CN214278329U

CN214278329U - Testing jig for flat pin chip diode

Info

Publication number: CN214278329U
Application number: CN202023062609.1U
Authority: CN
Inventors: 万奎
Original assignee: Changzhou Starsea Electronics Co ltd
Current assignee: Changzhou Starsea Electronics Co ltd
Priority date: 2020-12-17
Filing date: 2020-12-17
Publication date: 2021-09-24
Anticipated expiration: 2030-12-17

Abstract

The utility model belongs to the technical field of the diode, concretely relates to testing fixture of flat foot paster diode, including the base, the bracing piece is all installed to the base both sides, has erect the diaphragm between the bracing piece, installs the cylinder in the middle of the diaphragm, and the cylinder bottom is provided with the push rod, the measuring seat is installed to the push rod bottom, and measuring block is installed to measuring seat bottom, and measuring block below is provided with the biography material mechanism, passes the material mechanism including biography material seat, belt, fixed block and locating plate, installs the paster diode in the locating plate, the utility model discloses a setting up of locating plate cooperation ladder groove conveniently carries out joint and location to the paster diode, and vacuum generator further realizes adsorbing fixedly simultaneously, through measuring block and the measuring probe of belt conveying cooperation liftable, effectively improves efficiency of software testing, realizes that the test is automatic.

Description

Testing jig for flat pin chip diode

Technical Field

The utility model belongs to the technical field of the diode, concretely relates to test fixture of flat foot paster diode.

Background

The surface-mounted diode is a surface-packaged semiconductor resistor element, and is an electronic device with unidirectional conduction current. The electronic device has two lead terminals inside a semiconductor diode, and has a unidirectional current transfer characteristic in accordance with the direction of an applied voltage. After the diode is processed, the diode is usually electrically tested. Because the diode volume is less, if detect one by one through the manual work, can make the detection dynamics increase, the cost of labor drops into highly, consequently, the test fixture that the higher convenience of degree of automation detected carries out automated inspection to the diode urgently needed.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a can improve detection efficiency and convenient testing fixture to diode location's flat foot paster diode.

The utility model provides a following technical scheme:

a testing jig for a flat-pin chip diode comprises a base, wherein supporting rods are mounted on two sides of the base, a transverse plate is erected between the supporting rods, an air cylinder is mounted in the middle of the transverse plate, a push rod is arranged at the bottom of the air cylinder, a measuring seat is mounted at the bottom of the push rod, a measuring block is mounted at the bottom of the measuring seat, and a material conveying mechanism is arranged below the measuring block; pass material mechanism including passing material seat, belt, fixed block and locating plate, pass the material seat and install in the middle of the base, and pass the material seat both sides and all be provided with the belt, be provided with a plurality of fixed blocks on the belt, both sides the locating plate has been erect between the fixed block top, be provided with the ladder groove in the middle of the locating plate, inside joint has the paster diode.

Preferably, a sucker is arranged above the inside of the material conveying seat, a plurality of through holes are formed in the sucker, and a vacuum generator is arranged below the sucker.

Preferably, the belt both ends are provided with the belt pulley, install the controller in the belt pulley of one of them end, and are provided with the recess that holds the belt on the base.

Preferably, install infrared sensor in the measuring block, infrared sensor and controller electric connection, and measuring block bottom is provided with measuring probe.

The utility model has the advantages that: the utility model discloses a setting up of locating plate cooperation ladder groove is convenient to carry out joint and location to the paster diode, and vacuum generator further realizes adsorbing simultaneously fixedly, secondly, through measuring block and the measuring probe of belt conveying cooperation liftable, effectively improves efficiency of software testing, realizes that the test is automatic.

Drawings

Fig. 1 is a front view of a testing jig for a flat-pin chip diode according to the present invention;

fig. 2 is a side view of the testing jig for flat-pin chip diode of the present invention.

The figures are labeled as follows:

1-a base; 2-a support rod; 3-a groove; 4-a belt; 5, fixing blocks; 6-a transverse plate; 7-a measuring seat; 8-a push rod; 9-a cylinder; 10-a measuring block; 11-an infrared sensor; 12-a measurement probe; 13-a material conveying mechanism; 14-a patch diode; 15-positioning a plate; 16-a suction cup; 17-a material conveying seat; 18-a vacuum generator; 19-a controller; 20-pulley.

Detailed Description

The following detailed description of the embodiments of the present invention will be given with reference to the accompanying drawings to make it clear to those skilled in the art how to practice the invention. While the invention has been described in connection with its preferred embodiments, these embodiments are intended to be illustrative, and not to limit the scope of the invention.

Example 1:

with reference to fig. 1-2, the testing jig for the flat-pin chip diode comprises a base 1, wherein supporting rods 2 are mounted on two sides of the base 1, a transverse plate 6 is erected between the supporting rods 2, an air cylinder 9 is mounted in the middle of the transverse plate 6, a push rod 8 is arranged at the bottom of the air cylinder, a measuring seat 7 is mounted at the bottom of the push rod 8, a measuring block 10 is mounted at the bottom of the measuring seat 7, and a material conveying mechanism 13 is arranged below the measuring block 10; pass material mechanism 13 including passing material seat 17, belt 4, fixed block 5 and locating plate 15, pass material seat 17 and install in the middle of base 1, and pass material seat 17 both sides and all be provided with belt 4, be provided with a plurality of fixed blocks 5 on

belt

4, 5 fixed mounting of fixed block are on belt 4, both sides set up locating plate 15 between 5 tops of fixed block, locating plate 15 bottom is provided with the magnetic layer, connects through magnetism and fixes with both sides fixed block 5 to convenient the dismantlement, be provided with the ladder groove in the middle of the locating plate 15 to link up from top to bottom, ladder inslot portion joint has paster diode 14, and the convenience is fixed a position paster diode 14.

A sucker 16 is arranged above the interior of the material conveying seat 17, a plurality of through holes are formed in the sucker 16, a vacuum generator 18 is arranged below the sucker 16, and the surface-mounted diodes 14 in the positioning plate 15 are adsorbed and fixed through the vacuum generator 18; belt pulleys 20 are arranged at two ends of the belt 4, a controller 19 is arranged in the belt pulley 20 at one end, and a groove 3 for accommodating the belt 4 is arranged on the base 1; install infrared sensor 11 in the measurement piece 10,

infrared sensor

11 and 19 electric connection of controller, infrared sensor 11 cooperation controller 19 realize opening the start-stop to belt 4, and measurement piece 10 bottom is provided with measuring probe 12, and measuring probe 12 can test paster diode 14.

The utility model discloses a concrete theory of operation as follows:

during the use, put into the ladder groove of locating plate 15 with paster diode 14, carry out the joint location to paster diode 14 through the ladder groove, and locating plate 15 is fixed on fixed block 5 through the magnetism connection. The motor then rotates the pulley 20 and advances the belt 4, thereby advancing the positioning plate 15. When the positioning plate 15 moves to the lower part of the measuring block 10, the infrared sensor 11 detects the patch diode 14 which is right below, signals are transmitted to the controller 19 of the belt pulley 20, the controller 19 controls the belt 4 to stop transmitting, meanwhile, the vacuum generator 18 is externally connected with a vacuum pump, the patch diode 14 of the positioning plate 15 is adsorbed through the through hole of the sucking disc 16, and further fixing of the patch diode 14 is achieved. The cylinder 9 is then activated and the push rod 8 is pushed so that the measuring foot 7 with the measuring block 10 is lowered until the measuring probe 12 contacts the chip diode 14 and tests it.

After the test is finished, the air cylinder 9 drives the measuring block 10 to ascend, meanwhile, the vacuum generator 18 stops the adsorption operation, the tested surface mounted diodes 14 are not adsorbed any more, and the controller 19 controls the belt 4 to convey forwards again until the next surface mounted diode 14 is tested.

The above description is only a preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any modification and replacement based on the technical solution and inventive concept provided by the present invention should be covered within the protection scope of the present invention.

Claims

1. The utility model provides a flat foot paster diode's test fixture, includes base (1), its characterized in that: the device comprises a base (1), supporting rods (2) are arranged on two sides of the base (1), transverse plates (6) are erected between the supporting rods (2), an air cylinder (9) is arranged in the middle of each transverse plate (6), a push rod (8) is arranged at the bottom of each air cylinder, a measuring seat (7) is arranged at the bottom of each push rod (8), a measuring block (10) is arranged at the bottom of each measuring seat (7), and a material conveying mechanism (13) is arranged below each measuring block (10);

pass material mechanism (13) including passing material seat (17), belt (4), fixed block (5) and locating plate (15), pass material seat (17) and install in the middle of base (1), and pass material seat (17) both sides and all be provided with belt (4), be provided with a plurality of fixed blocks (5) on belt (4), both sides set up locating plate (15) between fixed block (5) top, be provided with the ladder groove in the middle of locating plate (15), inside joint has paster diode (14).

2. The testing fixture of flat-pin chip diode according to claim 1, characterized in that: a sucker (16) is arranged above the inner part of the material conveying seat (17), a plurality of through holes are arranged in the sucker (16), and a vacuum generator (18) is arranged below the sucker (16).

3. The testing fixture of flat-pin chip diode according to claim 1, characterized in that: belt pulleys (20) are arranged at two ends of the belt (4), a controller (19) is installed in the belt pulley (20) at one end, and a groove (3) for accommodating the belt (4) is formed in the base (1).

4. The testing fixture of flat-pin chip diode according to claim 3, characterized in that: install infrared sensor (11) in measuring block (10), infrared sensor (11) and controller (19) electric connection, and measuring block (10) bottom is provided with measuring probe (12).