CN215218635U - Probe for testing Seebeck coefficient - Google Patents
Probe for testing Seebeck coefficient Download PDFInfo
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- CN215218635U CN215218635U CN202121256069.2U CN202121256069U CN215218635U CN 215218635 U CN215218635 U CN 215218635U CN 202121256069 U CN202121256069 U CN 202121256069U CN 215218635 U CN215218635 U CN 215218635U
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- seebeck coefficient
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Abstract
The utility model relates to a be used for Seebeck coefficient test probe, including the hot probe body and the cold probe body, the outside of cold probe body is provided with the collets, is provided with the constantan wire between the outside of collets and hot probe body, be provided with the heater strip on the hot probe body, the hot probe body includes that hot probe mounting panel, fixed connection are at the hot probe shell of the left first pressure spring of hot probe mounting panel, fixed connection, set up at the heater of hot probe shell inboard, the thermocouple of fixed mounting on heater right side, peg graft at the inboard hot probe of heater to and the hot probe installation axle of fixed mounting on the hot probe mounting panel. According to the probe for testing the Seebeck coefficient, the Seebeck coefficient of a tested sample can be rapidly calculated according to a formula by acquiring the voltage between the first pure copper wire and the second pure copper wire and the voltage between the first pure copper wire and the third pure copper wire, and knowing the Seebeck coefficient at normal temperature.
Description
Technical Field
The utility model relates to a Seebeck coefficient test technical field.
Background
Seeback, a German scientist, finds that when the temperature difference exists between two metal joints, continuous current flows in a loop, the phenomenon is called Seeback effect, the Seeback coefficient can be used for representing the Seeback effect, the Seeback coefficient is an important parameter of thermoelectric performance of a reaction material, and the rapid and accurate measurement of the Seeback coefficient has great significance for evaluating the thermoelectric performance of the material.
The Seebeck coefficient test generally uses a thermocouple as a probe to measure the temperature and the potential difference of a contact point, but in the specific measurement process, one end of an additional device is required to be heated to form temperature difference, so that the difficulty is increased for the design of test equipment, the system is more complex, and a simple and practical test probe is required to measure the Seebeck coefficient.
SUMMERY OF THE UTILITY MODEL
The utility model discloses to the technical problem who exists among the prior art, provide one kind and be used for Seebeck coefficient test probe, solved Seebeck coefficient test probe and need form the comparatively complicated problem of the difference in temperature for the one end heating.
The utility model provides an above-mentioned technical problem's technical scheme as follows: the utility model provides a be used for Seebeck coefficient test probe, includes hot probe pen body and cold probe pen body, the outside of cold probe pen body is provided with the collets, is provided with the constantan wire between the outside of collets and hot probe pen body, be provided with the heater strip on the hot probe pen body, the hot probe pen body includes that hot probe pen mounting panel, fixed connection are at the left first pressure spring of hot probe pen mounting panel, fixed connection at the hot probe pen shell of the first pressure spring left end, set up at the inboard heater of hot probe pen shell, fixed mounting at the first thermocouple on heater right side, peg graft at the inboard hot probe pen probe of heater to and the hot probe pen installation axle of fixed mounting on hot probe pen mounting panel.
On the basis of the technical scheme, the utility model discloses can also do following improvement.
Further, the cold probe pen body comprises a cold probe pen mounting plate, a cold probe pen sleeve fixedly mounted on the left side of the cold probe pen mounting plate, a second compression spring fixedly mounted on the left side of the cold probe pen mounting plate, a cold probe pen probe fixedly connected to the left end of the second compression spring, a second thermocouple fixedly mounted on the right side of the cold probe pen mounting plate, and a cold probe pen insulating cap fixedly mounted on the right side of the cold probe pen mounting plate.
Further, the first pure copper wire of outside fixedly connected with of hot probe body, insulating block right side fixedly connected with second pure copper wire, the third pure copper wire of outside fixedly connected with of cold probe body, the joint has the sample between the hot probe body and the relative one side of cold probe body.
Furthermore, a through hole is formed in the outer side of the thermal probe pen shell, and the bottom end, far away from the thermal probe pen shell, of the first thermocouple penetrates through the through hole and extends to the outer side of the thermal probe pen shell.
Furthermore, the left end of the second thermocouple penetrates through the cold probe mounting plate and the cold probe sleeve in sequence and extends to the left side of the cold probe sleeve.
Furthermore, the cold probe pen sleeve is positioned on the inner side of the second compression spring, and the left end of the second thermocouple is connected with the cold probe pen probe in an inserting mode.
Further, the cold probe and the cold probe are fixedly connected with gold plating coatings on the outer sides, the hot probe mounting shaft is located on the inner side of the first compression spring, and the hot probe mounting shaft is connected with the hot probe shell in an inserting mode.
Compared with the prior art, the technical scheme of the application has the following beneficial technical effects:
1. according to the probe for testing the Seebeck coefficient, the Seebeck coefficient of a tested sample can be rapidly calculated according to a formula by acquiring the voltage between the first pure copper wire and the second pure copper wire and the voltage between the first pure copper wire and the third pure copper wire, and knowing the Seebeck coefficient at normal temperature.
2. This be used for Seebeck coefficient test probe, through hot probe mounting panel and first pressure spring with hot probe body and cold probe body install test support on, rethread hot probe and sample contact test contact temperature, and heat through the heater, extrude through first pressure spring, make hot probe and sample paste tightly, guarantee to survey stably, through cold probe and sample contact test contact temperature, do not heat, and extrude through second pressure spring, make cold probe and sample paste tightly, guarantee to survey stably, it is stable to survey.
Drawings
FIG. 1 is a circuit diagram of the overall structure of the present invention;
FIG. 2 is an exploded view of the thermal probe body of the present invention;
FIG. 3 is a three-dimensional schematic view of the thermal probe body with an integral structure according to the present invention;
FIG. 4 is an exploded view of the whole structure of the cold probe pen of the present invention;
fig. 5 is a three-dimensional schematic diagram of the whole structure of the cold probe pen body of the present invention.
In the drawings, the components represented by the respective reference numerals are listed below:
the thermal probe pen comprises a hot probe pen body 1, a cold probe pen body 2, an insulating block 3, a copper wire 4 kang, a first pure copper wire 5, a second pure copper wire 6, a third pure copper wire 7, a sample 8, a thermal probe pen mounting plate 11, a first compression spring 12, a thermal probe pen shell 13, a heater 14, a first thermocouple 15, a thermal probe pen probe 16, a thermal probe pen mounting shaft 17, a cold probe pen mounting plate 21, a cold probe pen sleeve 22, a second compression spring 23, a cold probe pen probe 24, a second thermocouple 25 and a cold probe pen insulating cap 26.
Detailed Description
The principles and features of the present invention are described below in conjunction with the following drawings, the examples given are only intended to illustrate the present invention and are not intended to limit the scope of the present invention.
Referring to fig. 1-5, in the embodiment, the probe for testing the Seebeck coefficient includes a thermal probe body 1 and a cold probe body 2, an insulating block 3 is fixedly connected to the outer side of the cold probe body 2, a constantan wire 4 is welded between the insulating block 3 and the outer side of the thermal probe body 1, a heating wire 9 is installed on the inner side of the thermal probe body 1, a first pure copper wire 5 is fixedly connected to the outer side of the thermal probe body 1, a second pure copper wire 6 is fixedly connected to the right side of the insulating block 3, a third pure copper wire 7 is fixedly connected to the outer side of the cold probe body 2, and a sample 8 is clamped between the opposite sides of the thermal probe body 1 and the cold probe body 2.
Wherein the Seebeck coefficient is expressed by the formula U1＝αK(T1-T2)，U2＝αS(T1-T2)；
To obtain
Two T are respectively the voltage between the first pure copper wire 5 and the second pure copper wire 6 and the voltage between the first pure copper wire 5 and the third pure copper wire 7, alpha with a lower corner labeled as K is the Seebeck coefficient of the constantan wire 4, and alpha with a lower corner labeled as S is the Seebeck coefficient to be measured.
The thermal probe body 1 comprises a thermal probe mounting plate 11, a first compression spring 12 fixedly connected to the left side of the thermal probe mounting plate 11, a thermal probe shell 13 fixedly connected to the left end of the first compression spring 12, a heater 14 fixedly mounted on the inner side of the thermal probe shell 13, a first thermocouple 15 fixedly mounted on the right side of the heater 14, a thermal probe 16 inserted in the inner side of the heater 14, and a thermal probe mounting shaft 17 fixedly mounted on the thermal probe mounting plate 11, wherein a through hole is formed in the outer side of the thermal probe shell 13, the bottom end of the first thermocouple 15, which is far away from the thermal probe shell 13, penetrates through the through hole and extends to the outer side of the thermal probe shell 13, the heater 14 is sleeved on the outer side of the thermal probe 16 and is used for heating the thermal probe 16 to a fixed temperature difference with the cold probe body 2, the thermal probe mounting plate 11 is mounted on a test support, and the contact part of the thermal probe 16 and the sample 8 is plated with gold, for improved contact performance and corrosion protection.
The cold probe pen body 2 comprises a cold probe pen mounting plate 21, a cold probe pen sleeve 22 fixedly mounted on the left side of the cold probe pen mounting plate 21, a second compression spring 23 fixedly mounted on the left side of the cold probe pen mounting plate 21, a cold probe pen probe 24 fixedly connected to the left end of the second compression spring 23, a second thermocouple 25 fixedly mounted on the right side of the cold probe pen mounting plate 21, and a cold probe pen insulating cap 26 fixedly mounted on the right side of the cold probe pen mounting plate 21, the left end of the second thermocouple 25 sequentially penetrates through the cold probe pen mounting plate 21 and the cold probe pen sleeve 22 and extends to the left side of the cold probe pen sleeve 22, the cold probe pen mounting plate 21 is mounted on a test support, the gold-plated probe pen probe 24 is composed of a good heat conducting material, and is anti-corrosion and contact performance improvement and surface treatment is performed.
The cold probe sleeve 22 is located on the inner side of the second compression spring 23, the left end of the second thermocouple 25 is inserted into the cold probe 24, gold-plated coatings are fixedly connected to the outer sides of the cold probe 24 and the cold probe 24, the hot probe mounting shaft 17 is located on the inner side of the first compression spring 12, and the hot probe mounting shaft 17 is inserted into the hot probe housing 13.
The working principle of the above embodiment is as follows:
(1) the hot probe pen body 1 is tightly attached to the top of the sample 8, the cold probe pen body 2 is tightly attached to the bottom of the sample, the voltage between the first pure copper wire 5 and the second pure copper wire 6, the voltage between the first pure copper wire 5 and the third pure copper wire 7 and the Seebeck coefficient of 4 at normal temperature are known, and then the Seebeck coefficient of the sample 8 to be detected can be rapidly calculated according to a formula.
(2) During the test, install hot probe body 1 and cold probe body 2 on the test support through hot probe mounting panel 11 and first pressure spring 12, rethread hot probe 16 and sample 8 contact test contact temperature, and heat through heater 14, extrude through first pressure spring 12, make hot probe 16 paste tightly with sample 8, contact test contact temperature through cold probe 24 and sample 8, do not heat, and extrude through second pressure spring 23, make cold probe 24 paste tightly with sample 8, it is more stable to survey.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the present invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included within the protection scope of the present invention.
Claims (7)
1. The probe for the Seebeck coefficient test is characterized by comprising a hot probe pen body (1) and a cold probe pen body (2), wherein an insulating block (3) is arranged on the outer side of the cold probe pen body (2), a constantan wire (4) is arranged between the insulating block (3) and the outer side of the hot probe pen body (1), and a heating wire (9) is arranged on the hot probe pen body (1);
the heat-detecting pen comprises a heat-detecting pen body (1) and is characterized by comprising a heat-detecting pen mounting plate (11), a first compression spring (12) fixedly connected to the left side of the heat-detecting pen mounting plate (11), a heat-detecting pen shell (13) fixedly connected to the left end of the first compression spring (12), a heater (14) arranged on the inner side of the heat-detecting pen shell (13), a first thermocouple (15) fixedly installed on the right side of the heater (14), a heat-detecting pen probe (16) inserted into the inner side of the heater (14), and a heat-detecting pen mounting shaft (17) fixedly installed on the heat-detecting pen mounting plate (11).
2. The Seebeck coefficient test probe according to claim 1, wherein the cold probe pen body (2) comprises a cold probe pen mounting plate (21), a cold probe pen sleeve (22) fixedly mounted on the left side of the cold probe pen mounting plate (21), a second hold-down spring (23) fixedly mounted on the left side of the cold probe pen mounting plate (21), a cold probe pen probe (24) fixedly connected to the left end of the second hold-down spring (23), a second thermocouple (25) fixedly mounted on the right side of the cold probe pen mounting plate (21), and a cold probe pen insulating cap (26) fixedly mounted on the right side of the cold probe pen mounting plate (21).
3. The Seebeck coefficient test probe as claimed in claim 1, wherein a first pure copper wire (5) is fixedly connected to the outer side of the hot probe pen body (1), a second pure copper wire (6) is fixedly connected to the right side of the insulating block (3), a third pure copper wire (7) is fixedly connected to the outer side of the cold probe pen body (2), and a sample (8) is clamped between the opposite sides of the hot probe pen body (1) and the cold probe pen body (2).
4. The Seebeck coefficient test probe according to claim 1, wherein a through hole is formed in the outer side of the thermal probe pen shell (13), and the bottom end of the first thermocouple (15) far away from the thermal probe pen shell (13) penetrates through the through hole and extends to the outer side of the thermal probe pen shell (13).
5. The probe for Seebeck coefficient test according to claim 2, wherein the left end of the second thermocouple (25) penetrates the cold stylus mounting plate (21) and the cold stylus sleeve (22) in sequence and extends to the left side of the cold stylus sleeve (22).
6. The probe for Seebeck coefficient test according to claim 2, wherein the cold stylus sleeve (22) is located inside a second compression spring (23), and the left end of the second thermocouple (25) is plugged into the cold stylus probe (24).
7. The Seebeck coefficient test probe according to claim 2, wherein a gold-plated coating is fixedly connected to the outer sides of the cold probe tip (24) and the cold probe tip (24), the hot probe mounting shaft (17) is located on the inner side of the first compression spring (12), and the hot probe mounting shaft (17) is inserted into the hot probe housing (13).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121256069.2U CN215218635U (en) | 2021-06-07 | 2021-06-07 | Probe for testing Seebeck coefficient |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121256069.2U CN215218635U (en) | 2021-06-07 | 2021-06-07 | Probe for testing Seebeck coefficient |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215218635U true CN215218635U (en) | 2021-12-17 |
Family
ID=79423716
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121256069.2U Active CN215218635U (en) | 2021-06-07 | 2021-06-07 | Probe for testing Seebeck coefficient |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215218635U (en) |
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2021
- 2021-06-07 CN CN202121256069.2U patent/CN215218635U/en active Active
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