CN213517823U - Test structure and display panel - Google Patents

Abstract

The application is suitable for the technical field of liquid crystal display, and provides a test structure and a display panel. The test wire is used for receiving a signal of the signal wire to be tested; the switch units are communicated with the test wires in a one-to-one mode, two adjacent switch units are correspondingly communicated, and the switch units are used for controlling the signal wires to be tested to be communicated with the test wires; the control unit is communicated with one of the switch units and is used for controlling the conduction of the switch units. The utility model provides a test structure, through with two adjacent switch unit intercommunications, one of them switch unit and the control unit intercommunication to be used for controlling a plurality of switch units, and switch on in order to with the corresponding signal introduction to corresponding test on the signal line that awaits measuring walk the line through the control switch unit, after the test is accomplished, only need with the control unit laser cutting fall can, improved cutting efficiency.

Description

Test structure and display panel

Technical Field

The application belongs to the technical field of liquid crystal display, and particularly relates to a test structure and a display panel.

Background

In the technology of a Gate Driver Less (GDL), a Gate driving circuit is designed on a glass substrate, and in the process of manufacturing a liquid crystal panel, a trace inside the panel needs to be tested, mainly an external signal is tested. The data signal and the gate driving signal need to be tested by an additional signal, and after the test is finished, the position of the additional signal needs to be disconnected by adopting a laser cutting mode, so that the display of the liquid crystal panel is prevented from being influenced after the liquid crystal panel is manufactured.

The data short bar is a transmission line of data signals during panel testing, and is used for shorting the data signal lines in all the planes together. The GDL test wire is a transmission wire of the gate driving signal during the panel test, and the GDL test wire is connected with the tested signal through a binding connection wire, that is, each tested signal corresponds to one GDL test wire. After the test is completed, the laser cutting path needs to pass through each GDL test routing, so that the laser cutting path is long in length and takes a long time.

Disclosure of Invention

An object of this application is to provide a test structure and display panel, aims at solving the test in the current test structure and walks the line and connect through binding connecting wire for laser cutting's the longer technical problem in route.

This application is realized like this, a mainboard ground connection structure includes:

the testing device comprises a plurality of testing wires, a signal receiving circuit and a signal processing circuit, wherein the testing wires are used for receiving signals on at least one signal wire to be tested;

the switch units are communicated with the test wires in a one-to-one mode, two adjacent switch units are communicated, and the switch units are used for controlling the communication between the signal wires to be tested and the test wires; and

and the control unit is communicated with one of the switch units and is used for controlling the respective conduction of the switch units so as to guide the signal on the signal wire to be tested into the corresponding test wiring.

The application provides a test structure's beneficial effect lies in: compared with the prior art, through corresponding the intercommunication with two adjacent switch units, one of them switch unit and the control unit intercommunication, this the control unit can control a plurality of switch units, and switch on separately through the control switch unit and walk the line in order to examine the leading-in corresponding test of the signal on the signal line that awaits measuring, after the test is accomplished, only need with the control unit laser cutting fall can, need not cut a plurality of tests and walk the line, the switch unit also need not to be opened, it connects through binding connecting wire to have solved the test of current test structure and walked the line, make the longer technical problem in path of laser cutting, and the cutting efficiency is improved.

In one embodiment, the switching unit is a thin film transistor switch.

In one embodiment, the switch unit is used for separating the test trace into two sections.

In one embodiment, the switching unit includes:

the switching unit includes:

a gate electrode;

the source-drain region is arranged on the grid electrode and comprises a source electrode, a drain electrode and a semiconductor layer, the semiconductor layer is positioned between the source electrode and the drain electrode, and the source electrode and the drain electrode are respectively connected between the two sections of test wires; and

and the grid insulating layer is used for separating the source drain region and the grid. In one embodiment, the gates of two adjacent switching cells are connected.

In one embodiment, the test trace includes a first segment and a second segment, the switch unit is located between the first segment and the second segment, and one end of the first segment close to the switch unit is communicated with the source electrode; one end of the second segment, which is close to the switch unit, is communicated with the drain electrode.

In one embodiment, the test structure further comprises:

the first test terminal is communicated with one end of the first section, which is far away from the switch unit; and

and the second test terminal is communicated with one end of the second section far away from the switch unit.

In one embodiment, the first test terminal is connected to an external device, the second test terminal is connected to a signal line to be tested, the external device receives a signal output by the test trace through the first test terminal to test the corresponding signal line to be tested, and the external device applies an external signal to the signal line to be tested through the second test terminal.

In one embodiment, the control unit is a gateless drive circuit switch terminal.

Another object of the present application is to provide a display panel, which includes the test structure described above.

The application provides a display panel's beneficial effect lies in: compared with the prior art, through adopting foretell test structure, can adopt the control unit to control a plurality of switch unit to switch on in order to with the signal introduction to corresponding test on the awaiting measuring signal line of correspondence walk the line through the control switch unit, after the test is accomplished, only need with the control unit laser cutting fall can, when satisfying the test, also improved cutting efficiency.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.

FIG. 1 is a schematic top view of a test structure provided in an embodiment of the present application;

FIG. 2 is a schematic cross-sectional view taken along line A-A of FIG. 1;

fig. 3 is a schematic front view structure diagram of a display panel according to an embodiment of the present application.

Wherein, in the figures, the respective reference numerals:

1-testing the structure; 11-test traces; 111-first stage; 112-a second segment; 113-a first test trace; 114-a second test trace; 115-a third test trace; 116-a fourth test trace; 12-a switching unit; 121-a gate; 122-source drain regions; 1221-source; 1222-a semiconductor layer; 1223-drain electrode; 123-a gate insulating layer; 124-a first switching unit; 125-a second switching unit; 126-a third switching unit; 127-a fourth switching unit; 13-a control unit; 14-a first test terminal; 15-a second test terminal; 2-a display panel; 21-a first film layer; 22-an insulating layer; 23-second film layer.

Detailed Description

In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly or indirectly secured to the other element. When an element is referred to as being "connected to" another element, it can be directly or indirectly connected to the other element. The terms "upper", "lower", "left", "right", "front", "rear", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positions based on the orientations or positions shown in the drawings, and are for convenience of description only and not to be construed as limiting the technical solution. The terms "first", "second" and "first" are used merely for descriptive purposes and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features. The meaning of "plurality" is two or more unless specifically limited otherwise.

The description and claims of this invention and the word "comprise" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, or system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

In order to explain the technical solution of the present application, the following detailed description is made with reference to the specific drawings and examples.

Referring to fig. 1, a test structure 1 provided in the embodiment of the present application includes a plurality of test traces 11, a plurality of switch units 12, and a control unit 13. The test trace 11 is configured to receive a signal on at least one signal line to be tested, that is, one test trace 11 receives a signal on one signal line to be tested and performs a test; the switch units 12 are communicated with the test trace 11 one to one, two adjacent switch units 12 are correspondingly communicated, and the switch units 12 are used for controlling the signal line to be tested to be communicated with the test trace 11; the control unit 13 is communicated with one of the switch units 12, and is configured to control each of the switch units 12 to be turned on to guide a signal on a signal line to be tested to the corresponding test trace 11. The specific working principle is as follows:

the control unit 13 outputs a high level to one of the switch units 12 to control the on and off of the switch units 12, so that when the switch unit 12 is turned on, the signal line to be tested is communicated with the corresponding test trace 11, and a signal on the signal line to be tested can be guided to the corresponding test trace 11 to test the signal line to be tested. Compare in present will test and walk line 11 and by test signal connection through binding connecting wire, test structure 1 in this embodiment connects a plurality of tests through a plurality of switch unit 12 and walks line 11, and through a plurality of switch unit 12 of the control unit 13 control, and after the test was accomplished, control unit 13 can be fallen by laser cutting, and switch unit 12 need not to be opened, does not influence product property ability, can improve cutting efficiency again.

Test structure 1 in the embodiment of the application, through with two adjacent switch unit 12 intercommunications, one of them switch unit 12 and the control unit 13 intercommunication, this control unit 13 can control a plurality of switch unit 12, and switch on through control switch unit 12 and walk line 11 with the signal introduction to corresponding test with the signal line that awaits measuring, after the test is accomplished, only need with the control unit 13 laser cutting fall can, need not cut a plurality of test and walk line 11, switch unit 12 also need not opened, it connects through binding connecting wire to have solved test among the current test structure 1 and walk line 11, make the longer technical problem of path of laser cutting, cutting efficiency is improved.

In an embodiment, referring to fig. 1 in particular, each switch unit 12 divides the test trace 11 into two segments, a first end of each switch unit 12 is connected to the first segment 111 of the test trace 11, a second end of each switch unit 12 is connected to the second segment 112 of the test trace 11, and each switch unit 12 is configured to control the corresponding test trace 11 to be conducted so as to be connected to the corresponding signal line to be tested.

The switch unit 12 may include a Thin Film Transistor (TFT) switch, which may be turned on under the driving of a high level, that is, when the control unit 13 provides a high level, the TFT switch may be turned on, control ends of two adjacent TFT switches are connected, and a control end of one of the TFTs is connected to the control unit 13, so that the control unit 13 may control a plurality of TFT switches.

It is understood that, in the embodiment, four test traces 11 are taken as an example, and the four test traces 11 can be a first test trace 113, a second test trace 114, a third test trace 115 and a fourth test trace 116. Then, correspondingly, the number of the switch units 12 is four, and the four switch units 12 are the first switch unit 124, the second switch unit 125, the third switch unit 126 and the fourth switch unit 127, respectively. The first test trace 113 is correspondingly communicated with the first switch unit 124, the second test trace 114 is correspondingly communicated with the second switch unit 125, the third test trace 115 is correspondingly communicated with the third switch unit 126, and the fourth test trace 11 is correspondingly communicated with the fourth switch unit 127. The control terminal of the first switching unit 124 is communicated with the control terminal of the second switching unit 125, the control terminal of the second switching unit 125 is communicated with the control terminal of the third switching unit 126, the control terminal of the third switching unit 126 is communicated with the control terminal of the fourth switching unit 127, and the control terminal of the fourth switching unit 127 is communicated with the control unit 13, so that the control unit 13 can control the first switching unit 124, the second switching unit 125, the third switching unit 126, and the fourth switching unit 127 to be turned on or off.

It should be noted that the number of the test traces 11 includes, but is not limited to, four, the number of the switch units 12 includes, but is not limited to, four, the number of the test traces 11 is designed according to the number of the signal lines to be tested, and correspondingly, the number of the switch units 12 is designed according to the number of the test traces 11.

Further, with reference to fig. 1 and fig. 2, the switch unit 12 includes a gate 121, a source-drain region 122, and a gate insulating layer 123. Wherein, the gate 121 is a control end of the switch unit 12; the source-drain region 122 is disposed on the gate 121, and includes a source 1221, a drain 1223, and a semiconductor layer 1222, the semiconductor layer 1222 is located between the source 1221 and the drain 1223, the source 1221 and the drain 1223 are respectively connected to each test trace 11, the source 1221 corresponds to a first end of the switch unit 12, and the drain 1223 corresponds to a second end of the switch unit 12; the gate insulating layer 123 serves to separate the source-drain regions 122 from the gate electrode 121.

Specifically, the gates 121 of two adjacent switching cells 12 are correspondingly connected, so that a plurality of switching cells 12 can be controlled, i.e., a plurality of switching cells 12 can be controlled using one control unit 13.

In one embodiment, referring to fig. 1 and fig. 2 in particular, the test trace 11 includes a first segment 111 and a second segment 112, the switch unit 12 is located between the first segment 111 and the second segment 112, and one end of the first segment 111 close to the switch unit 12 is communicated with the source 1221; one end of the second segment 112 close to the switch unit 12 is communicated with the drain 1223, so that the first segment 111 and the second segment 112 of the test trace 11 are connected together, and the conduction of the first segment 111 and the second segment 112 is controlled by controlling the conduction of the switch unit 12, so that the test signal is guided into the corresponding signal line to be tested.

Among other things, in one embodiment, to achieve communication between the test trace 11 and the signal line to be tested, the test structure 1 further includes a first test terminal 14 and a second test terminal 15. Wherein the first test terminal 14 is communicated with one end of the first segment 111 far away from the switch unit 12; the second testing terminal 15 is communicated with one end of the second segment 112 far away from the switch unit 12, that is, two ends of each testing trace 11 are communicated with testing terminals so as to be communicated with an external device and a signal line to be tested.

Specifically, the first test terminal 14 is connected to an external device, the second test terminal 15 is connected to a signal line to be tested, the external device receives a signal output by the test trace 11 through the first test terminal 14 to test the corresponding signal line to be tested, when the switch unit 12 is turned on, the signal line to be tested can output a signal to the external device through the test trace 11, that is, the external device can measure the output signal of the signal line to be tested from the first test terminal 14, so that the required signal can be measured quickly and effectively, and the accuracy and effectiveness of the signal test are improved. And the external device applies an external signal to the signal line to be tested through the second test terminal 15, and a signal output from the external device can be introduced into the signal line to be tested through the second test terminal 15.

In an embodiment, further referring to fig. 1 and fig. 2, the control unit 13 is a switch terminal of a gate-less driving circuit, and the switch terminal of the gate-less driving circuit outputs an open signal to the TFT switch, that is, a high level is given, after the test is completed, the switch terminal of the gate-less driving circuit is cut off by the laser, the TFT switch is not opened any more, the performance of the product is not affected, and the cutting efficiency is improved.

Referring to fig. 2 and fig. 3, an embodiment of the present application further provides a display panel 2 including the test structure 1 in any of the embodiments.

This display panel 2 is through adopting foretell test structure 1, can adopt the control unit 13 to control a plurality of switch unit 12 to switch on in order to with the corresponding signal introduction to corresponding test on the signal line that awaits measuring walk line 11 through control switch unit 12, when the test is accomplished the back, only need with the control unit 13 laser cutting fall can, when satisfying the test, also improved cutting efficiency.

In one embodiment, further referring to fig. 2 and 3, the display panel 2 includes a first film layer 21, an insulating layer 22, and a second film layer 23. Wherein, the insulating layer 22 is located on the first film layer 21; a second membrane layer 23 is located on the insulating layer 22.

The test trace 11 and the source-drain region 122 of the switch unit 12 are disposed corresponding to the second film layer 23, the gate insulating layer 123 of the switch unit 12 is disposed corresponding to the insulating layer 22, and the gate 121 of the switch unit 12 is disposed corresponding to the first film layer 21.

The above description is only exemplary of the present application and should not be taken as limiting the present application, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims (10)

1. A test structure, comprising:

the testing device comprises a plurality of testing wires, a signal receiving circuit and a signal processing circuit, wherein the testing wires are used for receiving signals on at least one signal wire to be tested;

the switch units are communicated with the test wires in a one-to-one mode, two adjacent switch units are communicated, and the switch units are used for controlling the communication between the signal wires to be tested and the test wires; and

and the control unit is communicated with one of the switch units and is used for controlling the respective conduction of the switch units so as to guide the signal on the signal wire to be tested into the corresponding test wiring.

2. The test structure of claim 1, wherein the switch unit is a thin film transistor switch.

3. The test structure of claim 1, wherein the switch unit is configured to separate the test trace into two sections.

4. The test structure of claim 3, wherein the switching unit comprises:

a gate electrode;

the source-drain region is arranged on the grid electrode and comprises a source electrode, a drain electrode and a semiconductor layer, the semiconductor layer is positioned between the source electrode and the drain electrode, and the source electrode and the drain electrode are respectively connected between the two sections of test wires; and

and the grid insulating layer is used for separating the source drain region and the grid.

5. The test structure of claim 4, wherein gates of two adjacent of the switch cells are connected.

6. The test structure of claim 4, wherein the test trace includes a first segment and a second segment, the switch unit is located between the first segment and the second segment, and an end of the first segment near the switch unit is in communication with the source; one end of the second segment, which is close to the switch unit, is communicated with the drain electrode.

7. The test structure of claim 6, wherein the test structure further comprises:

the first test terminal is communicated with one end of the first section, which is far away from the switch unit; and

and the second test terminal is communicated with one end of the second section far away from the switch unit.

8. The test structure of claim 7, wherein the first test terminal is connected to an external device, the second test terminal is connected to a signal line to be tested, the external device receives a signal output by the test trace through the first test terminal to test the corresponding signal line to be tested, and the external device applies an external signal to the signal line to be tested through the second test terminal.

9. The test structure of any one of claims 1 to 8, wherein the control unit is a gateless drive circuit switch terminal.

10. A display panel comprising a test structure according to any one of claims 1 to 9.

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