CN214843010U - System for real-time calibrating position and size of object to be measured on measuring machine - Google Patents
System for real-time calibrating position and size of object to be measured on measuring machine Download PDFInfo
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- CN214843010U CN214843010U CN202120053331.7U CN202120053331U CN214843010U CN 214843010 U CN214843010 U CN 214843010U CN 202120053331 U CN202120053331 U CN 202120053331U CN 214843010 U CN214843010 U CN 214843010U
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Abstract
The utility model provides a position and size measurement system for treating the object of measurationing is rectified immediately on measurationing board, and it includes microscope carrier, light source, image module and processing apparatus. The carrying platform is formed on the measuring machine platform and used for bearing an object to be measured, and the carrying platform is provided with standard scale size marks. The image module shoots the standard scale size mark and the object to be measured to obtain a plurality of actual images to be measured. The processing device compares the actual image to be measured with the standard scale size mark by the distance to obtain a position deviation value and a size deviation value, and provides related data for correcting the actual position and size of the object to be measured according to the position deviation value and the size deviation value.
Description
Technical Field
The present invention relates to a position and dimension measuring system, and more particularly to a position and dimension measuring system for calibrating an object to be measured on a measuring board of a Printed Circuit Board (PCB).
Background
In order to adapt to the rapid development of electronic technology and precision measurement process, the miniaturization development of electronic components is in a rapid development trend, and the hole diameters of the circuit and the contact drilling holes on the Printed Circuit Board (PCB) are increasingly smaller, so that the requirement on the position accuracy of the PCB is inevitably higher and higher.
After the measurement of the current Printed Circuit Board (PCB), the calibration ruler is used to calibrate the relative scales, but the measurement accuracy may be gradually deteriorated after a long time or no abnormal problem exists for a long time, and the problem of the position deviation of the object to be measured cannot be found in real time. At present, the calibration is performed off-line by using a standard ruler or a standard fixture when the measurement machine stops normal operation through a fixed time. However, taking corrections offline results in an inability to immediately detect anomalies and a downtime for correction verification reduces throughput. Therefore, if a system for measuring the position and size of the object to be measured can be generated and calibrated in real time, the productivity and competitiveness of the electronic technology industry can be greatly improved.
SUMMERY OF THE UTILITY MODEL
In view of the above problems and reasons to be solved, the present invention particularly provides a system for measuring a position and a size of an object to be measured on a measuring machine in real time, which comprises a stage, a light source, an image module and a processing device. The carrying platform is formed on the measuring machine platform and used for bearing the object to be measured, wherein the carrying platform is provided with a standard scale size mark. The light source is formed on a measuring device of the measuring machine for illuminating the image plane of the object to be measured and measuring a distance between the object to be measured and the carrying platform. The image module is formed on the measuring machine platform and shoots the standard scale size mark and the object to be measured towards the carrying platform sequentially and simultaneously, and the reflected light source is reflected on a sensor of the image module through a lens to obtain a plurality of actual images to be measured. The processing device is electrically connected to the measuring machine, compares the actual images to be measured with the standard scale size mark by the distance to obtain a position deviation value and a size deviation value, and provides relevant data for correcting the actual position and size of the object to be measured according to the position deviation value and the size deviation value.
According to another embodiment of the present invention, the light source is a laser light or an arbitrary light source.
According to another embodiment of the present invention, the standard scale dimension mark is an L-shaped scale, a straight line or an angle standard scale.
According to another embodiment of the present invention, the processing device includes a calibration procedure having a calibration algorithm for calibrating the position, size and angle of the objects to be measured.
According to another embodiment of the present invention, the processing device includes an adjusting module, which provides data related to the position and size of the objects to be measured according to the position deviation value and the size deviation value obtained by the calibration algorithm of the calibration procedure.
According to another embodiment of the present invention, the processing device obtains the position information and the size information of the object to be measured by the images of the actual object to be measured.
According to another embodiment of the present invention, the processing device has a position and a size of the object to be measured relative to a standard defined by the stage.
According to another embodiment of the present invention, the carrier has a standard resolution chart and a standard color chart.
According to another embodiment of the present invention, the position deviation value and the size deviation value are compared with a standard measurement monitoring system to exceed a specific value, and the processing device displays an alarm notification.
To sum up, the utility model provides a position and size measurement system that is used for just-in-time correcting an object of waiting to measurationing on a measurationing board has a standard scale size mark by the microscope carrier to and will wait to measurationing the image and compare by distance and standard scale size mark, correct the actual position of waiting to measurationing the object, realized replacing the position of waiting to measurationing the object of artifical detection machinery with the machine, and compare, adjust automatically. Greatly increasing the inspection efficiency and the related labor cost and increasing the productivity of the object.
Drawings
In order to make the aforementioned and other objects, features, advantages and embodiments of the invention more comprehensible, the following description is given:
fig. 1 is a schematic diagram illustrating devices and modules of a position and size measuring system for real-time calibrating an object to be measured on a measuring machine according to an embodiment of the present invention.
Fig. 2 is a diagram illustrating a relationship between devices and modules in a system for real-time calibrating a position and a dimension of an object to be measured on a measuring machine according to an embodiment of the present invention.
Fig. 3 is a schematic flow chart illustrating a method for calibrating a position and a size of an object to be measured on a measuring machine in real time according to an embodiment of the present invention.
Description of the reference numerals
100: system for real-time calibrating position and size of object to be measured on measuring machine
110: measuring machine
112: carrying platform
114: measuring device
116: standard scale size markings
120: light source
130: image module
140: processing apparatus
142: correction program
144: adjusting module
200-208: step (ii) of
Detailed Description
For the purpose of understanding the features, contents and advantages of the present invention, the present invention will be described in detail with reference to the drawings, which are used for illustration and the accompanying specification, and which are not necessarily true to scale and precise arrangement after the practice of the present invention, so the scope of the claims in actual practice should not be read and limited by the scale and arrangement of the drawings.
Referring to fig. 1 and 2, fig. 1 is a schematic diagram illustrating devices and modules of a system for calibrating a position and a dimension of an object to be measured on a measuring machine in real time according to an embodiment of the present invention. Fig. 2 is a diagram illustrating a relationship between devices and modules in a system for real-time calibrating a position and a dimension of an object to be measured on a measuring machine according to an embodiment of the present invention. The system 100 for real-time calibrating a position and a size of an object to be measured on a measuring machine shown in fig. 1 includes a measuring machine 110, a light source 120, an image module 130, and a processing device 140. According to another embodiment of the present invention, the object to be measured may be a printed circuit board, for example.
The metrology tool 110 includes a stage 112 and a measurement device 114. The carrier 112 is formed on the measurement machine 110 for carrying an object to be measured, wherein the carrier 112 has a standard scale mark 116. According to another embodiment of the present invention, the standard scale dimension mark 116 is an L-shaped scale, a straight line or an angle standard scale. According to another embodiment of the present invention, the carrier 112 has a standard resolution chart and a standard color chart.
The light source 120 is formed on the measuring device 114 of the measuring machine 110 for illuminating the image plane of the object to be measured and measuring the distance between the object to be measured and the carrier 112. According to another embodiment of the present invention, the light source 120 can be laser light, infrared light, visible light, ultraviolet light or any other light source.
The image module 130 is formed on the measurement machine 110 and sequentially captures the standard scale mark 116 and the object to be measured simultaneously toward the carrier 112, and the reflected light source 120 is reflected on a sensor of the image module 130 through a lens to obtain a plurality of actual images to be measured.
The processing device 140 is electrically connected to the measurement machine 110 and the image module 130, receives the actual image to be measured of the sensor, compares the distance with the standard scale dimension mark 116 to obtain a position deviation value and a dimension deviation value, and provides data related to the actual position and dimension of the object to be measured according to the position deviation value and the dimension deviation value. According to another embodiment of the present invention, the processing device 140 has a standard object position and size defined by the relative stage 112, and obtains the position information and the size information of the object to be measured by the actual object image to be measured. The processing device 140 includes a calibration routine 142 (shown in fig. 2) having a calibration algorithm for calibrating the position and size of the object to be measured. The processing device 140 includes an adjusting module 144 (shown in fig. 2) for providing data related to the position of the object to be measured according to the position deviation value and the dimension deviation value obtained by the calibration algorithm of the calibration process. According to another embodiment of the present invention, if the position deviation or the size deviation exceeds a specific value, the processing device 140 displays an alarm notification to inform the relevant personnel on the site to perform the processing.
Referring to fig. 3, fig. 3 is a schematic flow chart illustrating a method for calibrating a position and a size of an object to be measured on a measuring machine in real time according to an embodiment of the present invention. Please refer to fig. 1-3. In step 200, a carrier 112 on the metrology tool 110 carries an object to be measured.
In step 201, the light source 120 illuminates an image plane of an object to be measured. According to another embodiment of the present invention, the light source 120 can be laser light, infrared light, visible light, ultraviolet light or any other light source.
In step 202, the light source 120 measures the distance between the object to be measured and the stage 112. In step 203, the image module 130 sequentially photographs the objects to be measured toward the stage 112. According to another embodiment of the present invention, various means may be employed to provide distance information. For example, "time of flight," "stereo" laser measurements, distance sensors, camera autofocus information, and other means may be implemented. The image module 130 includes an optical pattern projector and a camera, for example, a camera of a mobile device. In step 204, the reflected light source 120 is reflected on the sensor of the image module 130 through the lens. In step 205, the image module 130 obtains a plurality of images of the actual object to be measured.
In step 206, the processing device 140 compares the actual measured object image with the standard scale mark 116 by distance. According to another embodiment of the present invention, the processing device 140 integrates the plurality of standard scale marks 116 to generate specific color calibration and correction parameters, and compares the specific color calibration and correction parameters with the actual image of the object to be measured. The correction parameter includes a predetermined distance correction coefficient. In step 207, the processing device 140 obtains a position deviation value and a dimension deviation value through the predetermined distance correction coefficient. According to another embodiment of the present invention, the processing device 140 can convert the position-corrected distance into a plane position coordinate of the object to be measured and a size of the object to be measured.
In step 208, the processing device 140 provides data related to the actual position and size of the object to be measured according to the position deviation value and the size deviation value. According to another embodiment of the present invention, the position deviation value or the size deviation value exceeds a specific value, and when the load of the adjusting module 144 exceeds, the processing device 140 will display an alarm notification to inform the relevant personnel to process.
To sum up, the utility model provides a position and size measurement system that is used for just-in-time correcting an object of waiting to measurationing on a measurationing board has a standard scale size mark by the microscope carrier to and will wait to measurationing the image and compare by distance and standard scale size mark, correct the actual position and the size of waiting to measurationing the object, realized replacing the position and the size of waiting to measurationing the object of artifical detection machinery with the machine, and compare, adjust automatically. Greatly increasing the inspection efficiency and the related labor cost and increasing the productivity of the object.
Although the present invention has been described with reference to the above embodiments, it should be understood that various changes and modifications can be made therein by those skilled in the art without departing from the spirit and scope of the invention.
Claims (9)
1. A system for calibrating a position and a dimension of an object to be measured on a measurement machine in real time, comprising:
a carrying platform formed on the measuring machine platform for bearing the object to be measured, wherein the carrying platform is provided with a standard scale size mark;
a light source formed on a measuring device of the measuring machine for illuminating an image plane of the object to be measured and measuring a distance between the object to be measured and the carrier;
the image module is formed on the measuring machine platform and sequentially shoots the standard scale size mark and the object to be measured simultaneously towards the carrying platform, and the reflected light source is reflected on a sensor of the image module through a lens to obtain a plurality of actual images to be measured;
and the processing device is electrically connected with the measuring machine, compares the actual image to be measured with the standard scale size mark by virtue of the distance to obtain a position deviation value and a size deviation value, and calculates and corrects the actual position and size data of the object to be measured according to the position deviation value and the size deviation value.
2. The system of claim 1, wherein the light source is laser light.
3. The system of claim 1, wherein the standard scale is marked with an L-scale, a straight line, or an angle standard scale.
4. The system of claim 1, wherein the processing device comprises a calibration process having a calibration algorithm for calibrating the position, dimension and angle of the object to be measured.
5. The system of claim 4, wherein the processing device comprises an adjustment module for calculating and correcting the actual position and size data of the object to be measured according to the position deviation and the size deviation obtained by the correction algorithm of the correction process.
6. The system of claim 1, wherein the processing device obtains position information and dimension information of an object to be measured from the actual image to be measured.
7. The system of claim 1, wherein the processing device has a standard object position and dimension defined with respect to the stage.
8. The system of claim 1, wherein the carrier has a standard resolution chart and a standard color chart.
9. The system of claim 1, wherein the processing device displays an alarm notification if the deviation of the position and the deviation of the dimension are compared with a standard measurement monitoring system to exceed a predetermined value.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN114719710A (en) * | 2022-03-08 | 2022-07-08 | 中国电子科技集团公司第十三研究所 | Displacement deviation measuring method |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN114719710A (en) * | 2022-03-08 | 2022-07-08 | 中国电子科技集团公司第十三研究所 | Displacement deviation measuring method |
CN114719710B (en) * | 2022-03-08 | 2024-01-30 | 中国电子科技集团公司第十三研究所 | Displacement deviation measuring method |
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