CN214262834U - Testing device and sorting machine - Google Patents

Abstract

The utility model provides a testing device and a sorting machine, which relate to the technical field of sorting equipment, wherein the testing device comprises a testing seat, a testing piece and a distance measuring sensor; the test seat is provided with a containing cavity for placing a product to be tested; the test piece can move relative to the test seat and test a product to be tested placed in the cavity; the distance measuring sensor is positioned above the containing cavity and used for collecting distance information between the distance measuring sensor and the containing cavity and comparing the distance information with preset distance information to obtain whether residues exist in the containing cavity or not. The sorter includes a testing device. Through this testing arrangement, the sorter that has alleviated among the prior art has the higher technical problem of the configuration requirement of camera and test system thereof.

Description

Testing device and sorting machine

Technical Field

The utility model belongs to the technical field of sorting facilities technique and specifically relates to a testing arrangement and sorter are related to.

Background

Take a handler for testing semiconductor devices as an example. In the prior art, a test socket of a handler for testing semiconductor devices is electrically connected to a tester. When the semiconductor element testing device works, the material carrying device of the sorting machine transfers the semiconductor elements to the feeding position, the testing arm takes away the semiconductor elements from the feeding position, and the semiconductor elements are tested on the testing seat. After the test arm completes the test work on the semiconductor element, the semiconductor element is taken away and put into the material discharging position, and the semiconductor device is removed by the test arm. At this time, the related parts may be faulty, so that the semiconductor devices remain in the cavity of the test socket, and when new semiconductor devices are sent to the test socket for testing, stacking may occur, which may affect the testing effect, or even damage the semiconductor devices and the test socket.

In order to prevent the above phenomena, the prior art adopts a method of sampling by a camera and analyzing photo data to determine whether there is a residual semiconductor device in a test socket. The semiconductor element is generally small in size, the sorting machine is compact in structure, and light rays in a test seat area are dark, so that the requirements for the configuration of the camera and a test system of the camera are high, the cost of the camera test system is high, and the cost competitiveness of the whole sorting machine is reduced.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a testing arrangement and sorter to alleviate the higher technical problem of sorter requirement to camera and test system's configuration that exists among the prior art.

In a first aspect, the present invention provides a testing device, including: the device comprises a test seat, a test piece and a distance measuring sensor; the test seat is provided with a containing cavity for placing a product to be tested; the test piece can move relative to the test seat and test a product to be tested placed in the cavity; the distance measuring sensor is located above the containing cavity and used for collecting distance information between the distance measuring sensor and the containing cavity and comparing the distance information with preset distance information to obtain whether residues exist in the containing cavity or not.

Furthermore, the position of the distance measuring sensor is adjustable, so that a light source point of the distance measuring sensor is located at the center of the accommodating cavity.

Furthermore, an installation seat for installing the distance measuring sensor is arranged above the test seat, and the installation seat comprises a bottom plate and an adjusting block arranged on the bottom plate; the distance measuring sensor is provided with a fixed block, and a position adjusting structure is arranged between the fixed block and the adjusting block.

Furthermore, the position adjusting structure comprises a circular hole, a waist-shaped hole and a connecting piece arranged between the circular hole and the waist-shaped hole in a penetrating way; one of the fixed block and the adjusting block is provided with the round hole, and the other is provided with the waist-shaped hole.

Furthermore, a plurality of distance measuring sensors are arranged on the bottom plate, the distance measuring sensors are arranged in a matrix form, and correspondingly, the bottom plate is provided with adjusting blocks matched with the distance measuring sensors in number; the bottom plate, the plurality of ranging sensors and the plurality of adjusting blocks form a testing module; the chamber is a plurality of and adopts the matrix to arrange, the quantity of test module with the quantity phase-match that holds the chamber.

Furthermore, the test modules are at least two groups, and a space for the test piece to move is reserved between every two adjacent test modules.

Furthermore, the containing cavity and the ranging sensor are both multiple, the containing cavity and the ranging sensor are equal in number and correspond to each other in position one by one.

Furthermore, it is a plurality of the appearance chamber all adopts the matrix to arrange with a plurality of range finding sensor.

Furthermore, two sides of the test seat are respectively provided with a material loading assembly, and the material loading assembly comprises a feeding plate and a discharging plate which move back and forth along a first direction; the test pieces are arranged corresponding to the material loading assembly and used for enabling products to be tested to be transferred among the corresponding feeding plate, the discharging plate and the containing cavity.

Has the advantages that:

the utility model provides a testing device, the test seat is provided with the containing cavity, when in use, a product to be tested can be placed in the containing cavity, meanwhile, a testing piece can move relative to the test seat, and the product to be tested placed in the containing cavity can be tested; the distance measuring sensor can collect the distance information between the distance measuring sensor and the containing cavity, when the distance information does not reach the preset distance information, the fact that residues exist in the containing cavity is indicated, at the moment, the residues can be taken out and then the product to be measured is placed, and therefore the product to be measured and the test base are prevented from being damaged; when the distance information reaches the preset distance information, it indicates that no residue exists in the cavity, and at the moment, the next product to be tested can be placed and the test can be continued.

According to the test device, the information of whether the residue exists in the cavity can be obtained by utilizing the distance measurement principle of the distance measurement sensor, so that the situation that a test piece crushes a product to be tested or the test result is influenced can be reduced; on the other hand, compared with the sampling by adopting a camera in the prior art, the distance measuring sensor has no higher requirement on the light brightness of the cavity, the cost is relatively low, and the cost competitiveness and the market competitive advantage of the whole sorting machine are relatively improved.

In a second aspect, the present invention provides a sorting machine, including: the test device of any of the preceding embodiments.

The utility model provides a sorter includes aforementioned testing arrangement, and wherein, technical advantage and effect that this sorter reached include technical advantage and effect that testing arrangement reached equally, and here is no longer repeated.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the technical solutions in the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention;

fig. 2 is a second schematic structural diagram of a testing apparatus according to an embodiment of the present invention;

fig. 3 is a top view of a test socket in a testing apparatus according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of a test module in a test apparatus according to an embodiment of the present invention;

fig. 5 is a second schematic structural diagram of a test module in the test apparatus according to an embodiment of the present invention;

FIG. 6 is a schematic view of the test socket and one of the two loading devices;

FIG. 7 is a second schematic view of the test socket and two loading devices;

fig. 8 is a schematic view of the one-to-one correspondence arrangement of the cavities and cavities in the test seat, the feeding plate, and the discharging plate.

Icon:

100-a test seat; 110-a chamber;

200-a test piece;

300-a ranging sensor;

410-a bottom plate; 420-a regulating block; 430-fixed block; 440-a connector; 421-waist-shaped hole; 431-circular hole;

500-a loading assembly; 510-feeding a plate; 520-discharge plate.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention, as generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the present invention, presented in the accompanying drawings, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate the position or positional relationship based on the position or positional relationship shown in the drawings, or the position or positional relationship which is usually placed when the product of the present invention is used, and are only for convenience of description and simplification of the description, but do not indicate or imply that the device or element referred to must have a specific position, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.

Furthermore, the terms "horizontal", "vertical" and the like do not imply that the components are required to be absolutely horizontal or pendant, but rather may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.

In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Some embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The embodiments described below and the features of the embodiments can be combined with each other without conflict.

The present embodiment provides a testing apparatus, as shown in fig. 1 to 3, the testing apparatus includes a testing socket 100, a testing piece 200 and a distance measuring sensor 300; the test seat 100 is provided with a cavity 110 for placing a product to be tested; the test piece 200 can move relative to the test base 100 and test the product to be tested placed in the cavity 110; the distance measuring sensor 300 is located above the cavity 110, and the distance measuring sensor 300 is used for collecting distance information between the distance measuring sensor 300 and the cavity 110, and comparing the distance information with preset distance information to obtain whether a residue exists in the cavity 110.

In the testing device provided by this embodiment, the cavity 110 is arranged on the testing seat 100, when in use, a product to be tested can be placed in the cavity 110, and meanwhile, the testing piece 200 can move relative to the testing seat 100 and can test the product to be tested placed in the cavity 110; because the distance measuring sensor 300 can collect the distance information between the distance measuring sensor and the cavity 110, when the distance information does not reach the preset distance information, it indicates that there is a residue (for example, a product to be tested or other foreign matters) in the cavity 110, and at this time, the product to be tested can be placed after the residue is taken out, so as to avoid damage to the product to be tested and the test socket 100; when the distance information reaches the preset distance information, it indicates that there is no residue in the cavity 110, and at this time, the next product to be tested may be placed and the test may be continued.

In short, when the cavity 110 is exposed to the distance measuring sensor 300, the cavity 110 has residues, and the distance measuring sensor 300 gives an alarm according to the fact that the measuring distance is within the abnormal range; if there is no residue in the cavity 110, the distance measuring sensor 300 is normal according to the fact that the measuring distance exceeds the abnormal range. If the cavity 110 is blocked by the test piece 200: the distance measuring sensor 300 may still display normal according to the shielding distance exceeding the abnormal range.

As can be seen from the foregoing, the testing device can utilize the distance measuring principle of the distance measuring sensor 300 to obtain the information about whether the residue exists in the cavity 110, on one hand, the occurrence of the situation that the product to be tested is crushed by the testing piece 200 or the testing result is affected can be reduced; on the other hand, compared with the prior art in which a camera is used for sampling, the distance measuring sensor 300 has no higher requirement on the light intensity of the cavity 110, and the cost is relatively low, so that the cost competitiveness and the market competitive advantage of the whole sorting machine are relatively improved. In addition, this testing arrangement can also solve current test zone space limited, and the operation degree of difficulty is higher when installing relevant parts such as camera light source, data line, takes place the technical problem of interference easily, replaces current mode through range finding sensor 300, can reach the effect of the installation of being convenient for.

It should be noted that the product to be tested may be a semiconductor device, and the requirement for the configuration of the camera test system is high when testing a semiconductor device with a small size, and the cost is about one hundred and several tens of thousands. The distance measuring sensor 300 used in the embodiment is low in price, simple in test method, stable in test performance and high in cost performance compared with a camera test system. In addition, when the prior art utilizes the camera to shoot and judges whether there is a semiconductor component in the containing cavity 110, the volume of the camera itself and the structure of the fixed camera occupy a certain part of space, and there is a great structural interference risk, and the volume of the distance measuring sensor 300 used in the embodiment is small, the installation structure is simple and convenient, and the interference risk is small and easy to adjust.

Further, the position of the distance measuring sensor 300 is adjustable, so that the light source point of the distance measuring sensor 300 is located at the center of the cavity 110, thereby ensuring the accuracy of information acquisition of the distance measuring sensor 300.

In this embodiment, as shown in fig. 4, a mounting seat for mounting the distance measuring sensor 300 is disposed above the testing seat 100, and the mounting seat includes a bottom plate 410 and an adjusting block 420 disposed on the bottom plate 410; the distance measuring sensor 300 is provided with a fixed block 430, and a position adjusting structure is arranged between the fixed block 430 and the adjusting block 420.

Optionally, the bottom plate may be a heat insulation plate.

In one embodiment of the present application, please continue to refer to fig. 4, the position adjustment structure includes a circular hole 431, a kidney-shaped hole 421 and a connecting member 440 disposed therebetween; one of the fixing block 430 and the adjusting block 420 is provided with a circular hole 431, and the other is provided with a kidney-shaped hole 421.

Alternatively, the connecting member 440 may be a screw, bolt, screw, or the like.

As shown in fig. 3 and 4, a plurality of distance measuring sensors 300 are arranged on the base plate 410, the plurality of distance measuring sensors 300 are arranged in a matrix, and correspondingly, the base plate 410 is provided with adjusting blocks 420, the number of which is matched with that of the plurality of distance measuring sensors 300; wherein, the bottom plate 410, the plurality of distance measuring sensors 300 and the plurality of adjusting blocks 420 form a testing module; the plurality of cavities 110 are arranged in a matrix manner, and the number of the test modules is matched with that of the cavities 110.

Specifically, the cavities 110 may be distributed in the test socket 100 in an a × B matrix, where a is greater than or equal to 1(a may have a value of 1, 2, or 3.) and B is greater than or equal to 1(B may have a value of 1, 2, or 3.), and correspondingly, the distance measuring sensors 300 are also distributed in an a × B matrix.

Furthermore, the number of the test modules is at least two, and a space for the movement of the test piece 200 is reserved between two adjacent test modules, so that the installation of the distance measuring sensor 300 is facilitated, and when the cavity 110 is increased or decreased by a certain multiple, the corresponding number of test modules can be increased or decreased to adapt to the corresponding number of test modules; through the setting of test module for the dismouting is more convenient.

Illustratively, when the cavities 110 are arranged in a 2 × 4 matrix, as shown in fig. 5, two sets of test modules are required in the present embodiment, and four distance measuring sensors 300 are disposed on each set of test modules to correspond to the cavities 110 in the test socket 100 one by one. The light source point of each distance measuring sensor 300 may be located at the center of the receiving chamber 110 by adjusting the position between the fixing block 430 and the adjusting block 420. Of course, the test modules may be three, four or five groups. Taking four sets of test modules as an example, two distance measuring sensors 300 can be disposed on each set of test modules, and four sets of test modules are required for a 2 × 4 matrix. The number of the test modules and the number of the distance measuring sensors 300 can be adjusted according to the number of the cavities 110.

In other embodiments, a set of test modules may be provided, that is, a set of test modules may be provided with the distance measuring sensors 300 in a number corresponding to the number of the cavities 110.

In addition to the above arrangement, the cavity 110 and the distance measuring sensor 300 are both plural, and the number of the cavity 110 and the distance measuring sensor 300 is equal and the positions thereof are in one-to-one correspondence. The plurality of cavities 110 and the plurality of distance measuring sensors 300 may be arranged in a matrix, but are not limited to the matrix arrangement, and may also be arranged in other ways, for example: annular arrays, semi-annular arrays, etc.

Having described the arrangement of the distance measuring sensors 300 and the arrangement of the test modules, the following description will be made about the test of the test piece 200.

As shown in fig. 6 and 7, the test socket 100 is respectively provided with a loading assembly 500 at both sides thereof, and the loading assembly 500 includes a feeding plate 510 and a discharging plate 520 reciprocating in a first direction; the test pieces 200 are two groups, the test pieces 200 are arranged corresponding to the material loading assembly 500, and the test pieces 200 are used for transferring products to be tested among the corresponding material inlet plate 510, the material outlet plate 520 and the accommodating cavity 110.

It should be noted that the test piece 200 may adopt an existing test arm form, and the test arm can move to the material inlet position and the material outlet position, and can also deliver the product to be tested on the material inlet position to the cavity 110, and can also deliver the product to be tested in the cavity 110 to the material outlet position.

Specifically, when the loading device is at the loading position, the corresponding testing arm can be moved to the loading position, and the semiconductor device on the loading plate 510 is taken away and returned to the testing seat 100 for testing; after the testing is completed, the semiconductor devices can be placed in the discharge position, and the discharge plate 520 can discharge the tested semiconductor devices.

As shown in fig. 6, the feeding plate 510 of the upper loading device is located at a feeding position, and the discharging plate 520 of the lower loading device is located at a discharging position; the semiconductor devices can be placed on the discharge plate 520 by the testing arm corresponding to the lower loading device, and in this process, the semiconductor devices on the feeding plate 510 can be taken away by the testing arm corresponding to the upper loading device, and the semiconductor devices can be placed in the cavities 110 of the testing base 100 for testing.

As shown in fig. 7, after the test of the upper semiconductor device is completed, the discharging plate 520 of the upper loading device is located at the discharging position, and the feeding plate 510 of the lower loading device is located at the feeding position; the semiconductor devices can be placed on the discharge plate 520 by the testing arm corresponding to the upper loading device, and in the process, the semiconductor devices on the feeding plate 510 can be taken away by the testing arm corresponding to the lower loading device, and the semiconductor devices can be placed in the cavities 110 of the testing base 100 for testing.

It should be noted that the material feeding position and the material discharging position corresponding to the material loading device on the same side are the same position, namely, the material loading position is used as the material feeding position to complete material feeding when the material feeding is needed, and otherwise, the material discharging position is used as the material discharging position to complete material discharging when the material discharging is needed.

In this embodiment, the distance measuring capability of the distance measuring sensor 300 is fully utilized, and according to the existence of a semiconductor element in the cavity 110 of the test socket 100 and the distance change caused by the movement of the two test arms, the existence of a residual semiconductor element or other foreign objects in the test socket 100 is checked by utilizing the period of time that the cavity 110 is exposed to the distance measuring sensor 300 before the next test, so as to avoid crushing the semiconductor element or influencing the test result.

In brief, after the test arm completes the test, the test arm is moved to the material discharging position, the test arm finishes taking the semiconductor device at the material feeding position, and in the process of moving to the test socket 100, a certain time interval exists, all the cavities 110 in the a × B matrix of the test socket 100 are exposed, and the corresponding distance measuring sensor 300 can test whether the semiconductor device exists in the cavities 110.

Further, as shown in fig. 8, cavities (the structure of the cavity may be the same as that of the cavity 110) or stations adapted to the cavity 110 on the test socket 100 are respectively disposed on the feeding plate 510 and the discharging plate 520, so as to ensure that the product to be tested can be accurately taken out of or placed into the cavity 110 of the test socket 100 while the product to be tested is taken and placed by the test piece 200 on the feeding plate 510 or the discharging plate 520.

Referring to fig. 8, for example, when the cavities 110 are arranged in a 2 × 4 matrix, two sets of test modules are required to be disposed to form two rows of distance measuring sensors 300, each row includes four distance measuring sensors 300, and correspondingly, cavities or stations of 2X4 are disposed on the feeding plate 510 and the discharging plate 520, respectively, wherein a distance between each row of distance measuring sensors 300 and each column of distance measuring sensors 300 is consistent with a distance between the cavities 110 of 2X 4.

The embodiment also provides a sorting machine, which comprises the testing device; the sorting machine further comprises other devices, and the arrangement of the other devices can refer to the prior art, and is not described in detail herein. The sorting machine provided by the embodiment includes the testing device, wherein the technical advantages and effects achieved by the sorting machine also include the technical advantages and effects achieved by the testing device, and are not described herein again.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.

Claims (10)

1. A test apparatus, comprising: the device comprises a test seat (100), a test piece (200) and a distance measuring sensor (300);

the test seat (100) is provided with a cavity (110) for placing a product to be tested;

the test piece (200) can move relative to the test seat (100) and test a product to be tested placed in the cavity (110);

the distance measuring sensor (300) is located above the accommodating cavity (110), the distance measuring sensor (300) is used for collecting distance information between the distance measuring sensor and the accommodating cavity (110), and whether residues exist in the accommodating cavity (110) is obtained by comparing the distance information with preset distance information.

2. The testing device according to claim 1, wherein the position of the distance measuring sensor (300) is adjustable so that the light source point of the distance measuring sensor (300) is located at the center of the cavity (110).

3. The testing device according to claim 1, wherein a mounting seat for mounting the distance measuring sensor (300) is arranged above the testing seat (100), and the mounting seat comprises a bottom plate (410) and an adjusting block (420) arranged on the bottom plate (410);

a fixed block (430) is arranged on the distance measuring sensor (300), and a position adjusting structure is arranged between the fixed block (430) and the adjusting block (420).

4. The testing device of claim 3, wherein the position adjusting structure comprises a circular hole (431), a kidney-shaped hole (421) and a connecting piece (440) arranged between the circular hole and the kidney-shaped hole;

one of the fixing block (430) and the adjusting block (420) is provided with the circular hole, and the other is provided with the waist-shaped hole (421).

5. The testing device according to claim 3 or 4, characterized in that a plurality of said distance measuring sensors (300) are arranged on said base plate (410), a plurality of said distance measuring sensors (300) are arranged in a matrix form, correspondingly, said base plate (410) is provided with said adjusting blocks (420) in a number adapted to the number of said distance measuring sensors (300); the bottom plate (410), the plurality of distance measuring sensors (300) and the plurality of adjusting blocks (420) form a testing module;

the chamber (110) is a plurality of and adopts the matrix arrangement, the quantity of test module with the quantity phase-match of chamber (110).

6. The test device according to claim 5, wherein the test modules are at least two groups, and a space for the test piece (200) to move is reserved between two adjacent groups of the test modules.

7. The testing device according to any one of claims 1 to 4, characterized in that the housing (110) and the distance measuring sensor (300) are provided in a plurality, equal in number and in one-to-one correspondence in position.

8. The testing device according to claim 7, wherein a plurality of said cavities (110) and a plurality of said distance measuring sensors (300) are arranged in a matrix.

9. The testing device according to any one of claims 1 to 4, wherein the two sides of the testing seat (100) are respectively provided with a loading assembly (500), and the loading assembly (500) comprises a feeding plate (510) and a discharging plate (520) which move back and forth along a first direction;

the test pieces (200) are arranged in two groups, the test pieces (200) and the material loading assembly (500) are arranged correspondingly, and the test pieces (200) are used for enabling products to be tested to be transferred among the corresponding feeding plate (510), the discharging plate (520) and the accommodating cavity (110).

10. A sorter, comprising: the test device of any one of claims 1-9.

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