CN214503410U - Mask type backlight source of transparent panel flaw detection equipment - Google Patents
Mask type backlight source of transparent panel flaw detection equipment Download PDFInfo
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- CN214503410U CN214503410U CN202120724921.8U CN202120724921U CN214503410U CN 214503410 U CN214503410 U CN 214503410U CN 202120724921 U CN202120724921 U CN 202120724921U CN 214503410 U CN214503410 U CN 214503410U
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- transparent panel
- substrate
- light emitting
- top substrate
- emitting diode
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Abstract
The utility model provides a mask type backlight source of a transparent panel flaw detection device, which comprises a top substrate and a bottom substrate, wherein the top substrate and the bottom substrate are arranged in parallel, a plurality of diffusion column sleeves are arranged between the top substrate and the bottom substrate, and each diffusion column sleeve is internally provided with a light-emitting diode; the LED comprises a top substrate, a bottom substrate, a light emitting diode and a light emitting diode, wherein a first black coating is arranged on the upper surface of the top substrate, a second black coating is arranged on the upper surface of the bottom substrate, and the light emitting diode is positioned between the top substrate and the second black coating. The mask type backlight light source of the transparent panel flaw detection device can solve the problem that a flare or a bright background is formed due to the fact that the light source faces the camera in the transparent panel flaw detection through the structure.
Description
Technical Field
The utility model relates to a transparent panel flaw check out test set's mask formula light source in a poor light belongs to panel processing trade, relates to the flaw and detects.
Background
At present, when detecting flaws on a transparent panel, a multi-angle arrangement of light sources is usually selected, which includes transmissive light sources, which are arranged on two sides of the transparent panel separately from a camera. However, the transmissive light source may directly illuminate the camera, creating a flare or bright background which is detrimental to detecting defects on the panel.
Therefore, there is a need to design a new mask-type backlight source for a transparent panel defect detecting apparatus to overcome the above problems.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to overcome prior art's defect, provide a transparent panel flaw check out test set's mask formula light source in a poor light, can solve in the transparent panel flaw detects because of the problem that the light source formed the flare or bright background in the face of the camera.
The utility model discloses a realize like this:
the utility model provides a mask type backlight source of a transparent panel flaw detection device, which comprises a top substrate and a bottom substrate, wherein the top substrate and the bottom substrate are arranged in parallel, a plurality of diffusion column sleeves are arranged between the top substrate and the bottom substrate, and each diffusion column sleeve is internally provided with a light-emitting diode;
the LED comprises a top substrate, a bottom substrate, a light emitting diode and a light emitting diode, wherein a first black coating is arranged on the upper surface of the top substrate, a second black coating is arranged on the upper surface of the bottom substrate, and the light emitting diode is positioned between the top substrate and the second black coating.
Furthermore, a plurality of first black coatings are arranged on the upper surface of the top substrate, the number of the first black coatings is the same as that of the light-emitting diodes, and the first black coatings cover the light-emitting diodes right above the first black coatings.
Further, a plurality of the light emitting diodes are arranged in a matrix.
Furthermore, the bottom substrate is a circuit board, and the light emitting diode is electrically connected with the circuit board.
Further, the second black coating covers the upper surface of the bottom substrate.
Further, the top substrate is a transparent substrate.
The utility model discloses following beneficial effect has:
the upper surface of a top substrate of a mask type backlight source of the transparent panel flaw detection equipment is provided with a first black coating, and the first black coating can prevent light rays emitted by a light emitting diode from directly entering a camera to form flare or a bright background; the second black coating arranged on the upper surface of the bottom substrate is a dark background in the visual field of the camera and is used for highlighting the illuminated flaws on the transparent panel to be detected; the mask type backlight light source of the transparent panel flaw detection device can solve the problem that a flare or a bright background is formed due to the fact that the light source faces the camera in the transparent panel flaw detection through the structure, and meanwhile, the detection accuracy can be improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a schematic structural diagram of a mask type backlight source of a transparent panel defect detection apparatus according to an embodiment of the present invention;
fig. 2 is a cross-sectional view of a mask type backlight source of a transparent panel flaw detection apparatus provided in an embodiment of the present invention;
fig. 3 is a schematic view of a mask type backlight source of a transparent panel flaw detection apparatus provided by an embodiment of the present invention in an operating state.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
In the description of the present embodiment, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, or orientations or positional relationships which are conventionally placed when the products of the present invention are used, and are only for convenience of describing the present invention and simplifying the description, but do not indicate or imply that the device or element to be referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
Furthermore, the terms "horizontal", "vertical", "overhang" and the like do not imply that the components are required to be absolutely horizontal or overhang, but may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.
In the description of the present embodiment, it should also be noted that, unless explicitly stated or limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in this particular embodiment may be specifically understood by those of ordinary skill in the art.
As shown in fig. 1 to 3, the utility model provides a transparent panel flaw detection equipment's mask formula backlight 300, transparent panel flaw detection equipment's mask formula backlight 300 is located and waits to detect the downside of flaw transparent panel 200, and camera 100 then is located and waits to detect the upside of flaw transparent panel 200.
As shown in fig. 1 to 3, the mask type backlight source 300 of the transparent panel defect detecting apparatus includes a top substrate 1 and a bottom substrate 3, where the top substrate 1 is a transparent substrate; the bottom substrate 3 is a circuit board. The top substrate 1 and the bottom substrate 3 are arranged in parallel, a plurality of diffusion column sleeves 6 are arranged between the top substrate 1 and the bottom substrate 3, and each diffusion column sleeve 6 is internally provided with a light-emitting diode 5; the diffusing column sleeve 6 wraps the light emitting diode 5 therein, so that the light emitted by the light emitting diode 5 is more uniform in all directions.
As shown in fig. 1 to 3, a first black coating 2 is disposed on the upper surface of the top substrate 1, and the first black coating 2 is directly printed on the upper surface of the transparent top substrate 1 to form a mask; in the preferred embodiment, a plurality of first black coating layers 2 are disposed on the upper surface of the top substrate 1, the number of the first black coating layers 2 is the same as that of the light emitting diodes 5, and the first black coating layers 2 cover right above the light emitting diodes 5. Namely, one first black coating 2 is arranged right above each light emitting diode 5, and a space between two adjacent first black coatings 2 is blank, and only the top substrate 1 is arranged. The first black coating 2 can prevent the light emitted from the light emitting diode 5 from directly entering the camera 100 to form flare or bright background. The function and function of the mask is well within the skill of those in the art and will not be described in detail herein.
As shown in fig. 1 to 3, the upper surface of the bottom substrate 3 is provided with a second black coating 4, and the light emitting diode 5 is located between the top substrate 1 and the second black coating 4. The second black coating 4 covers the upper surface of the bottom substrate 3. That is, the second black coating layer 4 completely covers the upper surface of the base substrate 3. The second black coating 4 disposed on the upper surface of the bottom substrate 3 is a dark background in the field of view of the camera 100, and is used to highlight the illuminated flaws on the transparent panel 200 to be detected, so that the detection accuracy can be improved. The second black coating 4 is a light absorption coating layer, which can make the background in the field of view of the camera 100 as dark as possible and make the flaws on the transparent panel 200 to be detected bright.
In the preferred embodiment, a plurality of the light emitting diodes 5 are arranged in a matrix, and a plurality of the corresponding first black coatings 2 are also arranged in a matrix. The light emitting diode 5 is electrically connected with the circuit board, and the circuit board is used for controlling the on-off condition of the light emitting diode 5; preferably, the circuit board can control the light emitting diodes 5 in groups. The light emitting diode 5 is a light source, and the color and the wavelength band of the light source are selected according to the requirements of practical application.
The utility model discloses a mode of mask (first black coating 2) shelters from the light of directive camera 100 in the light source, nevertheless keeps the light of other directions to make the background dark as far as possible with the help of extinction coating (second black coating 4), and make and wait to detect the flaw on the flaw transparent panel 200 bright. In addition, the light emitting diodes 5 are controlled to be switched in a grouping mode, when the camera 100 scans and photographs the transparent panel 200 to be detected with flaws along the track, the light source which may be caused is dynamically switched off, and more necessary light sources are dynamically switched on. Finally, the light emitted by the light source does not enter the camera 100, but more light sources are lightened as much as possible to form a multi-angle light field.
In summary, the upper surface of the top substrate 1 of the mask type backlight source 300 of the transparent panel defect detection apparatus is provided with the first black coating 2, and the first black coating 2 can prevent light emitted by the light emitting diode 5 from directly entering the camera to form a flare or a bright background; the second black coating 4 arranged on the upper surface of the bottom substrate 3 is a dark background in the visual field of the camera and is used for highlighting the illuminated flaws; the mask type backlight light source of the transparent panel flaw detection device can solve the problem that a flare or a bright background is formed due to the fact that the light source faces the camera in the transparent panel flaw detection through the structure, and meanwhile, the detection accuracy can be improved.
The above description is only a preferred embodiment of the present invention, and should not be taken as limiting the invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (6)
1. A mask type backlight source of a transparent panel flaw detection device is characterized by comprising a top substrate and a bottom substrate, wherein the top substrate and the bottom substrate are arranged in parallel, a plurality of diffusion column sleeves are arranged between the top substrate and the bottom substrate, and each diffusion column sleeve is internally provided with a light emitting diode;
the LED comprises a top substrate, a bottom substrate, a light emitting diode and a light emitting diode, wherein a first black coating is arranged on the upper surface of the top substrate, a second black coating is arranged on the upper surface of the bottom substrate, and the light emitting diode is positioned between the top substrate and the second black coating.
2. The masked backlight source of a transparent panel defect inspection apparatus of claim 1, wherein: the upper surface of the top substrate is provided with a plurality of first black coatings, the number of the first black coatings is the same as that of the light-emitting diodes, and the first black coatings cover the light-emitting diodes right above.
3. A masked backlight source of a transparent panel defect inspection apparatus according to claim 1 or 2, wherein: the plurality of light emitting diodes are arranged in a matrix.
4. The masked backlight source of a transparent panel defect inspection apparatus of claim 1, wherein: the bottom substrate is a circuit board, and the light emitting diode is electrically connected with the circuit board.
5. The masked backlight source of a transparent panel defect inspection apparatus of claim 1, wherein: the second black coating covers the upper surface of the bottom substrate.
6. The masked backlight source of a transparent panel defect inspection apparatus of claim 1, wherein: the top substrate is a transparent substrate.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2021207079043 | 2021-04-08 | ||
| CN202120707904 | 2021-04-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214503410U true CN214503410U (en) | 2021-10-26 |
Family
ID=78202396
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202120724921.8U Expired - Fee Related CN214503410U (en) | 2021-04-08 | 2021-04-09 | Mask type backlight source of transparent panel flaw detection equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214503410U (en) |
-
2021
- 2021-04-09 CN CN202120724921.8U patent/CN214503410U/en not_active Expired - Fee Related
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20211026 |
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| CF01 | Termination of patent right due to non-payment of annual fee |