CN214669532U - Radium-shine maintenance double-end probe electricity of panel surveys tool - Google Patents
Radium-shine maintenance double-end probe electricity of panel surveys tool Download PDFInfo
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- CN214669532U CN214669532U CN202121007246.3U CN202121007246U CN214669532U CN 214669532 U CN214669532 U CN 214669532U CN 202121007246 U CN202121007246 U CN 202121007246U CN 214669532 U CN214669532 U CN 214669532U
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Abstract
The utility model discloses a panel laser maintenance double-end probe electrical measurement jig, including mounting substrate, the PCB switching device that is used for receiving the detected signal is installed to mounting substrate's bottom, PCB switching device's bottom movable mounting has the probe locating plate, the inside of probe locating plate is installed a plurality of equidistance arranged double-end probes; it is a plurality of the double-end probe passes through the probe locating plate with PCB switching device location switches on, and is a plurality of the bottom of double-end probe is crossed and is extended the panel is corrected the board and is switched on with the panel that awaits measuring, through installing a plurality of double-end probe integratedly inside drawing the board to set up the top and the bottom of correcting the board at the top and the bottom of guide board and correct the top and the bottom probe structure that the double-end probe was corrected respectively, consequently at the installation or the in-process of dismantling, can be convenient for install fast or dismantle double-end probe device through guide board and arbitrary parallel and level degree that corrects a plurality of double-end probes of board guarantee.
Description
Technical Field
The utility model relates to an electricity is surveyed tool technical field, concretely relates to tool is surveyed to radium-shine maintenance double-end probe electricity of panel.
Background
When the electronic board is connected to other module components such as a touch screen and a display panel, the conductive electrode at one end of the electronic board is pressed with the peripheral circuit of the module component by a pressing machine, for example, one end of the electronic board is connected to the touch sensing layer, and the other end of the electronic board is connected to the circuit board after the other end is connected to the touch sensing layer.
In order to avoid poor pressing of the electronic board after pressing, an electrical test is usually performed on one end of the electronic board after pressing, when the electronic board is subjected to the electrical test, a common electrical testing device is an electrical testing probe, the electronic board is detected through a probe structure which is telescopic at the front end of the electrical testing probe, and a detected signal is transmitted to a processing module;
among the prior art, generally can adopt a plurality of electricity to survey the probe and detect the electron plate in step to need to ensure the roughness of probe tip conduction structure after a plurality of electricity survey probe installations, consequently a plurality of electricity survey the probe and need keep higher synchronism after the installation, thereby the step that leads to a plurality of probe installations is comparatively loaded down with trivial details and the installation degree of difficulty is great, therefore a plurality of probes are difficult to quick installation or dismantlement.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a tool is surveyed to radium-shine maintenance double-end probe electricity of panel to a plurality of probes of solving among the prior art are difficult to install fast or dismantle technical problem.
In order to solve the above technical problem, the utility model particularly provides the following technical scheme:
a double-end probe electrical measurement jig for panel laser maintenance comprises a mounting substrate, wherein a PCB (printed Circuit Board) adapter device for receiving detection signals is mounted at the bottom end of the mounting substrate, a probe positioning plate is movably mounted at the bottom end of the PCB adapter device, a plurality of double-end probes arranged at equal intervals are mounted inside the probe positioning plate, and the probe positioning plate is connected with a panel correction plate for correcting a panel to be detected through the plurality of double-end probes;
the double-end probes are positioned and conducted with the PCB switching device through the probe positioning plate, and the bottom ends of the double-end probes extend out of the panel correction plate to be conducted with a panel to be detected.
As an optimal scheme of the utility model, PCB switching device includes that fixed mounting is in the patch cord shell of mounting substrate bottom, and set up the inside PCB keysets of patch cord shell, the bottom central point of patch cord shell puts and is equipped with and is used for the location installation the spacing heavy groove of probe locating plate, the PCB keysets is in the inboard region in spacing heavy groove sets up to be used for switching on respectively a plurality ofly the probe butt joint port district of double-end probe.
As an optimized scheme of the utility model, the whole probe structure that comprises middle shell and both ends are flexible of double-end probe, the probe shell of double-end probe is the cylinder structure, and the fixed cover in probe shell middle part of double-end probe is equipped with the solid fixed ring of outside salient.
As a preferred scheme of the utility model, the probe locating plate is including the embedding spacing heavy inslot side and the correction mounting panel that passes through bolt fixed connection with it in four corners department, and be in correct under the mounting panel and be used for inserting a plurality ofly the probe guide board of double-end probe, be provided with all around of probe guide board and be used for the fixed connection upper end correct mounting panel and lower extreme the limit for height outer card frame of board is corrected to the panel.
As an optimal scheme of the utility model, correct the mounting panel with the panel is corrected and is equipped with the probe hole that a plurality of equidistance were arranged on the board, the probe hole is used for local embedding the probe shell of double-end probe supplies the probe structure passes, be equipped with the outer hole of the probe that a plurality of equidistance were arranged on the probe guide board, the outer groove of probe guide board is used for supplying the probe shell of double-end probe stretch into and with gu the solid fixed ring block.
As an optimal scheme of the utility model, the top and the bottom of limit for height outer calorie of frame are used for the block respectively correct the mounting panel with the panel corrects the periphery of board, and the last lower extreme of limit for height outer calorie of frame all through the bolt with correct the mounting panel with the panel corrects board fixed connection, the probe guide board passes through limit for height outer calorie of frame restriction with correct the mounting panel with the interval that the board was corrected to the panel, and the cooperation of probe guide board correct the mounting panel with the panel corrects the board and even takes and correct a plurality ofly the probe structure of double-end probe upper and lower extreme probe structure.
As an optimized scheme of the utility model, the probe guide board passes through the limit for height outer card frame with correct the mounting panel or with the panel is corrected board fixed connection and is used for restricting a plurality ofly the depth of parallelism of double-end probe.
Compared with the prior art, the utility model following beneficial effect has:
through installing a plurality of double-end probe integratedly inside drawing the board to set up at the top and the bottom of guide board and correct the top and the bottom probe structure that the board corrected the double-end probe respectively, consequently at the installation or the in-process of dismantling, can correct the parallel and level degree that the board ensured a plurality of double-end probes through guide board and arbitrary, be convenient for install fast or dismantle double-end probe device.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It should be apparent that the drawings in the following description are merely exemplary, and that other embodiments can be derived from the drawings provided by those of ordinary skill in the art without inventive effort.
Fig. 1 is a schematic view of the whole fixture in the embodiment of the present invention.
The reference numerals in the drawings denote the following, respectively:
1-a mounting substrate; 2-a PCB adapting device; 3-a probe positioning plate; 4-a double-ended probe; 5-panel straightening plate;
21-patch cord housing; 22-PCB interposer; 23-limiting sink grooves;
31-a correction mounting plate; 32-a probe guide plate; 33-height limiting outer clamping frame.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
As shown in fig. 1, the utility model provides a panel laser maintenance double-end probe electrical measuring tool, including mounting substrate 1, the bottom of mounting substrate 1 is installed and is used for receiving the PCB switching device 2 of detected signal, the bottom movable mounting of PCB switching device 2 has probe locating plate 3, the inside of probe locating plate 3 is installed a plurality of equidistance arranged double-end probes 4, probe locating plate 3 is connected with the panel correction plate 5 that is used for correcting the panel to be measured through a plurality of double-end probes 4;
a plurality of double-end probes 4 are positioned and conducted with PCB switching device 2 through probe positioning plate 3 to the bottom of a plurality of double-end probes 4 is crossed to extend out panel correction plate 5 and is conducted with the panel that awaits measuring.
The PCB adapter device 2 comprises an adapter cable shell 21 fixedly installed at the bottom end of the installation substrate 1 and a PCB adapter plate 22 arranged inside the adapter cable shell 21, a limiting sinking groove 23 used for positioning and installing the probe positioning plate 3 is formed in the center of the bottom end of the adapter cable shell 21, and the inner side area of the PCB adapter plate 22, which is located in the limiting sinking groove 23, is set to be a probe butt joint port area used for respectively conducting a plurality of double-head probes 4.
The double-ended probe 4 is wholly composed of a middle shell and a probe structure with two telescopic ends, the probe shell of the double-ended probe 4 is of a cylindrical structure, and the middle part of the probe shell of the double-ended probe 4 is fixedly sleeved with a fixing ring protruding outwards.
Probe locating plate 3 is including embedding spacing heavy inslot 23 inboard and at four corners department through bolt fixed connection's correction mounting panel 31 with it to and be in and correct the probe guide board 32 that the mounting panel 31 is used for inserting a plurality of double-ended probes 4 under, probe guide board 32 is provided with all around and is used for fixed connection upper end to correct mounting panel 31 and lower extreme panel to correct the outer card frame 33 of limit for height of board 5.
Rectify the probe hole that is equipped with a plurality of equidistance arrangements on mounting panel 31 and the panel 5, the probe hole is used for the probe shell of local embedding double-end probe 4 and supplies the probe structure to pass, is equipped with the probe outer orifice that a plurality of equidistance arranged on probe guide board 32, and the probe outer tank of probe guide board 32 is used for supplying the probe shell of double-end probe 4 to stretch into and with solid fixed ring block.
The top and the bottom of limit for height outer card frame 33 are used for the block respectively to rectify the periphery of installing panel 31 and panel correction board 5 to the upper and lower extreme of limit for height outer card frame 33 all corrects board 5 fixed connection with correcting installing panel 31 through bolt and panel, and probe guide board 32 corrects the interval of board 5 through limit for height outer card frame 33 restriction and correction installing panel 31 and panel, and probe guide board 32 cooperates and corrects the probe structure of a plurality of double-ended probes 4 upper and lower end probe structure of board 5 even area is corrected to installing panel 31 and panel.
The probe guide plate 32 is fixedly connected with the correction mounting plate 31 or the panel correction plate 5 through a height-limiting outer clamping frame 33 and is used for limiting the parallelism of the plurality of double-headed probes 4.
Through installing a plurality of double-end probe integratedly inside drawing the board to set up at the top and the bottom of guide board and correct the top and the bottom probe structure that the board corrected the double-end probe respectively, consequently at the installation or the in-process of dismantling, can correct the parallel and level degree that the board ensured a plurality of double-end probes through guide board and arbitrary, be convenient for install fast or dismantle double-end probe device.
The above embodiments are only exemplary embodiments of the present application, and are not intended to limit the present application, and the protection scope of the present application is defined by the claims. Various modifications and equivalents may be made by those skilled in the art within the spirit and scope of the present application and such modifications and equivalents should also be considered to be within the scope of the present application.
Claims (7)
1. The utility model provides a radium-shine maintenance double-end probe electricity of panel surveys tool, includes mounting substrate (1), its characterized in that: the bottom end of the mounting substrate (1) is provided with a PCB (printed circuit board) switching device (2) for receiving detection signals, the bottom end of the PCB switching device (2) is movably provided with a probe positioning plate (3), a plurality of double-headed probes (4) arranged at equal intervals are arranged inside the probe positioning plate (3), and the probe positioning plate (3) is connected with a panel correcting plate (5) for correcting a panel to be detected through the plurality of double-headed probes (4);
the double-end probes (4) are positioned and conducted with the PCB switching device (2) through the probe positioning plate (3), and the bottom ends of the double-end probes (4) extend out of the panel correcting plate (5) to be conducted with a panel to be tested.
2. The electrical measurement jig for the double-headed probe for laser maintenance of the panel according to claim 1, characterized in that: PCB switching device (2) are including fixed mounting in patch cord shell (21) of mounting substrate (1) bottom, and set up and be in the inside PCB keysets (22) of patch cord shell (21), the bottom central point of patch cord shell (21) puts and is equipped with and is used for the location installation spacing heavy groove (23) of probe locating plate (3), PCB keysets (22) are in the inboard region of spacing heavy groove (23) sets up to be used for switching on a plurality of respectively the probe butt joint port district of double-end probe (4).
3. The electrical measurement jig for the double-headed probe for laser maintenance of the panel according to claim 2, characterized in that: double-end probe (4) are whole to be formed by middle shell and the flexible probe structure in both ends, the probe shell of double-end probe (4) is the cylinder structure, and the fixed cover in probe shell middle part of double-end probe (4) is equipped with outside outstanding solid fixed ring.
4. The electrical measurement jig for the double-headed probe for laser maintenance of the panel according to claim 3, wherein: probe locating plate (3) is including embedding spacing heavy groove (23) inboard and in four corners department through bolt fixed connection's correction mounting panel (31) with it, and be in correct under mounting panel (31) be used for inserting a plurality of probe guide board (32) of double-end probe (4), be provided with all around of probe guide board (32) and be used for the fixed connection upper end correct mounting panel (31) and lower extreme outer card frame (33) of limit for height of board (5) are corrected to the panel.
5. The electrical measurement tool for the double-headed probe for laser maintenance of the panel according to claim 4, wherein: correct mounting panel (31) with the probe hole that is equipped with a plurality of equidistance on board (5) is corrected to the panel, the probe hole is used for local embedding the probe shell of double-end probe (4) supplies the probe structure passes, be equipped with the probe outer hole that a plurality of equidistance were arranged on probe guide board (32), the probe outer tank of probe guide board (32) is used for supplying the probe shell of double-end probe (4) stretch into and with gu fixed ring block.
6. The electrical measurement tool for the double-headed probe for laser maintenance of the panel according to claim 5, wherein: the top and the bottom of limit for height outer calorie of frame (33) are used for the block respectively correct the installation panel (31) with the periphery of board (5) is corrected to the panel, and the upper and lower end of limit for height outer calorie of frame (33) all through the bolt with correct installation panel (31) with board (5) fixed connection is corrected to the panel, probe guide board (32) pass through limit for height outer calorie of frame (33) restriction with correct installation panel (31) with the interval of board (5) is corrected to the panel, and probe guide board (32) cooperation correct installation panel (31) with board (5) are corrected a plurality ofly in the company's of area of double-end probe (4) upper and lower end probe structure's probe structure.
7. The electrical measurement tool for the double-headed probe for laser maintenance of the panel according to claim 6, wherein: the probe guide plate (32) passes through the height-limiting outer clamping frame (33) and the correcting installation plate (31) or the panel correcting plate (5) is fixedly connected and used for limiting the parallelism of the double-headed probe (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121007246.3U CN214669532U (en) | 2021-05-12 | 2021-05-12 | Radium-shine maintenance double-end probe electricity of panel surveys tool |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121007246.3U CN214669532U (en) | 2021-05-12 | 2021-05-12 | Radium-shine maintenance double-end probe electricity of panel surveys tool |
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| Publication Number | Publication Date |
|---|---|
| CN214669532U true CN214669532U (en) | 2021-11-09 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121007246.3U Active CN214669532U (en) | 2021-05-12 | 2021-05-12 | Radium-shine maintenance double-end probe electricity of panel surveys tool |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114034895A (en) * | 2021-11-22 | 2022-02-11 | 普铄电子(上海)有限公司 | High-frequency probe card for wafer test |
-
2021
- 2021-05-12 CN CN202121007246.3U patent/CN214669532U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114034895A (en) * | 2021-11-22 | 2022-02-11 | 普铄电子(上海)有限公司 | High-frequency probe card for wafer test |
| CN114034895B (en) * | 2021-11-22 | 2023-02-28 | 普铄电子(上海)有限公司 | High-frequency probe card for wafer test |
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