CN215116510U - Nondestructive testing clamp for shunt resistor - Google Patents

Abstract

A nondestructive test fixture for a shunt resistor comprises a pressing device, a sample fixing device, a probe fixing device, a PCB adapter plate, a fixture base, a supporting frame, a fixing rod and a locking nut; the clamp comprises a pressing device, a sample fixing device, a probe fixing device, a PCB adapter plate and a clamp base from top to bottom. The tested piece is placed in the product fixing seat, the product is pressed and fixed by the pressing device, the test probe contracts after contacting the product, and the test signal is transmitted to the instrument for testing through the switching PCB and the test cable. The gold-plated probes are distributed in a four-wire Kelvin mode, four-wire Kelvin resistance testing is achieved, and the problems that shunt resistors in the prior art are large in measuring error, low in measuring precision, inaccurate in high and low temperature testing, and poor in testing consistency and repeatability are solved. The method is widely applied to nondestructive testing of the shunt resistor.

Description

Nondestructive testing clamp for shunt resistor

Technical Field

The utility model relates to an electronic components field particularly, relates to the resistor field, and further say, relates to the test field of resistor.

Background

The shunt resistor is characterized by small resistance value (lowest to 0.1 omega), high resistance value precision (lowest to +/-1%), small temperature coefficient (lowest to 50 ppm/DEG C) and large power (highest to 15W). At present, there is not a unified frock clamp to shunt resistor's test, and the test fixture who mainly adopts ordinary resistance measures shunt resistor, and the problem that exists is: poor test consistency and repeatability, large measurement error, low measurement precision, inaccurate high and low temperature test and the like. Therefore, the utility model is provided specially.

Disclosure of Invention

The utility model aims at: the problems of poor test consistency and repeatability, large measurement error, low measurement precision and inaccurate high and low temperature test of the shunt resistor in the prior art are solved.

In order to solve the problem, the utility model provides a nondestructive test anchor clamps for shunt resistor, test anchor clamps structural schematic is shown in fig. 1, fig. 2. The clamp comprises from top to bottom:

the device comprises a pressing device 1, a sample fixing device 2, a probe fixing device 3, a PCB adapter plate 4, a clamp base 5, a support frame 6, a fixing rod 7 and a locking nut 8.

The pressing device 1 includes: the panel comprises a panel body 100, a lower limiting hole 101, an upper limiting hole 102, a movable pressing rod 103, a pressing device fixing screw hole 104, a pressing device adjusting mechanism 105, an insulating cylindrical pressing block 106, a limiting disc 107 and a spring 108. The panel body 100 is

A structure having lower and upper limiting holes 101 and 102 at both ends, of the panel body 100

The profile bottom is provided with mounting holes for mounting the hold-down device adjustment mechanism 105. The limiting disc 107 is arranged at the upper end of the spring 108 and is placed on the panel body 100

In the profiled groove. The movable pressure lever 103 penetrates through the upper limiting hole 102, the lower limiting hole 101, the limiting disc 107 and the spring 108, and the lower end of the movable pressure lever 103 is connected with the insulating cylindrical pressing block 106. The hold-down device 1 is fixed to the support frame 6 through a hold-down device fixing screw hole 104 of the panel body 100. The pressing device 1 presses the movable pressing rod 103 and the insulating cylindrical pressing block 106 downwards to press the test sample 9 below, and the test sample returns to the original position through the spring 108 after the test is finished.

The sample holding device 2 includes: the device comprises a guide positioning groove 201, a sample fixing seat 202, a sample fixing device body 203, a sample fixing device assembling hole 204, a test probe through hole 205, a stepped hole 206 and a sample clamping groove 207. The guide positioning groove 201 is formed in the upper surface of the sample fixing device body 203, the sample fixing base 202 is opened according to the shape of the test sample 9, and is vertically fixed right above the guide positioning groove 201, and a sample clamping groove 207 is formed with the upper surface of the sample fixing device body 203 for fixing the test sample.

The probe fixture 3 includes: the probe fixing base 301, the probe 302, the probe fixing device body 303, the probe fixing device assembling hole 304 and the PCB adapter plate installing hole 305. The probe holder 301 is fixed to the upper surface of the probe fixture body 303, and the probe 302 is fixed through a probe hole of the probe holder 301.

The PCB interposer 4 includes: PCB body 400, F + probe bonding pad 401, S + probe bonding pad 402, S-probe bonding pad 403, F-probe bonding pad 404, F + test cable bonding pad 405, S + test cable bonding pad 406, S-test cable bonding pad 407, F-test cable bonding pad 408, PCB adapter pad through-hole 409. An F + probe welding disc 401, an S + probe welding disc 402, an S-probe welding disc 403 and an F-probe welding disc 404 of the PCB adapter plate 4 are respectively welded with tail ends of the 4 probes 302, and an F + test cable welding disc 405, an S + test cable welding disc 406, an S-test cable welding disc 407 and an F-test cable welding disc 408 are respectively welded with test cables and are connected with a Kelvin resistance bottoming instrument through the test cables. The PCB adapter plate 4 is fixed to the bottom surface of the probe fixing device 3 through the PCB adapter plate through hole 409 and the PCB adapter plate mounting hole 305.

The fixing rod 7 is fixed right above the clamp base 5, and the sample fixing device 2 and the probe fixing device 3 are fixed on the fixing rod 7 through the sample fixing device assembling hole 204, the probe fixing device assembling hole 304 and the lock nut 8. The fixing rod 7 is in the shape of a pillar, the diameter of the upper pillar is smaller than the diameters of the sample fixing device assembly hole 204 and the probe fixing device assembly hole 304, and the diameter of the lower pillar is larger than the diameters of the sample fixing device assembly hole 204 and the probe fixing device assembly hole 304, and is used for supporting the sample fixing device 2 and the probe fixing device 3 to a certain height.

A nondestructive test anchor clamps for shunt resistor, will be surveyed the piece and put into foretell product fixing base, the push down device push down the product fixedly, test probe contact product after shrink, test signal passes through switching PCB and test cable transmit the instrument and test. The clamp is simple to operate, stable in contact and accurate in test, can be compatible with tests at normal temperature and high and low temperatures, and effectively solves the problem of inaccurate measurement of the resistance value of the shunt resistor.

Drawings

Fig. 1 is a schematic view of the assembly structure of the clamp of the present invention.

Fig. 2 is an enlarged schematic view of the structure of the clamp pressing device and the sample fixing device of the present invention.

Fig. 3 is a schematic diagram of the structure of the PCB board of the clamp of the present invention.

Fig. 4 is a schematic diagram of the structure of the finished product of the clamp of the present invention.

In the figure: 1 is a pressing device, 100 is a panel body, 101 is a lower limit hole, 102 is an upper limit hole, 103 is a movable pressing rod, 104 is a pressing device fixing screw hole, 105 is a pressing device adjusting mechanism, 106 is an insulating cylindrical pressing block, 107 is a limit disc, 108 is a spring, 2 is a sample fixing device, 201 is a guide positioning groove, 202 is a sample fixing seat, 203 is a sample fixing device body, 204 is a sample fixing device assembling hole, 205 is a test probe through hole, 206 is a stepped hole, 207 is a sample clamping groove, 3 is a probe fixing device, 301 is a probe fixing seat, 302 is a probe, 303 is a probe fixing device body, 304 is a probe fixing device assembling hole, 305 is a PCB adapter plate mounting hole, 4 is a PCB adapter plate, 400 is a PCB body, 401 is an F + probe welding disc, 402 is an S + probe welding disc, 403 is an S-probe welding disc, 404 is an F-probe welding disc, 405 is F + test cable bonding pad, 406 is S + test cable bonding pad, 407 is S-test cable bonding pad, 408 is F-test cable bonding pad, 409 is PCB switching dish through-hole, 5 is the anchor clamps base, 6 is the support frame, 7 is the dead lever, 8 is lock nut, 9 is the test sample.

Detailed Description

Take 5930 (imperial system) type shunt resistor as an example, combine fig. 1~ 4, the utility model provides a nondestructive test anchor clamps for 5930 (imperial system) type shunt resistor for to 5930 type shunt resistor resistance value accurate measurement under the different temperatures. The fixture comprises a pressing device, a product fixing seat, a test probe, a switching PCB and a probe fixing seat from top to bottom. The tested piece is placed in the product fixing seat, the product is pressed and fixed by the pressing device, the test probe contracts after contacting the product, and the test signal is transmitted to the instrument for testing through the switching PCB and the test cable.

Description of the construction of each part:

and a pressing device: a spring and an upper limit and a lower limit are arranged in the device, the initial position is the upper limit of the spring in a spring-up state, the spring is contracted to be positioned at the lower limit after being pressed down, and the tail end of the device is an insulating cylindrical pressing block;

and a sample fixing seat: the sample fixing seat is made of insulating materials and is provided with a guide groove, the guide groove is designed according to the appearance of a product, the tolerance is +/-0.1 mm, the accurate positioning effect is achieved, and the product is prevented from displacing during testing and affecting the testing precision; the product seat is positioned at two sides of the center and is provided with four through holes for testing probes, and the probes are used for contacting the product through the insulating material;

and a test probe: the method comprises the following steps of (1) adopting gold-plated probes with long service life, distributing the gold-plated probes in a four-wire Kelvin mode, wherein two probes in the middle are sampling terminals (sense terminals), probes on two sides are excitation terminals (force terminals), and the force probes are thicker in size and can resist certain working current;

and a probe fixing device: the probe fixing seat is made of insulating materials and used for fixing the probe, and a step hole is formed in the probe fixing seat and used for orientation and height fixing of the probe;

and a transfer PCB: the switching pcb is provided with switching bonding pads for respectively switching four testing probe signals to an instrument testing line; the switching PCB is fixed inside the probe fixing seat through screws.

The operation process comprises the following steps:

when in testing, the tested piece is placed in a product seat, the product seat is provided with a positioning groove, and the product slides in along the positioning groove until the product slides to the inner part for limiting;

the pressing device is pressed to the lower limit, the probe contracts, and the reading can be seen through the meter

In addition, according to the shape and the size of product, the utility model provides a structural model for shunt resistor's nondestructive test anchor clamps, among the concrete implementation process, be not limited to the specific shape of this embodiment, can carry out reasonable deformation, equivalent replacement and improvement etc. to each part according to the specific shape and the size of each part, all belong to the utility model discloses the scope of protecting.

Claims (4)

1. A non-destructive testing fixture for shunt resistors, comprising:

the device comprises a pressing device, a sample fixing device, a probe fixing device, a PCB adapter plate, a clamp base, a supporting frame, a fixing rod and a locking nut;

the pressing device comprises: the panel comprises a panel body, a lower limiting hole, an upper limiting hole, a movable pressure rod, a fixing screw hole of a pressing device, a pressing device adjusting mechanism, an insulating cylindrical press, a limiting disc and a spring;

the panel body is

The structure of the panel body having lower and upper limiting holes at both ends

The bottom of the mould is provided with a mounting hole for mounting a pressing device adjusting mechanism; the limiting disc is arranged at the upper end of the spring and is placed on the panel body

In the profiled groove; the movable pressure rod penetrates through the upper limiting hole, the lower limiting hole, the limiting disc and the spring, and the lower end of the movable pressure rod is connected with the insulating cylindrical pressing block; the pressing device is fixed on the supporting frame through a pressing device fixing screw hole of the panel body;

the sample holding device comprises: the device comprises a guide positioning groove, a sample fixing seat, a sample fixing device body, a sample fixing device assembling hole, a test probe through hole, a step hole and a sample clamping groove; the sample fixing seat is opened according to the shape of a test sample, is vertically fixed right above the guide positioning groove, and forms a sample clamping groove with the upper surface of the sample fixing device body;

the probe fixing device includes: the probe fixing seat is fixed on the upper surface of the probe fixing device body, and the probe penetrates through a probe hole of the probe fixing seat to be fixed;

the PCB keysets includes: the PCB comprises a PCB body, an F + probe welding disc, an S-probe welding disc, an F + test cable welding disc, an S-test cable welding disc, an F-test cable welding disc and a PCB adapter disc through hole; an F + probe welding disc, an S-probe welding disc and an F-probe welding disc of the PCB adapter plate are respectively welded with tail end heads of 4 probes, and an F + test cable welding disc, an S-test cable welding disc and an F-test cable welding disc are respectively welded with test cables and are connected with a Kelvin resistance bottoming instrument through the test cables; the PCB adapter plate is fixed on the bottom surface of the probe fixing device through a PCB adapter plate through hole and a PCB adapter plate mounting hole;

the fixing rod is fixed right above the clamp base, and the sample fixing device and the probe fixing device are fixed on the fixing rod through the sample fixing device assembling hole, the probe fixing device assembling hole and the locking nut; the fixing rod is in a pillar shape, the diameter of the upper pillar is smaller than the aperture of the sample fixing device assembling hole and the aperture of the probe fixing device assembling hole, and the diameter of the lower pillar is larger than the aperture of the sample fixing device assembling hole and the aperture of the probe fixing device assembling hole.

2. A nondestructive test fixture for shunt resistors as claimed in claim 1 wherein: the sample fixing seat is made of insulating materials.

3. A nondestructive test fixture for shunt resistors as claimed in claim 1 wherein: the probes are gold-plated probes and are distributed in a four-line Kelvin mode, the two probes in the middle are sampling terminals, and the probes on two sides are excitation terminals.

4. A nondestructive test fixture for shunt resistors as claimed in claim 1 wherein: the probe fixing seat is made of insulating materials, and a step hole is formed in the probe fixing seat.

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