CN213813734U - Auxiliary device for point measurement of oscilloscope probe - Google Patents

Abstract

The utility model discloses an auxiliary device is surveyed to oscilloprobe point, auxiliary device is surveyed to oscilloprobe point includes chassis, linking arm, probe clamp and anti-skidding piece, the one end of linking arm with the chassis links to each other, the other end with the probe clamp links to each other, just the linking arm is mobile, the probe clamp is used for centre gripping and fixed oscilloprobe, the anti-skidding piece that takes off is suitable for the cover to establish in the week side of being surveyed the piece, oscilloprobe can stretch into in the anti-skidding piece, so that the anti-skidding piece prevents the oscilloprobe slippage. According to the utility model discloses auxiliary device is surveyed to oscilloscope probe point relies on mechanical device fixed oscilloscope probe, has avoided holding the test unstability that brings, the fragile piece scheduling problem that awaits measuring because of the manual work is held between the fingers in hardware debugging and test procedure, has improved the stability of point survey efficiency, has improved the test.

Description

Auxiliary device for point measurement of oscilloscope probe

Technical Field

The utility model relates to a measuring equipment technical field, concretely relates to oscilloscope probe point survey auxiliary device.

Background

An oscilloscope is an electronic measuring instrument that converts electrical signals, such as current and voltage signals, into images and visually displays the characteristics of the detected electrical signals. The ripple wave measurement is usually performed by adding a grounding spring to a probe of a probe type oscilloscope, and in some application scenes, for example, high-density devices represented by mobile phones, because the size of components is very small and the density of parts of welding points is high, the devices are easily burnt due to short circuit caused by touching other points by an unstable probe in a handheld manner during the test process, and the test efficiency and the accuracy of the test result are seriously affected.

SUMMERY OF THE UTILITY MODEL

The present invention aims at solving at least one of the technical problems in the related art to a certain extent.

Therefore, the embodiment of the utility model provides an auxiliary device is surveyed to oscilloscope probe point, auxiliary device can improve efficiency of software testing, guarantees the accuracy of test result.

According to the utility model discloses auxiliary device is surveyed to oscilloprobe point includes chassis, linking arm, probe clamp and anti-slipping piece, the one end of linking arm with the chassis links to each other, the other end with the probe clamp links to each other, just the linking arm is mobile, the probe clamp is used for centre gripping and fixed oscilloprobe, the anti-slipping piece is suitable for the cover to establish in the week side of being surveyed the piece, oscilloprobe can stretch into in the anti-slipping piece, so that the anti-slipping piece prevents the oscilloprobe slippage.

According to the utility model discloses auxiliary device is surveyed to oscilloscope probe point relies on mechanical device fixed oscilloscope probe, has avoided holding the test unstability that brings, the fragile piece scheduling problem that awaits measuring because of the manual work is held between the fingers in hardware debugging and test procedure, has improved some efficiency of surveying, has reduced the some degree of difficulty of surveying, in addition, auxiliary device still includes that the antiskid takes off the piece in order to prevent oscilloscope probe slippage, has further improved the stability of test.

In some embodiments, the nonskid member includes a case body having both upper and lower ends open, and a guide surface connected to an upper end of the case body and extending toward an outer side in a direction from below to above.

In some embodiments, the guide surface is a smooth curved surface.

In some embodiments, the two guide surfaces are provided at opposite sides of the upper end of the case.

In some embodiments, the material of the slip prevention member is an insulating material.

In some embodiments, the auxiliary device for spot measurement of the oscilloscope probe further comprises an interval adjusting piece, wherein the interval adjusting piece is connected with the oscilloscope probe and is provided with a plurality of limiting bulges, and the limiting bulges are arranged at intervals along the radial direction of the oscilloscope probe.

In some embodiments, the auxiliary device for spot measurement of the oscilloscope probe further comprises a grounding spring, wherein the grounding spring comprises a first section and a second section which are connected, and the second section is adjustably clamped at the position of the limiting protrusion to adjust the distance between the second section and the probe of the oscilloscope probe.

In some embodiments, the limiting protrusions are inclined from bottom to top along the direction from the probe to the second section, and the inclination angles of the limiting protrusions are gradually reduced along the direction from the probe to the second section.

In some embodiments, the spacing adjustment member is removably coupled to the oscilloscope probe.

Drawings

Fig. 1 is a schematic diagram of an oscilloscope probe spot measurement auxiliary device according to an embodiment of the present invention;

figure 2 is a schematic view of a slip-off prevention element according to an embodiment of the invention;

FIG. 3 is a schematic view of a spacing adjuster according to an embodiment of the present invention;

fig. 4 is a bottom view of a spacing adjustment member according to an embodiment of the present invention;

fig. 5 is a schematic diagram of an oscilloscope probe according to an embodiment of the present invention;

fig. 6 is an assembly schematic diagram of a spacing adjustment member and an oscilloscope probe according to an embodiment of the present invention.

Reference numerals:

the chassis (1) is provided with a base plate,

the connecting arm (2) is connected to the arm,

the probe clip (3) is provided with a probe clip,

the anti-slip member 4, the case 41, the guide surface 42,

the spacing adjusting member 5, the first surface 51, the second surface 52, the limiting protrusion 53, the first connecting post 54, the second connecting post 55,

the scope probe 6, the probe 61,

a grounding spring 7, a first section 71, a second section 72.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention.

An oscilloscope probe spot measurement auxiliary device according to an embodiment of the utility model is described below with reference to the accompanying drawings.

As shown in fig. 1-6, the auxiliary device for spot measurement of the oscilloscope probe according to the embodiment of the utility model comprises a chassis 1, a connecting arm 2, a probe clamp 3 and an anti-slip piece 4.

The device to be tested is placed on the chassis 1, the connecting arm 2 is used for fixing the oscilloscope probe 6, one end of the connecting arm 2 is connected with the chassis 1, the other end of the connecting arm 2 is connected with the probe clamp 3, the connecting arm 2 is movable, the connecting arm 2 can be made of a softer metal material, the probe clamp 3 is used for clamping the oscilloscope probe 6, and the connecting arm 2 and the probe clamp 3 are matched with each other to fix the oscilloscope probe 6 at a proper position.

When in use, the anti-slip piece 4 needs to be placed on the chassis 1 and sleeved on the periphery of the tested device, the anti-slip piece 4 is provided with an opening, and the oscilloscope probe 6 can extend into the anti-slip piece 4 through the opening of the anti-slip piece 5, so that the anti-slip piece 4 can prevent the oscilloscope probe 6 from slipping. The anti-slip piece 4 is made of an insulating material, so that the short circuit of the tested device is avoided.

When the auxiliary device is used, a tested device is placed on the chassis 1, the anti-slip piece 4 is sleeved on the tested device, the probe clamp 3 is used for clamping the oscilloscope probe 6 and moving the oscilloscope probe 6 to a proper position, so that the probe 61 is abutted against the tested device, the oscilloscope probe 6 can be released at the moment and fixed by the auxiliary device, and of course, the oscilloscope probe 6 can be moved to a proper position first and then the oscilloscope probe 6 can be clamped by the probe clamp 3.

According to the utility model discloses auxiliary device is surveyed to oscilloscope probe point relies on mechanical device fixed oscilloscope probe, has avoided holding the test unstability that brings, the fragile piece scheduling problem that awaits measuring because of the manual work is held between the fingers in hardware debugging and test procedure, has improved some efficiency of surveying, has reduced some degree of difficulty of surveying, and this application still is equipped with anti-slipping 4 in addition in order to prevent 6 slippage of oscilloscope probe, has further improved the stability of test.

In some embodiments, the anti-slip device 4 comprises a box 41 and a guiding surface 42, the box 41 is hollow and has two open ends, and when the device is used, the box 41 is placed on the chassis 1, and the device to be tested is located inside the box 41.

The guide surface 42 is connected to the upper end of the case 41, and the guide surface 42 extends toward the outside in a direction from below to above. On the one hand, guide face 42 is used for providing the direction function, and guide probe 61 and the contact of being surveyed the device to reduce the degree of difficulty that probe 61 was fixed a position, prevent that probe 61 from touching by mistake, on the other hand, guide face 42 can provide certain counter weight for box body 41, guarantees that box body 41 can stably place the week side at the device under test, avoids pushing to other positions by probe 61 because of box body 41 is too light.

In some embodiments, the guiding surface 42 is a smooth curved surface, and the smooth curved surface structure can play a better guiding role, ensuring that the probe 61 can contact with the device to be tested more quickly and accurately.

Optionally, the two guide surfaces 42 are provided, and the two guide surfaces 42 are oppositely arranged at two sides of the upper end of the box body 41, as indicated in the background art, the mode of a probe of a stick-needle type oscilloscope plus the grounding spring 7 is generally adopted for measuring the ripple, the probe 61 of the probe and the grounding spring 7 are both required to be guided, and the two guide surfaces 42 can respectively guide the probe 61 and the grounding spring 7, so that the test efficiency is improved. Further, the guide surface 42 may be provided with a tapered structure similar to a funnel, and may also function to guide the grounding spring 7 and the probe 61 at the same time.

In some embodiments, the oscilloscope probe spot measurement auxiliary device further comprises a spacing adjusting part 5, during the ripple measurement process, the probe 61 needs to be in contact with the device to be tested, the grounding spring 7 needs to be pinched by hands and a suitable angle is found for grounding, but the grounding spring 7 pinched by hands is quite unstable and is easy to short circuit, so that the application adds the spacing adjusting part 5 to adjust the angle of the grounding spring 7, thereby adjusting the distance between the grounding spring 7 and the probe 61 and improving the test efficiency.

Specifically, the spacing adjusting part 5 is detachably connected with the oscilloscope probe 6, the spacing adjusting part 5 is provided with a plurality of limiting protrusions 53, the limiting protrusions 53 are arranged at intervals in the radial direction of the oscilloscope probe 6, the oscilloscope probe 6 is provided with a grounding spring 7, the grounding spring 7 comprises a first section 71 and a second section 72 which are connected, the first section 71 extends in the radial direction of the probe, the second section 72 extends in the axial direction of the probe, a user can shift the second section 72 to the proper limiting protrusion 53, and the limiting protrusion 53 clamps the second section 72, so that the second section 72 and the probe 61 of the oscilloscope probe 6 can be fixed with each other. When the grounding spring 7 is not required, the spacing adjusting member 5 is simply detached from the oscilloscope probe 6.

In some embodiments, the spacing member 5 includes a first surface 51, a second surface 52, and a connecting column, the first surface 51 and the second surface 52 are parallel to each other and are disposed opposite to each other, the first surface 51 and the second surface 52 have a spacing distance therebetween, one end of the connecting column is connected to the first surface 51, and the other end is connected to the second surface 52, and when the spacing member 5 is mounted on the oscilloscope probe 6, the probe 61 and the first and second sections 71 and 72 of the grounding spring 7 are both located between the first surface 51 and the second surface 52, so as to adjust the position of the second section 72.

The limiting protrusion 53 may be disposed on the first surface 51 or the second surface 52, and may also be disposed on both the first surface 51 and the second surface 52, of course, the limiting protrusion 53 should be disposed on one side of the first surface 51 adjacent to the second surface 52 or one side of the second surface 52 adjacent to the first surface 51 to ensure that the second section 72 can be caught by the limiting protrusion 53.

Further, as shown in fig. 4, the limiting protrusions 53 are inclined in the direction from the bottom to the top along the direction from the probe 61 to the second section 72, that is, the limiting protrusions are inclined in the direction from the bottom to the top along the radial direction of the probe 61 to the outside, and the inclination angles of the plurality of limiting protrusions 53 are gradually reduced along the direction from the probe 61 to the second section 72.

As shown in fig. 5 and 6, when the grounding spring 7 is not subjected to an external force, the second segment 72 is substantially parallel to the probe 61, but when the second segment 72 is bent inward, a certain angle is formed between the second segment 72 and the probe, and the angle is increased as the second segment is bent inward, so that the limiting protrusion 53 can adapt to the bending angle of the grounding spring 7, and therefore the limiting protrusion 53 is inclined and has different inclination angles, it should be noted that in order to prevent the grounding spring 7 from slipping off from the limiting protrusion 53, a notch may be provided on the limiting protrusion 53, and the second segment 72 may be clamped on the limiting protrusion 53.

Optionally, the first face 51 and the second face 52 are both triangular structures, the number of the connecting columns is two, and the connecting columns include a first connecting column 54 and a second connecting column 55, the first connecting column 54 is located at one corner corresponding to the first face 51 and the second face 52, the second connecting column 55 is located at the other corner corresponding to the first face 51 and the second face 52, after installation, the first connecting column 54 is clamped at one side, away from the second section 72, of the probe 61 of the oscilloscope probe 6, the second connecting column 55 is clamped above the first section 71, and the limiting protrusion 53 is arranged adjacent to one corner where the first face 51 or the second face 52 does not have a connecting column, so that the influence of the connecting columns on the movement of the second section 72 is avoided, the structure is simple, and the design is reasonable.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", and the like, indicate the orientation or positional relationship indicated based on the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally formed; may be mechanically coupled, may be electrically coupled or may be in communication with each other; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In the present application, unless expressly stated or limited otherwise, the first feature may be directly on or directly under the second feature or indirectly via intermediate members. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

In the present disclosure, the terms "one embodiment," "some embodiments," "an example," "a specific example," or "some examples" or the like mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present disclosure. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

Although embodiments of the present invention have been shown and described, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art without departing from the scope of the present invention.

Claims (10)

1. The utility model provides an auxiliary device is surveyed to oscilloprobe point which characterized in that, includes chassis, linking arm, probe clamp and anti-skidding piece, the one end of linking arm with the chassis links to each other, and the other end with the probe clamp links to each other, just the linking arm is movable, the probe clamp is used for centre gripping and fixed oscilloprobe, the anti-skidding piece is suitable for the cover to be established in the week side of being surveyed the piece, oscilloprobe can stretch into in the anti-skidding piece, so that the anti-skidding piece prevents the oscilloprobe slippage.

2. The oscilloscope probe point measurement auxiliary device according to claim 1, wherein the anti-slip member comprises a box body and a guide surface, wherein the upper end and the lower end of the box body are open, the guide surface is connected with the upper end of the box body, and the guide surface extends towards the outer side from the bottom to the top.

3. The oscilloscope probe point measurement auxiliary device according to claim 2, wherein the guide surface is a smooth curved surface.

4. The oscilloscope probe point measurement auxiliary device according to claim 2, wherein the two guide surfaces are oppositely arranged at two sides of the upper end of the box body.

5. The oscilloscope probe point measurement auxiliary device according to claim 1, wherein the material of the slip prevention member is an insulating material.

6. The auxiliary device for the spot measurement of the oscilloscope probe according to any one of claims 1 to 5, further comprising a spacing adjusting member, wherein the spacing adjusting member is connected with the oscilloscope probe, the spacing adjusting member is provided with a plurality of limiting protrusions, and the limiting protrusions are arranged at intervals along the radial direction of the oscilloscope probe.

7. The auxiliary device for the spot measurement of the oscilloscope probe according to claim 6, further comprising a grounding spring, wherein the grounding spring comprises a first section and a second section which are connected, and the second section is adjustably clamped at the position of the limiting protrusion to adjust the distance between the second section and the probe of the oscilloscope probe.

8. The auxiliary device for the point measurement of the oscilloscope probe according to claim 7, wherein the distance adjusting member comprises a first surface, a second surface and a connecting column, the first surface and the second surface are parallel and opposite to each other, two ends of the connecting column are respectively connected with the first surface and the second surface, and the limiting protrusion is arranged on one side of the first surface adjacent to the second surface and/or one side of the second surface adjacent to the first surface.

9. The oscilloscope probe spot measurement auxiliary device according to claim 8, wherein the limiting protrusion is inclined in a direction from bottom to top in a direction from the probe to the second section, and the inclination angles of the plurality of limiting protrusions are gradually reduced in a direction from the probe to the second section.

10. The oscilloscope probe point measurement auxiliary device according to claim 6, wherein the spacing adjustment member is detachably connected to the oscilloscope probe.

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