CN213544383U

CN213544383U - Refractive index measuring device

Info

Publication number: CN213544383U
Application number: CN202021855636.1U
Authority: CN
Inventors: 闫飞; 马磊; 彭俊; 张熠; 朱登宝
Original assignee: Suzhou PTC Optical Instrument Co Ltd
Current assignee: Suzhou PTC Optical Instrument Co Ltd
Priority date: 2020-08-31
Filing date: 2020-08-31
Publication date: 2021-06-25
Anticipated expiration: 2030-08-31

Abstract

The invention provides a refractive index measuring device which comprises a base, a measuring platform deck, a fixed platform and a measuring module and is characterized in that the measuring platform deck and the fixed platform are fixedly arranged on the base and are positioned on the same straight line, the measuring module is movably arranged on the fixed platform through a vertical rod, a rotating shaft is arranged in the fixed platform, the vertical rod is arranged on the rotating shaft and can rotate along with the rotating shaft, and an angle encoder is fixedly arranged on the fixed platform and used for recording the rotating angle of the vertical rod. The device measures the refractive index by adopting a reflection means, solves the problem of measuring the form of a sample, can measure the refractive index of the surface of a solid or liquid sample, and can accurately and quickly obtain the refractive index parameter by only replacing a light source and readjusting the swing position of the vertical rod to obtain a new critical angle when the refractive index parameter corresponding to different wavelengths of the material is to be obtained.

Description

Refractive index measuring device

Technical Field

The invention belongs to an optical detection device, and particularly relates to a refractive index measuring device.

Background

The semiconductor laser has directionality, the divergence angle of light beams is extremely small, the light beams are nearly parallel, the monochromaticity is good, compared with an LED monochromatic light source, the spectral coverage range of the light source of the laser is smaller than 1nm, and the limit spectral coverage range which can be achieved by the LED monochromatic light source is 15-30 nm. In a refractive index testing system, light with each wavelength correspondingly forms a critical angle, the angle of each critical angle is different, when the monochromaticity of a light source is not good enough, a light spot corresponding to the critical angle is difficult to accurately judge on an observation screen, and then the refractive index of a sample corresponding to the wavelength cannot be accurately calculated.

A traditional refractive index testing system adopts a deflection angle method, an auto-collimation method and a critical angle method, the ratio of sine values of an incident angle and a refraction angle is calculated by observing light incident and emergent light paths, and the refractive index of a light transmission sample is obtained.

Disclosure of Invention

In view of the above, the invention provides a refractive index measuring device, which adopts a reflection means to measure the refractive index, so as to solve the problem of measuring the sample form, measure the refractive index on the surface of a solid or liquid sample, and only need to replace a light source and readjust the swing position of a vertical rod to obtain a new critical angle in order to obtain the refractive index parameter corresponding to different wavelengths. The specific technical scheme of the invention is as follows:

the utility model provides a refractive index measuring device, includes base, measurement microscope carrier, fixed platform and measuring module, its characterized in that, the fixed setting of measurement microscope carrier and fixed platform is on the base, and is located same straight line, measuring module is in through the setting of montant activity fixed platform is last, install the pivot in the fixed platform, the montant sets up in the pivot, and can follow the pivot rotates, fixed platform is last still fixed to be provided with the angle encoder for record montant pivoted angle.

Furthermore, the measuring module comprises a laser and a polarization component, the laser is arranged above the vertical rod through the fixing of the laser fixing support, the polarization component is arranged on the vertical rod through the fixing of the polarization support and is positioned below the laser fixing support, and the connecting line of the laser center, the polarization component center and the measuring platform center is positioned on the same vertical line.

Furthermore, the height of the measuring carrying platform can be adjusted, and the measuring carrying platform can move up and down in the vertical direction.

Furthermore, a display screen is arranged on the base, is positioned on one side of the measuring carrying platform and the fixed platform and is parallel to the measuring carrying platform and the fixed platform.

Additional aspects and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.

Drawings

FIG. 1 is a schematic perspective view of a refractive index measuring device according to an embodiment of the present invention, wherein a display screen is not included;

FIG. 2 is a schematic side view of a refractive index measuring apparatus according to an embodiment of the present invention, which does not include a display screen;

FIG. 3 is a schematic front view of a refractive index measuring device according to an embodiment of the present invention, wherein the refractive index measuring device comprises a display screen;

FIG. 4 is a schematic front view of a refractive index measuring apparatus according to another embodiment of the present invention;

wherein, 1 is the base, 2 is fixed platform, 3 is the measurement microscope carrier, 4 is the pivot, 5 is the montant, 6 is angle encoder, 7 is the laser fixed bolster, 8 is the polarization support, 9 is the laser instrument, 10 is polarization component, 11 is the sample, 12 is the display screen, 13 is the dwang, 14 is photoelectric detector.

Detailed Description

In the description of the present invention, it is to be understood that the terms "upper", "lower", "left", "right", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention.

Referring to fig. 1, the refractive index measuring device of this embodiment, including base 1, measurement microscope carrier 3, fixed platform 2 and measuring module, the fixed setting of measurement microscope carrier 3 and fixed platform 2 is on base 1, and be located same straight line, measuring module passes through the setting of 5 activities of montant on fixed platform 2, install pivot 4 in fixed platform 2, montant 5 sets up in pivot 5, and can swing along with pivot 5, still fixed being provided with angle encoder 6 on fixed platform 2, be used for recording 5 wobbling angles of montant. The base 1 is also provided with a display screen 12 which is positioned at the left side of the measuring carrier 3 and the fixed platform 2 and is parallel to the measuring carrier

Preferably, the measuring module comprises a laser 9 and a polarization component 10, the laser 9 is fixedly arranged above the vertical rod 5 through a laser fixing support 7, the polarization component 10 is fixedly arranged on the vertical rod 5 through a polarization support 8 and is positioned below the laser fixing support 7, and a connecting line of the center of the laser 9 and the center of the polarization component 10 and the center of the measuring carrier 3 is positioned on the same vertical line.

Preferably, the measuring stage 3 is height-adjustable, and the load bearing sample 11 is moved up and down in the vertical direction.

In this embodiment, a single-wavelength laser 9 to be used for measurement is placed on a laser fixing support 7, where the wavelength may be any value from 365nm to 1000nm, the emitted laser obtains linear polarized light with high purity through a polarization component 10, the polarization component 10 may be a linear polarizer or a polarization splitting prism, and the incident polarized light may be adjusted through the installation angle of the polarization component 10. Placing a sample 11 to be measured on a measuring platform, adjusting the height position of a measuring carrier 3 to enable the upper surface of the sample 11 to be at the same height position as the center of a rotating shaft 4, ensuring that light rays are accurately incident on the upper surface of the sample 11, rotating a vertical rod 5, observing a reflected light spot signal on a display screen 12, keeping rotating until the light spot disappears or changes to the darkest degree, obtaining a critical angle, reading the rotating angle at the moment through an angle encoder 6, measuring the refractive index according to a Brewster angle method, and n = arctan (theta). In the process, the refractive index parameters of the sample material corresponding to different wavelengths can be quickly obtained by only replacing the light source and readjusting the rotation angle of the vertical rod 5 to obtain a new critical angle.

In other embodiments, the change of the light spot may be monitored by using a photodetector, a rotating rod is further installed on the rotating shaft 4 and is arranged behind the vertical rod 5, the photodetector is disposed on the rotating rod, when the vertical rod 5 is rotated, the rotating rod and the vertical rod 5 rotate synchronously, but the directions are opposite, the two rotate symmetrically around the center of the rotating shaft 4, the light spot signal reflected by the surface of the sample is monitored by the photodetector until the light spot disappears or changes to the darkest degree, a critical angle is obtained, the rotating angle at this time is read by the angle encoder 6, the refractive index is measured according to the brewster angle method, and n = arctan (θ).

Any reference in this specification to "this embodiment," "other embodiments," etc., means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the invention. This schematic representation in various places throughout this specification does not necessarily refer to the same embodiment. Further, when a particular feature, structure, or characteristic is described in connection with any embodiment, it is submitted that it is within the purview of one skilled in the art to effect such feature, structure, or characteristic in connection with other ones of the embodiments.

While specific embodiments of the invention have been described in detail with reference to a number of illustrative embodiments thereof, it should be understood that numerous other modifications and embodiments can be devised by those skilled in the art that will fall within the spirit and scope of the principles of this invention. In particular, reasonable variations and modifications are possible in the component parts and/or arrangements of the subject combination arrangement within the scope of the foregoing disclosure, the drawings and the appended claims without departing from the spirit of the invention. Except variations and modifications in the component parts and/or arrangements, the scope of which is defined by the appended claims and equivalents thereof.

Claims

1. The utility model provides a refractive index measuring device, includes base, measurement microscope carrier, fixed platform and measuring module, its characterized in that, the fixed setting of measurement microscope carrier and fixed platform is on the base, and is located same straight line, measuring module is in through the setting of montant activity fixed platform is last, install the pivot in the fixed platform, the montant sets up in the pivot, and can follow the pivot rotates, fixed platform is last still fixed to be provided with the angle encoder for record montant pivoted angle.

2. The refractive index measurement device of claim 1, wherein the measurement module comprises a laser and a polarization component, the laser is fixedly arranged above the vertical rod through a laser fixing support, the polarization component is fixedly arranged on the vertical rod through a polarization support and is located below the laser fixing support, and a connecting line of the center of the laser, the center of the polarization component and the center of the measurement stage is located on the same vertical line.

3. The refractive index measuring apparatus according to claim 1, wherein the measuring stage is adjustable in height and performs an up-and-down movement in a vertical direction.

4. A refractive index measuring apparatus as claimed in any one of claims 1 to 3, wherein a display screen is provided on the base, on one side of the measurement stage and the fixed platform, and parallel thereto.