CN213875886U - Testing device for quartz crystal oscillator - Google Patents

Testing device for quartz crystal oscillator Download PDF

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Publication number
CN213875886U
CN213875886U CN202023119898.4U CN202023119898U CN213875886U CN 213875886 U CN213875886 U CN 213875886U CN 202023119898 U CN202023119898 U CN 202023119898U CN 213875886 U CN213875886 U CN 213875886U
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test
fixedly connected
outside
crystal oscillator
quartz crystal
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CN202023119898.4U
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Chinese (zh)
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李升红
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Chengdu Xifeng Technology Co ltd
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Chengdu Xifeng Technology Co ltd
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Abstract

The utility model discloses a testing arrangement of quartz crystal oscillator, including the test box, test box top fixedly connected with test jig, the outside fixedly connected with pole setting of test jig, the outside swing joint of pole setting has the slider, the outside fixedly connected with tester of slider, tester bottom fixedly connected with test needle, one side fixedly connected with data screen that the tester is close to in the test jig outside. The utility model discloses a set up test jig and pole setting, slider, can be fine reciprocate, make the distance of test can reach suitable angle, through setting up tester and test needle, can be fine carry out comprehensive scan test to quartz crystal oscillator, guarantee that advancing of test needle is accurate to it, improved measuring accuracy and efficiency of software testing, through setting up the data screen, real-time test data of feedback that can be fine, the update and the accuracy of assurance data, make the test effect of this device more comprehensive.

Description

Testing device for quartz crystal oscillator
Technical Field
The utility model relates to a crystal oscillator tests technical field, specifically is a testing arrangement of quartz crystal oscillator.
Background
At present, most of electronic products or electronic component manufacturers use testing/detecting devices which heat or cool the testing/detecting products in one direction, but in the normal working process of some electronic equipment or electronic components, the heated state is that the internal temperature of the electronic components is raised by the heat radiation of a bottom or surrounding heating component. The test/detection equipment used by domestic related electronic product manufacturers is mainly imported equipment, and the equipment is mainly static test, while the temperature field change in the working process of the electronic product is a dynamic process, and the temperature change of the electronic product needs to be dynamically tested.
In the prior art, a novel quartz crystal oscillator testing device with the publication number of CN211236058U includes a testing box, an upper cover fixedly connected with the testing box, and a clamp mechanism for fixing a quartz crystal oscillator to be tested; the inside of the side wall of the test box body is provided with a heat insulation layer, and a gas circulation pipeline penetrates from the bottom of the test box body to the inside of the test box body; the bottom of the gas circulation pipeline is tightly matched with the heat-insulating layer, and a gap is reserved between the middle upper part of the gas circulation pipeline and the heat-insulating layer; and through holes are arranged on the side surface of the test box body and the heat insulation layer and are communicated with the gaps.
However, the device still has the following obvious defects in the using process, when the device is used, because the device does not have a test setting with a relatively comprehensive test effect, the device cannot effectively test the comprehensive data of the quartz crystal oscillator in the using process, omission and errors are easy to generate, the accuracy of a test part cannot be completely ensured, more time is spent on the alignment position, the working efficiency is greatly delayed, and the situation of unstable fixation occurs, so that the final test result is influenced.
Therefore, the utility model provides a testing arrangement of quartz crystal oscillator.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a testing arrangement of quartz crystal oscillator to solve the problem that proposes among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme:
the utility model provides a testing arrangement of quartz crystal oscillator, includes the test box, test box top fixedly connected with test jig, the outside fixedly connected with pole setting of test jig, the outside swing joint of pole setting has the slider, the outside fixedly connected with tester of slider, tester bottom fixedly connected with test needle, one side fixedly connected with data screen that the tester is close to in the test jig outside.
Through adopting above-mentioned technical scheme, through setting up test jig and pole setting, the slider, can be fine reciprocate, make the distance of test reach suitable angle, through setting up tester and test needle, can be fine carry out comprehensive scan test to quartz crystal oscillator, guarantee the advance of test needle aim at it, precision of software testing and efficiency of software testing have been improved, through setting up the data screen, real-time test data of feedback that can be fine, guarantee the update and the accuracy of data, make the test effect of this device more comprehensive.
Preferably, one side fixedly connected with testboard that the test box top is close to the test needle, testboard top fixedly connected with places the platform, place the bench top and seted up the wafer groove.
Through adopting above-mentioned technical scheme, through setting up the testboard and putting the platform, can make things convenient for the staff to put the test with its quartz crystal oscillator that needs to carry out the test, through setting up the wafer groove, can be fine let its staff test main wafer, guarantee that the data of test is more careful.
Preferably, the outside fixedly connected with fixing base of test box, fixing base top fixedly connected with motor cabinet, motor cabinet top fixedly connected with servo motor.
Through adopting above-mentioned technical scheme, through setting up motor and servo motor, can be fine carry out the power transmission to the test position, guarantee going on continuously of test for this device is more sparingly artifical.
Preferably, one side fixedly connected with connecting seat that the test box outside is close to the testboard, the outside swing joint of connecting seat has the connecting rod, connecting rod top fixedly connected with handle bar, one side fixedly connected with screens board that the connecting rod is close to in the connecting seat outside.
Through adopting above-mentioned technical scheme, through setting up connecting seat and connecting rod, handle bar, can make things convenient for the staff to carry out plug-type removal, through setting up the screens board, the landing of restriction connecting rod that can be fine avoids injuring the staff for the staff is more nimble to the use of this device.
Preferably, the bottom of the test box is fixedly connected with a base, the outside of the base is movably connected with a rotating shaft, the rotating shaft penetrates through the base, and the outside of the rotating shaft is fixedly connected with a movable wheel.
Through adopting above-mentioned technical scheme, through setting up base and pivot, removing the wheel, can make things convenient for the removal of test box, carry out the movement of position, practiced thrift staff's time and energy.
Compared with the prior art, the beneficial effects of the utility model are that: through setting up test jig and pole setting, slider, reciprocate that can be fine for the distance of test can reach suitable angle, through setting up tester and test needle, can be fine carry out comprehensive scanning test to quartz crystal oscillator, guarantee that advancing of test needle is aimed at it, improved measuring accuracy and efficiency of software testing, through setting up the data screen, real-time test data of feedback that can be fine, the renewal and the accuracy of assurance data, make the test effect of this device more comprehensive. Through setting up the testboard and putting the platform, can make things convenient for the staff to put the test with its quartz crystal oscillator that needs carry out the test, through setting up the wafer groove, can be fine let its staff test main wafer, guarantee that the data of test are more careful. Through setting up motor and servo motor, can be fine go on the power transmission to the test position, guarantee going on continuously of test for this device is more sparingly artifical. Through setting up connecting seat and connecting rod, handle bar, can make things convenient for the staff to carry out plug-type removal, through setting up the screens board, the landing of limiting the connecting rod that can be fine avoids injuring the staff for the staff is more nimble to the use of this device. Through setting up base and pivot, removing the wheel, can make things convenient for the removal of test box, carry out the movement of position, practiced thrift staff's time and energy. The practicability is very strong, and the method is very worthy of popularization.
Drawings
Fig. 1 is a schematic front structural view of the present invention;
fig. 2 is a schematic side view of the present invention;
fig. 3 is a schematic view of the back structure of the present invention.
In the figure: 1. a test box; 2. a test jig; 3. erecting a rod; 4. a slider; 5. a tester; 6. a test pin; 7. a data screen; 8. a motor base; 9. a servo motor; 10. a test bench; 11. a placing table; 12. a wafer slot; 13. a fixed seat; 14. a connecting seat; 15. a connecting rod; 16. a handle bar; 17. a clamping plate; 18. a base; 19. a rotating shaft; 20. the wheel is moved.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1 to 3, the present invention provides a technical solution:
a test device of a quartz crystal oscillator comprises a test box 1, wherein the top of the test box 1 is fixedly connected with a test frame 2, the outside of the test frame 2 is fixedly connected with a vertical rod 3, the outside of the vertical rod 3 is movably connected with a slide block 4, the outside of the slide block 4 is fixedly connected with a tester 5, the bottom of the tester 5 is fixedly connected with a test needle 6, one side of the outside of the test frame 2, which is close to the tester 5, is fixedly connected with a data screen 7, the test frame 2, the vertical rod 3 and the slide block 4 can be well moved up and down, so that the test distance can reach a proper angle, the tester 5 and the test needle 6 can be well used for carrying out comprehensive scanning test on the quartz crystal oscillator, the alignment of the test needle 6 is ensured, the test precision and the test efficiency are improved, the real-time test data can be well fed back by arranging the data screen 7, and the update and the accuracy of the data are ensured, make the test effect of this device more comprehensive, pole setting 3 is three-dimensional cylinder shape, and slider 4 is rectangle form, and data screen 7 is oval shape, and 1 top of test box is close to one side fixedly connected with testboard 10 of test needle 6, and testboard 10 top fixedly connected with places platform 11, places platform 11 top and has seted up wafer groove 12. Through setting up testboard 10 and placing platform 11, can make things convenient for the staff to put the test with its quartz crystal oscillator that needs to test, through setting up wafer groove 12, can be fine let its staff test main wafer, guarantee that the data of test is more careful, testboard 10 is rectangular form.
1 outside fixedly connected with fixing base 13 of test box, 13 top fixedly connected with motor cabinet 8 of fixing base, 8 top fixedly connected with servo motor 9 of motor cabinet, through setting up motor 8 and servo motor 9, can be fine carry out the power transmission to the test position, guarantee going on of test continuously, make this device more save artifically, 1 outside of test box is close to one side fixedly connected with connecting seat 14 of testboard 10, 14 outside swing joint of connecting seat has connecting rod 15, 15 top fixedly connected with handle bar 16 of connecting rod, 14 outside one side fixedly connected with screens board 17 that is close to connecting rod 15 of connecting seat. Through setting up connecting seat 14 and connecting rod 15, handle pole 16, can make things convenient for the staff to carry out plug-type removal, through setting up screens board 17, can be fine restrict the landing of connecting rod 15, avoid injuring the staff, make the staff more nimble to the use of this device, connecting rod 15 and handle pole 16 are three-dimensional cylinder shape, screens board 17 is rectangular form, 1 bottom fixedly connected with base 18 of test box, 18 outside swing joint of base has pivot 19, pivot 19 runs through base 18, 19 outside fixedly connected with of pivot removes wheel 20, through setting up base 18 and pivot 19, remove wheel 20, can make things convenient for the removal of test box 1, carry out the moving of position, the time and the energy of staff have been practiced thrift, pivot 19 is three-dimensional cylinder shape, it is three-dimensional circular form to remove wheel 20.
The working principle is as follows: when using this device, at first according to actual conditions pulling handle bar 16 drives the removal wheel 20 of test box 1 bottom and moves to the required position of testing that carries on, then the staff puts the platform 11 of putting on testboard 10 with its quartz crystal oscillator that needs carry on the test in, then can put main wafer and test in wafer groove 12, put servo motor 9 on the end on the motor cabinet 8 and can carry out power transmission, then slider 4 on the pole setting 3 can remove, thereby drive tester 5 and test needle 6 and carry out comprehensive test work to it, data screen 7 also can real-time update the main data of test during the test.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (5)

1. A test device of a quartz crystal oscillator comprises a test box (1), and is characterized in that: test box (1) top fixedly connected with test jig (2), test jig (2) outside fixedly connected with pole setting (3), pole setting (3) outside swing joint has slider (4), slider (4) outside fixedly connected with tester (5), tester (5) bottom fixedly connected with test needle (6), one side fixedly connected with data screen (7) that tester (5) are close to in test jig (2) outside.
2. The test apparatus of a quartz crystal oscillator according to claim 1, characterized in that: the testing device is characterized in that a testing table (10) is fixedly connected to one side, close to the testing needle (6), of the top of the testing box (1), a placing table (11) is fixedly connected to the top of the testing table (10), and a wafer groove (12) is formed in the top of the placing table (11).
3. The test apparatus of a quartz crystal oscillator according to claim 1, characterized in that: test box (1) outside fixedly connected with fixing base (13), fixing base (13) top fixedly connected with motor cabinet (8), motor cabinet (8) top fixedly connected with servo motor (9).
4. A test apparatus for a quartz crystal oscillator according to claim 2, characterized in that: the test box is characterized in that a connecting seat (14) is fixedly connected to one side, close to the test bench (10), of the outside of the test box (1), a connecting rod (15) is movably connected to the outside of the connecting seat (14), a handle rod (16) is fixedly connected to the top of the connecting rod (15), and a clamping plate (17) is fixedly connected to one side, close to the connecting rod (15), of the outside of the connecting seat (14).
5. The test apparatus of a quartz crystal oscillator according to claim 1, characterized in that: the test box is characterized in that a base (18) is fixedly connected to the bottom of the test box (1), a rotating shaft (19) is movably connected to the outside of the base (18), the rotating shaft (19) penetrates through the base (18), and a moving wheel (20) is fixedly connected to the outside of the rotating shaft (19).
CN202023119898.4U 2020-12-22 2020-12-22 Testing device for quartz crystal oscillator Active CN213875886U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202023119898.4U CN213875886U (en) 2020-12-22 2020-12-22 Testing device for quartz crystal oscillator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202023119898.4U CN213875886U (en) 2020-12-22 2020-12-22 Testing device for quartz crystal oscillator

Publications (1)

Publication Number Publication Date
CN213875886U true CN213875886U (en) 2021-08-03

Family

ID=77068007

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202023119898.4U Active CN213875886U (en) 2020-12-22 2020-12-22 Testing device for quartz crystal oscillator

Country Status (1)

Country Link
CN (1) CN213875886U (en)

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