CN213936122U

CN213936122U - Vacuum rotary table of IV tester

Info

Publication number: CN213936122U
Application number: CN202022463508.9U
Authority: CN
Inventors: 李永伟; 陈如龙; 陶龙忠; 杨灼坚; 唐福云; 蔡成; 周其斌; 张政
Original assignee: Jiangsu Runyang Yueda Photovoltaic Technology Co Ltd
Current assignee: Jiangsu Runyang Yueda Photovoltaic Technology Co Ltd
Priority date: 2020-10-30
Filing date: 2020-10-30
Publication date: 2021-08-10
Anticipated expiration: 2030-10-30

Abstract

The invention provides a vacuum turntable of an IV tester, which is characterized by comprising a turntable main body and a support unit, wherein a hollow bearing area is arranged in the middle of the turntable main body, strip-shaped adjusting grooves are arranged on the side edge of the turntable main body, the adjusting grooves are symmetrically arranged on two side edges of the turntable main body, and the support unit is arranged in the adjusting grooves and can move in the adjusting grooves. According to the vacuum turntable, the movable supporting unit is arranged on the turntable main body, the position of the supporting unit is adjusted at any time according to the size of a silicon wafer to meet the supporting function of the silicon wafers of various specifications, so that the vacuum turntable can be compatible with silicon wafer detection of various specifications and sizes, replacement is not needed midway, time and labor cost are saved, and the whole production efficiency of the battery silicon wafer is greatly improved.

Description

Vacuum rotary table of IV tester

Technical Field

The invention belongs to the field of detection, and particularly relates to a vacuum turntable of an IV tester.

Background

The manufacturing of the solar cell needs seven procedures of texturing, diffusion, etching, film coating, screen printing and sintering testing, wherein an IV tester is required to be used for testing the volt-ampere characteristic curve of the silicon wafer in the testing procedure, along with the continuous development of the photovoltaic industry, the silicon wafer size specification is more and more, the 156/166/210 size continuously appears, in the testing process, a vacuum turntable corresponding to the specification can be replaced when different silicon wafer products are tested, the process needs to be stopped, the process is not only tedious, but also wastes time, and the improvement of the production efficiency is not facilitated.

Disclosure of Invention

In view of the above, the invention provides a vacuum turntable of an IV tester, which can adjust the position of a supporting unit at any time according to the size of a bearing silicon wafer by arranging a movable supporting unit on a turntable main body, so as to meet the supporting function of silicon wafers of various specifications, thereby realizing that one vacuum turntable can be compatible with silicon wafer detection of various specifications, and the vacuum turntable does not need to be replaced in midway, saving time and labor cost, and greatly improving the whole production efficiency of battery silicon wafers.

The specific technical scheme of the invention is as follows:

the utility model provides a vacuum rotary table of IV tester, its characterized in that includes revolving stage main part and support element, has seted up the fretwork in the middle of the revolving stage main part and has born the weight of the district, has seted up the strip adjustment tank at the side inner wall of revolving stage main part, the adjustment tank sets up at the both sides limit symmetry of revolving stage main part, the support element sets up in the adjustment tank and can remove in the adjustment tank.

Further, the support unit includes support bar and limit baffle, and the fixed connection of support bar is in limit baffle is middle, and inwards extends to the bearing area by the side of revolving stage main part, limit baffle passes through the setting of nut activity and is in the adjustment tank.

Furthermore, the limiting baffle is provided with sliding grooves which are respectively positioned at two sides of the position of the supporting bar, and the nut is arranged in the sliding grooves and can move in the sliding grooves.

Further, there are 4 support units.

Furthermore, the front end of the supporting bar is provided with a sucker.

Additional aspects and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.

Drawings

FIG. 1 is a schematic structural view of one embodiment of a vacuum turntable of an IV tester according to the present invention;

FIG. 2 is a cross-sectional view taken along A-A of FIG. 1;

FIG. 3 is an enlarged view of B in FIG. 2;

the device comprises a turntable main body 1, a bearing area 2, a support unit 3, an adjusting groove 4, a nut 5, a sliding groove 6, a sucking disc 7, a support bar 30 and a limit baffle 31.

Detailed Description

The embodiments described below with reference to the drawings are illustrative only and should not be construed as limiting the invention.

Referring to fig. 1-3, an embodiment of a vacuum turntable of an IV tester comprises a turntable main body 1 and a supporting unit 3, wherein a hollow bearing area 2 is arranged in the middle of the turntable main body 1, a strip-shaped adjusting groove 4 is arranged on the inner wall of the side edge of the turntable main body 1, the adjusting grooves 4 are symmetrically arranged on the two side edges of the turntable main body 1, and the supporting unit 3 is arranged in the adjusting groove 4 and can move in the adjusting groove 4. In this embodiment, preferably, 4 support units 3 are provided, and are respectively provided in pairs at two sides of the turntable main body 1 for supporting the silicon wafer to be detected placed on the carrying region 2.

Preferably, the supporting unit 3 comprises a supporting bar 30 and a limit baffle 31, the supporting bar 30 is fixedly connected to the middle of the limit baffle 31 and extends inwards from the side edge of the turntable main body 1 to the bearing area 2, and the limit baffle 31 is movably arranged in the adjusting groove 4 through a nut 5. The limiting baffle 31 is provided with sliding grooves 6 which are respectively positioned at two sides of the position of the supporting bar 30, and the nuts 5 are arranged in the sliding grooves 6 and can move in the sliding grooves 6. When detecting the silicon chip size and changing, only need unscrew nut 5, promote limit baffle 31 and remove in the adjustment tank, and then adjusted the position that support bar 30 is located the bearing area 2 to this size that adapts to the back silicon chip of changing, easy and simple to handle need not to change revolving stage main part 1 midway, save time and human cost, greatly improved the whole production efficiency of battery silicon chip.

Preferably, the front end of the supporting strip 30 in the bearing area 2 is provided with a sucker 7 for further fixing the silicon wafer, so as to prevent the silicon wafer from generating position deviation in the detection process.

While specific embodiments of the invention have been described in detail with reference to exemplary embodiments thereof, it should be understood that numerous other modifications and embodiments can be devised by those skilled in the art that will fall within the spirit and scope of the principles of this invention. In particular, reasonable variations and modifications are possible in the component parts and/or arrangements of the subject combination arrangement within the scope of the foregoing disclosure, the drawings and the appended claims without departing from the spirit of the invention. Except variations and modifications in the component parts and/or arrangements, the scope of which is defined by the appended claims and equivalents thereof.

Claims

1. The utility model provides a vacuum rotary table of IV tester, its characterized in that includes revolving stage main part and support element, has seted up the fretwork in the middle of the revolving stage main part and has born the weight of the district, has seted up strip adjustment tank on the side inner wall of revolving stage main part, the adjustment tank sets up at the both sides limit symmetry of revolving stage main part, the support element sets up in the adjustment tank and can remove in the adjustment tank.

2. The IV tester vacuum turntable of claim 1, wherein the support unit comprises a support bar and a limit stop, the support bar is fixedly connected to the middle of the limit stop and extends inwards from the side edge of the turntable body to the bearing area, and the limit stop is movably disposed in the adjustment groove through a nut.

3. The vacuum turntable of claim 2, wherein the limit stops have sliding grooves on them, the limit stops are respectively located on both sides of the support bar, and the nuts are disposed in the sliding grooves and can move in the sliding grooves.

4. The IV tester vacuum turntable of claim 1, wherein there are 4 support units.

5. The IV tester vacuum turntable of claim 2, wherein the support bar is provided with a suction cup at a front end thereof.