CN213986642U - Semiconductor static testing device - Google Patents
Semiconductor static testing device Download PDFInfo
- Publication number
- CN213986642U CN213986642U CN202022901988.2U CN202022901988U CN213986642U CN 213986642 U CN213986642 U CN 213986642U CN 202022901988 U CN202022901988 U CN 202022901988U CN 213986642 U CN213986642 U CN 213986642U
- Authority
- CN
- China
- Prior art keywords
- bevel gear
- mounting
- semiconductor
- driving
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to an electrostatic test technical field, concretely relates to semiconductor static testing arrangement, comprises a workbench, one side of workstation is provided with test assembly, test assembly includes that installation mechanism and setting are in the static test rifle at installation mechanism top, the opposite side of workstation still is equipped with feeding mechanism, still be equipped with the controller on the workstation, test assembly, installation mechanism, static test rifle, feeding mechanism all with the controller electricity is connected. Semiconductor static testing arrangement is convenient for realize semi-automatization to the semiconductor and detect to improve detection efficiency.
Description
Technical Field
The utility model relates to an electrostatic test technical field especially relates to a semiconductor electrostatic test device.
Background
Static electricity is a common phenomenon in nature, and mainly refers to the continuous accumulation of charges on an object, when a certain amount of charges are accumulated, and when the charges are close to or in contact with another object without or with different charges, a large amount of charges can be transferred, so that what we say is an electrostatic discharge phenomenon.
With the continuous development of semiconductor technology, more attention is paid to the damage of electrostatic discharge to devices, and the requirement of the antistatic capability of the devices is continuously improved. Therefore, the semiconductor is also required to be subjected to electrostatic testing after the production is completed. At present, for electrostatic testing of semiconductors, the size of a semiconductor device to be tested is different due to different types of the semiconductor device, so that the semiconductor device is generally detected by manually holding an electrostatic tester by hand, errors are large, and the detection efficiency is low.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, an object of the utility model is to provide a semiconductor static testing arrangement, semiconductor static testing arrangement is convenient for realize semi-automatization to the semiconductor and detects to improve detection efficiency.
In order to achieve the technical effects, the utility model adopts the following technical scheme:
the utility model provides a semiconductor static testing arrangement, includes the workstation, one side of workstation is provided with test assembly, test assembly includes installation mechanism and sets up the static test rifle at installation mechanism top, the opposite side of workstation still is equipped with feeding mechanism, still be equipped with the controller on the workstation, test assembly, installation mechanism, static test rifle, feeding mechanism all with the controller electricity is connected.
Furthermore, a first driving assembly for driving the testing assembly to move is arranged between the mounting mechanism and the workbench.
Further, first drive assembly is including setting up installation base on the workstation, first mounting groove has been seted up at the top of installation base, the inside of first mounting groove is equipped with first bevel gear, first bevel gear meshes the second bevel gear of horizontal installation, just first bevel gear's the number of teeth is less than the second bevel gear, the inboard of second bevel gear is equipped with the mounting hole, be equipped with the internal thread on the inner wall of mounting hole, the mounting hole endotheca is equipped with the lifter, the lateral surface of lifter be equipped with the external screw thread that the internal thread matches, the top of lifter with installation mechanism fixed connection, still be equipped with on the workstation and be used for driving the first driving motor of first bevel gear motion.
Further, the installation base is still equipped with a plurality of second mounting grooves around first mounting groove, the inside of second mounting groove is equipped with flexible guide bar, the both ends of flexible guide bar respectively with installation base and installation mechanism fixed connection.
Further, installation mechanism includes the bracing piece, the top of bracing piece is equipped with and is used for right the static test rifle carries out the mounting fixture of centre gripping, still be equipped with between mounting fixture and the bracing piece and be used for the drive the second drive assembly that mounting fixture reciprocated.
Further, the second driving assembly is a servo electric cylinder.
Further, feeding mechanism includes the action wheel and follows the driving wheel, action wheel and follow are provided with conveyor belt horizontally between the driving wheel, conveyor belt's lateral surface interval is equipped with a plurality of storage tanks that are used for placing the semiconductor that awaits measuring uniformly, and the bottom of storage tank is equipped with the through-hole confession the pin of the semiconductor that awaits measuring passes, feeding mechanism is still including setting up conveyor belt inboard be used for with the ground connection sheetmetal of pin contact.
Compared with the prior art, the utility model provides a pair of semiconductor static testing arrangement's beneficial effect does: the installation mechanism capable of ascending and descending is arranged on the workbench and used for installing the static testing gun, the installation base is arranged on the workbench, the first bevel gear and the second bevel gear are installed inside the installation base, the first bevel gear and the second bevel gear are matched to realize lifting of the lifting rod, the technical effect of slightly adjusting the height of the static testing gun is achieved, and the static testing gun is convenient to adapt to testing of semiconductors to be tested in different models and types. And meanwhile, a feeding mechanism is arranged under the static test gun and used for conveying materials, so that the automation degree of the semiconductor static test can be further improved, and the detection efficiency is convenient to improve.
Drawings
Fig. 1 is a schematic view of an overall structure of a semiconductor electrostatic testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic view of an overall structure of a semiconductor electrostatic testing apparatus according to an embodiment of the present invention;
the reference signs are: 10, a workbench, 11, a controller, 20, a mounting base, 21, a first mounting groove, 22, a first bevel gear, 23, a first driving motor, 24, a second bevel gear, 25, a lifting rod, 26, a second mounting groove, 261, a telescopic guide rod, 30, a support rod, 31, a servo electric cylinder, 32, a fixing clamp, 33, an electrostatic testing gun, 41, a driving wheel, 42, a driven wheel, 43, a conveying belt, 44, a containing groove, 45, a through hole, 46 and a grounding metal sheet.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and therefore are only examples, and the protection scope of the present invention is not limited thereby.
As shown in fig. 1-2, the semiconductor static test device provided by this embodiment includes a workbench 10, one side of the workbench 10 is provided with a test component, the test component includes an installation mechanism and a static test gun 33 arranged at the top of the installation mechanism, the other side of the workbench 10 is further provided with a feeding mechanism, the feeding mechanism is used for conveying a semiconductor to be tested to the position under the static test gun 33, the workbench 10 is further provided with a controller 11, and the test component, the installation mechanism, the static test gun 33 and the feeding mechanism are all electrically connected with the controller 11. In specific implementation, the controller 11 controls the feeding mechanism to deliver the semiconductor to be tested to the electrostatic testing gun 33 and send the semiconductor to be tested, and the mounting mechanism drives the electrostatic testing gun 33 to move downwards to realize detection.
In this embodiment, a first driving component for driving the testing component to move relative to the worktable 10 is disposed between the mounting mechanism and the worktable 10, and the first driving component is used for adjusting the height of the mounting mechanism. Specifically, first drive assembly is including setting up installation base 20 on the workstation 10, first mounting groove 21 has been seted up at the top of installation base 20, the inside of first mounting groove 21 is equipped with first bevel gear 22, first bevel gear 22 meshes horizontal installation's second bevel gear 24, just first bevel gear 22's the number of teeth is less than second bevel gear 24, second bevel gear 24's inboard is equipped with the mounting hole, be equipped with the internal thread on the inner wall of mounting hole, the mounting hole endotheca is equipped with lifter 25, the lateral surface of lifter 25 be equipped with the external screw thread that the internal thread matches, lifter 25's top with installation mechanism fixed connection, still be equipped with on the workstation 10 and be used for driving first bevel gear 22 moves first driving motor 23. The installation base 20 is still equipped with a plurality of second mounting grooves 26 around first mounting groove 21, the inside of second mounting groove 26 is equipped with flexible guide bar 261, the both ends of flexible guide bar 261 respectively with installation base 20 and installation mechanism fixed connection. In specific implementation, the controller 11 controls the motor to drive the first bevel gear 22 to move, the second bevel gear 24 is driven by the first bevel gear 22 to rotate and drives the lifting rod 25 to lift through the matching of the internal thread and the external thread, the lifting rod 25 and the telescopic guide post are matched to realize the lifting of the mounting mechanism together, meanwhile, in the process of driving the second bevel gear 24 by the first bevel gear 22, the lifting rod 25 can be lifted slowly, and the height of the static test gun 33 at the top of the mounting mechanism can be adjusted slowly and slightly.
In this embodiment, in order to facilitate static test gun 33 with the semiconductor's that awaits measuring contact, installation mechanism includes bracing piece 30, the bottom of bracing piece 30 with lifter 25 with flexible guide bar 261 fixed connection, the top of bracing piece 30 is equipped with and is used for right static test gun 33 carries out the mounting fixture 32 of centre gripping, mounting fixture 32 can select the anchor clamps commonly used such as chuck or jack catch, plays the fixed action to static test gun 33. Still be equipped with between mounting fixture 32 and the bracing piece 30 and be used for the drive mounting fixture 32 second drive assembly that reciprocates, second drive assembly is used for the drive the static discharge chamber is intermittent type or continuous linear motion in vertical direction to realize detecting with the semiconductor contact that awaits measuring that moves to static test gun 33 below. Specifically, the second driving component is a servo electric cylinder 31 to ensure the control precision.
In this embodiment, the feeding mechanism includes a driving wheel 41 and a driven wheel 42, and a second driving motor for driving the driving wheel 41 is further disposed on the working table 10, and the second driving motor is electrically connected to the control unit. Drive wheel 41 and follow and be provided with conveyor belt 43 horizontally between the driving wheel 42, conveyor belt 43's lateral surface interval is equipped with a plurality of storage tanks 44 that are used for placing the semiconductor that awaits measuring uniformly, the bottom of storage tank 44 is equipped with through-hole 45 confession the pin of the semiconductor that awaits measuring passes, feeding mechanism is still including setting up conveyor belt 43 inboard be used for with the ground connection sheetmetal 46 of pin contact. In specific implementation, the grounding metal sheet 46 needs to be grounded, and then the controller 11 controls the conveying belt 43 to convey the semiconductor to be tested to the position right below the electrostatic testing gun 33, at this time, the pins of the semiconductor to be tested penetrate through the through holes 45 and contact with the metal sheet.
Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art will understand that the present invention can be modified or replaced with other embodiments without departing from the spirit and scope of the present invention, which should be construed as limited only by the appended claims. The technology, shape and construction parts which are not described in detail in the present invention are all known technology.
Claims (7)
1. A semiconductor electrostatic test device is characterized in that: including workstation (10), one side of workstation (10) is provided with the test subassembly, the test subassembly includes installation mechanism and sets up static test rifle (33) at installation mechanism top, the opposite side of workstation (10) still is equipped with feeding mechanism, still be equipped with controller (11) on workstation (10), test subassembly, installation mechanism, static test rifle (33), feeding mechanism all with controller (11) electricity is connected.
2. The electrostatic testing apparatus for semiconductors of claim 1, wherein: and a first driving component for driving the testing component to move is arranged between the mounting mechanism and the workbench (10).
3. A semiconductor electrostatic testing apparatus according to claim 2, wherein: the first driving assembly comprises a mounting base (20) arranged on the workbench (10), the top of the mounting base (20) is provided with a first mounting groove (21), a first bevel gear (22) is arranged inside the first mounting groove (21), the first bevel gear (22) is engaged with a second bevel gear (24) which is horizontally arranged, the number of teeth of the first bevel gear (22) is less than that of the second bevel gear (24), the inner side of the second bevel gear (24) is provided with a mounting hole, the inner wall of the mounting hole is provided with internal threads, a lifting rod (25) is sleeved in the mounting hole, the outer side surface of the lifting rod (25) is provided with an external thread matched with the internal thread, the top of the lifting rod (25) is fixedly connected with the mounting mechanism, the workbench (10) is also provided with a first driving motor (23) for driving the first bevel gear (22) to move.
4. A semiconductor electrostatic testing apparatus according to claim 3, wherein: installation base (20) still are equipped with a plurality of second mounting grooves (26) around first mounting groove (21), the inside of second mounting groove (26) is equipped with flexible guide bar (261), the both ends of flexible guide bar (261) respectively with installation base (20) and installation mechanism fixed connection.
5. The electrostatic testing apparatus for semiconductors of claim 1, wherein: the mounting mechanism comprises a supporting rod (30), the top of the supporting rod (30) is provided with a fixing clamp (32) used for clamping the static testing gun (33), and a second driving assembly used for driving the fixing clamp (32) to move up and down is further arranged between the fixing clamp (32) and the supporting rod (30).
6. The electrostatic testing apparatus for semiconductors of claim 5, wherein: the second driving component is a servo electric cylinder (31).
7. The electrostatic testing apparatus for semiconductors of claim 1, wherein: feeding mechanism includes action wheel (41) and follows driving wheel (42), be provided with conveyor belt (43) horizontally between action wheel (41) and the driven driving wheel (42), the lateral surface interval of conveyor belt (43) is equipped with a plurality of storage tanks (44) that are used for placing the semiconductor that awaits measuring uniformly, and the bottom of storage tank (44) is equipped with through-hole (45) confession the pin of the semiconductor that awaits measuring passes, feeding mechanism is still including setting up conveyor belt (43) inboard be used for with ground connection sheetmetal (46) of pin contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022901988.2U CN213986642U (en) | 2020-12-04 | 2020-12-04 | Semiconductor static testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022901988.2U CN213986642U (en) | 2020-12-04 | 2020-12-04 | Semiconductor static testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213986642U true CN213986642U (en) | 2021-08-17 |
Family
ID=77240193
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022901988.2U Active CN213986642U (en) | 2020-12-04 | 2020-12-04 | Semiconductor static testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213986642U (en) |
-
2020
- 2020-12-04 CN CN202022901988.2U patent/CN213986642U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN211965066U (en) | Visual defect detection equipment | |
| CN107791011B (en) | A kind of full line stud automatic assembly system and method | |
| CN112007868A (en) | Chip capacitor detection equipment | |
| CN104889729A (en) | LED assembling machine | |
| CN109029268B (en) | Mute key verticality height automatic detection machine | |
| CN211877747U (en) | 3D visual detection equipment | |
| CN211707423U (en) | Rotating disc type watch glass lens detector | |
| CN108356841B (en) | Method for carrying photovoltaic module by using manipulator | |
| CN110841929B (en) | Turntable type watch glass lens detector | |
| CN110239953B (en) | Automatic gasket feeding mechanism | |
| CN206050806U (en) | A kind of mechanical hand positions grasping mechanism | |
| CN213986642U (en) | Semiconductor static testing device | |
| CN209387742U (en) | A kind of multistation shell test machine | |
| CN209367340U (en) | A kind of card plug box automatic charging positioning device | |
| CN111137640A (en) | Screen color inspection machine | |
| CN218646205U (en) | Optical lens piece thickness detection device | |
| CN207566469U (en) | The handling equipment of circuit board testing machine | |
| CN216310188U (en) | FLASH wafer automatic detection machine | |
| CN209707846U (en) | Liquid crystal display lights detecting probe seat jacking apparatus | |
| CN208459425U (en) | Automatic detection device | |
| CN210512953U (en) | Full-automatic screw thread go-no go gauge detection equipment | |
| CN109592407B (en) | PCB board self-cleaning and check out test set | |
| CN209905892U (en) | Feeding and discharging device | |
| CN112246693A (en) | Triaxial sensor production equipment with counting and subpackaging functions | |
| CN220323489U (en) | Big cylinder battery DCIR testing arrangement of compatibility |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |