CN214703687U

CN214703687U - Clamp for radio frequency test of semiconductor chip

Info

Publication number: CN214703687U
Application number: CN202023026677.2U
Authority: CN
Inventors: 严维新; 荣春华; 曹庚才; 许保花
Original assignee: Xi'an Keente Precision Machinery Co ltd
Current assignee: Xi'an Keente Precision Machinery Co ltd
Priority date: 2020-12-16
Filing date: 2020-12-16
Publication date: 2021-11-12
Anticipated expiration: 2030-12-16

Abstract

The utility model relates to a radio frequency test fixture technical field, and a anchor clamps for semiconductor chip radio frequency test is disclosed, comprises a workbench, the upper and lower both sides of workstation are connected with input joint and output respectively and connect, the front end of workstation is fixed and is provided with the anchor clamps frame, the inboard of anchor clamps frame is provided with the chip carrier, the front end sliding connection of workstation has two movable blocks that set up about anchor clamps frame symmetry, the slot has been seted up to the front end of movable block, sliding connection has same U-shaped crimping board in two slots, a plurality of reset spring of fixedly connected with between the tank bottom of U-shaped crimping board one end that is located the slot and slot, the activity is seted up in a plurality of jacks and jack to the horizontal part of U-shaped crimping board and is inserted and is equipped with the suction tube, the front end fixed connection of many suction tubes has same buffer tube. The utility model discloses make the clamping of chip more firm, can realize taking out fast the chip, the last unloading operation of being convenient for has improved detection efficiency.

Description

Clamp for radio frequency test of semiconductor chip

Technical Field

The utility model relates to a radio frequency test fixture technical field especially relates to an anchor clamps for semiconductor chip radio frequency test.

Background

The radio frequency test method of the semiconductor chip commonly used at present comprises two methods of a probe on-chip test and a test fixture test, wherein the test method of the test fixture is to assemble the chip on a test carrier and test the performance of the chip through a microstrip line and a radio frequency connector. The power supply bias of the chip is additionally applied independently by adopting the clamp test method, the working point of the device can be flexibly adjusted, and the optimal working point of the device can be found by comparing the performances of different working points.

At present, the semiconductor chip radio frequency test fixture semiconductor chip in the prior art in the market of China is difficult to take out the chip after being placed in the fixture frame, so that the test efficiency is influenced, a good limiting mechanism is not arranged on the upper portion of the chip, and the stability of the placement structure is influenced.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the semiconductor chip radio frequency test fixture semiconductor chip among the prior art and placing and be difficult to take out the chip in the anchor clamps frame back, influenced efficiency of software testing, and do not have fine stop gear to the upper portion of chip, influenced the problem of the steadiness of placing the structure, and the anchor clamps that are used for semiconductor chip radio frequency test that propose.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

a clamp for a semiconductor chip radio frequency test comprises a workbench, wherein an input connector and an output connector are respectively connected to the upper side and the lower side of the workbench, a clamp frame is fixedly arranged at the front end of the workbench, a chip carrier is arranged on the inner side of the clamp frame, two movable blocks symmetrically arranged relative to the clamp frame are slidably connected to the front end of the workbench, slots are formed in the front end of each movable block, the two slots are slidably connected with a same U-shaped crimping plate, a plurality of reset springs are fixedly connected between one end, located in each slot, of each U-shaped crimping plate and the bottom of each slot, a plurality of jacks are formed in the horizontal part of each U-shaped crimping plate, suction pipes are movably inserted in the jacks, a same buffer pipe is fixedly connected to the front ends of the plurality of suction pipes, a negative pressure suction disc is fixedly communicated to the rear end of each suction pipe, and a plurality of pull-down springs sleeved outside each suction pipe are fixedly connected to one opposite side of each buffer pipe and each U-shaped crimping plate, one side of the workbench is provided with a negative pressure suction machine, and an air inlet of the negative pressure suction machine is communicated with one end of the buffer tube through a communication hose.

Preferably, the left side and the right side of the clamp frame are symmetrically and fixedly connected with two fixing plates, and the fixing plates are fixedly connected with the workbench through hexagon bolts.

Preferably, the front end of the workbench is symmetrically and fixedly connected with two T-shaped clamping blocks, and the side wall of the rear end of the moving block is provided with a T-shaped clamping groove matched and in sliding connection with the T-shaped clamping blocks.

Preferably, the rear end of the U-shaped crimping plate is symmetrically and fixedly connected with a plurality of positioning insertion columns, and the front end of the clamp frame is provided with a plurality of positioning insertion slots correspondingly inserted with the positioning insertion columns.

Preferably, the negative pressure sucking disc is made of silica gel.

Preferably, the negative pressure suction machine is electrically connected with an external power supply through a control switch.

Compared with the prior art, the utility model provides an anchor clamps for semiconductor chip radio frequency test possesses following beneficial effect:

1. this an anchor clamps for semiconductor chip radio frequency test, through the workstation that is equipped with, bolted connection through fixed plate and workstation makes the anchor clamps frame install on the workstation fast, place the chip that awaits measuring again and carry out relevant detection operation in the anchor clamps frame, the outside at the workstation is connected that the matching joint through T shape fixture block and T shape draw-in groove makes two movable blocks firm fast, pull-down effect through reset spring and the activity plug bush effect between slot and the U-shaped crimping board make the U-shaped crimping board drive the vacuum suction dish and push down the upside at the chip, it is spacing to realize the firm on chip upper portion, make the clamping of chip more firm, and convenient for detect and use.

2. This an anchor clamps for semiconductor chip radio frequency test through the negative pressure suction machine that is equipped with, when needs take out the chip, starts the negative pressure and takes out and attack, and negative pressure suction machine forms the negative pressure suction power to the buffer tube, and then firmly adsorbs the chip through negative pressure suction disc, and pull-up U-shaped crimping board again takes out the chip and can realize taking out fast the chip outside the anchor clamps frame, and the unloading operation of being convenient for has improved detection efficiency.

3. This an anchor clamps for semiconductor chip radio frequency test, through the drop-down spring that is equipped with, when negative pressure suction dish crimping was at the chip upside, drop-down spring had the pressure compensation effect, avoided hard extrusion to cause the problem that the chip damaged easily.

And the part that does not relate to among the device all is the same with prior art or can adopt prior art to realize, the utility model discloses make the clamping of chip more firm, can realize taking out fast to the chip, the last unloading operation of being convenient for has improved detection efficiency.

Drawings

Fig. 1 is a schematic structural diagram of a clamp for radio frequency testing of a semiconductor chip according to the present invention;

fig. 2 is a schematic side view of the U-shaped crimping plate of the clamp for testing the radio frequency of the semiconductor chip.

In the figure: the device comprises a workbench 1, an input connector 2, an output connector 3, a clamp frame 4, a chip carrier 5, a moving block 6, a slot 7, a U-shaped crimping plate 8, a return spring 9, a suction tube 10, a buffer tube 11, a negative pressure suction cup 12, a pull-down spring 13, a negative pressure suction machine 14, a communication hose 15, a fixing plate 16, a T-shaped clamping block 17, a T-shaped clamping groove 18, a positioning insertion column 19 and a positioning insertion slot 20.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Referring to fig. 1-2, a clamp for semiconductor chip radio frequency testing, comprising a workbench 1, wherein the upper side and the lower side of the workbench 1 are respectively connected with an input connector 2 and an output connector 3, the front end of the workbench 1 is fixedly provided with a clamp frame 4, the inner side of the clamp frame 4 is provided with a chip carrier 5, the front end of the workbench 1 is slidably connected with two moving blocks 6 symmetrically arranged about the clamp frame 4, the front end of the moving block 6 is provided with a slot 7, the two slots 7 are slidably connected with a same U-shaped crimping plate 8, a plurality of reset springs 9 are fixedly connected between one end of the U-shaped crimping plate 8 positioned in the slot 7 and the bottom of the slot 7, the horizontal part of the U-shaped crimping plate 8 is provided with a plurality of jacks, suction pipes 10 are movably inserted in the jacks, the front ends of the plurality of suction pipes 10 are fixedly connected with a same buffer pipe 11, the rear ends of the suction pipes 10 are fixedly communicated with a negative pressure suction disc 12, the opposite side of the buffer tube 11 and the U-shaped compression joint plate 8 is fixedly connected with a plurality of pull-down springs 13 sleeved outside the suction tube 10, one side of the workbench 1 is provided with a negative pressure suction machine 14, and an air inlet of the negative pressure suction machine 14 is communicated with one end of the buffer tube 11 through a communication hose 15.

The left side and the right side of the clamp frame 4 are opposite to each other, two fixing plates 16 are symmetrically and fixedly connected with each other, and the fixing plates 16 and the workbench 1 are fixedly connected through hexagon bolts.

The front end of the workbench 1 is symmetrically and fixedly connected with two T-shaped clamping blocks 17, and the side wall of the rear end of the moving block 6 is provided with a T-shaped clamping groove 18 which is matched with the T-shaped clamping blocks 17 in a sliding connection mode.

The rear end of the U-shaped crimping plate 8 is symmetrically and fixedly connected with a plurality of positioning insertion columns 19, and the front end of the clamp frame 4 is provided with a plurality of positioning insertion slots 20 correspondingly inserted with the positioning insertion columns 19.

The negative pressure suction cup 12 is made of silica gel.

The negative pressure suction machine 14 is electrically connected with an external power supply through a control switch.

In the utility model, when in use, the clamp frame 4 is quickly installed on the workbench 1 through the bolt connection of the fixed plate 16 and the workbench 1 by the workbench 1, then the chip to be tested is placed in the clamp frame 4 for relevant detection operation, the two moving blocks 6 are quickly and stably connected at the outer side of the workbench 1 through the matching clamping of the T-shaped clamping block 17 and the T-shaped clamping groove 18, the U-shaped crimping plate 8 drives the negative pressure sucking disc 12 to press down at the upper side of the chip through the pull-down action of the reset spring 9 and the movable sleeve action between the slot 7 and the U-shaped crimping plate 8, the stable limit of the upper part of the chip is realized, the clamping of the chip is more stable, the detection and the use are convenient, the negative pressure suction machine 14 is started when the chip needs to be taken out through the arranged negative pressure suction machine 14, the negative pressure suction machine 14 forms negative pressure suction force into the buffer tube 11, and then take out sucking disc 12 through the negative pressure and firmly adsorb the chip, pull up U-shaped crimping board 8 again, take out the chip and can realize taking out fast to the chip outside anchor clamps frame 4, the unloading operation of being convenient for go up has improved detection efficiency, through the pull-down spring 13 that is equipped with, when the negative pressure is taken out sucking disc 12 crimping and is in the chip upside, pull-down spring 13 has the pressure compensation effect, avoids hard extrusion to cause the problem that the chip damaged easily.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. The clamp for the radio frequency test of the semiconductor chip comprises a workbench (1), wherein an input connector (2) and an output connector (3) are respectively connected to the upper side and the lower side of the workbench (1), and the clamp is characterized in that a clamp frame (4) is fixedly arranged at the front end of the workbench (1), a chip carrier (5) is arranged on the inner side of the clamp frame (4), two movable blocks (6) symmetrically arranged relative to the clamp frame (4) are slidably connected to the front end of the workbench (1), a slot (7) is formed in the front end of each movable block (6), one U-shaped crimping plate (8) is slidably connected in each slot (7), a plurality of reset springs (9) are fixedly connected between one end, located in each slot (7), of each U-shaped crimping plate (8) and the bottom of each slot (7), a plurality of jacks are formed in the horizontal portion of each U-shaped crimping plate (8), and a suction pipe (10) is movably inserted in each jack, many the front end fixedly connected with of suction tube (10) is same buffer tube (11), the rear end fixed intercommunication of suction tube (10) has negative pressure suction disc (12), the relative one side fixedly connected with of buffer tube (11) and U-shaped crimping board (8) is established a plurality of covers and is established pull-down spring (13) outside suction tube (10), one side of workstation (1) is provided with negative pressure suction machine (14), the air inlet of negative pressure suction machine (14) is through the one end intercommunication of intercommunication hose (15) and buffer tube (11).

2. The clamp for the radio frequency test of the semiconductor chip according to claim 1, wherein two fixing plates (16) are symmetrically and fixedly connected to the left and right opposite sides of the clamp frame (4), and the fixing plates (16) are fixedly connected to the workbench (1) through hexagon bolts.

3. The clamp for the radio frequency test of the semiconductor chip according to claim 1, wherein two T-shaped clamping blocks (17) are symmetrically and fixedly connected to the front end of the workbench (1), and a T-shaped clamping groove (18) matched with and slidably connected with the T-shaped clamping block (17) is formed in the side wall of the rear end of the moving block (6).

4. The clamp for the radio frequency test of the semiconductor chip according to claim 1, wherein a plurality of positioning insertion posts (19) are symmetrically and fixedly connected to the rear end of the U-shaped crimping plate (8), and a plurality of positioning insertion slots (20) which are correspondingly inserted with the positioning insertion posts (19) are formed in the front end of the clamp frame (4).

5. The clamp for the radio frequency test of the semiconductor chip as recited in claim 1, wherein the negative pressure suction cup (12) is made of silicone.

6. The clamp for radio frequency testing of semiconductor chips as recited in claim 1, wherein the negative pressure suction machine (14) is electrically connected to an external power source through a control switch.