CN214669457U

CN214669457U - Multifunctional chip test fixture

Info

Publication number: CN214669457U
Application number: CN202120764370.8U
Authority: CN
Inventors: 张锋
Original assignee: Kunshan Zhuolida Precision Metal Parts Co ltd
Current assignee: Kunshan Zhuolida Precision Metal Parts Co ltd
Priority date: 2021-04-14
Filing date: 2021-04-14
Publication date: 2021-11-09
Anticipated expiration: 2031-04-14

Abstract

The utility model discloses a multifunctional chip testing jig, which comprises a base plate, wherein a fixed block and a quick clamp are fixed on the upper surface of the base plate, the fixed block and the quick clamp are respectively positioned at two ends of the base plate, a first probe fixing component is fixed on the fixed block, a second probe fixing component is fixed at one end of the quick clamp through a fixed seat, and a combined chip fixing component is arranged between the first probe fixing component and the second probe fixing component; the utility model discloses mainly use through the cooperation that the fixed subassembly of chip, the fixed subassembly of first probe, the fixed subassembly of second probe and quick clamp, through the fixed subassembly of combination formula chip, make the fixed subassembly of chip assemble according to the production of different chips to make a tool can be applicable to the test of multiple chip, improve test fixture's function to a certain extent, reduced the test cost of different chip productions, and reduced new model tool research and development time.

Description

Multifunctional chip test fixture

Technical Field

The utility model relates to a test fixture technical field specifically is a multifunctional chip test fixture.

Background

The chip is a general name of semiconductor element products, also called microcircuits, microchips and integrated circuits, and refers to a silicon chip containing integrated circuits, which is small in size and is often a part of a computer or other electronic equipment. In the chip production technology, in order to ensure that the performance of the produced chip is normal, the produced chip needs to be subjected to functional test, when testing, a special test fixture for the chip is usually used to be matched with test equipment for use, however, most functions of the existing chip test fixtures are unique, one fixture can only be used for testing one chip and cannot be applied to testing of different types of chips, so that the test cost of different chip production is increased, the research and development time of a new type of fixture is increased, and therefore a multifunctional chip test fixture needs to be provided.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a multifunctional chip test fixture uses through the cooperation of the fixed subassembly of chip, the fixed subassembly of probe and quick clamp, makes the test that a tool can be applicable to multiple chip to current chip test fixture function singleness who proposes in the solution background art increases the test cost of different chip productions, and increases the problem of new model of a machine tool research and development time.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a multifunctional chip test fixture, includes the bottom plate, fixed surface has fixed block and quick clamp on the bottom plate, fixed block and quick clamp are located the both ends of bottom plate respectively, be fixed with the fixed subassembly of first probe on the fixed block, the one end of quick clamp is fixed with the fixed subassembly of second probe through the fixing base, just fixing base and bottom plate sliding connection, be provided with the fixed subassembly of combination formula chip between the fixed subassembly of first probe and the fixed subassembly of second probe, the fixed subassembly of chip and bottom plate sliding connection, just the fixed subassembly of chip passes through the bolt and is fixed with the bottom plate, all be provided with the probe on the fixed subassembly of first probe and the fixed subassembly of second probe, the one end of probe and the outer wall laminating of the fixed subassembly of chip.

Preferably, the first probe fixing assembly comprises a first T-shaped block and a first clamping block with a notch in a rectangular shape, the first clamping block is fixed on one side of the first clamping block through a bolt, and a transverse rod of the first T-shaped block is fixedly connected with the fixing block through a bolt.

Preferably, the second probe fixing assembly comprises a second T-shaped block and a rectangular second clamping block with a notch, the second clamping block is fixed on one side of the second T-shaped block through a bolt, the fixing seat is in a shape of ' 21274 ', the transverse rod of the second T-shaped block is arranged in the fixing seat in a shape of ' v ' -shaped ', a limiting block is fixed at the lower end of the fixing seat, and a first sliding groove for the limiting block to slide is formed in the upper surface of the bottom plate.

Preferably, the first probe fixing assembly and the second probe fixing assembly are symmetrically arranged, one side of each of the first clamping block and the second clamping block is provided with a through hole through which one end of the probe penetrates, and the first T-shaped block and the second T-shaped block are provided with round holes through which the other end of the probe is fixed.

Preferably, the chip fixing component comprises a fixing frame and a rectangular feeding block, the fixing frame comprises a longitudinal plate and two vertical plates, the vertical plates are fixed on the upper surface of the longitudinal plate, the feeding block is fixed between the two vertical plates through fastening bolts, two positioning blocks are fixed at the lower end of the longitudinal plate, two sliding second sliding grooves for the two positioning blocks are formed in the upper surface of the bottom plate, through holes for the through bolts to penetrate through are formed in the upper surfaces of the two ends of the bottom plate, a notch for the probe to penetrate through is formed in the upper surface of the feeding block, and limiting grooves for limiting the chips are formed in the two sides of the notch respectively.

Preferably, a bump is fixed at the lower end of the feeding block, a third sliding groove for the bump to insert into is formed in the upper surface of each longitudinal plate, and the length of the third sliding groove is the same as the distance between the two longitudinal plates.

Preferably, the quick clamp comprises a fixing plate, a handle and a connecting rod, the fixing plate is fixed to the bottom plate through a bolt, one end of the handle is rotatably connected with the fixing plate, one end of the connecting rod is rotatably connected with the side wall of the handle, and the other end of the connecting rod is fixed to the outer wall of the fixing seat.

Compared with the prior art, the beneficial effects of the utility model are that:

1. the utility model discloses mainly use through the cooperation that the fixed subassembly of chip, the fixed subassembly of first probe, the fixed subassembly of second probe and quick clamp, through the fixed subassembly of combination formula chip, make the fixed subassembly of chip assemble according to the production of different chips to make a tool can be applicable to the test of multiple chip, improve test fixture's function to a certain extent, reduced the test cost of different chip productions, and reduced new model tool research and development time.

Drawings

Fig. 1 is a schematic structural view of the present invention;

fig. 2 is a schematic sectional structure of the present invention;

fig. 3 is a schematic top view of the present invention;

fig. 4 is a schematic structural diagram of the chip fixing assembly of the present invention.

In the figure: 1. a base plate; 2. a fixed block; 3. a first probe fixing member; 4. a probe; 5. a chip fixing component; 6. a fixed seat; 7. a second probe-holding assembly; 8. a limiting block; 9. a first chute; 10. a fixing plate; 11. a handle; 12. a connecting rod; 13. a second chute; 14. fastening a bolt; 15. positioning blocks; 16. a bump; 17. a third chute; 18. a notch; 19. a longitudinal plate; 20. a vertical plate; 301. a first T-shaped block; 302. a first clamping block; 501. a fixed mount; 502. feeding a material block; 701. a second T-shaped block; 702. and a second clamping block.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention provides a technical solution: a multifunctional chip testing jig comprises a bottom plate 1, wherein a fixed block 2 and a quick clamp are fixed on the upper surface of the bottom plate 1, the fixed block 2 and the quick clamp are respectively positioned at two ends of the bottom plate 1, a first probe fixing component 3 is fixed on the fixed block 2, one end of the quick clamp is fixed with a second probe fixing component 7 through a fixed seat 6, the fixed seat 6 is in sliding connection with the bottom plate 1, a combined chip fixing component 5 is arranged between the first probe fixing component 3 and the second probe fixing component 7, the chip fixing component 5 is in sliding connection with the bottom plate 1, the chip fixing component 5 is fixed with the bottom plate 1 through a bolt, probes 4 are respectively arranged on the first probe fixing component 3 and the second probe fixing component 7, and one end of each probe 4 is attached to the outer wall of the chip fixing component 5;

through the setting of the fixed subassembly 5 of combination formula chip, can assemble the fixed subassembly 5 of chip according to the production demand of different chips, use through the cooperation of the fixed subassembly 5 of chip, the fixed subassembly 3 of first probe, the fixed subassembly 7 of second probe and quick clamp to make a tool can be applicable to the test of multiple chip, improve test fixture's function to a certain extent, the test cost of different chip productions has been reduced, and new model tool development time has been reduced

The first probe fixing assembly 3 comprises a first T-shaped block 301 and a first clamping block 302 with a notch in a rectangular shape, the first clamping block 302 is fixed on one side of the first clamping block 302 through a bolt, a transverse rod of the first T-shaped block 301 is fixedly connected with the fixing block 2 through the bolt, the probe 4 is fixed through the first clamping block 302, and then the probe 4 is supported and fixed through the first clamping block 302, and the first clamping block 302 is detachably arranged, so that the probe 4 can be conveniently installed and replaced;

the second probe fixing component 7 comprises a second T-shaped block 701 and a rectangular second clamping block 702 with a notch, the second clamping block 702 is fixed on one side of the second T-shaped block 701 through a bolt, the fixing seat 6 is 21274, a transverse rod of the second T-shaped block 701 is arranged and fixed in the fixing seat 6, a limiting block 8 is fixed at the lower end of the fixing seat 6, a first sliding groove 9 for the limiting block 8 to slide is formed in the upper surface of the bottom plate 1, the second probe fixing component 7 is driven to move through a quick clamp through the arrangement of the limiting block 8, and the function of a chip is tested conveniently;

the first probe fixing component 3 and the second probe fixing component 7 are symmetrically arranged, through holes for penetrating through one ends of the probes 4 are formed in one sides of the first clamping block 302 and the second clamping block 702, round holes for fixing the other ends of the probes 4 are formed in the first T-shaped block 301 and the second T-shaped block 701, test points on two sides of a chip are electrically connected through the probes 4 through the first probe fixing component 3 and the second probe fixing component 7, and performance of different pins of the chip can be conveniently detected;

the chip fixing component 5 comprises a fixing frame 501 and a rectangular feeding block 502, the fixing frame 501 comprises a longitudinal plate 19 and two vertical plates 20, the two vertical plates 20 are fixed on the upper surface of the longitudinal plate 19, the feeding block 502 is fixed between the two vertical plates 20 through fastening bolts 14, two positioning blocks 15 are fixed at the lower end of the longitudinal plate 19, and a second sliding groove 13 for the two positioning blocks 15 to slide is formed in the upper surface of the bottom plate 1, so that the distance between the chip fixing component 5 and the first probe fixing component 3 can be conveniently adjusted, and the chip fixing component is convenient to use for probes 4 with different lengths; the upper surfaces of two ends of the bottom plate 1 are provided with through holes for bolts to penetrate through, the upper surface of the feeding block 502 is provided with a notch 18 for a probe 4 to penetrate through, two sides of the notch 18 are respectively provided with a limiting groove for limiting a chip, the fastening bolt 14 is in threaded connection with a vertical plate, the feeding block 502 can be fixed inside the fixing frame 501 or the feeding block 502 can be taken out of the fixing frame 501 through tightening and loosening the fastening bolt 14, so that different feeding blocks 502 can be conveniently replaced according to the requirement of actually testing the type of the chip, one jig can be suitable for testing various chips, and the diversity of the testing jig is improved to a certain extent;

the lower end of the feeding block 502 is fixed with a convex block 16, the upper surface of the longitudinal plate 19 is provided with a third sliding chute 17 for the convex block 16 to insert, the length of the third sliding chute is the same as the distance between the two longitudinal plates 19, the convex block 16 can limit the feeding block 502, and the deflection of the feeding block 502 after installation is reduced;

the rapid clamp comprises a fixing plate 10, a handle 11 and a connecting rod 12, the fixing plate 10 is fixed with the bottom plate 1 through a bolt, one end of the handle 11 is rotatably connected with the fixing plate 10, one end of the connecting rod 12 is rotatably connected with the side wall of the handle 11, the other end of the connecting rod 12 is fixed with the outer wall of the fixing seat 6, the fixing seat 6 can be driven to move through the rapid clamp, and the fixing seat 6 can drive the second probe fixing component 7 to move conveniently;

when the test fixture is used, different feeding blocks 502 are installed inside the fixing frame 501 through the second sliding grooves 13 according to the types of actual chip tests, the feeding blocks 502 are fixed in the fixing frame 501 through tightening the fastening bolts 14, the fixing frame 501 is moved through the positioning blocks 15 according to the length of the probes 4 and is used for adjusting the distance between the fixing frame 501 and the first probe fixing component 3, the fixing frame 501 and the bottom plate 1 are fixed through bolts, the chips are placed in the limiting grooves of the feeding blocks 502, the quick clamp is opened and closed to quickly clamp the fixing seat 6 to move, the fixing seat 6 drives the second probe fixing component 7 to move, the probes 4 on two sides are attached to test points on two sides of the chips, the performance test of the chips is facilitated, one fixture can be suitable for the tests of various chips by replacing different feeding blocks 502, and the functions of the test fixture are improved to a certain extent, the test cost of different chip productions is reduced, and the research and development time of a new model jig is reduced.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a multi-functional chip test fixture, includes bottom plate (1), its characterized in that: the upper surface of the bottom plate (1) is fixed with a fixed block (2) and a quick clamp, the fixed block (2) and the quick clamp are respectively positioned at two ends of the bottom plate (1), a first probe fixing component (3) is fixed on the fixing block (2), a second probe fixing component (7) is fixed at one end of the quick clamp through a fixing seat (6), the fixed seat (6) is connected with the bottom plate (1) in a sliding way, a combined chip fixing component (5) is arranged between the first probe fixing component (3) and the second probe fixing component (7), the chip fixing component (5) is connected with the bottom plate (1) in a sliding way, and the chip fixing component (5) is fixed with the bottom plate (1) through a bolt, the first probe fixing component (3) and the second probe fixing component (7) are both provided with probes (4), one end of the probe (4) is attached to the outer wall of the chip fixing component (5).

2. The multifunctional chip testing jig of claim 1, wherein: the first probe fixing assembly (3) comprises a first T-shaped block (301) and a first clamping block (302) with a notch in a rectangular shape, the first clamping block (302) is fixed on one side of the first clamping block (302) through a bolt, and a transverse rod of the first T-shaped block (301) is fixedly connected with the fixing block (2) through a bolt.

3. The multifunctional chip testing jig of claim 2, wherein: the second probe fixing assembly (7) comprises a second T-shaped block (701) and a second clamping block (702) with a notch in a rectangular shape, the second clamping block (702) is fixed on one side of the second T-shaped block (701) through a bolt, the fixing seat (6) is arranged in a manner of being 21274, a transverse rod of the second T-shaped block (701) is fixed inside the fixing seat (6), a limiting block (8) is fixed at the lower end of the fixing seat (6), and a first sliding groove (9) for the limiting block (8) to slide is formed in the upper surface of the bottom plate (1).

4. The multifunctional chip testing jig of claim 3, wherein: the first probe fixing component (3) and the second probe fixing component (7) are symmetrically arranged, one side of each of the first clamping block (302) and the second clamping block (702) is provided with a through hole through which one end of the probe (4) penetrates, and the first T-shaped block (301) and the second T-shaped block (701) are provided with round holes through which the other end of the probe (4) is fixed.

5. The multifunctional chip testing jig of claim 1, wherein: the chip fixing component (5) comprises a fixing frame (501) and a rectangular feeding block (502), the fixing frame (501) comprises a longitudinal plate (19) and two vertical plates (20), the vertical plates (20) are fixed on the upper surface of the longitudinal plate (19), the feeding block (502) is fixed between the two vertical plates (20) through fastening bolts (14), two positioning blocks (15) are fixed at the lower end of the longitudinal plate (19), two sliding second sliding grooves (13) for the two positioning blocks (15) are formed in the upper surface of the bottom plate (1), through holes for the bolts to penetrate through are formed in the upper surfaces of the two ends of the bottom plate (1), notches (18) for probes (4) to penetrate through are formed in the upper surface of the feeding block (502), and limiting grooves for limiting chips are formed in the two sides of the notches (18) respectively.

6. The multifunctional chip testing jig of claim 5, wherein: the lower end of the upper block (502) is fixed with a convex block (16), the upper surface of the longitudinal plate (19) is provided with a third sliding groove (17) for the convex block (16) to insert, and the length of the third sliding groove is the same as the distance between the two longitudinal plates (19).

7. The multifunctional chip testing jig of claim 1, wherein: the rapid clamp comprises a fixing plate (10), a handle (11) and a connecting rod (12), wherein the fixing plate (10) is fixed with a bottom plate (1) through a bolt, one end of the handle (11) is rotatably connected with the fixing plate (10), one end of the connecting rod (12) is rotatably connected with the side wall of the handle (11), and the other end of the connecting rod (12) is fixed with the outer wall of a fixing seat (6).