CN212031654U - Testing device and testing system - Google Patents

Abstract

The utility model relates to a semiconductor device tests technical field, especially relates to a testing arrangement and test system. The utility model discloses a testing arrangement will test jack spare movably connect in the test base plate makes adjacently be close to each other or keep away from between the test jack spare, and then can change the sequencing of test jack spare in a flexible way, can carry out the arrangement of the semiconductor device's of testing pin according to the user's needs in a flexible way, and then the arrangement that the sequencing of adjustment test jack spare made it corresponding with the arrangement of semiconductor device's pin, can test the different semiconductor device of multiple pin sequencing in a flexible way. The utility model provides a testing arrangement can test the different semiconductor device of multiple pin sequencing in a flexible way, practices thrift the cost, improves work efficiency.

Description

Testing device and testing system

Technical Field

The utility model relates to a semiconductor device tests technical field, especially relates to a testing arrangement and test system.

Background

With the development of semiconductor device technology, semiconductor devices have been developed in the direction of high performance, high reliability and miniaturization. In order to ensure that the device can meet performance requirements, market requirements and the like, the device needs a relatively long research and development period from research and development to market, and a plurality of tests are required in the process to ensure that the device can meet the research and development requirements. The test occupies a very important position in the whole process, the current test device is very inconvenient to use in the actual test process, the jumper wire needs to be welded for testing each time, the process is time-consuming and labor-consuming, and the pins of the components can be welded badly to influence the experimental result. And may even damage the device, delaying the experimental cycle.

SUMMERY OF THE UTILITY MODEL

The utility model provides a testing arrangement, testing arrangement test jack spare movably connect in test substrate can solve above-mentioned technical problem effectively.

The utility model discloses a testing device, which comprises a testing substrate and at least two testing jack pieces used for connecting a device to be tested; the test socket piece is movably connected to the test substrate, so that adjacent test socket pieces are close to or far away from each other.

In one embodiment, the testing device further comprises at least two testing groups, wherein the testing groups are movably connected to the testing substrate so as to enable the adjacent testing groups to approach or move away from each other; the test jack piece is arranged in the test group and can move along with the test group.

In one embodiment, the test socket members are spaced apart from the test group and are selectively slidable along a first predetermined direction; the test groups are connected to the test substrate at intervals and can selectively slide along a second preset direction; the first preset direction and the second preset direction form an included angle.

In one embodiment, the angle between the first preset direction and the second preset direction is set to 90 °.

In one embodiment, the test jack piece comprises a jack, and a clamping elastic sheet for clamping a pin of the device to be tested is arranged on the inner side of the jack.

In one embodiment, the clamping elastic sheet includes a first elastic sheet and a second elastic sheet, at least a part of which are abutted against each other, and the first elastic sheet and the second elastic sheet are separated from each other under the pressure action of the pin of the device to be tested and accumulate elastic potential energy so as to abut against the pin of the device to be tested.

In one embodiment, the first resilient piece and the second resilient piece are symmetrically and obliquely arranged about a connection point of the first resilient piece and the second resilient piece, and a distance between the first resilient piece and the second resilient piece gradually decreases along an extending direction of the jack of the test jack piece.

In one embodiment, the first elastic sheet is provided with a bent shape, and the first elastic sheet is provided with a first bending part and a second bending part which are connected with each other; the second elastic sheet is arranged in a bent shape and is provided with a third bent part and a fourth bent part which are connected with each other; the first bending part and the third bending part are arranged oppositely, and the distance between the first bending part and the third bending part is gradually reduced along the extension direction of the jack of the test jack piece; the second bending part and the fourth bending part are arranged oppositely, and the distance between the second bending part and the fourth bending part is gradually reduced along the extension direction of the jack of the test jack piece.

In one embodiment, the first bent portion and the third bent portion are symmetrically disposed about an axis of the insertion hole; the second bending part and the fourth bending part are symmetrically arranged relative to the axis of the jack.

In one embodiment, a test wire is arranged on the clamping elastic sheet and arranged along the extending direction of the jack.

In one embodiment, an insulating glue is provided at the edge of the receptacle.

The utility model also provides a test system, test system includes foretell testing arrangement.

The utility model provides a pair of testing arrangement compares with prior art, possesses following beneficial effect at least:

the utility model discloses a testing arrangement will test jack spare movably connect in the test base plate makes adjacently be close to each other or keep away from between the test jack spare, and then can change the sequencing of test jack spare in a flexible way, can carry out the arrangement of the semiconductor device's of testing pin according to the user's needs in a flexible way, and then the arrangement that the sequencing of adjustment test jack spare made it corresponding with the arrangement of semiconductor device's pin, can test the different semiconductor device of multiple pin sequencing in a flexible way. The utility model provides a testing arrangement can test the different semiconductor device of multiple pin sequencing in a flexible way, practices thrift the cost, improves work efficiency.

The utility model provides a test system owing to include foretell testing arrangement, consequently also possesses and has foretell beneficial effect.

Drawings

The present invention will be described in more detail hereinafter based on embodiments and with reference to the accompanying drawings.

Fig. 1 is a schematic overall structure diagram of a testing device according to an embodiment of the present invention;

fig. 2 is a schematic cross-sectional view of a testing device according to an embodiment of the present invention;

fig. 3 is a schematic diagram of a connection structure of a testing apparatus and a device under test according to an embodiment of the present invention;

fig. 4 is a schematic connection cross-sectional view of a testing apparatus and a device under test at a first viewing angle according to an embodiment of the present invention;

fig. 5 is a schematic connection cross-sectional view of a testing apparatus and a device under test at a second viewing angle according to an embodiment of the present invention.

In the drawings, like parts are provided with like reference numerals. The figures are not drawn to scale.

Reference numerals:

10-a test device; 11-a test substrate; 13-test group; 131-a test jack; 133-test leads; 135-insulating glue; 15-clamping the elastic sheet; 151-a first spring plate; 151 a-a first bend; 151 b-a second bend; 153-a second spring plate; 153 a-third bend; 153 b-fourth fold.

Detailed Description

The present invention will be further explained with reference to the accompanying drawings.

Referring to fig. 1 to 5, a testing apparatus 10 of the present invention includes a testing substrate 11 and at least two testing socket members 131 for connecting to a device under test; the test socket members 131 are movably connected to the test substrate 11, so that adjacent test socket members 131 are close to or far from each other.

The utility model discloses a testing arrangement 10 will test jack piece 131 movably connect in test base plate 11 makes adjacent be close to each other or keep away from between the test jack piece 131, and then can change the sequencing of test jack piece 131 in a flexible way, can carry out the arrangement of the semiconductor device's that tests pin according to the user's needs in a flexible way, and then the arrangement that the sequencing of adjustment test jack piece 131 made it corresponding with the arrangement of semiconductor device's pin, can test the different semiconductor device of multiple pin sequencing in a flexible way. The utility model provides a testing arrangement 10 can test the different semiconductor device of multiple pin sequencing in a flexible way, practices thrift the cost, improves work efficiency.

In one example, the testing device 10 further includes at least two testing groups 13, wherein the testing groups 13 are movably connected to the testing substrate 11 so as to move adjacent testing groups 13 toward or away from each other; the test socket 131 is disposed in the test set 13 and is movable with the test set 13. . At least two test groups 13 are arranged, the test groups 13 are movably connected to the test substrate 11, so that the adjacent test groups 13 can be close to or far away from each other, that is, the test groups 13 can be adjusted to correspond to the pins of the semiconductor device to be tested according to the distance between the pins, thereby being convenient for realizing flexible switching test and enhancing the test matching of the test device 10.

In one example, the test socket members 131 are spaced apart from each other and connected to the test set 13 and selectively slidable along a first predetermined direction, and the test set 13 is spaced apart from each other and connected to the test substrate 11 and selectively slidable along a second predetermined direction; the first preset direction and the second preset direction form an included angle. Configuring the test jack 131 to be selectively slidable along a first predetermined direction, and configuring the test group 13 to be selectively slidable along a second predetermined direction; the first preset direction and the second preset direction form an included angle, so that the test set 13 and the test jack 131 can slide along different directions.

Specifically, in this embodiment, an included angle between the first preset direction and the second preset direction is set to be 90 °. That is, the test socket 131 slides along the up-down direction, so that the test set 13 slides along the left-right direction (the test set 13 can slide left and right, that is, the test socket 131 arranged in the test set 13 can also move left and right), that is, the test socket 131 can slide up and down, left and right, and further the sequence of the test socket 131 can be flexibly rearranged according to the user's requirement, thereby realizing the test of various semiconductor devices. It should be noted that, an included angle between the first preset direction and the second preset direction is not limited herein, and it is understood that, in other specific embodiments, the included angle between the first preset direction and the second preset direction may also be set to other values according to a user's requirement, for example, 30 °, 45 °, or 75 °.

Specifically, in the present embodiment, the test substrate 11 has a first sliding slot (not shown in the figure) arranged along a first preset direction, and the test set 13 is slidably connected to the first sliding slot and can reciprocate along the first preset direction in the first sliding slot; the testing unit 13 has a second sliding slot along a second predetermined direction, and the testing socket member 131 is slidably connected to the second sliding slot (not shown) and can reciprocate along the second predetermined direction in the second sliding slot. It should be further noted that, in this embodiment, a preset gap is provided between adjacent test sets 13, and a specific gap size may be optionally designed in an actual design application according to a requirement of a user, where the size of the specific gap is not limited, and is not excessively set forth. Similarly, in this embodiment, a preset gap is also provided between adjacent test socket pieces 131, and the specific size of the gap may be optionally designed in practical design application according to the requirement of a user, and the size of the specific gap is not limited herein, and is not set forth in too many limitations.

Specifically, in the present embodiment, the testing device 10 includes four sets of testing groups 13, and the four sets of testing groups 13 are connected to the testing substrate 11 in parallel at intervals. It should be noted that, the specific number of the test sets 13 is not limited here, and it should be understood that, in other specific embodiments, the number of the test sets 13 may also be set to two or six, etc. according to the requirement of the user.

In one example, the test socket member 131 includes a socket, and a clamping spring 15 for clamping a pin of the device under test is disposed inside the socket. Set up centre gripping shell fragment 15, can be used to the device pin that awaits measuring, in the test process, the device pin that awaits measuring inserts in the jack of corresponding test jack piece 131 and carries out the test procedure, centre gripping shell fragment 15 can firmly grasp the device pin that awaits measuring and avoid its landing and then influence the result of test, sets up the stability that centre gripping shell fragment 15 can strengthen the test procedure simultaneously.

In one example, the clamping resilient sheet 15 includes a first resilient sheet 151 and a second resilient sheet 153, at least a portion of which abut against each other, and the first resilient sheet 151 and the second resilient sheet 153 are separated from each other under the pressure of the pin of the device under test and accumulate elastic potential energy so as to abut against the pin of the device under test. In the testing process, the pins of the device to be tested are inserted into the corresponding sockets of the testing socket 131 for testing, the first elastic sheet 151 and the second elastic sheet 153 are mutually away from each other under the pressure action of the pins of the device to be tested and accumulate elastic potential energy to abut against the pins of the device to be tested, and the pins of the device to be tested can be firmly clamped by the elastic force of the elastic first elastic sheet 151 and the elastic second elastic sheet 153.

In one example, the first resilient piece 151 and the second resilient piece 153 are symmetrically and obliquely disposed about a connection point of the first resilient piece 151 and the second resilient piece 153, and a distance between the first resilient piece 151 and the second resilient piece 153 gradually decreases along an extending direction of the insertion hole of the test socket piece 131. The first elastic sheet 151 and the second elastic sheet 153 are symmetrically and obliquely arranged about the connection point of the first elastic sheet 151 and the second elastic sheet 153, so that the clamping elastic sheet 15 can clamp pins of devices to be tested with different sizes, and in the testing process, as the distance between the first elastic sheet 151 and the second elastic sheet 153 is gradually reduced along the extension direction of the jack of the testing jack piece 131, namely the cross sections of the first elastic sheet 151 and the second elastic sheet 153 form a cone shape, the pins of the devices to be tested can be clamped by the first elastic sheet 151 and the second elastic sheet 153 in a larger range. Meanwhile, after the test is completed, the pins of the device to be tested are separated from the corresponding jacks of the test jack piece 131, the first elastic sheet 151 and the second elastic sheet 153 are abutted against each other under the action of elastic force, so that the jacks of the test jack piece 131 are shielded, and dust or other impurities can be effectively prevented from falling into the jacks and further influencing subsequent tests.

In one example, the first elastic piece 151 is provided with a bent shape, and the first elastic piece 151 includes a first bent portion 151a and a second bent portion 151b connected to each other; the second elastic piece 153 is bent, and the second elastic piece 153 has a third bent portion 153a and a fourth bent portion 153b connected to each other; the first bent portion 151a and the third bent portion 153a are disposed opposite to each other, and a distance between the first bent portion 151a and the third bent portion 153a gradually decreases along an extending direction of the socket of the test socket piece 131; the second bent portion 151b is opposite to the fourth bent portion 153b, and a distance between the second bent portion 151b and the fourth bent portion 153b gradually decreases along an extending direction of the socket of the test socket piece 131. The first elastic sheet 151 and the second elastic sheet 153 are bent to further enhance the elasticity of the first elastic sheet 151 and the second elastic sheet 153, when a pin of a device to be tested is connected, the end of the pin of the device to be tested can slide along the inclined planes of the first bent portion 151a and the third bent portion 153a under the action of pressure, and then slide into the inclined plane formed by the second bent portion 151b and the fourth bent portion 153b, and continue to extend into the testing position, so that the second bent portion 151b and the fourth bent portion 153b obtain the inclined pressure from the structure under the action of the first bent portion 151a and the third bent portion 153a, and further the second bent portion 151b and the fourth bent portion 153b are clamped more firmly in the clamping process.

In one example, the first bent portion 151a and the third bent portion 153a are symmetrically disposed about an axis of the insertion hole; the second bent portion 151b and the fourth bent portion 153b are symmetrically disposed about an axis of the insertion hole. The first bending part 151a and the third bending part 153a are symmetrically arranged about the axis of the insertion hole, and the second bending part 151b and the fourth bending part 153b are symmetrically arranged about the axis of the insertion hole, so that the pins of the test device can be effectively prevented from tilting during the test process while the clamping is ensured to be stable.

In one example, the holding elastic piece 15 is provided with a test wire 133, and the test wire 133 is arranged along the extending direction of the jack. The test lead 133 is directly led out, so that the trouble that the pins are damaged by the bonding wires of the pins and even the device is damaged is avoided. When testing, the components can be directly inserted into the jacks of the invention for direct testing.

In one example, an insulating glue 135 is provided at the edge of the receptacle. The edge of the jack is provided with the insulating glue 135, so that the short circuit problem caused by mistaken contact between two adjacent pins due to the close pins can be effectively avoided.

The utility model also provides a test system, test system includes foretell testing arrangement 10.

The utility model provides a test system is owing to include foretell testing arrangement 10, consequently also possesses and has foretell beneficial effect.

While the invention has been described with reference to a preferred embodiment, various modifications may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In particular, the technical features mentioned in the embodiments can be combined in any way as long as there is no structural conflict. The present invention is not limited to the particular embodiments disclosed herein, but encompasses all technical solutions falling within the scope of the claims.

Claims (12)

1. The test device is characterized by comprising a test substrate and at least two test jack pieces for connecting a device to be tested; the test socket piece is movably connected to the test substrate, so that adjacent test socket pieces are close to or far away from each other.

2. The testing device of claim 1, further comprising at least two testing groups, wherein the testing groups are movably coupled to the testing substrate to move adjacent testing groups toward or away from each other; the test jack piece is arranged in the test group and can move along with the test group.

3. The test apparatus as claimed in claim 2, wherein the test socket member is connected to the test group at intervals and selectively slidable along a first predetermined direction; the test groups are connected to the test substrate at intervals and can selectively slide along a second preset direction; the first preset direction and the second preset direction form an included angle.

4. A test device according to claim 3, wherein the angle between the first predetermined direction and the second predetermined direction is set to 90 °.

5. The testing device of any one of claims 1-4, wherein the testing socket member comprises a socket, and a clamping spring for clamping a pin of the device under test is arranged inside the socket.

6. The testing device of claim 5, wherein the clamping spring plate comprises a first spring plate and a second spring plate, at least a part of the first spring plate and the part of the second spring plate are abutted against each other, and the first spring plate and the second spring plate are separated from each other under the pressure action of the pin of the device to be tested and accumulate elastic potential energy so as to abut against the pin of the device to be tested.

7. The testing device of claim 6, wherein the first resilient piece and the second resilient piece are symmetrically and obliquely arranged about a connection point of the first resilient piece and the second resilient piece, and a distance between the first resilient piece and the second resilient piece gradually decreases along an extending direction of the jack of the testing jack piece.

8. The testing device as claimed in claim 6, wherein the first resilient plate is provided with a bent portion, and the first resilient plate has a first bending portion and a second bending portion connected to each other;

the second elastic sheet is arranged in a bent shape and is provided with a third bent part and a fourth bent part which are connected with each other;

the first bending part and the third bending part are arranged oppositely, and the distance between the first bending part and the third bending part is gradually reduced along the extension direction of the jack of the test jack piece;

the second bending part and the fourth bending part are arranged oppositely, and the distance between the second bending part and the fourth bending part is gradually reduced along the extension direction of the jack of the test jack piece.

9. The testing device of claim 8, wherein the first bend and the third bend are symmetrically disposed about an axis of the socket; the second bending part and the fourth bending part are symmetrically arranged relative to the axis of the jack.

10. The testing device of claim 5, wherein the clamping spring is provided with a testing wire, and the testing wire is arranged along the extending direction of the jack.

11. The testing device of claim 5, wherein an insulating glue is disposed at an edge of the receptacle.

12. A test system comprising a test device according to any one of claims 1 to 11.

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