CN214669456U

CN214669456U - Chip fine-tuning testing device

Info

Publication number: CN214669456U
Application number: CN202120762409.2U
Authority: CN
Inventors: 刘坡
Original assignee: Youpushi Electronics Shenzhen Co ltd
Current assignee: Youpushi Electronics Shenzhen Co ltd
Priority date: 2021-04-14
Filing date: 2021-04-14
Publication date: 2021-11-09
Anticipated expiration: 2031-04-14

Abstract

The utility model discloses a chip fine-tuning testing device, which comprises a detection table, wherein a first fine-tuning mechanism is fixed on one side of the upper surface of the detection table, a second fine adjustment mechanism is fixed on the top of the first fine adjustment mechanism, a socket is arranged on the top of the second fine adjustment mechanism, the top of the second fine adjustment mechanism is fixed with a dismounting mechanism for fixing a socket, the top of the detection table is provided with a CCD camera, a rotating mechanism for rotating the CCD camera is fixed at one side of the top of the detection platform, which is close to the CCD camera, the utility model can conveniently complete the detection work of the chip and can accurately adjust the position of the socket when the detection work is carried out, therefore, the chip can be accurately pressed into the socket, and the socket can be conveniently disassembled and assembled by people, so that the socket is convenient to replace by people when damaged, and the replacement efficiency is improved.

Description

Chip fine-tuning testing device

Technical Field

The utility model relates to a chip testing arrangement technical field specifically is a chip fine setting testing arrangement.

Background

In the current semiconductor chip test, the tester needs to press the chip into the groove of the socket on the PCB test board, so that the contact on the chip is connected with the pin of the socket, the pin on the socket is connected with the contact of the PCB circuit board, at this time, a path is formed, then inputting a certain voltage on the PCB test board to check the output condition, different voltages can generate different paths to have different outputs, the output is in accordance with the required parameters to be good products, the chip is held by the tester through the suction nozzle and put into the socket, the tester can only place the chip at a specific position, therefore, we need to change the position of the socket to ensure the chip to be smoothly placed into the socket, the socket is fixed with the PCB test board by screws and is relatively static, the PCB test board is fixed with the test bracket by screws and is relatively static, therefore, the chip can be accurately pressed into the socket only by manually adjusting the bracket and changing the position of the top of the bracket.

According to a fine tuning test device for a semiconductor chip provided by the prior patent CN208172167U, the fine tuning test device comprises a bracket base, a middle fixed block, a top supporting device, an up-down fine tuning device and a left-right fine tuning device, wherein the middle fixed block can be arranged on the bracket base in an up-down moving manner, and the top supporting device is arranged at the upper part of the middle fixed block and can move left and right relative to the middle fixed block; the upper fine adjustment device and the lower fine adjustment device are arranged on the bracket base and the middle fixing block, and the left fine adjustment device and the right fine adjustment device are arranged on the middle fixing block and the top supporting device. Wherein because test the back many times, wearing and tearing can appear in the inside pin of socket to cause the junction contact failure of socket and chip easily, just need change the socket this moment, this current device can not make things convenient for people to change the socket. Therefore, a chip fine-tuning test device is provided.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a chip fine setting testing arrangement to solve the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a chip fine setting testing arrangement, is including examining test table, one side of examining test table upper surface is fixed with first fine-tuning, the top of first fine-tuning is fixed with second fine-tuning, the socket is installed at the top of second fine-tuning, the top of second fine-tuning is fixed with the dismouting mechanism that is used for fixed socket, the top of examining test table is provided with the CCD camera, one side that the top of examining test table is close to the CCD camera is fixed with the slewing mechanism who is used for rotating the CCD camera.

Preferably, the first fine adjustment mechanism comprises a first slide rail, a first slide bar, a first moving plate, a first linear motor, a second slide rail, a second slide bar, a second moving plate and a second linear motor, first slide rails are symmetrically fixed on one side of the upper surface of the detection table, first slide bars are connected to the outer walls of the first slide rails in a sliding manner, a first moving plate is fixed on the tops of the two first slide bars, a first linear motor is fixed on one side of the upper surface of the detection table close to the first moving plate, the first moving plate is fixed with the moving end of the first linear motor, second slide rails are symmetrically fixed at the top of the first moving plate, second slide bars are connected on the outer walls of the second slide rails in a sliding manner, a second moving plate is fixed at the tops of the two second slide bars, and a second linear motor is fixed in the middle of the upper surface of the first moving plate, and the second moving plate is fixed with the moving end of the second linear motor.

Preferably, the second fine adjustment mechanism comprises a connecting frame, a rotating plate and a first servo motor, the connecting frame is fixed to the top of the second moving plate, the rotating plate is connected to the top of the connecting frame in a rotating mode, the first servo motor is fixed to the bottom of the connecting frame, and the output end of the first servo motor is fixed to the rotating plate.

Preferably, dismouting mechanism includes installing frame, sliding tray, stopper, draw-in groove, pull rod, pulling block and spring, the middle part of rotor plate upper surface is fixed with the installing frame, the inner wall sliding connection of socket and installing frame, the sliding tray has been seted up at the middle part of installing frame one side, the inner wall sliding connection of sliding tray has the stopper, one side that the stopper is close to the socket is the inclined plane setting, the draw-in groove has been seted up to the position that one side that the socket is close to the stopper corresponds the stopper, stopper and draw-in groove joint, one side that the stopper kept away from the draw-in groove is fixed with the pull rod, the pull rod passes through slide opening and installing frame sliding connection, the one end that the stopper was kept away from to the pull rod is fixed with the pulling block, the one end that the stopper is close to the stopper is fixed with the spring, the one end that the stopper was kept away from to the spring is fixed with the inner wall of sliding tray.

Preferably, the top of the connecting frame is fixed with an annular slide rail, the outer wall of the rotating plate is provided with an annular sliding groove, and the annular slide rail is rotatably connected with the inner wall of the annular sliding groove.

Preferably, slewing mechanism includes support column, pivot, connecting rod and second servo motor, it is fixed with the support column to examine one side that the socket was kept away from on the bench top, the upper end of support column is rotated through the bearing and is connected with the pivot, one side of pivot is fixed with the connecting rod, the connecting rod is fixed with the CCD camera, the bottom that the upper end of support column is located the pivot is fixed with second servo motor, the bottom of pivot is fixed with second servo motor's output.

Preferably, the bottom of the detection platform is symmetrically fixed with ear plates.

Preferably, the surface of the pulling block is provided with anti-skid grains.

Preferably, the inner wall of the mounting frame is provided with a chamfer.

Preferably, the bottom of the supporting column is symmetrically fixed with reinforcing ribs, and the reinforcing ribs are fixed with the detection table.

Compared with the prior art, the beneficial effects of the utility model are that:

1. the utility model discloses a CCD camera that sets up can be convenient for carry out the coordinate calibration to the position of chip when the chip is impressed, and then send the coordinate to the controller, be convenient for through the first linear electric motor of controller control, second linear electric motor and first servo motor function, thereby adjust the position of socket, make it can be corresponding with the chip position, thereby can guarantee the accurate socket of impressing of chip in, and can guarantee through the second linear electric motor who sets up that the CCD camera can follow the socket top after the location and remove.

2. The utility model discloses a second fine-tuning that sets up can be convenient for adjust the angle of socket to after its position corresponds well with the chip, can further adjust its angle, thereby can guarantee that its angle is corresponding with the chip, further improvement the chip degree of accuracy of impressing the socket.

3. The utility model discloses a dismouting mechanism that sets up can be convenient for people's dismouting socket to after the socket overuse, when its pin takes place wearing and tearing, make things convenient for people to change the socket, and very big improvement the efficiency of dismouting, made things convenient for people to use.

Drawings

Fig. 1 is a schematic view of the overall structure of the present invention;

fig. 2 is one of the structural schematic diagrams of the first fine adjustment mechanism of the present invention;

fig. 3 is a second schematic structural view of the first fine adjustment mechanism of the present invention;

fig. 4 is a schematic structural view of a second fine adjustment mechanism of the present invention;

fig. 5 is a schematic view of the position structure of the annular slide rail of the present invention;

FIG. 6 is an enlarged view of the point A of the present invention;

FIG. 7 is a schematic structural view of the mounting and dismounting mechanism of the present invention;

FIG. 8 is an enlarged view of the point B of the present invention;

fig. 9 is a second schematic structural view of the mounting and dismounting mechanism of the present invention;

fig. 10 is an enlarged view of the position C of the present invention.

In the figure: 1. a detection table; 2. a first fine adjustment mechanism; 3. a second fine adjustment mechanism; 4. a socket; 5. a disassembly and assembly mechanism; 6. a CCD camera; 7. a rotating mechanism; 8. a first slide rail; 9. a first slide bar; 10. a first moving plate; 11. a first linear motor; 12. a second slide rail; 13. a second slide bar; 14. a second moving plate; 15. a second linear motor; 16. a connecting frame; 17. a rotating plate; 18. a first servo motor; 19. installing a frame; 20. a sliding groove; 21. a limiting block; 22. a card slot; 23. a pull rod; 24. pulling the block; 25. A spring; 26. an annular slide rail; 27. an annular chute; 28. a support pillar; 29. a rotating shaft; 30. a connecting rod; 31. a second servo motor; 32. an ear plate; 33. anti-skid lines; 34. and (5) reinforcing ribs.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1 and 4, the present invention provides a technical solution: the utility model provides a chip fine setting testing arrangement, is including examining test table 1, one side of examining test table 1 upper surface is fixed with first fine-tuning 2, the top of first fine-tuning 2 is fixed with second fine-tuning 3, socket 4 is installed at second fine-tuning 3's top, second fine-tuning 3's top is fixed with dismouting mechanism 5 that is used for fixed socket 4, the top of examining test table 1 is provided with CCD camera 6, one side that the top of examining test table 1 is close to CCD camera 6 is fixed with slewing mechanism 7 that is used for rotating CCD camera 6, and CCD camera 6 through setting up can be more accurate fix a position the position and the angle of chip to can guarantee that socket 4 can be accurate adjust to corresponding with the chip.

Referring to fig. 2 and 3, the first fine adjustment mechanism 2 includes a first slide rail 8, a first slide bar 9, a first moving plate 10, a first linear motor 11, a second slide rail 12, a second slide bar 13, a second moving plate 14 and a second linear motor 15, the first slide rail 8 is symmetrically fixed on one side of the upper surface of the detection table 1, the first slide bar 9 is connected to the outer wall of the first slide rail 8 in a sliding manner, the first moving plate 10 is fixed on the top of the two first slide bars 9, the first linear motor 11 is fixed on one side of the upper surface of the detection table 1 close to the first moving plate 10, the first moving plate 10 is fixed on the moving end of the first linear motor 11, the second slide rail 12 is symmetrically fixed on the top of the first moving plate 10, the second slide bar 13 is connected to the outer wall of the second slide rail 12 in a sliding manner, the second moving plate 14 is fixed on the top of the two second slide bars 13, the second linear motor 15 is fixed in the middle of the upper surface of the first moving plate 10, and the second moving plate 14 is fixed to the moving end of the second linear motor 15, so that the position of the socket 4 can be conveniently adjusted, and the position of the socket 4 is ensured to correspond to the chip.

Referring to fig. 4 and 5, the second fine adjustment mechanism 3 includes a connecting frame 16, a rotating plate 17 and a first servo motor 18, the connecting frame 16 is fixed on the top of the second moving plate 14, the rotating plate 17 is rotatably connected on the top of the connecting frame 16, the first servo motor 18 is fixed on the bottom of the connecting frame 16, and an output end of the first servo motor 18 is fixed to the rotating plate 17, so that the angle of the socket 4 can be conveniently adjusted, the angle of the socket 4 is ensured to correspond to the chip box, and the chip can be accurately pressed into the socket 4.

Referring to fig. 7, 8, 9 and 10, the dismounting mechanism 5 includes a mounting frame 19, a sliding groove 20, a limiting block 21, a clamping groove 22, a pull rod 23, a pulling block 24 and a spring 25, the mounting frame 19 is fixed in the middle of the upper surface of the rotating plate 17, the socket 4 is slidably connected with the inner wall of the mounting frame 19, the sliding groove 20 is formed in the middle of one side of the mounting frame 19, the limiting block 21 is slidably connected with the inner wall of the sliding groove 20, one side of the limiting block 21 close to the socket 4 is arranged in an inclined plane, the clamping groove 22 is formed in the side of the socket 4 close to the limiting block 21 corresponding to the limiting block 21, the limiting block 21 is clamped with the clamping groove 22, the pull rod 23 is fixed on one side of the limiting block 21 far from the clamping groove 22, the pull rod 23 is slidably connected with the mounting frame 19 through a sliding hole, and the pulling block 24 is fixed at one end of the pull rod 23 far from the limiting block 21, and a spring 25 is fixed at one end of the limiting block 21 close to the pull rod 23, and one end of the spring 25 far away from the limiting block 21 is fixed with the inner wall of the sliding groove 20.

Referring to fig. 5 and 6, an annular slide rail 26 is fixed at the top of the connecting frame 16, an annular sliding groove 27 is formed in the outer wall of the rotating plate 17, and the annular slide rail 26 is rotatably connected with the inner wall of the annular sliding groove 27, so that people can replace the socket 4 conveniently, and the dismounting efficiency is greatly improved.

Referring to fig. 3, the rotating mechanism 7 includes a supporting column 28, a rotating shaft 29, a connecting rod 30 and a second servo motor 31, the supporting column 28 is fixed on one side of the top of the detection table 1 away from the socket 4, the upper end of the supporting column 28 is rotatably connected with the rotating shaft 29 through a bearing, the connecting rod 30 is fixed on one side of the rotating shaft 29, the connecting rod 30 is fixed with the CCD camera 6, the second servo motor 31 is fixed on the bottom of the supporting column 28, which is located at the rotating shaft 29, and the bottom of the rotating shaft 29 is fixed with the output end of the second servo motor 31, so that the CCD camera 6 can be conveniently rotated, and the CCD camera 6 cannot block the chip from being pressed in during the chip pressing process.

Referring to fig. 1, the bottom of the test platform 1 is symmetrically fixed with ear plates 32, which can facilitate the fixation of the test platform 1 on a testing machine.

Referring to fig. 8, the surface of the pulling block 24 is provided with anti-slip lines 33, which is convenient for people to pull the pulling block 24.

Referring to fig. 8, the inner wall of the mounting frame 19 is chamfered to facilitate the insertion of the socket 4 into the mounting frame 19.

Referring to fig. 1, reinforcing ribs 34 are symmetrically fixed at the bottom of the supporting column 28, and the reinforcing ribs 34 are fixed to the detection table 1, so that the connection stability of the supporting column 28 and the detection table 1 can be improved.

The working principle is as follows: when the testing machine is used, when a chip is picked up to the top of the detection table 1 by the suction nozzle, the CCD camera 6 carries out coordinate positioning on the chip, the coordinate is transmitted to the controller, the controller controls and drives the first linear motor 11 and the second linear motor 15, so that the first moving plate 10 is driven to slide along the first slide rail 8, the second moving plate 14 moves along the second slide rail 12, the position of the socket 4 is finally driven to correspond to the position of the chip, the first servo motor 18 is driven to rotate, the rotating table is driven to rotate, so that the socket 4 is driven to rotate, the angle of the socket 4 corresponds to the angle of the chip, the position of the socket 4 is finally adjusted to ensure that the chip is accurately pressed in, the chip is pressed into the socket 4 by the testing machine, and the second servo motor 31 is driven to rotate before the chip is pressed in, so that the rotating shaft 29 is driven to rotate, thereby driving the CCD camera 6 to rotate, so that the CCD camera 6 is shifted away from the top of the socket 4, preventing the CCD camera 6 from blocking the chip due to pressing, further carrying out the chip test, when the pins of the socket 4 are worn and cause the inaccuracy of the detection data, the pulling block 24 is pulled to the side far away from the socket 4, thereby driving the pull rod 23 to pull to the side far away from the clamping groove 22, thereby driving the limit block 21 to pull out from the clamping groove 22, further pulling the socket 4 upwards, completing the dismounting work of the socket 4, further loosening the pulling block 24, driving the limit block 21 to reset under the resilience force of the spring 25, after the socket 4 is replaced, aligning the new socket 4 to the mounting frame 19, and one side of the clamping groove 22 is positioned at one side of the limit block 21, further pressing the socket 4 into the mounting frame 19, and extruding the limit block 21 in the pressing process, make stopper 21 slide to the one side of keeping away from socket 4, can extrude spring 25 simultaneously, wait socket 4 and impress back in the installing frame 19 completely, drive stopper 21 and slide into draw-in groove 22 under the effect of spring 25 resilience force for socket 4's position is fixed, thereby accomplishes socket 4's fixed work.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a chip fine setting testing arrangement, is including examining test table (1), its characterized in that: a first fine adjustment mechanism (2) is fixed on one side of the upper surface of the detection table (1), a second fine adjustment mechanism (3) is fixed on the top of the first fine adjustment mechanism (2), a socket (4) is installed on the top of the second fine adjustment mechanism (3), a dismounting mechanism (5) for fixing the socket (4) is fixed on the top of the second fine adjustment mechanism (3), a CCD camera (6) is arranged on the top of the detection table (1), and a rotating mechanism (7) for rotating the CCD camera (6) is fixed on one side, close to the CCD camera (6), of the top of the detection table (1);

the disassembly and assembly mechanism (5) comprises an installation frame (19), a sliding groove (20), a limiting block (21), a clamping groove (22), a pull rod (23), a pulling block (24) and a spring (25), the installation frame (19) is fixed in the middle of the upper surface of the rotating plate (17), the socket (4) is in sliding connection with the inner wall of the installation frame (19), the sliding groove (20) is formed in the middle of one side of the installation frame (19), the limiting block (21) is in sliding connection with the inner wall of the sliding groove (20), one side, close to the socket (4), of the limiting block (21) is arranged in an inclined plane, the clamping groove (22) is formed in one side, close to the limiting block (21), of the socket (4) corresponding to the position of the limiting block (21), the limiting block (21) is connected with the clamping groove (22), the pull rod (23) is fixed on one side, far away from the clamping groove (22), and the pull rod (23) is in sliding connection with the installation frame (19) through a sliding hole, the one end that stopper (21) were kept away from in pull rod (23) is fixed with pulling piece (24), the one end that stopper (21) are close to pull rod (23) is fixed with spring (25), the one end that stopper (21) were kept away from in spring (25) is fixed with the inner wall of sliding tray (20).

2. The chip fine-tuning test device according to claim 1, wherein: the first fine adjustment mechanism (2) comprises a first slide rail (8), a first slide bar (9), a first moving plate (10), a first linear motor (11), a second slide rail (12), a second slide bar (13), a second moving plate (14) and a second linear motor (15), the first slide rail (8) is symmetrically fixed on one side of the upper surface of the detection table (1), the first slide bar (9) is connected to the outer wall of the first slide rail (8) in a sliding manner, the first moving plate (10) is fixed on the tops of the two first slide bars (9), the first linear motor (11) is fixed on one side, close to the first moving plate (10), of the upper surface of the detection table (1), the first moving plate (10) is fixed with the moving end of the first linear motor (11), the second slide rail (12) is symmetrically fixed on the top of the first moving plate (10), and the second slide bar (13) is connected to the outer wall of the second slide rail (12) in a sliding manner, and a second moving plate (14) is fixed at the tops of the two second sliding bars (13), a second linear motor (15) is fixed in the middle of the upper surface of the first moving plate (10), and the moving ends of the second moving plate (14) and the second linear motor (15) are fixed.

3. The chip fine-tuning test device according to claim 2, wherein: the second fine adjustment mechanism (3) comprises a connecting frame (16), a rotating plate (17) and a first servo motor (18), the connecting frame (16) is fixed to the top of the second moving plate (14), the rotating plate (17) is connected to the top of the connecting frame (16) in a rotating mode, the first servo motor (18) is fixed to the bottom of the connecting frame (16), and the output end of the first servo motor (18) is fixed to the rotating plate (17).

4. The device for trimming and testing the chip according to claim 3, wherein: the top of link (16) is fixed with annular slide rail (26), annular spout (27) have been seted up to the outer wall of rotor plate (17), annular slide rail (26) rotates with the inner wall of annular spout (27) and is connected.

5. The chip fine-tuning test device according to claim 1, wherein: slewing mechanism (7) are including support column (28), pivot (29), connecting rod (30) and second servo motor (31), it is fixed with support column (28) to detect one side that socket (4) were kept away from on platform (1) top, the upper end of support column (28) is rotated through the bearing and is connected with pivot (29), one side of pivot (29) is fixed with connecting rod (30), connecting rod (30) are fixed with CCD camera (6), the bottom that the upper end of support column (28) is located pivot (29) is fixed with second servo motor (31), the bottom of pivot (29) is fixed with the output of second servo motor (31).

6. The chip fine-tuning test device according to claim 1, wherein: the bottom of the detection table (1) is symmetrically fixed with ear plates (32).

7. The chip fine-tuning test device according to claim 1, wherein: the surface of the pulling block (24) is provided with anti-skid grains (33).

8. The chip fine-tuning test device according to claim 1, wherein: the inner wall of the mounting frame (19) is provided with a chamfer.

9. The device for trimming and testing the chip according to claim 5, wherein: the bottom symmetry of support column (28) is fixed with strengthening rib (34), strengthening rib (34) are fixed with detecting platform (1).