CN214953700U

CN214953700U - Testing device for spring probe

Info

Publication number: CN214953700U
Application number: CN202121328267.5U
Authority: CN
Inventors: 彭启南
Original assignee: Suzhou Dick Microelectronics Co ltd
Current assignee: Suzhou Dick Microelectronics Co ltd
Priority date: 2021-06-15
Filing date: 2021-06-15
Publication date: 2021-11-30
Anticipated expiration: 2031-06-15

Abstract

The utility model discloses a testing arrangement for spring probe, the drill jig comprises a base station, set up the riser on the base station, it sets up the testboard to slide on the riser, set up the test seat on the testboard, set up the centre gripping subassembly in the test seat, and pass through the probe in the centre gripping subassembly ability centre gripping test seat, the centre gripping subassembly includes the centre gripping pipe, set up reset spring in the centre gripping pipe, just the tip of centre gripping pipe sets up the centre gripping post, and is in under reset spring's the effect, the centre gripping post can expose the centre gripping pipe to can support with the interior probe of test seat and lean on. Through setting up this kind of testing arrangement, with the probe through set up the testboard in the test seat on to carry out the centre gripping through the centre gripping subassembly, guaranteed the stable centre gripping to detecting a flaw, obtain efficient probe testing arrangement, provide the guarantee for subsequent probe uses.

Description

Testing device for spring probe

Technical Field

The utility model relates to a production facility field of spring probe especially relates to a testing arrangement for spring probe.

Background

The test probe is a kind of test probe for testing a PCB board or a chip. For example, the probe is directly contacted with the pad or bump on the chip to extract the chip signal, and then the peripheral test instrument and software control are matched to achieve the purpose of automatic measurement.

The quality of the test probe determines the test result, and in the production process of the probe, the probe needs to be tested to obtain the quality of the probe, so that the follow-up test is guaranteed. However, the existing test instrument is performed by a single test, and is inefficient.

Therefore, the present invention is directed to a testing device for spring probes, which solves the above problems.

SUMMERY OF THE UTILITY MODEL

In order to overcome the above disadvantages, an object of the present invention is to provide a testing device for a spring probe.

In order to achieve the above purpose, the utility model discloses a technical scheme is: the utility model provides a testing arrangement for spring probe, includes the base station, set up the riser on the base station, it sets up the testboard to slide on the riser, set up the test seat on the testboard, set up the centre gripping subassembly in the test seat, and pass through the probe in centre gripping subassembly ability centre gripping test seat, the centre gripping subassembly includes the centre gripping pipe, set up reset spring in the centre gripping pipe, just the tip of centre gripping pipe sets up the centre gripping post, just under reset spring's effect, the centre gripping post can expose the centre gripping pipe to can support with the test seat in the probe and lean on.

Preferably, the clamping assemblies are arranged in at least three groups and are uniformly distributed on the test seat. That is, three or four groups of clamping assemblies are generally arranged, so that the stable clamping of the probe is ensured.

Preferably, the end of the clamping column is provided with a silica gel pad, and the silica gel pad is provided with a groove. The setting of silica gel pad has guaranteed the frictional force between with the probe promptly, and the recess that sets up simultaneously increases the contact with the probe surface.

Preferably, a test bottom plate is arranged on the base platform, a connecting contact is arranged on the test bottom plate, and the connecting contact can be contacted with the probe and tested. Namely, the testing bottom plate is also connected with a computer, and can obtain and record testing data.

Preferably, the vertical plate is connected with the test board through a moving assembly, the moving assembly comprises a moving rail, the moving rail is vertically arranged on the vertical plate, a sliding block is arranged on the test board, the sliding block is arranged on the moving rail, a nut is connected to the sliding block, a lead screw is arranged in the nut and connected with a motor, and the motor is arranged on the base platform. The screw rod is driven to rotate by the motor, then the nut drives the sliding block to slide along the moving track, the height between the test bench and the base platform is adjusted, and the test bench can be adapted to test probes with different lengths.

Preferably, the test seat is a through hole, a test ladder is arranged in the through hole, and the test ladder is provided with a clamping assembly. The cooperation setting of test ladder and through-hole has guaranteed that the probe can be smooth to set up on the test seat promptly to carry out the centre gripping through the centre gripping subassembly, provide convenience for subsequent test

Preferably, a plurality of test seats are arranged on the test bench, and each test seat is internally provided with a probe. A plurality of test seats are arranged on the same test board and can be uniformly distributed according to the array, so that testers can conveniently select different numbers, and the purpose of synchronous test is achieved.

The utility model relates to a testing arrangement for spring probe's beneficial effect is, through setting up this kind of testing arrangement, with the probe through set up the testboard in the test seat on to carry out the centre gripping through the centre gripping subassembly, guaranteed to the stable centre gripping of detecting a flaw, obtain efficient probe testing arrangement, provide the guarantee for subsequent probe uses.

Drawings

Fig. 1 is a schematic structural diagram of a testing apparatus for a spring probe.

Fig. 2 is a partially enlarged view of fig. 1.

FIG. 3 is a schematic view of a clamping assembly.

In the figure:

1. a base platform 2, a vertical plate 3, a test platform 4, a test seat 5, a clamping component 6, a test bottom plate 7 and a moving component,

41. the test ladder is used to test the ladder,

51. a clamping tube 52, a reset spring 53, a clamping column 54, a silica gel pad 55, a groove,

61. the connection contact points are connected with each other,

71. a moving track, 72, a sliding block, 73, a nut, 74, a screw rod and 75 motors.

Detailed Description

The following detailed description of the preferred embodiments of the present invention will be provided in conjunction with the accompanying drawings, so as to enable those skilled in the art to more easily understand the advantages and features of the present invention, and thereby define the scope of the invention more clearly and clearly.

Referring to fig. 1-3, the testing apparatus for a spring probe in this embodiment includes a base platform 1, a vertical plate 2 is disposed on the base platform 1, a testing platform 3 is slidably disposed on the vertical plate 2, a testing base 4 is disposed on the testing platform 3, a clamping assembly 5 is disposed in the testing base 4, and the probe in the testing base 4 can be clamped by the clamping assembly 5, the clamping assembly 5 includes a clamping tube 51, a return spring 52 is disposed in the clamping tube 51, a clamping column 53 is disposed at an end of the clamping tube 51, and under the action of the return spring 52, the clamping column 53 exposes the clamping tube 51 and can abut against the probe in the testing base 4.

The clamping components 5 are arranged in at least three groups and are uniformly distributed on the test seat 4. That is, three or four groups of clamping assemblies 5 are generally arranged, so that stable clamping of the probe is ensured.

The end of the clamping column 53 is provided with a silicon rubber pad 54, and a groove 55 is arranged on the silicon rubber pad 54. Namely, the arrangement of the silicon rubber pad 54, the friction force between the silicon rubber pad and the probe is ensured, and the groove 55 is arranged to increase the contact with the surface of the probe.

A test base plate 6 is arranged on the base table 1, a connecting contact 61 is arranged on the test base plate 6, and the connecting contact 61 can be contacted with a probe to carry out testing. Namely, the test base plate 6 is also connected with a computer, and test data can be obtained and recorded.

The vertical plate 2 is connected with the test platform 3 through the moving assembly 7, the moving assembly 7 comprises a moving track 71, the moving track 71 is vertically arranged on the vertical plate 2, a sliding block 72 is arranged on the test platform 3, the sliding block 72 is arranged on the moving track 71, a nut 73 is connected onto the sliding block 72, a screw rod 74 is arranged in the nut 73, the screw rod 74 is connected with a motor 75, and the motor 75 is arranged on the base platform 1. The screw rod 74 is driven to rotate by the motor 75, then the nut 73 drives the sliding block 72 to slide along the moving track 71, the height between the test bench 3 and the base platform 1 is adjusted, and the test bench can be adapted to the test of probes with different lengths.

The test seat 4 is a through hole, a test step 41 is arranged in the through hole, and the clamping component 5 is arranged on the test step 41. That is, the matching arrangement of the test ladder 41 and the through hole ensures that the probe can be smoothly arranged on the test seat 4 and clamped by the clamping component 5, thereby providing convenience for subsequent tests

A plurality of test seats 4 are arranged on the test bench 3, and probes are arranged in each test seat 4. A plurality of test seats 4 are arranged on the same test bench 3, and the test seats 4 can be uniformly distributed according to the array, so that testers can conveniently select different numbers, and the purpose of synchronous test is achieved.

The utility model relates to a testing arrangement for spring probe's beneficial effect is, through setting up this kind of testing arrangement, with the probe through set up testboard 3 in test seat 4 to carry out the centre gripping through centre gripping subassembly 5, guaranteed the stable centre gripping of detecting a flaw, obtain efficient probe testing arrangement, provide the guarantee for subsequent probe uses.

The above embodiments are only for illustrating the technical concept and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, so as not to limit the protection scope of the present invention, and all equivalent changes or modifications made according to the spirit of the present invention should be covered in the protection scope of the present invention.

Claims

1. A testing device for a spring probe, characterized by: the improved vertical clamping test device comprises a base station, a vertical plate is arranged on the base station, a test bench is arranged on the vertical plate in a sliding mode, a test seat is arranged on the test bench, a clamping assembly is arranged in the test seat and can clamp a probe in the test seat, the clamping assembly comprises a clamping pipe, a reset spring is arranged in the clamping pipe, a clamping column is arranged at the end of the clamping pipe and is under the action of the reset spring, the clamping column can expose the clamping pipe and can abut against the probe in the test seat.

2. A test apparatus for a spring probe according to claim 1, wherein: the clamping components are provided with at least three groups and are evenly distributed on the test seat.

3. A test apparatus for a spring probe according to claim 1, wherein: the tip of centre gripping post sets up to the silica gel pad, just set up the recess on the silica gel pad.

4. A test apparatus for a spring probe according to claim 1, wherein: the test base plate is arranged on the base platform, the test base plate is provided with a connecting contact, and the connecting contact can be in contact with the probe and can be used for testing.

5. A test apparatus for a spring probe according to claim 1, wherein: the vertical plate is connected with the test board through the moving assembly, the moving assembly comprises a moving rail, the moving rail is vertically arranged on the vertical plate, a sliding block is arranged on the test board and arranged on the moving rail, a nut is connected onto the sliding block, a lead screw is arranged in the nut and connected with a motor, and the motor is arranged on the base station.

6. A test apparatus for a spring probe according to claim 1, wherein: the test seat is a through hole, a test ladder is arranged in the through hole, and the test ladder is provided with a clamping assembly.

7. A test apparatus for a spring probe according to claim 1, wherein: the test bench is provided with a plurality of test seats, and each test seat is internally provided with a probe.