CN215218987U - DC characteristic test system of GPIO - Google Patents

DC characteristic test system of GPIO Download PDF

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Publication number
CN215218987U
CN215218987U CN202023259064.3U CN202023259064U CN215218987U CN 215218987 U CN215218987 U CN 215218987U CN 202023259064 U CN202023259064 U CN 202023259064U CN 215218987 U CN215218987 U CN 215218987U
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gpio
tested
controller
test
mcu
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王博
王展
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Suzhou Furuisi Information Technology Co ltd
Zhaoyi Innovation Technology Group Co ltd
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Suzhou Furuisi Information Technology Co ltd
GigaDevice Semiconductor Beijing Inc
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Abstract

The application provides a DC characteristic test system of GPIO relates to MCU test field. The test system comprises a controller, a MCU and a test module, wherein the controller executes a test on the MCU to be tested according to the test condition of the instruction; the power supply module is connected with the controller; the load control circuit is connected with the MCU to be tested and the controller; the controller controls the power supply module to provide different power supply voltages for the MCU to be tested according to different test conditions, controls the load control circuit to provide different load currents for the MCU to be tested and controls the flow direction of the load currents, and the GPIO to be tested of the MCU to be tested outputs different voltages. The output voltage of the GPIO is acquired by the analog-to-digital converter, so that DC characteristic test aiming at the GPIO under different test conditions is realized, flow direction control and current gear switching of GPIO load current can be quickly and accurately realized, and meanwhile, an automatic detection method is provided, and the test efficiency is improved.

Description

DC characteristic test system of GPIO
Technical Field
The application relates to the field of MCU testing, in particular to a system for testing the DC characteristic of GPIO.
Background
At present, more and more embedded products use a microcontroller MCU as a main control unit, a single chip cannot operate only by the MCU (or CPU) and a memory, and an electronic product can be controlled only by configuring peripheral functions, the MCU (or CPU) executes operations according to instructions, reads and writes data, and performs condition judgment, and the memory is used to store the instructions or the read data. In order to exchange signals with external sensors, switches, and the like, a peripheral function such as an "input/output port (I/O port)" is required. Among the "Input/Output ports (I/O ports)", an Input/Output port of a digital signal, i.e., "GPIO (General Purpose Input/Output)" is also called a "General Purpose I/O port", which is a very convenient port for Input/Output of a digital signal. The digital output sensor value and the ON/OFF value of the switch are transmitted to the input end of the singlechip, the operation result of the singlechip is displayed through the LED, and a signal for driving the motor to run is output.
In the DC characteristic test of GPIO, for different load currents, currently, the resistance value of the adjustable resistor is mostly adjusted to switch different load currents, so that a tester needs to manually adjust the resistance value repeatedly to find a proper resistance value, and then the GPIO load current is obtained. Meanwhile, when the supply voltage of the MCU changes, the load current also changes correspondingly, and at the moment, a tester needs to readjust the resistance value of the resistor, and the resistance value is VOHAnd VOLIn the test, if the GPIO load current flows in different directions, a tester needs to readjust the connection method of the circuit, and finally the DC characteristic test aiming at the GPIO can be completed. Therefore, the current DC characteristic test of GPIO not only requires a lot of manual operations, but also the working efficiency of the staff is low.
Disclosure of Invention
The application provides a DC characteristic test system of GPIO, has solved above-mentioned problem.
In order to solve the above technical problem, an embodiment of the present invention provides a system, including: the controller is used for testing the MCU to be tested according to the test condition of the instruction;
the power supply module is connected with the controller;
the load control circuit is connected with the MCU to be tested and the controller;
wherein, according to different test conditions, the controller controls the power supply module to provide different power supply voltages for the MCU to be tested, controls the load control circuit to provide different load currents for the MCU to be tested and controls the flow direction of the load currents,
and the controller obtains the output voltage of the GPIO to be tested of the MCU to be tested through the analog-to-digital converter.
Further, the load control circuit includes: a first current generating circuit, receiving a first signal, generating a first current whose magnitude varies with the first signal, the first current having a direction from a power supply terminal of the load control circuit to an output terminal of the load control circuit; a second current generating circuit, receiving the second signal, generating a second current whose magnitude varies with the second signal, the second current having a direction from the output terminal of the load control circuit to ground; and the controller controls the switch to determine whether the GPIO to be tested is connected with the first current generation circuit or the second current generation circuit. Still further, the first current generation circuit includes: the circuit comprises a first operational amplifier, a PMOS (P-channel metal oxide semiconductor) tube and a first resistor, wherein a positive phase input signal of the first operational amplifier is the first signal, and an inverted phase input signal of the first operational amplifier is connected with a source electrode of the PMOS tube.
Still further, the second current generation circuit includes: the transistor comprises a second operational amplifier, an NMOS tube and a second resistor, wherein a positive phase input signal of the second operational amplifier is the second signal, and an inverted phase input signal of the second operational amplifier is connected with a source electrode of the NMOS tube. According to the DC characteristic test system of the GPIO, the controller controls the power supply module to provide different target power supply voltages for the MCU to be tested according to different test conditions, and the load control circuit is controlled to generate load currents under various test conditions and correct load current flowing directions. Through the mode, various parameters of the DC characteristic test aiming at the GPIO can be automatically configured, a worker does not need to manually adjust the resistance value of the adjustable resistor and manually adjust the connection method of the circuit, and the working efficiency of the worker is greatly improved.
The controller can control the first current generation circuit to generate different load currents by adjusting the first signal; the controller may control the second current generating circuit to generate different load currents by adjusting the second signal.
In addition, the system adopts an analog-to-digital converter of the controller to collect data of the output voltage of the GPIO so as to realize the test of DC characteristic aiming at the GPIO. By the mode, any data in the whole test process does not need to be recorded manually, acquisition equipment such as an oscilloscope and the like is omitted, the working reliability of the equipment is further improved, data are not omitted or wrong in the whole test recording process, and the accuracy of the whole test result is also ensured.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without inventive labor.
FIG. 1 is a schematic diagram of a DC characteristic testing system for GPIO according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a load control circuit according to an embodiment of the present invention;
fig. 3 is an exemplary circuit diagram of a load control circuit according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 shows a schematic diagram of a DC characteristic testing system for GPIOs according to an embodiment of the present invention. The system comprises: the device comprises a controller 102, a power supply module 104, an MCU110 to be tested and a load control circuit 106.
The MCU110 to be tested has, for example, 20 pins (pins) P1-P20, the number of pins is different according to different MCUs, and each pin has a corresponding definition (pin definition). Taking this embodiment as an example, P1 is used as the working voltage input port VDD of the MCU and is connected to the power module 104, the controller 102 controls the power module 104 to provide different power supply voltages for the MCU110 to be tested, and P2 is used as the ground voltage port GND. When the MCU110 to be tested uses I2C bus to transmit signals with the controller 102, 2 pins are used, such as P6 and P7, and P3-P5 and P8-P20 can be used as the pins of the MCU GPIO peripheral function; when the MCU110 to be tested uses the SPI bus to transmit signals with the controller 102, 4 pins are used, for example, P6-P9, and P3-P5 and P11-P20 may be used as the duties of the GPIO peripheral function of the MCU.
The controller 102 executes a test on the MCU110 to be tested according to the test conditions of the instruction, and the controller 102 is connected to the power module 104, the load control circuit 106, and the MCU110 to be tested, respectively.
The controller 102 is configured to control the power module 104 and the load control circuit 106 to automatically generate various parameters under various test conditions, and at the same time, the controller 102 further cooperates with its own analog-to-digital conversion module to measure an output voltage value of a GPIO to implement a test for a DC characteristic of the GPIO, where the GPIO is a GPIO of the MCU to be tested, for example, when the MCU110 to be tested is connected to the controller 102 using I2C bus and transmits a signal, and the GPIO to be tested for the DC characteristic test is P8-P10.
The power module 104 is connected to the controller 102 and the MCU110 to be tested. The power module 104 includes a digitally adjustable power supply; the controller 102 controls the digitally adjustable power supply to output a target supply voltage.
The power supply module 104 is used for providing different power supply voltages for the MCU to be tested according to the instruction of the controller 102; therefore, the step that the direct current power supply needs to be adjusted manually to provide power supply voltage for the MCU to be tested at present is omitted, and the working efficiency is further improved.
It should be noted that the DC characteristic test for GPIO specifically refers to: at different load currents, for example, the load currents can have four steps of 4mA, 6mA, 8mA and 20 mA. High and low level voltage values output by GPIO: vOH、VOLIn the whole test process, the power supply voltage of the MCU needs to be adjusted to test the V under different power supply voltagesOHAnd VOLNumerical value to characterize the driving capability of GPIO, in addition, at VOHAnd VOLIn the test, the current directions of GPIO load currents are different and need to be adjusted at any time, and generally, VOLIn the test, the load current flows from the outside to GPIO, VOHThe load current is drained by the GPIO.
The DC test of the GPIO comprises measuring the voltage on the GPIO to be tested when the MCU outputs logic 1 or 0 through the GPIO under different MCU working voltages and different load currents. For example, when the power supply voltage of the power supply module is 2V, that is, the MCU110 to be tested operates at 2V, and the load current supplied by the load control circuit 106 is 4mA, the GPIO to be tested outputs logic 1, and the voltage value of the GPIO to be tested is measured. The test performed when the MCU outputs logic 1 through the GPIO to be tested also becomes VOHAnd (6) testing.
Similarly, the test performed when the MCU outputs logic 0 through the GPIO to be tested also becomes VOLAnd (6) testing.
In the process of VOHDuring testing, the load current flows out of the GPIO to be tested in the direction of the load current, and the GPIO load current also becomes a source current. In the process of VOLDuring testing, the load current flows in the same direction as the GPIO or GPIO load current to be testedThe current also becomes the sink current.
FIG. 2 is a schematic diagram of a load control circuit according to an embodiment of the present invention, which is used to facilitate testing of low level voltage values and testing of high level voltage values during a DC test of the desktop computer.
The load control circuit includes: a first current generating circuit 211, a second current generating circuit 212, and a switch S.
The first current generation circuit 211 receives a first signal from a controller, and generates a first load current I1 (hereinafter referred to as a first current) whose magnitude changes in accordance with the first signal; the second current generation circuit 212 receives the second signal from the controller, and generates a second load current I2 (hereinafter referred to as a second current) whose magnitude changes in accordance with the second signal.
The first current I1 is sink current, and can be V of GPIOOLTesting; the second current I2 is a source current and can be used for V of GPIOOHAnd (6) testing. When the GPIO to be tested is connected with the first current generating circuit 211, the controller realizes the test aiming at the low level voltage value of the GPIO to be tested; when the GPIO to be tested is connected with the second current generation circuit 212, the controller realizes the test aiming at the high-level voltage value of the GPIO to be tested.
The measurement circuit for the voltage of the GPIO to be measured includes, for example, an Analog-to-Digital Converter (ADC). In this embodiment, for the DC characteristic test, the output voltage value of the GPIO needs to be obtained, and the controller may acquire the output voltage of the GPIO through an analog-to-digital conversion module (ADC), and naturally obtain data of the output voltage value of the GPIO. Of course, a digital oscilloscope and other devices can be used for collecting data of the GPIO output voltage value and feeding the data back to the controller, but in the process, the devices are naturally added, and the more the devices are, the lower the reliability of natural test is, therefore, in the embodiment of the invention, the analog-to-digital conversion module of the controller is directly used for collecting the output voltage value of the GPIO, and the reliability is higher.
The control end of the switch S is connected with the controller. For example, the switch S is a single-pole double-throw switch or a multiplexer. For another example, the switch S may include two switches, one of the switches is connected between the GPIO to be tested and the first current generation circuit, and the other switch is connected between the GPIO to be tested and the second current generation circuit.
V of GPIOOHThe test comprises the following steps. The control switch S of the controller disconnects the first current generation circuit 211 from the GPIO to be tested, and the second current generation circuit 212 is connected to the GPIO to be tested. The controller will control this time VOHThe second signal corresponding to the test condition is sent to the second current generating circuit 212, and the second current generating circuit 212 generates the second current I2 with a corresponding magnitude. And the controller controls the power supply module to provide the MCU to be tested with the MCU working voltage corresponding to the test condition. The MCU outputs logic 1 through the GPIO to be tested, and the controller measures the voltage of the GPIO to be tested through the GPIO voltage measuring circuit and records the test parameters of the test condition and the voltage of the GPIO to be tested. The controller carries out V under the next test condition by changing the magnitude of the second signal and/or the working voltage of the MCUOHAnd (6) testing. VOHThe test parameters of the test include, but are not limited to, the operating voltage and the second current of the MCU. For example, the second current has magnitudes of 4mA, 6mA, 8mA, and 20mA, respectively, under different test conditions.
In some embodiments, a GPIO test program is run on the controller. The program can make the GPIO test system automatically complete V under various test conditionsOHTest and VOLTesting, by controlling switch S to realize VOHTest and VOLSwitching between tests.
In an embodiment, the controller is, for example, a control MCU, the first signal and the second signal output by the control MCU are digital signals, and the first signal and the second signal are converted by a digital-to-analog converter into analog signals matched with the first current generation circuit and the second current generation circuit, for example, V, respectivelyDAC0And VDAC1The voltage value of (2). The controller may control the first current generating circuit 211 to generate different load currents by adjusting the first signal; the controller may control the second current generating circuit 212 to generate different load currents by adjusting the second signal. The digital-to-analog converter may be provided on the control MCU side, or may be provided on the first current generation circuit 211 and the second current generation circuit 212 side.
Generally speaking, the power supply voltage refers to the power supply voltage provided for the MCU to be tested, and the load current refers to the current flowing through the GPIO output terminal. In the main control module in this embodiment, various parameters under various test conditions for the DC characteristic test of the GPIO are preset in advance, and the various parameters under each test condition are different; the main control module can automatically control the adjustable power supply module and the load control circuit to generate corresponding parameters aiming at the parameters of the DC characteristic test of the GPIO.
When the controller starts, the adjustable power supply module is controlled to generate 2.0V voltage and output the voltage to the MCU to be tested by using the power supply voltage of 2.0V and the current of 8mA under the first test condition, the load control circuit is controlled to generate 8mA load current, and simultaneously, the V is tested under the test conditionOLWhen the test is finished, the control current flows from the power supply of the load control circuit to the GPIO, and the test V is tested under the test conditionOHWhen the current is controlled, the current is discharged from the GPIO; when the DC characteristic test under the test condition is finished, the controller can automatically switch to the power supply voltage of 5.0V and the load current of 8mA under the second test condition, control the adjustable power supply module to generate the voltage of 5.0V and output the voltage to the MCU to be tested, control the load control circuit to generate the load current of 8mA, and similarly, the test V under the test condition is used for testing the voltageOLWhen the test is finished, the control current flows from the power supply of the load control circuit to the GPIO, and the test V is tested under the test conditionOHWhen the current is controlled, the current is discharged from the GPIO; and the like until the DC characteristic test under all the test conditions is completely finished.
In the embodiment of the invention, the load control circuit is connected with the MCU to be tested and is used for providing different load currents for the GPIO and controlling the flow direction of the load currents according to the instruction of the controller; therefore, the operation that at present, a tester needs to repeatedly and manually adjust to find a proper resistance value so as to obtain accurate GPIO load current is omitted. Meanwhile, the operation that a tester needs to readjust the resistance value of the resistor when the supply voltage of the MCU changes is also omitted. The operation that the tester needs to readjust the circuit connection method because the current direction of the load current is different is also omitted. This undoubtedly greatly improves the working efficiency of the worker, and because the above operations are all completed by the automatic control of the controller, not only is no error guaranteed, but also the overall speed of the DC characteristic test is improved.
Fig. 3 is a circuit diagram of the load control circuit of the present embodiment.
In the circuit diagram of this embodiment, the first signal and the second signal are converted into analog signals matched with the first current generating circuit and the second current generating circuit by the digital-to-analog converter, for example, VDAC0And VDAC1The voltage value of (2). Referring to fig. 2, the first current generation circuit of the load control circuit includes: the first operational amplifier OP1, the PMOS transistor M2, and the first resistor R1. The second current generation circuit of the load control circuit includes: a second operational amplifier OP2, an NMOS transistor M1, and a second resistor R2.
The source electrode of the PMOS tube M2 is connected with the first end of the first resistor R1, the drain electrode of the PMOS tube M2 is connected with the first input end of the single-pole double-throw switch S1, and the grid electrode of the PMOS tube M2 is connected with the output end of the first operational amplifier OP 1; the inverting input terminal of the first operational amplifier OP1 is connected to the source of the PMOS transistor M2, and the non-inverting input terminal of the first operational amplifier OP1 receives the first signal of the controller (converted into V by the DAC)DAC0) (ii) a The second end of the first resistor R1 is connected with a power supply VCC of the load control circuit; the output end of the switch S1 is connected with the GPIO to be tested of the MCU to be tested.
V controlled by controllerDAC0Generating different first load currents (I)1) First load current (I)1) The flow from the power supply VCC of the load control circuit to the output of the switch S1 is also seen as from the power supply terminal of the load control circuit to the output of the load control circuit. Specifically, the first operational amplifier OP1 controls the PMOS transistor M2 such that the input voltage (i.e. VCC-I) at the inverting input terminal of the first operational amplifier OP11R1) is equal to the voltage V at its non-inverting inputDAC0M2 is turned on as long as the output voltage of OP1 is less than 0, so that when V is performedOLDuring the test, the controller sets through signals: SEL selects GPIO to be tested to be connected with the drain electrode of PMOS tube M2, and then the load current value I flowing into GPIO from VCC at the moment1Comprises the following steps: (VCC-V)DAC0) /R1, known from the formula, by adjusting the controller output and converting via a digital-to-analog converterVDAC0By this value, switching of the magnitude of the load current can be achieved.
By the mode, the first current generation circuit can be controlled to generate different load currents, the flow direction of the load current is enabled to flow to the GPIO to be tested from the power supply VCC of the load control circuit, and the low voltage V aiming at the output voltage of the GPIO is metOLThe power supply voltage of the MCU to be tested is controlled by the controller to be automatically adjusted by the adjustable power supply module, so that the switching of different grades of load currents is realized without manually adjusting the resistance value of the adjustable resistor, and the flow direction adjustment of the load currents is realized without adjusting a circuit connection method.
Similarly, the source of the NMOS transistor M1 is connected to the first end of the second resistor R2, the drain of the NMOS transistor M1 is connected to the second input terminal of the switch S1, and the gate of the NMOS transistor M1 is connected to the output terminal of the second operational amplifier OP 2; the inverting input terminal of the second operational amplifier OP2 is connected to the source of the NMOS transistor M1, and the non-inverting input terminal of the second operational amplifier OP2 receives the second signal (converted into V by the DAC) from the controllerDAC1(ii) a The second terminal of the second resistor R2 is connected to ground.
The second operational amplifier OP2, the NMOS transistor M1 and the second resistor R2 together form a second current generating circuit controlled by V of the controllerDAC1And generating different load currents and controlling the load currents to flow out from the GPIO. The controller converts the second signal into V through the digital-to-analog converterDAC1Generating a second, different load current (I)2) Second load current (I)2) From the output of the load control circuit to ground. Specifically, the second operational amplifier OP2 controls the NMOS transistor M1 such that the input voltage (i.e., I) at the inverting input of the second operational amplifier OP22R2) is equal to its positive input voltage VDAC1. When carrying out VOHWhen in test, the controller selects the GPIO to be tested to be connected with the drain electrode of the NMOS tube M1 through SEL, and the load current value I flowing out of the GPIO at the moment2Comprises the following steps: vDAC1/R1, known from the formula, by adjusting the V of the controllerDAC1By this value, switching of the magnitude of the load current can be achieved.
By the way, do notBut the second current generation circuit can be controlled to generate different load currents, the flow direction of the load current is enabled to flow out from the GPIO to be tested, and the high voltage V aiming at the output voltage of the GPIO is metOHThe power supply voltage of the MCU to be tested is controlled by the controller to be automatically adjusted by the adjustable power supply module, the work of the constant current source circuit is not influenced, the resistance value of the adjustable resistor is not required to be manually adjusted to realize the switching of different levels of load current, and the flow direction adjustment of the load current is also not required to be realized by adjusting the circuit connection.
In the process, the controller controls the on-off of the switch S1 through setting a signal line SEL so as to control the GPIO to be connected with the first current generation circuit or control the GPIO to be connected with the second current generation circuit. When carrying out VOLWhen in test, the controller is connected with the drain electrode of the PMOS tube M2 through the first input end of the SEL selection switch S1, so that the GPIO of the MCU to be tested is connected with the drain electrode of the PMOS tube M2, and V can be carried outOLTesting; when carrying out VOHWhen in test, the controller is connected with the drain electrode of the NMOS tube M1 through the second input end of the SEL selection switch S1, so that the GPIO of the MCU to be tested is connected with the drain electrode of the NMOS tube M1, and V can be carried outOHAnd (6) testing.
For example: when the GPIO is connected with the first current generation circuit, the controller adjusts the V of the controllerDAC0The load current value flowing into the GPIO from the VCC is 8mA, the adjustable power supply module provides 2.0V power supply voltage for the MCU to be tested, and then the output voltage of the GPIO is measured, so that the V under the test conditions of the power supply voltage of 2.0V and the load current of 8mA is realizedOLTesting; and then. The controller controls SEL to connect GPIO with the second current generation circuit, and the controller adjusts V of the controllerDAC1The load current value flowing out of the GPIO is 8mA, the supply voltage of 2.0V is kept to be provided for the MCU to be tested, and then the output voltage of the GPIO is measured through the ADC, so that the V under the test conditions of the supply voltage of 2.0V and the load current of 8mA is realizedOHAnd (6) testing.
Thereafter, the controller again adjusts the V of the controllerDAC1The value is such that the load current value flowing out of the GPIO is 20mA, and simultaneouslyThe adjustable power supply module provides 5.0V power supply voltage for the MCU to be tested, and the ADC is used for measuring the output voltage of the GPIO, so that the voltage V under the test conditions of 5.0V power supply voltage and 20mA load currentOHTesting; the controller adjusts the V of the controllerDAC0The value of the load current flowing into the GPIO from the VCC is 20mA, the supply voltage of 5.0V is kept to be provided for the MCU to be tested, and then the output voltage of the GPIO is measured through the ADC, so that the V under the test conditions of the supply voltage of 5.0V and the load current of 20mA is realizedOHAnd (6) testing.
The above process is repeated until V is completed under all test conditionsOL、VOHTesting, namely, when the GPIO is connected with the first current generation circuit, the controller realizes the testing of the low-level voltage value aiming at the GPIO under each test condition; when the GPIO is connected with the second current generation circuit, the controller realizes the test of the high-level voltage value aiming at the GPIO under each test condition.
In summary, the system for testing the DC characteristic of the GPIO according to the embodiment of the present invention can automatically operate, automatically configure various parameters under various test conditions, and automatically record data, thereby finally achieving the purpose of automatically completing the DC characteristic test of the GPIO.
It should be further noted that, in the embodiment of the present invention, when the controller controls the adjustable power supply module and the load control circuit, it is not limited that the adjustable power supply module can only be adjusted through the I2C bus to provide the power supply voltage, it is also not limited that the load current can only be adjusted through the output data of the digital-to-analog conversion module, and it is also not limited that the output voltage of the GPIO can only be measured through the analog-to-digital conversion module. All the ways of implementing the above functions fall within the scope of protection of the technical solution of the present invention.
Through the embodiment, the controller controls the power supply module to provide the power supply voltage under each test condition for the MCU to be tested, and controls the load control circuit to generate the load current under various test conditions and correct load current flowing direction. Through the mode, various parameters of the DC characteristic test aiming at the GPIO can be automatically configured, a worker does not need to manually adjust the resistance value of the adjustable resistor and manually adjust the connection method of the circuit, and the working efficiency of the worker is greatly improved.
In addition, the system adopts an analog-to-digital conversion module of the controller to acquire the data of the output voltage of the GPIO so as to realize the test of the DC characteristic aiming at the GPIO. By the mode, any data in the whole test process does not need to be recorded manually, acquisition equipment such as an oscilloscope and the like is omitted, the working reliability of the equipment is further improved, data are not omitted or wrong in the whole test recording process, and the accuracy of the whole test result is also ensured.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, herein, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
While the present invention has been described with reference to the embodiments shown in the drawings, the present invention is not limited to the embodiments, which are illustrative and not restrictive, and it will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention as defined in the appended claims.

Claims (8)

1. A DC characteristic test system of GPIO is characterized by comprising:
the controller is used for testing the MCU to be tested according to the test condition of the instruction;
the power supply module is connected with the controller;
the load control circuit is connected with the MCU to be tested and the controller;
wherein, according to different test conditions, the controller controls the power supply module to provide different power supply voltages for the MCU to be tested, controls the load control circuit to provide different load currents for the MCU to be tested and controls the flow direction of the load currents,
and the controller obtains the output voltage of the GPIO to be tested of the MCU to be tested through the analog-to-digital converter.
2. The system of claim 1, wherein the load control circuit comprises:
a first current generating circuit, receiving a first signal, generating a first current whose magnitude varies with the first signal, the first current having a direction from a power supply terminal of the load control circuit to an output terminal of the load control circuit;
a second current generating circuit, receiving the second signal, generating a second current whose magnitude varies with the second signal, the second current having a direction from the output terminal of the load control circuit to ground; and
and the controller controls the switch to determine whether the GPIO to be tested is connected with the first current generation circuit or the second current generation circuit.
3. The system of claim 2, wherein the first current generating circuit comprises: the circuit comprises a first operational amplifier, a PMOS (P-channel metal oxide semiconductor) tube and a first resistor, wherein a positive phase input signal of the first operational amplifier is the first signal, and an inverted phase input signal of the first operational amplifier is connected with a source electrode of the PMOS tube.
4. The system of claim 2, wherein the second current generating circuit comprises: the transistor comprises a second operational amplifier, an NMOS tube and a second resistor, wherein a positive phase input signal of the second operational amplifier is the second signal, and an inverted phase input signal of the second operational amplifier is connected with a source electrode of the NMOS tube.
5. The system of claim 3 or 4, wherein the controller is capable of controlling the first current generating circuit to generate different load currents by adjusting the first signal;
the controller may control the second current generating circuit to generate different load currents by adjusting the second signal.
6. The system of claim 2, wherein the switch comprises a single pole double throw switch.
7. The system of claim 1, wherein the power module comprises a digitally adjustable power supply; the controller controls the digital adjustable power supply to output a target power supply voltage.
8. The system of claim 2, wherein when the GPIO to be tested is connected with the first current generating circuit, the controller implements a test for the GPIO to be tested at a low level voltage value;
when the GPIO to be tested is connected with the second current generation circuit, the controller realizes the test aiming at the high level voltage value of the GPIO to be tested.
CN202023259064.3U 2020-12-29 2020-12-29 DC characteristic test system of GPIO Active CN215218987U (en)

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