CN214278241U - General type test fixture - Google Patents
General type test fixture Download PDFInfo
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- CN214278241U CN214278241U CN202023084780.2U CN202023084780U CN214278241U CN 214278241 U CN214278241 U CN 214278241U CN 202023084780 U CN202023084780 U CN 202023084780U CN 214278241 U CN214278241 U CN 214278241U
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Abstract
The utility model discloses a universal test fixture, which comprises a base, wherein a placing groove is arranged inside the base, one end of the placing groove is provided with a fixed block, a first conductive contact piece is arranged on the fixed block, the other end of the placing groove is provided with a moving block, a second conductive contact piece is arranged on the moving block, the side surface of the base is provided with a moving component, the moving component is in transmission connection with the moving block and controls the moving block to move in the placing groove, the base is also provided with a connecting terminal, the number of the connecting terminal is consistent with the sum of the number of the first conductive contact piece and the second conductive contact piece, and the connecting terminal is electrically connected with each first conductive contact piece and each second conductive contact piece one by one, in the universal test fixture, a chip is arranged in the placing groove, the moving component controls the moving block to move to fixedly clamp chips with different sizes, and then the first conductive contact piece and the second conductive contact piece are electrically connected with different chips, the wiring terminal is connected with external detection equipment for detection and test, so that the universality of the test fixture is improved.
Description
Technical Field
The utility model relates to a power electronic production auxiliary assembly technical field, concretely relates to general type test fixture.
Background
In the production process of the power electronic chip, manual sampling is needed, at the moment, each end of the chip needs to be electrically connected, and then electrical performance detection is carried out. However, in the process of sampling detection, the chip types are different and the sizes are different, and if the detection is simply carried out through a clamp, the problems of unreliable contact and the like exist.
In summary, the following steps: a universal test fixture is designed.
SUMMERY OF THE UTILITY MODEL
The utility model discloses an overcome foretell not enough, provide a general type test fixture.
The utility model discloses a following technical scheme realizes above-mentioned purpose:
the utility model provides a general type test fixture, which comprises a base, the inside of base is equipped with the standing groove, the one end of standing groove is equipped with the fixed block, be equipped with first conductive contact piece on the fixed block, the other end of standing groove is equipped with the movable block, be equipped with second conductive contact piece on the movable block, the side of base is equipped with the removal subassembly, the removal subassembly is connected with the movable block transmission and removes the subassembly control movable block and remove in the standing groove, still be equipped with binding post on the base, binding post's quantity is unanimous with the quantity sum of first conductive contact piece and second conductive contact piece, and binding post is connected with each first conductive contact piece and second conductive contact piece one-to-one electricity.
Preferably, the moving assembly comprises a screw, a rotary table, a moving groove and a sliding block, the moving groove is located on the base and parallel to the placing groove, the sliding block is located in the moving groove, the sliding block penetrates through a groove in the groove wall of the moving groove and is connected with the moving block, the screw penetrates through the moving groove and is in threaded connection with the sliding block, and the rotary table is located outside the base and fixed at the end of the screw.
Preferably, the side of the base is provided with a display board, the sliding block is provided with a pointer, and the end of the pointer is positioned above the display board.
Preferably, the first conductive contact pieces are located on the inner side and below the fixed block, and the second conductive contact pieces are located on the inner side and below the moving block.
Preferably, the fixed block is in threaded connection with the base, the number of the first conductive contact pieces on the fixed block is greater than or equal to 1, and the number of the second conductive contact pieces on the moving block is greater than or equal to 1.
The utility model has the advantages that: in this general type test fixture, place the chip in the standing groove, remove the movable block of subassembly control and remove, come to fix the centre gripping to the chip of equidimension not, carry out the electricity by first conductive contact and second conductive contact to different chips again and connect, connect external detection equipment by binding post and detect the test, improved test fixture's commonality.
Drawings
The invention will now be described, by way of example, with reference to the accompanying drawings, in which:
fig. 1 is a schematic structural diagram of the present invention.
In the figure: 1. the display device comprises a base, 2 parts of a fixed block, 3 parts of a first conductive contact piece, 4 parts of a moving block, 5 parts of a second conductive contact piece, 6 parts of a wiring terminal, 7 parts of a screw rod, 8 parts of a rotary table, 9 parts of a sliding block, 10 parts of a pointer, 11 parts of a display board and 12 parts of a moving groove.
Detailed Description
The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic drawings and illustrate the basic structure of the present invention only in a schematic manner, and thus show only the components related to the present invention.
As shown in fig. 1, a general type test fixture, including base 1, the inside of base 1 is equipped with the standing groove, the one end of standing groove is equipped with fixed block 2, be equipped with first conductive contact piece 3 on the fixed block 2, the other end of standing groove is equipped with movable block 4, be equipped with second conductive contact piece 5 on the movable block 4, the side of base 1 is equipped with the removal subassembly, the removal subassembly is connected with the transmission of movable block 4 and the removal subassembly control movable block 4 moves in the standing groove, still be equipped with binding post 6 on the base 1, the quantity of binding post 6 is unanimous with the quantity sum of first conductive contact piece 3 and second conductive contact piece 5, and binding post 6 is connected with each first conductive contact piece 3 and second conductive contact piece 5 electricity one by one.
In this general type test fixture, place the chip in the standing groove, remove subassembly control movable block 4 and remove, come to fix the centre gripping to the chip of equidimension not, carry out the electricity by first conductive contact 3 and second conductive contact 5 again and connect different chips and connect external detection equipment by binding post 6 and detect the test. The device can improve the kind that detects the chip greatly, has improved test fixture's practicality.
Specifically, the moving assembly comprises a screw 7, a rotary table 8, a moving groove 12 and a sliding block 9, the moving groove 12 is located on the base 1 and is parallel to the placing groove, the sliding block 9 is located in the moving groove 12, the sliding block 9 penetrates through a groove in the groove wall of the moving groove 12 and is connected with the moving block 4, the screw 7 penetrates through the moving groove 12, the screw 7 is in threaded connection with the sliding block 9, and the rotary table 8 is located outside the base 1 and is fixed at the end of the screw 7. By rotating the rotary disc 8, the rotary disc 8 can control the sliding block 9 to move in the moving groove 12 through the screw 7, and the sliding block 9 can control the moving block 4 to move in the placing groove, so that the distance between the fixed block 2 and the moving block 4 is controlled, the chip is clamped and fixed, and then the detection is carried out.
Specifically, a display board 11 is arranged on the side surface of the base 1, a pointer 10 is arranged on the sliding block 9, the end portion of the pointer 10 is located above the display board 11, various models are written on the display board 11, the pointer 10 is located at a position corresponding to the model, and then the moving block 4 moves to a designated position.
Specifically, the first conductive contact pieces 3 are located on the inner side and below the fixed block 2, and the second conductive contact pieces 5 are located on the inner side and below the moving block 4, so that the first conductive contact pieces 3 and the second conductive contact pieces 5 can be electrically connected no matter whether the contact points of the chips are located on the bottom or the side.
Specifically, the fixed block 2 is in threaded connection with the base 1, the number of the first conductive contact pieces 3 on the fixed block 2 is greater than or equal to 1, the number of the second conductive contact pieces 5 on the moving block 4 is greater than or equal to 1, and the number of the first conductive contact pieces 3 on the fixed block 2 and the number of the second conductive contact pieces 5 on the moving block 4 are controlled according to pins of the chip.
In light of the above, the present invention is not limited to the above embodiments, and various changes and modifications can be made by the worker without departing from the scope of the present invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.
Claims (5)
1. The utility model provides a general type test fixture which characterized in that: the novel electric soldering iron comprises a base, a placing groove is formed in the base, a fixed block is arranged at one end of the placing groove, a first conductive contact piece is arranged on the fixed block, a moving block is arranged at the other end of the placing groove, a second conductive contact piece is arranged on the moving block, a moving assembly is arranged on the side face of the base, the moving assembly is in transmission connection with the moving block and controls the moving block to move in the placing groove, a wiring terminal is further arranged on the base, the number of the wiring terminal is consistent with the sum of the number of the first conductive contact pieces and the number of the second conductive contact pieces, and the wiring terminal is electrically connected with the first conductive contact pieces and the second conductive contact pieces one by one.
2. The universal test fixture of claim 1, wherein: the moving assembly comprises a screw, a rotary table, a moving groove and a sliding block, the moving groove is located on the base and parallel to the placing groove, the sliding block is located in the moving groove, the sliding block penetrates through a groove in the groove wall of the moving groove to be connected with the moving block, the screw penetrates through the moving groove and is in threaded connection with the sliding block, and the rotary table is located outside the base and fixed at the end of the screw.
3. The universal test fixture of claim 2, wherein: the side of base is equipped with a show board, is equipped with a pointer on the slider, and the tip of pointer is located the top of show board.
4. The universal test fixture of claim 1, wherein: the first conductive contact pieces are located on the inner side and the lower portion of the fixed block, and the second conductive contact pieces are located on the inner side and the lower portion of the moving block.
5. The universal test fixture of claim 1, wherein: the fixed block is in threaded connection with the base, the number of the first conductive contact pieces on the fixed block is larger than or equal to 1, and the number of the second conductive contact pieces on the moving block is larger than or equal to 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023084780.2U CN214278241U (en) | 2020-12-18 | 2020-12-18 | General type test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202023084780.2U CN214278241U (en) | 2020-12-18 | 2020-12-18 | General type test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN214278241U true CN214278241U (en) | 2021-09-24 |
Family
ID=77799995
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202023084780.2U Active CN214278241U (en) | 2020-12-18 | 2020-12-18 | General type test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN214278241U (en) |
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2020
- 2020-12-18 CN CN202023084780.2U patent/CN214278241U/en active Active
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