CN217033584U - Magnet probe station equipment - Google Patents
Magnet probe station equipment Download PDFInfo
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- CN217033584U CN217033584U CN202220570882.5U CN202220570882U CN217033584U CN 217033584 U CN217033584 U CN 217033584U CN 202220570882 U CN202220570882 U CN 202220570882U CN 217033584 U CN217033584 U CN 217033584U
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- fixedly connected
- magnet
- probe station
- horizontal displacement
- sample
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Abstract
The utility model discloses a magnet probe station device which comprises an operation table, wherein the upper surface of the operation table is fixedly connected with two slide rails corresponding to each other in position, the surfaces of the slide rails are connected with slide blocks in a sliding manner, the upper surfaces of the two slide blocks are fixedly connected with a horizontal displacement plate, the surface of the horizontal displacement plate is fixedly connected with two extension plates, and the upper surfaces of the two extension plates are both fixedly connected with fixed columns. This magnet probe station equipment places the board through setting up the slide rail, the lead screw, the slider, the horizontal displacement board, extension board and locator, can drive the slider through the regulating wheel that rotates on the lead screw and remove, thereby carry out horizontal migration and location to the horizontal displacement board, thereby can drive the sample and remove the magnetic field position between two magnets and carry out the magnetic field test, also be convenient for simultaneously remove the sample to microscopical below and observe, thereby make things convenient for the staff to carry out performance parameter's test to the sample under the magnetic field.
Description
Technical Field
The utility model relates to the technical field of magnet probe stations, in particular to magnet probe station equipment.
Background
The superconducting magnet probe station is an analytical instrument used in the field of physics, most magnet probe stations in the market are used for horizontal magnetic field testing at present, while the number of magnet probe stations used for vertical magnetic field testing is small, and the probe stations used for vertical magnetic field testing are expensive and complex in testing operation.
And the smaller the distance between two magnetic poles of the existing magnet probe station, the larger the magnetic field provided by the magnet, but the smaller the distance between the magnetic poles, the sample can not be positioned during the vertical magnetic field test, thereby being inconvenient for the sample pricking test.
We therefore propose a magnet probe station apparatus to address the two problems set out above.
Disclosure of Invention
It is an object of the present invention to provide a magnet probe station apparatus to solve the problems set forth in the background art described above.
In order to achieve the purpose, the utility model provides the following technical scheme: the utility model provides a magnet probe station equipment, includes the operation panel, the last fixed surface of operation panel is connected with two slide rails that the position is corresponding, the sliding surface of slide rail is connected with the slider, two the last fixed surface of slider is connected with the horizontal displacement board, two the fixed surface of horizontal displacement board is connected with two extension boards, two the equal fixedly connected with fixed column in upper surface of extension board, the board is placed to the top fixedly connected with locator of fixed column, the last fixed surface of operation panel is the mounting panel of falling L shape, all is provided with the corresponding magnet in position between the lower surface of mounting panel and the upper surface of operation panel, the screw hole has been seted up to the upper surface of mounting panel, and the inner wall threaded connection of screw hole has the threaded rod, and the bottom of threaded rod is connected with the surperficial rotation of magnet, and the top of threaded rod is provided with magnet adjust knob.
Preferably, an Jiong-shaped fixing frame is fixedly connected to the upper surface of the operating platform, a microscope adjusting frame is arranged on the surface of the Jiong-shaped fixing frame, and a microscope is arranged on the surface of the microscope adjusting frame.
Preferably, the inner wall of slide rail rotates and is connected with the lead screw, lead screw and slider threaded connection, and the tip of lead screw extends to the outside of slide rail, and fixedly connected with regulating wheel.
Preferably, a rotary placing table is arranged on the upper surface of the horizontal displacement plate, and the sample placing plate is rotatably connected to the upper surface of the rotary placing table.
Preferably, the sample placing plate is made of an aluminum alloy material or other materials which do not isolate the magnetic field.
Preferably, the sample placement plate is positioned to correspond to the magnet and the microscope, respectively.
Advantageous effects
The utility model provides a magnet probe station device, which has the following beneficial effects:
1. this magnet probe station equipment places the board through setting up the slide rail, the lead screw, the slider, the horizontal displacement board, extension board and locator, can drive the slider through the regulating wheel that rotates on the lead screw and remove, thereby carry out horizontal migration and location to the horizontal displacement board, thereby can drive the sample and remove the magnetic field position between two magnets and carry out the magnetic field test, also be convenient for simultaneously remove the sample to microscopical below and observe, thereby make things convenient for the staff to carry out performance parameter's test to the sample under the magnetic field.
2. This magnet probe station equipment, through setting up mounting panel, threaded rod and magnet adjust knob, can drive the threaded rod through rotating magnet adjust knob and rotate, and then drive the magnet and adjust and remove from top to bottom to the convenient distance to between two magnets is adjusted, realizes the intensity regulation in magnetic field, places the platform through setting up the rotation, is convenient for drive the sample and places the board and rotate and fix a position, conveniently carries out the magnetic field test of different positions to the sample.
Drawings
FIG. 1 is a schematic view of a first perspective structure according to the present invention;
FIG. 2 is a schematic perspective view of a second embodiment of the present invention;
fig. 3 is a schematic view of the top-cut structure of the slide rail of the present invention.
In the figure: the device comprises an operation table 1, a sliding rail 2, a sliding block 3, a horizontal displacement plate 4, an extension plate 5, a positioner placing plate 6, a mounting plate 7, a magnet 8, a magnet adjusting knob 9, a fixing frame 10 Jiong, a microscope adjusting frame 11, a microscope 12, a screw 13, a rotary placing table 14 and a sample placing plate 15.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-3, the present invention provides a technical solution: a magnet probe station device comprises an operating platform 1, wherein an Jiong-shaped fixing frame 10 is fixedly connected to the upper surface of the operating platform 1, a microscope adjusting frame 11 is arranged on the surface of the Jiong-shaped fixing frame 10, and a microscope 12 is arranged on the surface of the microscope adjusting frame 11.
The upper surface of the operating platform 1 is fixedly connected with two slide rails 2 corresponding to each other in position, the surface of each slide rail 2 is connected with a slide block 3 in a sliding manner, the inner wall of each slide rail 2 is rotatably connected with a lead screw 13, each lead screw 13 is in threaded connection with the corresponding slide block 3, the end part of each lead screw 13 extends to the outer part of each slide rail 2, and each adjusting wheel is fixedly connected with the corresponding adjusting wheel.
The upper surfaces of the two sliding blocks 3 are fixedly connected with a horizontal displacement plate 4, the upper surface of the horizontal displacement plate 4 is provided with a rotary placing table 14, the upper surface of the rotary placing table 14 is rotatably connected with a sample placing plate 15, the sample placing plate 15 is made of aluminum alloy materials or other materials which do not isolate magnetic fields, and the positions of the sample placing plate 15 correspond to the magnet 8 and the microscope 12 respectively.
Through setting up rotatory platform 14 of placing, be convenient for drive the sample and place board 15 and rotate and fix a position, conveniently carry out the magnetic field test of different positions to the sample.
The sample placing plate 15 can be designed into a normal-temperature sample stage, a high-temperature sample stage, a low-temperature vacuum cavity or a nitrogen cavity, the test samples can be heated or cooled according to different test requirements, the sample placing plate can fix the test samples in a vacuum mode or a mode using a clamp, and the sample placing plate can be rectangular, circular, rhombic or in other shapes.
Two extension boards 5 of fixed surface of horizontal displacement board 4 are connected with, two equal fixedly connected with fixed columns in upper surface of extension board 5, board 6 is placed to the top fixedly connected with locator of fixed column, through setting up slide rail 2, lead screw 13, slider 3, horizontal displacement board 4, board 6 is placed to extension board 5 and locator, regulating wheel through rotating on the lead screw 13 can drive slider 3 and remove, thereby carry out horizontal migration and location to horizontal displacement board 4, thereby can drive the sample and remove to the magnetic field position between two magnets 8 and carry out the magnetic field test, also be convenient for simultaneously observe the sample below that removes microscope 12, thereby make things convenient for the staff to carry out performance parameter's test to the sample under the magnetic field.
The last fixed surface of operation panel 1 is connected with mounting panel 7 that is the shape of falling L, all is provided with the corresponding magnet 8 in position between the lower surface of mounting panel 7 and the upper surface of operation panel 1, and threaded hole is seted up to the upper surface of mounting panel 7, and the inner wall threaded connection of screw hole has the threaded rod, and the bottom of threaded rod is connected with the surface rotation of magnet 8, and the top of threaded rod is provided with magnet adjust knob 9.
Through setting up mounting panel 7, threaded rod and magnet adjust knob 9, can drive the threaded rod through rotating magnet adjust knob 9 and rotate, and then drive magnet 8 and adjust and remove from top to bottom to the convenience is adjusted the distance between two magnets 8, realizes the intensity control in magnetic field.
The working principle is as follows: when the magnet probe test is carried out, firstly, the sliding block 3 is driven to move through the rotating screw rod 13, and then the horizontal displacement plate 4 is driven to move to the middle position of the operation table 1, then a sample is placed on the sample placing plate 15, the probe positioner is fixed on the surface of the positioner placing plate 6 through a vacuum chuck, the probe is pricked and fixed to the sample through the probe positioner, the sample is moved to the lower part of the microscope 12 and is focused on a point position to be tested through the microscope 12, the sample placing plate 15 is moved to the magnetic field center position between the two magnets 8 through the sliding rail 2, the magnets 8 are driven to move up and down through rotating the magnet adjusting knob 9, the size of the magnetic field is adjusted, the required strength is reached through the current control magnetic field, and the performance parameters of the sample under the magnetic field are tested.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. A magnet probe station apparatus comprising an operating station (1), characterized in that: the upper surface of the operating platform (1) is fixedly connected with two slide rails (2) with corresponding positions, the surface of each slide rail (2) is connected with a slide block (3) in a sliding manner, the upper surfaces of the two slide blocks (3) are fixedly connected with a horizontal displacement plate (4), the surface of each horizontal displacement plate (4) is fixedly connected with two extension plates (5), the upper surfaces of the two extension plates (5) are both fixedly connected with fixed columns, the top ends of the fixed columns are fixedly connected with a locator placing plate (6), the upper surface of the operating platform (1) is fixedly connected with an inverted L-shaped mounting plate (7), magnets (8) with corresponding positions are arranged between the lower surface of the mounting plate (7) and the upper surface of the operating platform (1), the upper surface of the mounting plate (7) is provided with threaded holes, the inner wall of each threaded hole is in threaded connection with a threaded rod, and the bottom end of each threaded rod is rotatably connected with the surface of each magnet (8), and the top end of the threaded rod is provided with a magnet adjusting knob (9).
2. A magnet probe station apparatus as claimed in claim 1, wherein: the microscope is characterized in that an Jiong-shaped fixing frame (10) is fixedly connected to the upper surface of the operating table (1), a microscope adjusting frame (11) is arranged on the surface of the Jiong-shaped fixing frame (10), and a microscope (12) is arranged on the surface of the microscope adjusting frame (11).
3. A magnet probe station apparatus as claimed in claim 1, characterised in that: the inner wall of slide rail (2) rotates and is connected with lead screw (13), lead screw (13) and slider (3) threaded connection, and the tip of lead screw (13) extends to the outside of slide rail (2), and fixedly connected with regulating wheel.
4. A magnet probe station apparatus as claimed in claim 1, wherein: the upper surface of the horizontal displacement plate (4) is provided with a rotary placing table (14), and the upper surface of the rotary placing table (14) is rotatably connected with a sample placing plate (15).
5. The magnet probe station apparatus of claim 4, wherein: the sample placing plate (15) is made of aluminum alloy materials or other materials which do not isolate the magnetic field.
6. The magnet probe station apparatus of claim 4, wherein: the positions of the sample placing plate (15) correspond to the magnet (8) and the microscope (12), respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220570882.5U CN217033584U (en) | 2022-03-16 | 2022-03-16 | Magnet probe station equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220570882.5U CN217033584U (en) | 2022-03-16 | 2022-03-16 | Magnet probe station equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217033584U true CN217033584U (en) | 2022-07-22 |
Family
ID=82455221
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220570882.5U Active CN217033584U (en) | 2022-03-16 | 2022-03-16 | Magnet probe station equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217033584U (en) |
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2022
- 2022-03-16 CN CN202220570882.5U patent/CN217033584U/en active Active
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