CN213544445U - High-low temperature testing device - Google Patents
High-low temperature testing device Download PDFInfo
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- CN213544445U CN213544445U CN202021740762.2U CN202021740762U CN213544445U CN 213544445 U CN213544445 U CN 213544445U CN 202021740762 U CN202021740762 U CN 202021740762U CN 213544445 U CN213544445 U CN 213544445U
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- low temperature
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Abstract
The utility model discloses a high low temperature testing arrangement, including base, mobile device, high low temperature testing arrangement, high low temperature test storehouse, slip pull device, blast apparatus and buffering storehouse, mobile device locates on the base, high low temperature test storehouse is located on the mobile device, the buffering storehouse is located on the mobile device and is close to high low temperature testing arrangement, slip pull device locates between high low temperature test storehouse and the buffering storehouse, blast apparatus locates in the buffering storehouse, high low temperature testing arrangement locates in the high low temperature test storehouse. The utility model belongs to the technical field of high low temperature test, specifically indicate a can carry out the high low temperature testing arrangement of former temperature recovery to article after the measurement.
Description
Technical Field
The utility model belongs to the technical field of high low temperature test, specifically indicate a high low temperature testing arrangement.
Background
The research of material science often needs to research the performance parameters and the change conditions of various materials under high-temperature and low-temperature environments, such as the magnetic, electrical, optical and other performance research and parameter test of various materials under high temperature and low temperature, and the change rule of various performance parameters under the condition of high-temperature and low-temperature alternate change; the existing high-low temperature testing device is of a box body structure with a temperature control system, is mainly used for reliability tests of high-low temperature application environments of parts and materials of related products such as electricians, electronics, automobiles, motorcycles and the like, and verifies whether performance indexes of the high-low temperature testing device meet requirements of the use environments of the products; above-mentioned current high low temperature testing arrangement is usually after carrying out high low temperature test to the object that awaits measuring, can not be very fast the recovery original temperature for operating personnel can not take out the article that awaits measuring very fast.
SUMMERY OF THE UTILITY MODEL
For solving the above-mentioned current difficult problem, the utility model provides a can carry out the high low temperature test device of former temperature recovery to the article after the measurement.
The utility model adopts the following technical scheme: the utility model relates to a high low temperature testing arrangement, including base, mobile device, high low temperature testing arrangement, high low temperature test storehouse, slip pull device, blast apparatus and buffering storehouse, the mobile device is located on the base, high low temperature test storehouse is located on the mobile device, the buffering storehouse is located on the mobile device and is close to high low temperature testing arrangement, slip pull device is located between high low temperature test storehouse and the buffering storehouse, is used for keeping apart high low temperature test storehouse and buffering storehouse, blast apparatus locates in the buffering storehouse, carries out former temperature restoration to the article after the measurement, high low temperature testing arrangement locates in high low temperature test storehouse; the sliding drawing device comprises a suspension plate, a drawing motor, a roller rod, a drawing line, a fixed pulley, a heat insulation plate and a baffle plate, wherein one end of the heat insulation plate is arranged at the joint of the buffer bin and the high-low temperature test bin, one end of the suspension plate is arranged on the heat insulation plate, the drawing motor is arranged on the suspension plate, one end of the roller rod is connected with the output shaft end of the drawing motor, one end of the drawing line is arranged at the other end of the roller rod, the fixed pulley can be slidably arranged on the heat insulation plate, the other end of the drawing line penetrates through the fixed pulley and is arranged in the heat insulation plate, one end of the baffle plate is connected with the other end of the drawing line, when an article after measurement needs to be subjected to original temperature recovery, the drawing motor works to drive the roller rod to rotate, the roller rod winds the drawing line, the drawing line slides.
Further, the heat insulation plate is arranged in a hollow cavity, and the width of the heat insulation plate is larger than that of the baffle.
Further, the moving device comprises a ball screw, a rotating motor shell, a supporting plate, a sample, a screw shell and a slide block, the screw rod shell is arranged on the base, the rotating motor shell is arranged on one side wall of the screw rod shell, the rotating motor is arranged in the motor shell, one end of the ball screw is rotatably arranged on two opposite side walls in the screw shell, one end of the ball screw is connected with the output shaft end of the rotating motor, the surface of the ball screw is provided with threads, the sliding block is arranged on the ball screw in a sliding way, threads are arranged in the sliding block, the internal threads of the sliding block are meshed with the threads of the ball screw, one end of the supporting plate penetrates through the screw shell to be connected with the sliding block, the sample is arranged on the supporting plate, the rotating motor works to drive the ball screw to rotate, the ball screw drives the sliding block to slide on the ball screw, and the sliding block drives the supporting plate to move along the screw shell.
Further, blast apparatus includes motor housing, driving motor, flabellum storehouse, flabellum, heated warehouses and heating wire, motor housing locates the surge bin upper wall, driving motor locates in the motor housing, the flabellum storehouse is located the upper wall in the surge bin, the flabellum is located in the flabellum storehouse, driving motor output shaft end links to each other with the flabellum, the heated warehouses is located on the flabellum storehouse diapire, in the heated warehouses is located to the heating wire, and when the object that awaits measuring needs to heat up, driving motor work drives the flabellum rotatory, and the heating wire heats up gas in the heated warehouses, blows off hot-blast object that awaits measuring through the flabellum and carries out the intensification processing, and when the object that awaits measuring needs to cool down, driving motor work drives the fla.
Furthermore, the buffer bin is provided with a small ventilation hole, a handle and a heat insulation sleeve, the small ventilation hole is formed in the upper wall of the buffer bin, the handle is arranged on the side wall of the buffer bin, and the heat insulation sleeve is arranged on the handle.
Adopt above-mentioned structure the utility model discloses the beneficial effect who gains as follows: this scheme high low temperature testing arrangement, slip pull device divide into high low temperature test storehouse and buffering storehouse two parts with whole equipment, the object through the test in high low temperature test storehouse passes through mobile device and slip pull device's setting, portable buffering storehouse of advancing, the initial temperature that resumes very fast of the object physical stamina that awaits measuring in buffering storehouse, the operating personnel of being convenient for takes out the article that awaits measuring, overcome the object that awaits measuring under traditional high low temperature testing arrangement and carried out the high low temperature test after, the shortcoming of the original temperature of resume very fast.
Drawings
Fig. 1 is a schematic view of the overall structure of a high and low temperature testing device of the present invention;
fig. 2 is the utility model relates to a high low temperature testing arrangement blast apparatus schematic structure.
The device comprises a base 1, a base 2, a moving device 3, a high and low temperature testing device 4, a high and low temperature testing bin 5, a sliding drawing device 6, a blowing device 7, a buffering bin 8, a suspension plate 9, a pulling motor 10, a roller rod 11, a pulling line 12, a fixed pulley 13, a heat insulation plate 14, a baffle plate 15, a ball screw 16, a rotating motor 17, a rotating motor shell 18, a support plate 19, a sample 20, a screw shell 21, a sliding block 22, a motor shell 23, a driving motor 24, a fan blade bin 25, fan blades 26, a heating bin 27, an electric heating wire 28, a small air hole 29, a handle 30 and a heat insulation sleeve.
Detailed Description
The technical solution of the present invention will be described in further detail with reference to the following embodiments, and the technical features or the connection relations of the present invention, which are not described in detail, are the prior art adopted.
The present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1-2, the utility model relates to a high and low temperature testing device, which comprises a base 1, a mobile device 2, a high and low temperature testing device 3, a high and low temperature testing chamber 4, a sliding drawing device 5, a blowing device 6 and a buffering chamber 7, wherein the mobile device 2 is arranged on the base 1, the high and low temperature testing chamber 4 is arranged on the mobile device 2, the buffering chamber 7 is arranged on the mobile device 2 and is close to the high and low temperature testing device 3, the sliding drawing device 5 is arranged between the high and low temperature testing chamber 4 and the buffering chamber 7, the blowing device 6 is arranged in the buffering chamber 7, and the high and low temperature testing device 3 is arranged in the high and low temperature testing chamber 4; the sliding drawing device 5 comprises a suspension plate 8, a drawing motor 9, a roller rod 10, a drawing line 11, a fixed pulley 12, a heat insulation plate 13 and a baffle plate 14, wherein one end of the heat insulation plate 13 is arranged at the joint of a buffer bin 7 and a high-low temperature test bin 4, one end of the suspension plate 8 is arranged on the heat insulation plate 13, the drawing motor 9 is arranged on the suspension plate 8, one end of the roller rod 10 is connected with the output shaft end of the drawing motor 9, one end of the drawing line 11 is arranged at the other end of the roller rod 10, the fixed pulley 12 is arranged on the heat insulation plate 13 in a sliding mode, the other end of the drawing line 11 penetrates through the fixed pulley 12 and is arranged in the heat insulation plate 13, and one end of the baffle plate 14 is connected.
The heat insulation plate 13 is arranged in a hollow cavity, and the width of the heat insulation plate 13 is larger than that of the baffle 14.
The moving device 2 comprises a ball screw 15, a rotating motor 16, a rotating motor shell 17, a supporting plate 18, a sample 19, a screw shell 20 and a sliding block 21, wherein the screw shell 20 is arranged on the base 1, the rotating motor shell 17 is arranged on one side wall of the screw shell 20, the rotating motor 16 is arranged in the rotating motor shell 17, one end of the ball screw 15 is rotatably arranged on the opposite side walls in the screw shell 20, one end of the ball screw 15 is connected with the output shaft end of the rotating motor 16, the surface of the ball screw 15 is provided with threads, the sliding block 21 is slidably arranged on the ball screw 15, the threads are arranged in the sliding block 21, the internal threads of the sliding block 21 are meshed with the threads of the ball screw 15, one end of the supporting plate 18 penetrates through the screw shell 20 to be connected with the sliding block 21, and the.
The buffer bin 7 is provided with a small air hole 28, a handle 29 and a heat insulation sleeve 30, the small air hole 28 is formed in the upper wall of the buffer bin 7, the handle 29 is formed in the side wall of the buffer bin 7, and the heat insulation sleeve 30 is formed in the handle 29.
When the device is used, an operator places an object to be tested on the supporting plate 18, high and low temperature tests are carried out in the high and low temperature test chamber 4 through the high and low temperature test device 3, after the tests are finished, the rotating motor 16 works to drive the ball screw 15 to rotate, the ball screw 15 drives the slide block 21 to slide on the ball screw 15, the slide block 21 drives the supporting plate 18 to move along the screw shell 20, the pulling motor 9 works to drive the roller rod 10 to rotate, the roller rod 10 winds the pulling wire 11, the pulling wire 11 slides on the fixed pulley 12 and drives the baffle plate 14 to ascend, the object to be tested moves into the buffer chamber 7, when the object to be tested needs to be heated, the driving motor 23 works to drive the fan blades 25 to rotate, the heating wire 27 heats the gas in the heating chamber 26, hot air is blown out through the fan blades 25 to carry out heating treatment on the object to be tested, when the object to be tested needs to be cooled, the, the fan blades 25 cool the object to be measured, and after the temperature of the object to be measured is recovered, an operator holds the handle 29 through the heat insulation sleeve 30 to open the buffer bin 7, and then takes out the object.
The present invention and the embodiments thereof have been described above, but the description is not limited thereto, and the embodiment shown in the drawings is only one of the embodiments of the present invention, and the actual structure is not limited thereto. In summary, those skilled in the art should understand that they should not be limited to the embodiments described above, and that they can design the similar structure and embodiments without departing from the spirit of the invention.
Claims (5)
1. A high and low temperature testing device is characterized in that: the device comprises a base, a moving device, a high-low temperature testing bin, a sliding drawing device, a blowing device and a buffering bin, wherein the moving device is arranged on the base; the sliding drawing device comprises a suspension plate, a drawing motor, a roller rod, a drawing line, a fixed pulley, a heat insulation plate and a baffle plate, wherein one end of the heat insulation plate is arranged at the joint of the buffer bin and the high-low temperature test bin, one end of the suspension plate is arranged on the heat insulation plate, the drawing motor is arranged on the suspension plate, one end of the roller rod is connected with the output shaft end of the drawing motor, one end of the drawing line is arranged at the other end of the roller rod, the fixed pulley is slidably arranged on the heat insulation plate, the other end of the drawing line penetrates through the fixed pulley and is arranged in the heat insulation plate, and one end of the baffle plate is connected with the.
2. A high and low temperature test apparatus according to claim 1, wherein: the heat insulation plate is arranged in a hollow cavity, and the width of the heat insulation plate is larger than that of the baffle.
3. A high and low temperature test apparatus according to claim 1, wherein: the moving device comprises a ball screw, a rotating motor shell, a supporting plate, a sample, a screw shell and a sliding block, wherein the screw shell is arranged on the base, the rotating motor shell is arranged on one side wall of the screw shell, the rotating motor is arranged in the rotating motor shell, one end of the ball screw is rotatably arranged on two opposite side walls in the screw shell, one end of the ball screw is connected with the output shaft end of the rotating motor, threads are arranged on the surface of the ball screw, the sliding block is slidably arranged on the ball screw, threads are arranged in the sliding block, inner threads of the sliding block are meshed with the threads of the ball screw, one end of the supporting plate penetrates through the screw shell and is connected with the sliding block, and.
4. A high and low temperature test apparatus according to claim 1, wherein: the blowing device comprises a motor shell, a driving motor, a fan blade bin, fan blades, a heating bin and a heating wire, wherein the motor shell is arranged on the upper wall of the buffer bin, the driving motor is arranged in the motor shell, the upper wall of the buffer bin is arranged on the fan blade bin, the fan blades are arranged in the fan blade bin, the output shaft end of the driving motor is connected with the fan blades, the heating bin is arranged on the bottom wall of the fan blade bin, and the heating wire is arranged in the heating bin.
5. A high and low temperature test apparatus according to claim 1, wherein: the buffer bin is provided with a small ventilation hole, a handle and a heat insulation sleeve, the small ventilation hole is formed in the upper wall of the buffer bin, the handle is arranged on the side wall of the buffer bin, and the heat insulation sleeve is arranged on the handle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021740762.2U CN213544445U (en) | 2020-08-19 | 2020-08-19 | High-low temperature testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021740762.2U CN213544445U (en) | 2020-08-19 | 2020-08-19 | High-low temperature testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213544445U true CN213544445U (en) | 2021-06-25 |
Family
ID=76489122
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021740762.2U Active CN213544445U (en) | 2020-08-19 | 2020-08-19 | High-low temperature testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213544445U (en) |
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2020
- 2020-08-19 CN CN202021740762.2U patent/CN213544445U/en active Active
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