CN214953694U

CN214953694U - Test probe

Info

Publication number: CN214953694U
Application number: CN202120403313.7U
Authority: CN
Inventors: 吕媚
Original assignee: Shanghai Zhijin Electronic Technology Co ltd
Current assignee: Shanghai Zhijin Electronic Technology Co ltd
Priority date: 2021-02-23
Filing date: 2021-02-23
Publication date: 2021-11-30
Anticipated expiration: 2031-02-23

Abstract

The utility model discloses a test probe relates to test probe technical field. The utility model discloses a probe body, the inside cavity of having seted up of probe body, interior cavity inner wall top surface fixedly connected with telescopic column, telescopic spring has been cup jointed to telescopic column week side, and fixed surface is connected with the spliced pole under the telescopic column, and fixed surface is connected with the probe head under the spliced pole, and fixed surface is connected with the fixed column on the probe body, and fixed surface is connected with the connecting seat on the fixed column. The utility model discloses a set up the wedge, when placing the probe in the spread groove, the wedge can receive the extrusion of spliced pole inner wall, and then enters into the recess, until reaching in the draw-in groove, can fix the probe, through setting up the button, press down the button and can drive the stripper bar and reset spring removes, make the carriage release lever extrusion wedge, make the wedge can't fix in the draw-in groove, can take off the probe and change.

Description

Test probe

Technical Field

The utility model belongs to the technical field of the test probe, especially, relate to a test probe.

Background

In recent years, large data is becoming more and more popular, semiconductor chips are used as carriers for data transmission processing, the performance of the semiconductor chips often affects the execution capacity of the whole electronic equipment, and in order to ensure the normal operation of the semiconductor chips, the semiconductor chips must be detected by using a test probe before being mounted.

When testing semiconductor chip, use the probe head mostly, but long-time the use, the probe head can be because of reasons such as wearing and tearing, and it is less accurate to lead to the test result, but current test probe can change the probe head less, leads to when using more inconvenient.

In order to solve the above problem, the utility model provides a test probe.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a test probe solves current test probe and can change the probe head less, more inconvenient problem when leading to the use.

In order to solve the technical problem, the utility model discloses a realize through following technical scheme:

the utility model relates to a test probe, including the probe body, the inside cavity of having seted up of probe body, the flexible post of interior intracavity wall top surface fixedly connected with, the expanding spring has been cup jointed to flexible post week side, the surface fixedly connected with spliced pole under the flexible post, fixed surface is connected with the probe head under the spliced pole, fixed surface is connected with the fixed column on the probe body, fixed surface is connected with the connecting seat on the fixed column.

Further, fixed surface is connected with the connecting block on the probe, a connecting block side is seted up flutedly, fixedly connected with extrusion spring in the recess, extrusion spring one end fixedly connected with wedge, the spread groove has been seted up to the spliced pole lower surface, the draw-in groove has been seted up in the spread groove, through setting up the wedge, when placing the probe in the spread groove, the wedge can receive the extrusion of spliced pole inner wall, and then enters into the recess, until reaching in the draw-in groove, can fix the probe.

Furthermore, the connecting groove position and size are both adapted to the connecting block, and the wedge-shaped block position and size are both adapted to the clamping groove.

Further, sliding connection has the button in the draw-in groove, a button side fixedly connected with stripper bar and reset spring, reset spring quantity is two, and is the symmetry setting through the stripper bar, through setting up the button, presses down the button and can drive stripper bar and reset spring and remove, makes the stripper bar extrusion wedge, makes the wedge unable fix in the draw-in groove, can take off the probe head and change.

Furthermore, one end of the telescopic spring is connected with the top surface of the inner cavity, and the other end of the telescopic spring is connected with the connecting column.

Further, fixed column week side fixedly connected with extrusion piece through setting up the extrusion piece, presses down the extrusion piece, can increase the area of contact between probe and the testee, makes the test result more accurate, a plurality of evenly distributed's constant head tank is seted up to fixed column week side, through setting up the constant head tank, can pass through the constant head tank with this device and fix on the testing instrument, the standing groove has been seted up to probe body week side, through setting up the standing groove, is convenient for take up this device.

The utility model discloses following beneficial effect has:

the utility model discloses a set up the wedge, when placing the probe in the spread groove, the wedge can receive the extrusion of spliced pole inner wall, and then enter into the recess, until reaching in the draw-in groove, can fix the probe, through setting up the button, press down the button and can drive the stripper bar and reset spring removes, make the stripper bar extrude the wedge, make the wedge can't fix in the draw-in groove, can take off the probe and change, through setting up the stripper bar, press down the stripper bar, can increase the area of contact between probe and the testee, make the test result more accurate, through setting up the constant head tank, can pass through the constant head tank with this device and fix on testing instrument, through setting up the standing groove, be convenient for take up this device.

Of course, it is not necessary for any particular product to achieve all of the above-described advantages at the same time.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.

FIG. 1 is a schematic perspective view of the present invention;

FIG. 2 is a schematic view of the bottom perspective structure of the present invention;

FIG. 3 is a schematic view of the structure of the connection column of the present invention;

FIG. 4 is an enlarged view of a portion A of FIG. 3 according to the present invention;

FIG. 5 is a schematic view of a probe head structure according to the present invention;

fig. 6 is a top view of the present invention;

FIG. 7 is a schematic cross-sectional view taken along line A-A of FIG. 6 according to the present invention;

fig. 8 is an enlarged view of a portion B of fig. 7 according to the present invention.

In the drawings, the components represented by the respective reference numerals are listed below:

1. a probe body; 11. a placement groove; 2. an inner cavity; 21. a tension spring; 3. a telescopic column; 4. connecting columns; 5. a probe head; 6. fixing a column; 61. extruding the block; 62. positioning a groove; 7. a connecting seat; 8. connecting blocks; 81. a groove; 82. a compression spring; 83. a wedge block; 9. connecting grooves; 91. a card slot; 92. a button; 93. an extrusion stem; 94. a return spring.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the protection scope of the present invention.

In the description of the present invention, it is to be understood that the terms "upper", "middle", "outer", "inner", and the like, indicate positional or positional relationships, are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the referenced components or elements must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention.

Referring to fig. 1-8, the utility model relates to a test probe, including probe body 1, cavity 2 has been seted up to probe body 1 inside, and the flexible post 3 of 2 inner wall top surfaces fixedly connected with of cavity, 3 side has cup jointed expanding spring 21 around the flexible post, and the surface fixedly connected with spliced pole 4 under the flexible post 3, the surface fixedly connected with probe 5 under the spliced pole 4, the fixed surface fixedly connected with fixed column 6 on probe body 1, the fixed surface fixedly connected with connecting seat 7 on the fixed column 6.

Preferably, fixed surface is connected with connecting block 8 on probe 5, recess 81 has been seted up to 8 a sides of connecting block, fixedly connected with extrusion spring 82 in the recess 81, extrusion spring 82 one end fixedly connected with wedge 83, spread groove 9 has been seted up to 4 lower surfaces of spliced pole, draw-in groove 91 has been seted up in the spread groove 9, through setting up wedge 83, when placing probe 5 in spread groove 9, wedge 83 can receive the extrusion of 4 inner walls of spliced pole, and then enter into recess 81, until reaching in draw-in groove 91, can fix probe 5.

Preferably, the connecting groove 9 is adapted to the connecting block 8 in position and size, and the wedge block 83 is adapted to the locking groove 91 in position and size.

Preferably, sliding connection has button 92 in draw-in groove 91, and a button 92 side fixedly connected with pressure ram 93 and reset spring 94, and reset spring 94 quantity is two, and is the symmetry setting through pressure ram 93, through setting up button 92, presses button 92 and can drive pressure ram 93 and reset spring 94 and remove, makes pressure ram 93 extrusion wedge 83, makes wedge 83 unable the fixing in draw-in groove 91, can take off probe head 5 and change.

Preferably, one end of the extension spring 21 is connected with the top surface of the inner cavity 2, and the other end is connected with the connecting column 4.

Preferably, fixed column 6 week side fixedly connected with extrusion piece 61, through setting up extrusion piece 61, press extrusion piece 61 downwards, can increase the area of contact between 5 heads of probe and the testee, it is more accurate to make the test result, fixed column 6 week side is seted up a plurality of evenly distributed's constant head tank 62, through setting up constant head tank 62, can fix this device on test instrument through constant head tank 62, standing groove 11 has been seted up to 1 week side of probe body, through setting up standing groove 11, be convenient for take up this device.

As shown in fig. 1-8, this embodiment is a method for using a test probe: the user at first places probe 5 in spliced pole 4 below, wedge 83 can receive the extrusion of spliced pole 4 inner wall and then enter into recess 81, treat wedge 83 joint can normally test in draw-in groove 91, the user at first aims at the object that needs the test with probe 5, press extrusion piece 61 downwards after that, make probe 5 and the object that awaits measuring fully contact, also can fix this device on the testing instrument with the testing instrument through constant head tank 62 and test, after probe 5 live time overlength, need change, then press button 92, downwards spur probe 5 to change can.

In the description herein, references to the description of "one embodiment," "an example," "a specific example," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

The preferred embodiments of the present invention disclosed above are intended only to help illustrate the present invention. The preferred embodiments are not intended to be exhaustive or to limit the invention to the precise embodiments disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and its practical applications, to thereby enable others skilled in the art to best understand the invention for and utilize the invention. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A test probe comprising a probe body (1), characterized in that: interior cavity (2) have been seted up to probe body (1) inside, interior cavity (2) inner wall top surface fixedly connected with telescopic column (3), telescopic spring (21) have been cup jointed to telescopic column (3) week side, telescopic column (3) lower fixed surface is connected with spliced pole (4), spliced pole (4) lower fixed surface is connected with probe (5), fixed surface is connected with fixed column (6) on probe body (1), fixed surface is connected with connecting seat (7) on fixed column (6).

2. The test probe according to claim 1, wherein a connecting block (8) is fixedly connected to the upper surface of the probe head (5), a groove (81) is formed in one side surface of the connecting block (8), an extrusion spring (82) is fixedly connected to the inside of the groove (81), a wedge block (83) is fixedly connected to one end of the extrusion spring (82), a connecting groove (9) is formed in the lower surface of the connecting column (4), and a clamping groove (91) is formed in the connecting groove (9).

3. A test probe according to claim 2, characterized in that the connecting slot (9) is adapted in position and size to the connecting piece (8), and the wedge-shaped block (83) is adapted in position and size to the slot (91).

4. The test probe according to claim 2, wherein a button (92) is slidably connected in the slot (91), a pressing rod (93) and a return spring (94) are fixedly connected to one side of the button (92), and the number of the return springs (94) is two, and the two return springs are symmetrically arranged through the pressing rod (93).

5. A test probe according to claim 1, characterized in that one end of the extension spring (21) is connected to the top surface of the inner cavity (2) and the other end is connected to the connecting column (4).

6. The test probe according to claim 1, wherein a pressing block (61) is fixedly connected to the peripheral side of the fixed column (6), a plurality of positioning grooves (62) are uniformly distributed on the peripheral side of the fixed column (6), and a placing groove (11) is formed on the peripheral side of the probe body (1).