CN214151703U - Switching device for developing and testing double-interface smart card chip - Google Patents

Abstract

A switching device for developing and testing a double-interface smart card chip comprises a switching board, wherein an adjustable antenna coil part and a contact type testing pin part which are designed in parallel are respectively arranged on the switching board; the adjustable antenna coil part includes: the antenna comprises a contact communication interface conforming to an ISO/IEC 7816 protocol, a contact pad leading-out pin, a coupling antenna implementing ISO/IEC 14443 non-contact communication protocol and a configuration pin used for adjusting the number of turns of the coupling antenna. The utility model discloses with the parallel integrated design of adjustable antenna coil portion and contact test pin portion: when the contact type intelligent card chip is tested and developed, data interaction is carried out through a contact type test pin part; when the non-contact intelligent card chip is tested and developed, data interaction is carried out through the coupling antenna metal coil, two test conditions are met simultaneously, and the test environment does not need to be changed.

Description

Switching device for developing and testing double-interface smart card chip

Technical Field

The utility model relates to a switching device for two interface smart card chip development tests belongs to the technical field that the chip was verified, was developed and test equipment.

Background

Smart cards are generally classified into three types, i.e., contact type smart cards, contactless type smart cards, and dual interface type smart cards, according to the interface. After the chip is designed, a series of tests including a pin test, an internal program execution test, an interface test and the like need to be performed on a sample wafer, and the chip packaging form at this time is not the final intelligent card form, but a large number of internal signals are led out as Bonding pads and then are packaged correspondingly. When the chip under the package is developed and tested, a great obstacle exists in information interaction between the reader and the chip, and especially when non-contact and contact type interface tests are performed, the requirements for using internal test pins and performing communication conforming to ISO/IEC 7816 contact and ISO/IEC 14443 non-contact protocols with the chip are met, and common test equipment cannot adapt to the situation.

Disclosure of Invention

Not enough to prior art, the utility model discloses a switching device for two interface smart card chip development tests. The utility model is suitable for a work such as development, test of contact, non-contact and two interface smart card chips.

The technical scheme of the utility model as follows:

a switching device for developing and testing a double-interface smart card chip is characterized by comprising a switching board, wherein an adjustable antenna coil part and a contact type testing pin part which are designed in parallel are respectively arranged on the switching board; the adjustable antenna coil part includes: the device comprises a contact communication interface conforming to an ISO/IEC 7816 protocol, a contact pad leading-out pin, a coupling antenna specified by implementing an ISO/IEC 14443 non-contact communication protocol and a configuration pin for adjusting the number of turns of the coupling antenna; the coupling antenna is a multi-turn wound metal coil, the line width, the interval and the number of turns of the metal coil can be set by utilizing a configuration pin according to the electrical characteristics of the chip to be tested, and the number of turns of the coupling antenna is adjusted to match the optimal number of turns of the chip to be tested by configuring the configuration pin in the using process; the contact pad lead-out pin: VCC, RST, CLK, NC4, GND, NC6, I/O, and NC8, respectively.

The contact type test pin part comprises a locking base provided with a pin leading-out device and the pin leading-out device.

According to when switching device used, after loading the chip on the keysets, its whole can be regarded as one and have "smart card" of whole functions, can be connected "smart card" and recognizer this moment, passes through during the detection recognizer sends the instruction to "smart card" to carry out the development of system on chip or the test of all kinds of operations of chip inside.

The technical advantages of the utility model reside in that:

the utility model discloses with the parallel integrated design of adjustable antenna coil portion and contact test pin portion:

when the contact type intelligent card chip is tested and developed, data interaction is carried out through a contact type test pin part; when the non-contact intelligent card chip is tested and developed, data interaction is carried out through the coupling antenna metal coil, two test conditions are met simultaneously, and the test environment does not need to be changed. Locking base's pin extraction device can test the development to the chip of different packaging form, different pin numbers, and the variety of test function has been decided in drawing forth of pin:

like DIP, QFN, BGA etc., fix the chip that corresponds in locking base department, all pins of chip are drawn forth by pin extraction means for test to being surveyed the chip:

1) interface tests such as SPI, IIC, GPIO, UART, USB and the like;

2) internal operation tests such as encryption and decryption algorithms, data storage, data reading and the like;

3) the dual-interface card test such as contact communication protocol and non-contact communication protocol test and the test development of the chip internal system such as COS downloading, programming, data processing and the like:

4) the switching device can also be additionally applied to tests of digital processing modules (DSP), special function chips and high-performance chips except for intelligent cards.

Drawings

Fig. 1 is a schematic diagram illustrating a chip module connection of the adapter device according to the present invention;

1-1: the contact type communication interface conforms to the ISO/IEC 7816 protocol and comprises 8 pads;

1-2: a coupling antenna specified by an ISO/IEC 14443 non-contact communication protocol is implemented;

1-3: coupling an antenna terminal pin;

1-4: a pin extraction device;

1-5: locking the base;

1-6: an adjustable antenna coil section;

1-7: a contact test lead portion;

1-8: a configuration pin for adjusting the number of turns of the coupling antenna;

1-9: the contact pad lead-out pin comprises 8 pins, namely VCC, RST, CLK, NC4, GND, NC6, I/O and NC 8;

fig. 2 is a schematic view of an application scenario of the switching device according to the present invention;

fig. 3 is a schematic diagram of the present invention adjusted to a 4-turn antenna;

3-1: a starting end of the second loop antenna;

3-2: the starting end of the third circle of antenna;

3-3: a third turn of antenna termination end;

3-4: the starting end of the fourth turn of antenna;

3-5: a fourth turn of antenna termination end;

3-6: an antenna start terminal contact;

3-7: an antenna termination end contact;

fig. 4 is a schematic diagram of an ISO/IEC 14443 contactless communication antenna of the adaptor device according to the present invention;

fig. 5 is a schematic diagram of pins configured in ISO/IEC 7816 contact communication mode of the adaptor device of the present invention;

FIG. 6 is a schematic diagram of an ISO/IEC 7816 contact pad pin of the adapter device of the present invention;

fig. 7 is a schematic diagram of a pad led out from a PIN of a DIP chip base supporting 48 PINs of the adapter device of the present invention;

fig. 8 is a schematic diagram of a pad led out from a PIN of a DIP chip base supporting 24 PINs of the adapter device of the present invention;

fig. 9 is a schematic diagram of a plurality of preset ground pins of the adapter device according to the present invention;

fig. 10 is a schematic diagram of pad leading-out from a single pin of a DIP chip base of the adapter device.

The specific implementation mode is as follows:

the present invention will be described in detail below with reference to the following examples and drawings, but is not limited thereto.

Examples 1,

As shown in fig. 1, an adapter device for developing and testing a dual-interface smart card chip comprises an adapter plate, and an adjustable antenna coil part 1-6 and a contact test pin part 1-7 which are arranged in parallel on the adapter plate respectively;

the adjustable antenna coil part 1-6 includes: the device comprises a contact communication interface 1-1 which accords with an ISO/IEC 7816 protocol, a contact pad leading-out pin 1-9, a coupling antenna 1-2 which is specified by the implementation of the ISO/IEC 14443 non-contact communication protocol, and a configuration pin 1-8 for adjusting the number of turns of the coupling antenna; contact pad pin 1-9: VCC, RST, CLK, NC4, GND, NC6, I/O, and NC8, respectively; the contact type test pin part 1-7 comprises a locking base 1-5 provided with a pin leading-out device and a pin leading-out device 1-4.

Examples 2,

Referring to fig. 1, as shown in fig. 3-10, an apparatus circuit schematic diagram of a switching apparatus for a dual-interface smart card chip development test is shown, in which an adjustable antenna coil portion includes contact pad outgoing pins 1-4, VCC, RST, CLK, NC4, GND, NC6, I/O and NC8, respectively. Meanwhile, the adjustable antenna coil part comprises a coupling antenna which is made of a plurality of turns of coupling antenna wires and conforms to the ISO/IEC 14443 non-contact communication protocol.

As shown in fig. 3, each loop of the coupled antenna is connected with a pad for adjusting the number of loops, which is a schematic diagram of a 4-loop antenna.

The utility model discloses a concrete application scene is as follows:

as shown in FIG. 2, for an application scene of a switching device for two interface smart card chip development test, in the test development process, send interactive instruction for the recognizer through the host computer, the host computer is connected to recognizer one end, other one end is connected the switching device, the switching device in the two interface chips of the examination development of awaiting measuring of loading. The transmitted instruction is interacted with a double-interface chip carried by the adapter plate through the recognizer, and at the moment, a test instrument can be used for carrying out signal observation, test, voltage filling, data writing and reading and other operations on each pin of the pin leading-out device.

The utility model discloses a two interface smart card test chip of 16PIN DIP encapsulation at first puts into locking base 1-5 with the chip to lock all PINs. At this time, all the pins are led out to the external pad.

And (3) non-contact communication function test: the coupling antenna adjustment pads of the adjustable antenna coil section are connected as shown in fig. 3, showing that the antenna is adjusted to 4 turns, and the antenna coil is set in a closed loop. And placing the adjustable antenna coil part in the non-coupling area of the card reader. At this time, the card reader can perform non-contact communication with the test chip.

Contact communication function test: the contact pad lead-out pins 1-9 are connected to the lead-out devices 1-4 of the DIP chip through DuPont wires, and the switching device is inserted into a contact card slot of a card reader, so that contact communication can be carried out with the DIP chip.

And (4) testing other functions:

by connecting instruments such as an oscilloscope and a logic analyzer to the pin leading-out devices 1 to 4, specific function tests can be performed on other bonding pads of the chip to be tested.

Claims (2)

1. A switching device for developing and testing a double-interface smart card chip is characterized by comprising a switching board, wherein an adjustable antenna coil part and a contact type testing pin part which are designed in parallel are respectively arranged on the switching board;

the adjustable antenna coil part includes: the antenna comprises a contact communication interface conforming to an ISO/IEC 7816 protocol, a contact pad leading-out pin, a coupling antenna implementing ISO/IEC 14443 non-contact communication protocol and a configuration pin used for adjusting the number of turns of the coupling antenna.

2. The adapting device for the development and test of the dual-interface smart card chip as claimed in claim 1, wherein the contact type test pin part comprises a locking base provided with a pin extraction device and the pin extraction device.

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