CN108801487B - Metal test piece temperature measuring device and system - Google Patents
Metal test piece temperature measuring device and system Download PDFInfo
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- CN108801487B CN108801487B CN201810344878.5A CN201810344878A CN108801487B CN 108801487 B CN108801487 B CN 108801487B CN 201810344878 A CN201810344878 A CN 201810344878A CN 108801487 B CN108801487 B CN 108801487B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
- G01K7/04—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples the object to be measured not forming one of the thermoelectric materials
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Abstract
The disclosure relates to a metal test piece temperature measuring device and a system. The device includes: an insulating substrate; the reference ends of the N thermocouples are arranged in the insulating base body, the measuring ends of the N thermocouples extend out of the surface of the insulating base body, and the N measuring ends are arranged in an array mode to form a test piece bearing surface; at least one measuring end is of a pointed structure, and N is a natural number greater than or equal to 2. The method can realize surface temperature measurement of a metal sheet test piece without damaging the test piece, is simple and convenient to test, and ensures that the contact point between the thermocouple measuring end and the surface of the test piece is reduced because at least one measuring end is of a pointed structure, thereby improving the measuring precision.
Description
Technical Field
The utility model relates to a temperature measurement technical field especially relates to a metal test piece temperature measuring device and temperature measurement system including this metal test piece temperature measuring device.
Background
There are a number of surface temperature testing problems in aerospace, energy, chemical, textile and other scientific research and production. But the environmental conditions, temperature sensors and the measured surface influence each other to form a complex system. Various factors directly or indirectly affect the accuracy of the surface temperature measurement. Thus, surface temperature measurement is a measurement that is often required but difficult to perform.
For the surface temperature measurement of a metal test piece, two modes of thermocouple temperature measurement and radiation temperature measurement are generally available. The oxidation reaction of the surface of the metal test piece at high temperature can change the surface emissivity of the metal test piece, and the radiation temperature measurement precision is influenced. Therefore, the surface temperature field of the metal test piece is generally measured by thermocouple, for example, in the related art, a thermocouple may be welded on the back surface of the metal test piece to measure the surface temperature. However, the method cannot be used for a thin-thickness metal sheet test piece, and the instantaneous high temperature in the welding process can break down the metal sheet test piece to cause damage to the front surface of the test piece. Therefore, there is a need to provide a new technical solution to improve one or more of the problems in the above solutions.
Disclosure of Invention
An object of the present disclosure is to provide a metal test piece temperature measuring device and a temperature measuring system including the same, thereby overcoming one or more problems caused by limitations and defects of the related art at least to a certain extent.
According to a first aspect of the embodiments of the present disclosure, there is provided a metal test piece temperature measuring device, the device including:
an insulating substrate; and
the reference ends of the N thermocouples are arranged in the insulating base body, the measuring ends of the N thermocouples extend out of the surface of the insulating base body, and the N measuring ends are arranged in an array mode to form a test piece bearing surface; at least one measuring end is of a pointed structure, and N is a natural number greater than or equal to 2.
In the embodiments of the present disclosure, the pointed structure is needle-shaped or cone-shaped.
In the embodiment of the disclosure, the surface of the pointed structure is covered with a protective film layer, and the thickness of the protective film layer is 10-100 micrometers.
In an embodiment of the present disclosure, the protective film is a silicon dioxide film.
In an embodiment of the present disclosure, the apparatus further includes:
and the N signal wires are respectively electrically connected with the reference ends of the N thermocouples, extend out of the insulating base body from the insulating base body and are used for transmitting signals output when the N thermocouples measure the metal test piece.
In the embodiment of the disclosure, the reference end of each thermocouple is at least partially encapsulated in an insulating sleeve, and the insulating sleeves are arranged on the insulating base in an array manner, so that N measuring ends form an array arrangement.
In the embodiment of the disclosure, one surface of the insulating base body is recessed inwards to form N containing holes which are arranged in an array; each insulating sleeve at least partially extends into the corresponding accommodating hole so as to enable each insulating sleeve to be arranged on the insulating base body in an array mode; one end of each signal wire is positioned at the bottom of the corresponding accommodating hole and is electrically connected with the reference end of the corresponding thermocouple, and the other end of each signal wire extends out of the insulating base body.
In the embodiment of the disclosure, an elastic part is arranged at one end of the insulating sleeve extending into the accommodating hole; wherein the elastic deformation amount of the elastic piece is related to the deformation amount of the metal test piece placed on the test piece bearing surface.
In the embodiment of the present disclosure, further, one end of each signal line is electrically connected to the reference end of the corresponding thermocouple after extending on the surface of the elastic member; or one end of each signal wire extends through the elastic piece and then is electrically connected with the reference end of the corresponding thermocouple.
According to a second aspect of the embodiments of the present disclosure, a metal test piece temperature measurement system is provided, which includes a data processing device and the metal test piece temperature measurement device according to any one of the embodiments; the reference ends of N thermocouples in the metal test piece temperature measuring device are respectively connected with the data processing device.
The technical scheme provided by the embodiment of the disclosure can have the following beneficial effects:
in the embodiment of the disclosure, a plurality of thermocouples can be arranged on the insulating base body in an array manner, and the measuring end of each thermocouple forms a test piece bearing surface on the surface of the insulating base body to bear a metal test piece to be measured, such as a metal sheet test piece, so that the surface temperature measurement of the metal test piece can be realized. Therefore, the surface temperature measurement is carried out without welding a thermocouple on the back surface of the metal test piece, the test piece is not damaged, the test is simple and convenient, and at least one measuring end is of a pointed structure, so that the contact point between the thermocouple measuring end and the surface of the test piece is reduced, and the measuring precision can be improved to a certain degree.
Drawings
FIG. 1 shows a schematic diagram of a temperature measurement device for a metal test piece in an exemplary embodiment of the disclosure;
FIG. 2 shows a top view of the temperature measuring device of the metal test piece shown in FIG. 1;
FIG. 3 shows a schematic diagram of a temperature measurement system for a metal test piece in an exemplary embodiment of the disclosure.
Detailed Description
Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many different forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
Furthermore, the drawings are merely schematic illustrations of the present disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus their repetitive description will be omitted. Some of the block diagrams shown in the figures are functional entities and do not necessarily correspond to physically or logically separate entities. These functional entities may be implemented in the form of software, or in one or more hardware modules or integrated circuits, or in different networks and/or processor devices and/or microcontroller devices.
First, in the present exemplary embodiment, there is provided a metal test piece temperature measuring apparatus, which may include an insulating base 10 and N thermocouples 20, as shown in fig. 1 to 2. The insulating base 10 may be formed of an insulating material such as plastic or ceramic, and the insulating base 10 may be, for example, a rectangular structure, a cylindrical structure, or the like, which is not limited in this embodiment.
The reference terminals 22 (also called cold terminals or free terminals) of the N thermocouples 20 are disposed in the insulating base 10, and a signal line may extend out of the insulating base 10 to transmit a signal of the reference terminal 22, such as a thermoelectric voltage signal. The measuring ends 21 (also called thermodes, working ends or hot ends) of the N thermocouples 20 extend out of the surface of the insulating base 10, and the N measuring ends 21 are arranged in an array to form a test piece bearing surface on which a metal test piece to be tested is placed during testing. The metal test piece to be tested can be a metal sheet test piece with the thickness of less than 0.5 millimeter. Therefore, when the surface temperature of the metal sheet test piece is measured, a thermocouple does not need to be welded on the back surface of the metal test piece to measure the surface temperature, the test piece is not damaged, and the test is simple and convenient. Meanwhile, the metal test piece does not need to be clamped by a clamp to be in contact with the measuring end of the thermocouple for measurement, so that the influence of heat conduction caused by the clamp on the temperature field of the test piece can be avoided, and the measurement precision is further improved. At least one of the measuring ends 21 is of a pointed structure, so that the contact point between the thermocouple measuring end 21 and the surface of the test piece is reduced, and the measuring accuracy can be further improved to a certain extent.
Specifically, in the embodiment of the present disclosure, the apparatus may further include N signal lines 24, such as flexible thin wires. The N signal wires 24 may be electrically connected to the reference terminals 22 of the N thermocouples 20, respectively, and extend from the insulating base 10 to the insulating base 10, such as from the port 40, so as to be connected to an external data processing device for data analysis. The N signal lines 24 are respectively used for transmitting signals such as thermoelectric potential difference signals output when the N thermocouples 20 measure the metal test piece. For the specific processing of the thermocouple output signal, reference may be made to the prior art, which is not described herein. It should be noted that, in general, the thermocouple 20 is formed by joining two ends of two conductors with different compositions, for example, one end of the two conductors is joined to be the measuring end 21, and the other two conductors are insulated and extend independently to form two independent terminals. The signal line 24 in this embodiment is a signal line including two wires to be connected to the two terminals of the reference terminal 22, and may be extended from the corresponding ports 40, respectively.
In order to improve the measurement accuracy of the surface temperature of the metal test piece, in the embodiment of the present disclosure, the measuring end 21 of each thermocouple 20 may be a pointed structure. In some embodiments, the pointed structure may be needle-shaped or cone-shaped, but is not limited thereto. Thus, the needle-shaped thermocouple measuring end 21 is adopted, the contact point is smaller, the influence of the heat conduction of the thermocouple on a test piece is greatly reduced, and the measurement precision can be higher.
Further, in the embodiment of the present disclosure, referring to fig. 1, the surface of the pointed structure may be covered with a protective film layer 23, and the thickness of the protective film layer 23 is 10 to 100 micrometers. This protection film layer 23 can increase the intensity of measuring end 21 tip to a certain extent, also can prevent to measure the end surface oxidation to can avoid the test piece to bend measuring end 21 or surface oxidation and influence the contact of measuring end 21 and test piece surface, and then can further improve measurement accuracy to a certain extent. Specifically, the protective film 23 may be a silicon dioxide film, but is not limited thereto, and may be a material that can increase the strength of the measuring tip to some extent or a material that prevents surface oxidation. The silicon dioxide film layer may be formed by, for example, an evaporation process, but is not limited thereto.
In the embodiment of the present disclosure, the reference end 22 of each thermocouple 20 is at least partially encapsulated in an insulating sleeve 25, and the insulating sleeves 25 are arranged on the insulating base 10 in an array so that N measuring ends 21 form an array. Illustratively, the reference end 22 of each thermocouple 20 is substantially entirely enclosed within an insulating sleeve 25, and each reference end 22 may expose a small portion (not shown) that is connected to the signal wire 24. The insulating sleeve 25 may be a plastic sleeve or a ceramic sleeve, and the ceramic sleeve may be a ceramic composite steel pipe, which may be selected according to the situation. The insulating sleeve 25 is adopted to package the reference end 22 of the thermocouple 20, so that the thermocouple 20 is conveniently installed on the insulating base body 10, the strength of the thermocouple 20 can be further increased to rigidly support the measuring end 21 to a certain degree, the test effect is prevented from being influenced by the fact that the test piece bends the measuring end 21, and the measuring precision is improved.
Specifically, in the embodiment of the present disclosure, a surface of the insulating base 10 is concave like the upper surface to form N accommodating holes (not shown) arranged in an array, such as N circular holes, specifications, such as diameters and depths, of the respective circular holes may be the same, and spacing distances between the N circular holes arranged in the array may be the same or different, and the specific number of the circular holes is set as required, which is not limited in this embodiment. The diameter of the circular hole may be matched with the diameter of the insulating sleeve 25, so that at least a portion of each insulating sleeve 25 may extend into the corresponding receiving hole, so that each insulating sleeve 25 is arranged on the insulating base 10 in an array, as shown in fig. 2. In this way, the array arrangement of the insulating sleeves 25 and thus the array arrangement of the thermocouple measuring ends 21 is realized by providing a plurality of receiving holes arranged in an array on the insulating base 10. One end of each signal wire 24 is located at the bottom of the corresponding accommodating hole and is electrically connected with the exposed small part of the reference end 22 of the corresponding thermocouple. And the other end of each of the signal lines 24 extends out of the insulating base 10, for example, out of the port 40.
Furthermore, because the metal test piece, especially the metal sheet test piece, has thermal stress deformation, if the metal sheet test piece generates small deformation during testing, for example, the surface bending can make the measuring end of part of the thermocouple not contact with the surface of the test piece, that is, the contact is unstable, thereby affecting the measuring accuracy. Therefore, in the embodiment of the present disclosure, an elastic element 30 is disposed at one end of the insulating sleeve 25 extending into the accommodating hole, so that the elastic element 30 is located between the bottom of the accommodating hole and the lower end of the ceramic sleeve 25, the insulating sleeve 25 can slightly move up and down in the accommodating hole under the action of the elastic element 30 to drive the corresponding measuring end 21 to move up and down, and the accommodating hole can limit the position in the vertical direction. Thus, when a thin metal sheet test piece is placed on the plurality of measuring ends 21 arranged in an array during a test, the elastic member 30 at the lower end of each thermocouple is slightly compressed due to gravity, and the corresponding insulating sleeve 25 slightly moves downward by a certain distance. When the metal thin sheet test piece is slightly deformed such as surface bending, the elastic member 30 at the lower end of the thermocouple corresponding to the bent portion slightly rebounds under the action of the elastic force, so that the measuring end 21 of each thermocouple is in good contact with the surface of the test piece substantially all the time. Referring to fig. 3, the elastic members 30 at the lower ends of the middle two thermocouples 20 are shown to be compressed by a small amount, while the elastic members at both sides are compressed by a large amount to conform to the curvature of the surface of the test piece. The elastic deformation amount of the elastic piece is related to the deformation amount of the metal test piece placed on the bearing surface of the test piece, so that each measuring end always well contacts the surface of the test piece. The measuring end of the thermocouple is stably contacted with the test piece by using the elastic force of the elastic piece in the embodiment, welding is not needed, the test piece is not damaged, the use is convenient, and the measuring precision is high.
Specifically, the elastic member 30 may be a spring, a rubber member, or the like, and is preferably an insulating elastic member. One end of each signal wire 24 is electrically connected to the reference end 22 of the corresponding thermocouple 20 after extending on the surface of the elastic member 30. For example, the signal wire 24 is formed to be spirally attached to, e.g., glued to, the surface of the elastic member 30 and electrically connected, e.g., soldered or the like, to the corresponding reference terminal 22 of the thermocouple 20 (not shown). The elastic element has small deformation, and the signal wire can not fall off or be broken off generally. Alternatively, one end of each signal wire 24 extends through the elastic member 30 and is electrically connected to the reference end 22 of the corresponding thermocouple 20. For example, one end of the signal wire 24 extends through the middle space of the spring and is electrically connected to the corresponding reference end 22 of the thermocouple 20, such as by welding, etc., as shown in fig. 1, which is only schematically illustrated, and the signal wire 24 includes two wires, each of which passes through the elastic member 30. If the spring is made of metal material, the signal wire can be provided with an insulating sleeve. One end of the signal wire 24 may also be electrically connected to the reference end 22 of the thermocouple 20 (not shown) after passing through a hole in the rubber member, for example, although the embodiment is not limited thereto.
In one embodiment, and referring to FIG. 3, this embodiment can accurately detect the problem of temperature field measurement on the back surface of laser irradiated metal foil 302 in real time. A metal foil test piece 302 is placed on a needle-like thermocouple array, and a laser beam 301 is irradiated from top to bottom on the surface of the metal foil test piece 302. The temperature of the foil test piece 302 rises under irradiation of the laser beam 301, and the back surface temperature field changes with time. The back surface of the foil test piece 302 is always in good contact with the needle-like measuring end 21 of the thermocouple 20 due to the gravity and the elastic member 30, and the influence on the heat conduction behavior of the foil test piece 302 is small due to the small contact point. In this way, the thermocouple array with the needle-like measuring ends 21 can measure the temperature field of the foil test piece 302 and transmit the data to the data processing device 303 for analysis processing. The embodiment can effectively solve the problem of measuring the temperature field of the back surface of the metal sheet test piece 302 irradiated by the laser beam 301, and has the characteristics of convenience in use, small contact point, stable contact, high measurement precision, suitability for measuring the temperature field in the thermal deformation process of the test piece and the like.
The embodiment of the present disclosure further provides a temperature measuring system for a metal test piece, and as shown in fig. 3, the system may include a data processing device 303 and the temperature measuring device for a metal test piece according to any one of the embodiments. The reference ends 22 of the N thermocouples 20 in the metal specimen temperature measuring device are respectively connected with the data processing device 303. For the metal test piece temperature measuring device, reference may be made to the description in the foregoing embodiments, and details are not repeated here.
The metal test piece temperature measuring device and system provided by the embodiment of the disclosure can be used for measuring the change of the surface temperature field of a test piece. The device measures the test piece by utilizing the array-arranged needle-shaped thermocouple measuring ends, and has small contact points and high measuring precision; the measuring end of the thermocouple is stably contacted with the test piece by utilizing the elastic force of the elastic piece, welding is not needed, the test piece is not damaged, and the use is convenient; the test piece can be directly placed on the needle-shaped thermocouple measuring end array for temperature measurement, so that the influence of heat conduction on the temperature field of the test piece due to the use of a clamp is avoided, and the measurement precision is improved.
In the description of the present disclosure, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and therefore should not be considered as limiting the present disclosure.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present disclosure, "a plurality" means two or more unless specifically limited otherwise.
In the present disclosure, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integral; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present disclosure can be understood by those of ordinary skill in the art as appropriate.
In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise the first and second features being in direct contact, or may comprise the first and second features being in contact, not directly, but via another feature in between. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present disclosure. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples described in this specification can be combined and combined by those skilled in the art.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
Claims (8)
1. The utility model provides a metal test piece temperature measuring device for carry out surface temperature to the foil test piece and measure, its characterized in that, the device includes:
the insulation substrate is provided with insulation sleeves in an array manner, N accommodating holes in an array manner are formed in one surface of the insulation substrate in a concave manner, and at least part of each insulation sleeve extends into the corresponding accommodating hole; and
the reference end of each thermocouple is at least partially encapsulated in an insulating sleeve, the measuring ends of the N thermocouples extend out of the surface of the insulating base body, the N measuring ends are arranged in an array mode to form a test piece bearing surface, and one end, extending into the accommodating hole, of the insulating sleeve is provided with an elastic piece;
at least one measuring end is of a pointed structure, N is a natural number which is more than or equal to 2, and the elastic deformation amount of the elastic piece is related to the deformation amount of the metal test piece placed on the bearing surface of the test piece; the thermocouple also comprises two conductors with different components, wherein one end of each conductor is connected to serve as the measuring end, and the other two conductors are insulated and independently extend to form two independent terminals serving as the reference ends.
2. The device for measuring the temperature of a metal specimen according to claim 1, wherein the pointed structure is needle-shaped or cone-shaped.
3. The temperature measuring device for the metal test piece according to claim 1, wherein a protective film is coated on the surface of the pointed structure, and the thickness of the protective film is 10-100 micrometers.
4. The temperature measuring device for the metal test piece according to claim 3, wherein the protective film is a silicon dioxide film.
5. The temperature measuring device for the metal test piece according to any one of claims 1 to 4, further comprising:
and the N signal wires are respectively electrically connected with the reference ends of the N thermocouples, extend out of the insulating base body from the insulating base body and are used for transmitting signals output when the N thermocouples measure the metal test piece.
6. The temperature measuring device for a metal test piece according to claim 5,
one end of each signal wire is positioned at the bottom of the corresponding accommodating hole and is electrically connected with the reference end of the corresponding thermocouple, and the other end of each signal wire extends out of the insulating base body.
7. The device for measuring the temperature of a metal test piece according to claim 5, wherein one end of each signal wire is electrically connected with the reference end of the corresponding thermocouple after extending on the surface of the elastic member; or one end of each signal wire extends through the elastic piece and then is electrically connected with the reference end of the corresponding thermocouple.
8. A metal test piece temperature measurement system is characterized by comprising a data processing device and the metal test piece temperature measurement device as claimed in any one of claims 1 to 7; the reference ends of N thermocouples in the metal test piece temperature measuring device are respectively connected with the data processing device.
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| CN109443577B (en) * | 2018-11-15 | 2021-03-12 | 中国工程物理研究院材料研究所 | Temperature measuring device in metal temperature changing process and using method thereof |
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| CN101293272B (en) * | 2008-06-18 | 2011-01-19 | 北京科技大学 | Apparatus for measuring continuous casting billet skin temperature and measuring method thereof |
| CN102095515B (en) * | 2011-01-05 | 2012-07-04 | 北京航空航天大学 | Temperature-measuring device for cylindrical combustion chamber wall |
| CN102719867A (en) * | 2012-06-28 | 2012-10-10 | 华南理工大学 | Method for processing temperature thermocouple on surface of workpiece |
| CN105277291B (en) * | 2014-07-21 | 2018-06-12 | 北京航天动力研究所 | A kind of combustion chamber chamber wall temperature gradiometry module |
| CN105277290B (en) * | 2014-07-21 | 2018-02-13 | 北京航天动力研究所 | A kind of combustion chamber chamber wall temperature gradiometry module |
| CN207019805U (en) * | 2017-05-27 | 2018-02-16 | 重庆市海辰仪表成套工程有限公司 | Forked type thermocouple |
| CN107340080A (en) * | 2017-06-13 | 2017-11-10 | 北京卫星环境工程研究所 | Needle-like film thermocouple verification experimental verification system and its application based on surface temperature measurement method |
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| JPH08166292A (en) * | 1994-12-13 | 1996-06-25 | Sony Corp | Temperature measuring apparatus for multi-point measurement |
| CN201397196Y (en) * | 2009-05-11 | 2010-02-03 | 成都市卓睿科技有限公司 | Plane multipoint temperature sensor |
| CN204719088U (en) * | 2015-05-08 | 2015-10-21 | 广东建准检测技术有限公司 | The temperature measuring equipment that a kind of conductor DC resistance detects |
| CN206339361U (en) * | 2016-11-23 | 2017-07-18 | 中国空气动力研究与发展中心超高速空气动力研究所 | A kind of warm test device of the arc tunnel flat plate model back of the body |
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