should not be understood as the restriction of the utility model.

Claims

1. A specimen in-situ heating fixture for an atomic force microscope, comprising:

a base;

2. The in-situ sample heating fixture for an atomic force microscope according to claim 1, wherein the clamping device comprises a pressing assembly, the pressing assembly comprises a plurality of clamping pieces, and the clamping pieces are arranged on the base around the supporting platform and used for pressing and fixing the sample to be tested on the supporting platform.

3. The in situ heating fixture for atomic force microscope samples as claimed in claim 2, wherein the compressing assembly further comprises a first mounting seat having a mounting hole and fixed on the base around the supporting platform, and the plurality of clamping pieces are evenly distributed along the circumference of the mounting hole in a cantilever manner on the top surface of the first mounting seat.

4. The in-situ heating fixture for the sample of the atomic force microscope as claimed in claim 3, wherein the top of the first mounting seat is provided with an annular step connected to the mounting hole, and the step surface of the annular step is flush with the upper surface of the supporting platform.

5. The in-situ heating fixture for the sample of the atomic force microscope as claimed in claim 3, wherein the base comprises a bottom plate and a fixing base, a through hole is formed through the middle of the bottom plate, the fixing base is fixed in the through hole, the supporting base is fixed on the fixing base, and the mounting base is fixed on the bottom plate and is located on the same central axis with the through hole.

6. The in-situ heating fixture for the sample of the atomic force microscope as claimed in claim 5, wherein the center of the fixing base protrudes upwards to form a fixing post, the bottom of the supporting base is formed with a groove, the groove covers the fixing post and forms a receiving cavity, and the heater is disposed in the receiving cavity.

7. The specimen in-situ heating clamp for the atomic force microscope according to claim 6, wherein the fixing column is protruded upwards to form a positioning portion, and the heater is in a ring structure and is positioned on the fixing column by the positioning portion.

8. The in-situ sample heating fixture for an atomic force microscope as claimed in claim 6, wherein the supporting platform has a first through-slot formed on a sidewall thereof and communicating with the receiving cavity, the fixing base has a second through-slot corresponding to the first through-slot, a third through-slot is formed between the first mounting base and the bottom plate, and electrical connection wires of the heater sequentially pass through the first through-slot, the second through-slot and the third through-slot and are electrically connected to an external power source.

9. The in-situ sample heating fixture for an atomic force microscope according to claim 1, wherein the clamping device further comprises a clamping assembly, the clamping assembly comprises a second mounting seat detachably mounted on the supporting platform and a second clamping piece mounted on the second mounting seat, the second mounting seat has a vertical clamping surface, one end of the second clamping piece is fixed on the second mounting seat, the other end of the second clamping piece extends towards the clamping surface and is provided with a clamping portion at the end, and the clamping portion is used for matching with the clamping surface to clamp and fix the sample to be measured in a vertical state.

10. The in-situ heating fixture for the sample of the atomic force microscope as claimed in claim 9, wherein the second clamping piece has an elongated hole formed at the one end thereof, and the second clamping piece is fixed on the second mounting seat through the elongated hole and a locking member.