CN213398824U

CN213398824U - Chip electrical property test platform

Info

Publication number: CN213398824U
Application number: CN202022441076.1U
Authority: CN
Inventors: 李崇万
Original assignee: Deotec Semiconductor Shanghai Co ltd
Current assignee: Deotec Semiconductor Shanghai Co ltd
Priority date: 2020-10-28
Filing date: 2020-10-28
Publication date: 2021-06-08
Anticipated expiration: 2030-10-28

Abstract

The utility model discloses a chip electrical property test platform, which comprises a base consisting of a top plate, a left side plate and a right side plate; a plurality of through holes are formed in the left side plate or the right side plate of the base; a socket is mounted on the left side plate or the right side plate of the base and connected with a plug, and the plug is connected with a test instrument through a wire; a fastening device is arranged between the socket and the plug; the test piece is installed in the base and is connected with the socket. The utility model relates to a rationally, liberated both hands, greatly increased detection efficiency, also guaranteed the effect that detects, moreover the utility model discloses processing is simple, and is with low costs, is the detection auxiliary assembly of an ideal.

Description

Chip electrical property test platform

Technical Field

The utility model belongs to chip test platform field, more specifically say, relate to a chip electrical property test platform.

Background

The performance of the chip is particularly important as a core component of an electronic product, so that the chip is detected in multiple directions at present, and the yield of the chip is finally ensured.

Electrical performance testing is an important test item. At present, the common method for detecting the electrical property is to manually hold the detection probe and connect the detection probe with a detection instrument for detection. Such a mode needs a large amount of manual work, and efficiency is not high moreover, also can the mistake appear in the time of the detection, leads to the yields to judge by mistake as the defective products.

SUMMERY OF THE UTILITY MODEL

Not enough to prior art exists, the utility model aims to provide a chip electrical property test platform to solve the defect of current technique.

Chip electrical property test platform, corresponding with test instrument and test piece, its characterized in that: comprises a base consisting of a top plate, a left side plate and a right side plate; a plurality of through holes are formed in the left side plate or the right side plate of the base; a socket is mounted on the left side plate or the right side plate of the base and connected with a plug, and the plug is connected with a test instrument through a wire; a fastening device is arranged between the socket and the plug; the test piece is installed in the base and is connected with the socket.

According to the optimized scheme, the fastening device comprises first fixed shafts which are symmetrically arranged on the upper surface and the lower surface of the socket from top to bottom, and one ends of U-shaped movable seats are connected to the two first fixed shafts; one end of the U-shaped movable seat, which is far away from the socket, is a clamping end part, and an upper clamping groove and a lower clamping groove are arranged in the clamping end part; two clamping shafts are symmetrically installed on the upper portion of the plug, and clamping is achieved through the one-to-one correspondence of the clamping shafts and the clamping grooves.

According to the optimized scheme, a handle plate is arranged on the U-shaped movable seat.

According to the optimized scheme, the top plate, the left side plate and the right side plate are integrally designed and manufactured by metal materials, and the thickness of the top plate, the left side plate and the right side plate is 2-5 mm.

According to the optimized scheme, the top plate is provided with a threading hole.

Owing to adopted above-mentioned technical scheme, compare with prior art, the beneficial effects of the utility model are that:

the utility model relates to a rationally, utilize base and the firm socket plug realization of grafting to connect, put the chip in the base, current test piece tests, and test instrument work shows the testing result simultaneously, has just so liberated both hands, greatly increased detection efficiency, also guaranteed the effect that detects, moreover the utility model discloses processing is simple, and is with low costs, is the detection auxiliary assembly of an ideal.

The present invention will be further explained with reference to the drawings and examples.

Drawings

Fig. 1 is a schematic front view of an embodiment of the present invention;

fig. 2 is a schematic top view of an embodiment of the present invention;

fig. 3 is a schematic side view of an embodiment of the present invention.

Detailed Description

Examples

As shown in fig. 1-3, the electrical performance testing platform of the chip corresponds to the testing instrument and the testing piece. The test instrument and the test piece are both conventional, the test instrument is used for detecting signals and realizing detection results, and the test piece is used for clamping a chip and realizing communication of the signals and transmitting the detection signals to the test instrument. These are prior art and the construction, installation and operation of the same are well within the skill of the art and will not be described in detail.

The chip electrical performance test platform comprises a base consisting of a top plate 8, a left side plate 7 and a right side plate 9. A plurality of through holes 12 are arranged on the left side plate or the right side plate of the base. The top plate is provided with a threading hole 11.

Install socket 10 on the left side board of base or the right side board, socket 10 is connected with plug 1, and plug 1 is connected with test instrument through the wire. A fastening device is arranged between the socket 10 and the plug 1. The fastening device comprises first fixing shafts 6 which are symmetrically arranged on the upper surface and the lower surface of the socket from top to bottom, and one ends of U-shaped movable seats 5 are connected to the two first fixing shafts 6. The one end that the socket was kept away from to U-shaped sliding seat 5 is joint tip 4, is provided with two joint recesses from top to bottom in the joint tip 4. Two clamping shafts 3 are symmetrically installed on the upper portion of the plug, and clamping is achieved through the clamping shafts 3 and the clamping grooves in a one-to-one correspondence mode. The test piece is installed in the base and is connected with the socket. And a handle plate 2 is arranged on the U-shaped movable seat.

The top plate, the left side plate and the right side plate are integrally designed and manufactured by metal materials, and the thickness of the top plate, the left side plate and the right side plate is 2-5 mm.

When the test device works, the chip is inserted into the test piece in the base, the power is on, and then the test instrument detects signals and displays a detection result. If the product is qualified, the product is good, and if the product is not qualified, the product is defective. And after the detection is finished, taking down the chip and immediately putting the next chip.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and to simplify the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. Chip electrical property test platform, corresponding with test instrument and test piece, its characterized in that: comprises a base consisting of a top plate, a left side plate and a right side plate; a plurality of through holes are formed in the left side plate or the right side plate of the base; a socket is mounted on the left side plate or the right side plate of the base and connected with a plug, and the plug is connected with a test instrument through a wire; a fastening device is arranged between the socket and the plug; the test piece is installed in the base and is connected with the socket.

2. The platform for testing electrical performance of chips of claim 1, wherein: the fastening device comprises first fixed shafts which are symmetrically arranged on the upper surface and the lower surface of the socket from top to bottom, and one ends of U-shaped movable seats are connected to the two first fixed shafts; one end of the U-shaped movable seat, which is far away from the socket, is a clamping end part, and an upper clamping groove and a lower clamping groove are arranged in the clamping end part; two clamping shafts are symmetrically installed on the upper portion of the plug, and clamping is achieved through the one-to-one correspondence of the clamping shafts and the clamping grooves.

3. The platform for testing electrical performance of chips of claim 2, wherein: and a handle plate is arranged on the U-shaped movable seat.

4. The platform for testing electrical performance of chips of claim 3, wherein: the top plate, the left side plate and the right side plate are integrally designed and manufactured by metal materials, and the thickness of the top plate, the left side plate and the right side plate is 2-5 mm.

5. The platform for testing electrical performance of chips of claim 4, wherein: the top plate is provided with a threading hole.