CN213903716U

CN213903716U - CAF test device

Info

Publication number: CN213903716U
Application number: CN202022397351.4U
Authority: CN
Inventors: 何清国
Original assignee: Dongguan Itst Technology Co ltd
Current assignee: Dongguan Itst Technology Co ltd
Priority date: 2020-10-26
Filing date: 2020-10-26
Publication date: 2021-08-06
Anticipated expiration: 2030-10-26

Abstract

The utility model discloses a CAF test device, including surveying test panel, the top surface of surveying test panel is provided with multiunit DC power end PIN hole, the inside in DC power end PIN hole is provided with multiunit passageway PIN hole, be provided with the rubber layer between the DC power end PIN hole that corresponds, the inboard that just is located the rubber layer between the adjacent passageway PIN hole is provided with the multiunit test wire, the outside that the outside of test wire just is located the test version is provided with the incubator, the outside surface of incubator and the outside that is located the test wire are provided with the connection socket, the outside surface of connection socket is provided with the high resistance meter, the outside of high resistance meter is provided with the connection plug, the outside surface of surveying test panel is provided with the DC power. The utility model relates to a CAF test device does the independent design to biasing test circuit and high resistance measurement circuit, guarantees that measurement circuit anti-interference ability simplifies measurement operation simultaneously, promotes measurement of efficiency.

Description

CAF test device

Technical Field

The utility model relates to a test device technical field, in particular to CAF test device.

Background

PCBCAF test is simple, but there are many obstacles in carrying on the correct test method, wherein the most important difficult point is that the measurement loop requires high and the measurement process is tedious, the measurement time is long, wherein because the high resistance test is apt to receive the electric interference, the test is under the environment of high temperature and high humidity, and generally there are 100-300 test channels to go on at the same time, reduce the interference of test wire and line in the measurement process, measure the interference of the connecting terminal, and the interference among the test boards, etc., so the design requirement to test wire and connecting terminal type selection and test board is very high; generally, 288 channels can be tested by one incubator at the same time, and the insulation resistance value of each channel needs to be measured independently, since the high resistance measurement needs 60s time to be stable, theoretical calculation for measuring the insulation resistance of all channels of one incubator needs about 5 hours, and the operation time of each channel needs to be measured, the actual measurement time is longer, so that a CAF test device is provided.

SUMMERY OF THE UTILITY MODEL

The utility model discloses a main aim at provides a CAF test device can effectively solve the problem in the background art.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides a CAF test device, includes surveys the test panel, the top surface of surveying the test panel is provided with multiunit DC power end PIN hole, the inside in DC power end PIN hole is provided with multiunit passageway PIN hole, be provided with the rubber layer between the DC power end PIN hole that corresponds, the inboard that just is located the rubber layer between the adjacent passageway PIN hole is provided with the multiunit test wire, the outside that the outside of test wire just is located surveying the test panel is provided with the incubator, the outside surface of incubator and the outside that is located the test wire are provided with connection socket, connection socket's outside surface is provided with the high stop gauge, the outside of high stop gauge is provided with the wiring plug, the outside surface of surveying the test panel is provided with the DC power.

Preferably, the test board and the PIN holes of the DC power supply end are welded in an electroplating mode, the number of the PIN holes of the DC power supply end is six, the outer surface of the outer side of each PIN hole of the DC power supply end is provided with a gold-plated terminal, the gold-plated terminals are fixedly connected with the PIN holes of the DC power supply end, and the PIN holes of the DC power supply end correspond to the DC power supply.

By adopting the technical scheme, the following technical effects can be achieved: thereby achieving the effect of group testing.

Preferably, PIN needles are arranged on the inner side of the PIN hole of the DC power supply end and the inner side of the PIN hole of the channel, the rubber layer is of a high-temperature-resistant soft silica gel line structure, the PIN hole of the DC power supply end is connected with the PIN hole of the channel through a testing line, the PIN holes of the channel can be arranged in a number mode, the rubber layer is fixedly connected with the testing line, the bottom of the rubber layer is fixedly connected with the outer surface of the top of the testing board, the PIN holes of the channel are in groups, the rubber layer is in two groups, and the corresponding PIN holes of the channel are arranged in parallel.

By adopting the technical scheme, the following technical effects can be achieved: thereby achieving the effect of convenient arrangement test.

Preferably, the DC power supply is interconnected to a test board via a test line, the test board is interconnected to the incubator via a test line, and the test board biases the incubator via the PIN hole.

By adopting the technical scheme, the following technical effects can be achieved: thereby achieving the effect of directly biasing the test loop.

Preferably, the PIN needle is electrically connected with the wiring plug, the high-resistance meter is in interactive connection with the PIN needle through a testing line, the wiring socket is mutually connected with the incubator through the testing line, the wiring socket is movably connected with the wiring plug, and the testing line is inserted into the inner side of the corresponding testing board after the detection of the high-resistance meter is completed.

By adopting the technical scheme, the following technical effects can be achieved: thereby achieving the effect of avoiding interference detection.

Compared with the prior art, the utility model discloses following beneficial effect has: according to the CAF test testing device, the DC power supply is connected with the test board through the test wire, the power supply is started, meanwhile, bias voltage is applied to PIN holes of each channel in the incubator, specific data are obtained, and the parallel PIN holes of the channels are arranged, so that the effect of detecting a loop is achieved; through in inserting the wiring plug with the high resistance meter outside, make PIN needle and incubator be connected, take off the high resistance meter measurement PIN needle of connecting according to order with individual passageway PIN hole, measure, insert again after the measurement is accomplished and correspond and survey in the board to the effect of measuring terminal connection and measurement return circuit design has been reached.

Drawings

FIG. 1 is a schematic diagram of a CAF test device according to the present invention;

fig. 2 is a schematic view of a testing loop of a CAF testing apparatus of the present invention;

fig. 3 is the utility model relates to a CAF test device's test terminal is connected and return circuit schematic diagram.

In the figure: 1. a test board; 2. a DC power terminal PIN hole; 3. a channel PIN hole; 4. a rubber layer; 5. a test line; 6. a temperature box; 7. a connection socket; 8. a high resistance meter; 9. a wiring plug; 10. a DC power supply; 11. A PIN needle; 12. and a gold-plated terminal.

Detailed Description

In order to make the technical means, creation features, achievement purposes and functions of the present invention easy to understand, the present invention is further described below with reference to the following embodiments.

As shown in fig. 1-3, a CAF test device, including testing board 1, the top surface of testing board 1 is provided with multiunit DC power end PIN hole 2, the inside of DC power end PIN hole 2 is provided with multiunit passageway PIN hole 3, be provided with rubber layer 4 between the DC power end PIN hole 2 that corresponds, the inboard that just is located rubber layer 4 between the adjacent passageway PIN hole 3 is provided with multiunit test wire 5, the outside that just is located testing board 1 in the outside of test wire 5 is provided with incubator 6, the outside surface of incubator 6 and the outside that is located test wire 5 are provided with connection socket 7, connection socket 7's the outside surface is provided with high resistance meter 8, high resistance meter 8's the outside is provided with connection plug 9, the outside surface of testing board 1 is provided with DC power 10.

The test board 1 is for electroplating welding with DC power end PIN hole 2, and DC power end PIN hole 2 is six groups, and the outside surface of DC power end PIN hole 2 is provided with gilding terminal 12, and gilding terminal 12 is fixed connection with DC power end PIN hole 2, and DC power end PIN hole 2 is corresponding with DC power 10.

PIN needles 11 are arranged on the inner side of the DC power supply end PIN hole 2 and the inner side of the channel PIN hole 3, the rubber layer 4 is of a high-temperature-resistant soft silica gel line structure, safety is improved, the DC power supply end PIN hole 2 is connected with the channel PIN hole 3 through a test line 5, the channel PIN holes 3 can be arranged in a number mode, the rubber layer 4 is fixedly connected with the test line 5, the bottom of the rubber layer 4 is fixedly connected with the outer surface of the top of the test board 1, the channel PIN holes 3 are 288 groups, the rubber layer 4 is divided into two groups, and the corresponding channel PIN holes 3 are arranged in parallel; PIN needle 11 is electric connection with connection plug 9, and high resistant meter 8 is interactive connection with PIN needle 11 through test wire 5, and connection socket 7 is interconnect through test wire 5 and incubator 6, and connection socket 7 is swing joint with connection plug 9, and high resistant meter 8 detects and inserts test wire 5 the inboard of the corresponding test panel 1 again after accomplishing.

The DC power source 10 is interconnected with the test board 1 through the test line 5, the test board 1 is interconnected with the oven 6 through the test line 5, and the test board 1 biases the oven 6 through the passage PIN hole 3.

It should be noted that the utility model relates to a CAF test device, when using, the staff connects DC power 10 with test board 1 through test wire 5, starts the power and biases 288 passageway PIN holes in the incubator simultaneously, obtains concrete data, and utilizes parallel passageway PIN hole to arrange, thereby has reached the effect of detection return circuit; in order to prevent interference between other channels, the staff inserts high resistance meter 8 outside wiring plug 9 in the wiring plug 9, makes PIN needle and incubator 6 be connected, takes off 288 passageway PIN holes 3 single according to the order and connects high resistance meter 8 and measure PIN needle 10, measures, inserts again after the measurement is accomplished and corresponds in surveying test panel 1 to the effect of measuring terminal connection and measurement circuit design has been reached, promotion measurement efficiency.

The basic principles and the main features of the invention and the advantages of the invention have been shown and described above. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the foregoing embodiments and descriptions are provided only to illustrate the principles of the present invention without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. A CAF test device, includes testing board (1), its characterized in that: the outer surface of the top of the test board (1) is provided with a plurality of groups of DC power supply end PIN holes (2), a plurality of groups of channel PIN holes (3) are arranged in the DC power supply end PIN hole (2), a rubber layer (4) is arranged between the corresponding PIN holes (2) of the DC power supply end, a plurality of groups of test lines (5) are arranged between the PIN holes (3) of the adjacent channels and on the inner side of the rubber layer (4), an incubator (6) is arranged at the outer side of the test wire (5) and the outer side of the test board (1), a wiring socket (7) is arranged on the outer surface of the outer side of the incubator (6) and positioned on the outer side of the test wire (5), the outer surface of the outer side of the connection socket (7) is provided with a high impedance meter (8), the outside of high resistant meter (8) is provided with wiring plug (9), the outside surface of surveying test panel (1) is provided with DC power (10).

2. The CAF test rig of claim 1, wherein: the test board (1) and the DC power end PIN holes (2) are in electroplating welding, the DC power end PIN holes (2) are six groups, a gold-plated terminal (12) is arranged on the outer side outer surface of each DC power end PIN hole (2), the gold-plated terminals (12) are fixedly connected with the DC power end PIN holes (2), and the DC power end PIN holes (2) correspond to the DC power supply (10).

3. The CAF test rig of claim 1, wherein: the inner side of the DC power end PIN hole (2) and the inner side of the channel PIN hole (3) are both provided with PIN needles (11), the rubber layer (4) is of a high-temperature-resistant soft silica gel line structure, the DC power end PIN hole (2) is connected with the channel PIN hole (3) through a test line (5), the channel PIN hole (3) can be arranged in a number mode, the rubber layer (4) is fixedly connected with the test line (5), the bottom of the rubber layer (4) is fixedly connected with the outer surface of the top of the test board (1), the channel PIN hole (3) is 288 groups, the rubber layer (4) is two groups, and the corresponding channel PIN holes (3) are arranged in parallel.

4. The CAF test rig of claim 1, wherein: the DC power supply (10) is connected with the test board (1) through the test wire (5), the test board (1) is connected with the incubator (6) through the test wire (5), and the test board (1) biases the incubator (6) through the channel PIN hole (3).

5. The CAF test rig of claim 3, wherein: PIN needle (11) are electric connection with wiring plug (9), high resistant meter (8) are interactive connection through test line (5) and PIN needle (11), connection socket (7) are interconnect through test line (5) and incubator (6), connection socket (7) are swing joint with wiring plug (9), high resistant meter (8) detect the inboard of test panel (1) that inserts corresponding test line (5) after accomplishing again.