CN213275365U - Test platform and 3D laser microscope - Google Patents
Test platform and 3D laser microscope Download PDFInfo
- Publication number
- CN213275365U CN213275365U CN202022361193.7U CN202022361193U CN213275365U CN 213275365 U CN213275365 U CN 213275365U CN 202022361193 U CN202022361193 U CN 202022361193U CN 213275365 U CN213275365 U CN 213275365U
- Authority
- CN
- China
- Prior art keywords
- platform
- sample
- slide
- test
- locking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Microscoopes, Condenser (AREA)
Abstract
The utility model relates to the technical field of laser microscopes, in particular to a test platform and a 3D laser microscope, wherein, the test platform comprises a first platform, a second platform, a sliding assembly and a locking piece, the bearing surface of the first platform is coplanar with the bearing surface of the second platform, the sliding assembly is used for enabling the first platform and the second platform to be close to or away from each other, and the locking piece is used for locking the relative position of the first platform and the second platform; the sample to be measured which is vertically placed can be fixed between the two opposite surfaces of the first platform and the second platform. This test platform can adapt to the sample that awaits measuring of unidimensional not, and through the sample mounting that awaits measuring, can firmly fix the sample that awaits measuring of vertical placing to in measure the cross-section of the sample that awaits measuring.
Description
Technical Field
The utility model relates to a laser microscope technical field especially relates to a test platform and 3D laser microscope.
Background
The resolution of the 3D laser confocal microscope can reach the resolution level of 0.001 mu m or even finer, is between the maximum theoretical resolution of 0.2 mu m of a common wide-field optical microscope and the resolution of 0.1nm of a transmission electron microscope, and has many advantages in the fields of semiconductors and photovoltaic cells. The crystalline silicon solar cell technology is mostly in the micrometer and even sub-nanometer scale range, so that the two-dimensional (2D) profile and three-dimensional (3D) level measurement and analysis of a 3D laser confocal microscope in the scale range are widely applied. However, the current 3D laser confocal microscope sample bearing table is only suitable for observing the surface topography or measuring the size of the cell, but not for testing and analyzing the cross section of the cell, which limits a certain application range of the microscope.
In addition, the size of the existing test platform is limited, and when a sample with a large size is tested, the sample is easy to incline, so that the test is influenced.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a: the utility model provides a test platform to solve the problem that the microscope sample plummer can't bear the weight of the sample that awaits measuring of great size among the correlation technique, can't be suitable for the sample cross-section test that awaits measuring.
In order to achieve the purpose, the utility model adopts the following technical proposal:
in one aspect, the present invention provides a testing platform, which includes a first platform, a second platform, a sliding assembly and a locking member, wherein the carrying surface of the first platform is coplanar with the carrying surface of the second platform, the sliding assembly is used to make the first platform and the second platform approach to each other or separate from each other, and the locking member is used to lock the relative positions of the first platform and the second platform; and a vertically placed sample to be detected can be fixed between two opposite surfaces of the first platform and the second platform.
Optionally, at least one of two opposite surfaces of the first platform and the second platform is provided with an air hole, the air hole is communicated with an air suction and supply device, and the air hole can adsorb the sample to be detected.
Optionally, the air holes are provided with a plurality of air holes, each air hole is independently connected with a pipeline for air inlet and outlet, each pipeline is provided with a switch, and the switches are used for controlling the on-off of the pipelines.
Optionally, at least one of two opposite surfaces of the first platform and the second platform is provided with a first threaded through hole, and a tightening screw penetrates through the first threaded through hole and then can abut against the sample to be tested.
Optionally, the sliding assembly comprises a sliding seat and a sliding block, the sliding block can slide along the sliding seat, the sliding seat is fixedly connected with the first platform, the sliding block is fixedly connected with the second platform, and the locking piece can fix the sliding seat and the sliding block.
Optionally, the retaining member is a locking screw, the slider is provided with a second threaded through hole, and the locking screw passes through the second threaded through hole and then can abut against the sliding seat.
Optionally, a handle is arranged at one end of the locking screw, which is far away from the sliding block.
Optionally, the bearing surfaces of the first platform and the second platform are provided with fixing components, and the fixing components are used for fixing the sample to be tested.
Optionally, the first platform and the second platform are both of a semi-cylinder structure, and a circular bearing surface can be formed after the first platform and the second platform are relatively attached.
On the other hand, the utility model provides a 3D laser microscope, including the test platform in any one of the above-mentioned scheme.
The utility model has the advantages that:
the utility model provides a test platform, this test platform are through first platform and the second platform that can alternate segregation or be close to for test platform's adjustable dimension can adapt to not unidimensional sample that awaits measuring.
When the cross section of the sample to be tested is tested, the vertically placed sample to be tested can be firmly fixed through the sample fixing part to be tested, so that the cross section of the sample to be tested can be conveniently measured and analyzed.
Drawings
Fig. 1 is a schematic structural diagram of a test platform according to an embodiment of the present invention.
In the figure:
1. a first platform; 2. a second platform; 4. a locking member;
11. air holes; 31. a slide base; 32. a slide block.
Detailed Description
The technical solution of the present invention will be described clearly and completely with reference to the accompanying drawings, and obviously, the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Where the terms "first position" and "second position" are two different positions, and where a first feature is "over", "above" and "on" a second feature, it is intended that the first feature is directly over and obliquely above the second feature, or simply means that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention.
Fig. 1 is a schematic structural diagram of a test platform according to an embodiment of the present invention. As shown in fig. 1, the present embodiment provides a testing platform, which includes a first platform 1, a second platform 2, a sliding assembly and a locking member 4, wherein a carrying surface of the first platform 1 is coplanar with a carrying surface of the second platform 2, the sliding assembly is configured to enable the first platform 1 and the second platform 2 to approach each other and to be separated from each other, and when the first platform 1 is separated from the second platform 2, a sample to be tested with a larger size can be horizontally placed on an upper surface of the testing platform; when the first platform 1 is separated from the second platform 2, the two opposite surfaces of the first platform 1 and the second platform 2 can also clamp a vertically placed sample to be tested, so that the cross section of the sample to be tested can be tested. The locking piece 4 is used for locking the relative position of the first platform 1 and the second platform 2; the sample to be measured which is vertically placed can be fixed between two opposite surfaces of the first platform 1 and the second platform 2.
In the embodiment, the first platform 1 and the second platform 2 which can be separated from each other are used, so that the size of the test platform is adjustable. This setting can adapt to the sample that awaits measuring of different sizes, need cut apart the condition that awaits measuring the sample or break into pieces when having avoided the local position of the sample that awaits measuring.
When testing the cross section of a sample to be tested, the conventional method is to clamp the sample to be tested which is vertically placed by two solids. However, this situation is often not firm and the sample to be tested is prone to shift during the testing process. In this embodiment, the sample mounting that awaits measuring can firmly be fixed with the sample that awaits measuring of vertical placing to measure and the analysis in the cross-section to the sample that awaits measuring.
Regarding the fixing manner of the sample to be measured, in this embodiment, specifically, an air hole 11 is provided on at least one of two surfaces of the first platform 1 and the second platform 2, the air hole 11 is communicated with the air suction and supply device, and the air hole 11 can adsorb the sample to be measured. Preferably, the air holes 11 are arranged on two opposite surfaces of the first platform 1 and the second platform 2. The device can fix two or even a plurality of samples to be tested on two surfaces simultaneously, so that the testing efficiency is improved; and a sample to be detected with a larger size can be fixed at the same time.
In addition, the air suction and supply device is arranged so that the air hole 11 can provide negative pressure and positive pressure. When a sample to be detected is vertically arranged on one platform, the air hole 11 provides negative pressure so as to complete the adsorption and fixation of the sample to be detected. After the test is finished, the air hole 11 provides positive pressure so that the sample to be tested can be smoothly taken down.
Regarding the arrangement of the air holes 11, in this embodiment, specifically, the air holes 11 may be, but are not limited to, two rows, the number of each air hole 11 may be, but is not limited to, six, and each air hole 11 is individually connected with a pipeline for air to enter and exit, and each pipeline is provided with a switch for controlling on and off of the pipeline. The air holes 11 at different positions can be selected according to the size or the structure of the sample to be detected to perform air suction so as to adsorb and fix the sample to be detected.
Regarding the fixing manner of the sample to be measured, in other embodiments, at least one of two opposite surfaces of the first platform 1 and the second platform 2 is provided with a first threaded through hole, and the tightening screw can abut against the sample to be measured after passing through the first threaded through hole.
During the use, with the sample that awaits measuring place between first platform 1 and the second platform 2 of separation, the tight screw in top passes first screw through-hole and awaits measuring sample butt, with the sample centre gripping that awaits measuring between tight screw in top and second platform 2.
Regarding the arrangement of the first threaded through holes, in the present embodiment, specifically, the first threaded through holes of the first platform 1 may be, but are not limited to, two rows, and the number of the first threaded through holes in each row may be, but is not limited to, six.
A locking member 4 may be provided to the sliding assembly for locking the sliding assembly so that the relative position of the first platform 1 and the second platform 2 connected to the sliding assembly is locked. Specifically, the sliding assembly comprises a sliding seat 31 and a sliding block 32, the sliding block 32 can slide along the sliding seat 31, the sliding seat 31 is fixedly connected with the first platform 1, the sliding block 32 is fixedly connected with the second platform 2, and the first platform 1 and the second platform 2 can be close to and separated from each other in the sliding process of the sliding block 32 along the sliding seat 31. Further, retaining member 4 is locking screw, and slider 32 is equipped with second screw thread through-hole, and locking screw can pass behind the second screw thread through-hole and the slide 31 butt.
During the measurement, the platform is operated frequently, and a convenient operation mode is needed to lock the relative positions of the first platform 1 and the second platform 2. For this purpose, in this embodiment, the end of the locking screw remote from the slider 32 is provided with a handle.
When a light sheet sample to be tested is placed on the bearing surface, the slide is easy to occur. Therefore, in this embodiment, the bearing surfaces of the first platform 1 and the second platform 2 are respectively provided with a fixing component, and the fixing components are used for fixing the sample to be tested. Specifically, the fixing assembly is used for fixing a sample to be detected and comprises a sheet-shaped clamping plate and a fixing screw for fixing the clamping plate on a bearing surface. When the sample clamp is used, the fixing screw is loosened to enable a gap larger than the thickness of a sample to be measured to be formed between the clamp plate and the bearing surface, the sample to be measured is placed on the bearing surface, the clamp plate is used for pressing the sample to be measured, and the sample to be measured can be fixed by screwing the fixing screw.
Optionally, the first platform 1 and the second platform 2 may be but not limited to be semi-cylindrical structures, and when the first platform 1 and the second platform 2 are both semi-cylindrical structures, the first platform 1 and the second platform 2 can form a circular bearing surface after being attached to each other. The round bearing surface can adapt to the existing test equipment on one hand; on the other hand, the edges and corners are few, collision is not easy to occur, the test safety is improved, and the human-computer efficacy is met.
The embodiment also provides a 3D laser microscope, which comprises the test platform in the technical scheme.
It is obvious that the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (10)
1. A test platform is characterized by comprising a first platform (1), a second platform (2), a sliding assembly and a locking member (4), wherein the bearing surface of the first platform (1) is coplanar with the bearing surface of the second platform (2), the sliding assembly is used for enabling the first platform (1) and the second platform (2) to approach to each other or to separate from each other, and the locking member (4) is used for locking the relative positions of the first platform (1) and the second platform (2); the sample to be measured which is vertically placed can be fixed between two opposite surfaces of the first platform (1) and the second platform (2).
2. The test platform according to claim 1, characterized in that at least one of two opposite surfaces of the first platform (1) and the second platform (2) is provided with an air hole (11), the air hole (11) is communicated with an air suction and supply device, and the air hole (11) can adsorb the sample to be tested.
3. The test platform according to claim 2, wherein a plurality of air holes (11) are arranged, each air hole (11) is separately connected with a pipeline for air inlet and outlet, each pipeline is provided with a switch, and the switches are used for controlling the on-off of the pipelines.
4. The test platform according to claim 1, wherein at least one of two opposite surfaces of the first platform (1) and the second platform (2) is provided with a first threaded through hole, and a tightening screw can abut against the sample to be tested after penetrating through the first threaded through hole.
5. Test platform according to claim 1, characterized in that said sliding assembly comprises a slide (31) and a slide (32), said slide (32) being able to slide along said slide (31), said slide (31) being solidly connected to said first platform (1), said slide (32) being solidly connected to said second platform (2), said locking element (4) being able to fix said slide (31) and said slide (32).
6. Test platform according to claim 5, characterized in that the locking element (4) is a locking screw, and the slide (32) is provided with a second threaded through hole through which the locking screw can abut against the slide (31).
7. Test platform according to claim 6, characterized in that the end of the locking screw remote from the slide (32) is provided with a handle.
8. The testing platform according to claim 1, characterized in that the bearing surfaces of the first platform (1) and the second platform (2) are provided with fixing components for fixing the sample to be tested.
9. The test platform according to claim 1, wherein the first platform (1) and the second platform (2) are both of a semi-cylindrical structure, and a circular bearing surface can be formed after the first platform (1) and the second platform (2) are relatively attached.
10. A 3D laser microscope comprising a test platform according to any one of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022361193.7U CN213275365U (en) | 2020-10-21 | 2020-10-21 | Test platform and 3D laser microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022361193.7U CN213275365U (en) | 2020-10-21 | 2020-10-21 | Test platform and 3D laser microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213275365U true CN213275365U (en) | 2021-05-25 |
Family
ID=75950397
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022361193.7U Active CN213275365U (en) | 2020-10-21 | 2020-10-21 | Test platform and 3D laser microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN213275365U (en) |
-
2020
- 2020-10-21 CN CN202022361193.7U patent/CN213275365U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105388327B (en) | It is a kind of that original position Micromechanics, micro-structure, the device and method of ingredient Study on Integration are carried out in scanning electron microscope | |
| CN200960630Y (en) | Sample polishing clamp | |
| CN106935464A (en) | Instrument and diffraction image imaging method for transmitted electron back scattering diffraction | |
| CN109186994A (en) | A kind of charging interface plug and pull out detector | |
| CN213275365U (en) | Test platform and 3D laser microscope | |
| CN110712129A (en) | Auxiliary clamp for mechanical vibration polishing sample | |
| CN201465986U (en) | Block-shaped metal material scanning electron microscope sample stable | |
| CN201645274U (en) | Clamping device for polishing surface of stainless steel sheet | |
| CN209085910U (en) | A kind of charging interface plug and pull out detector | |
| CN208034491U (en) | Stereomicroscope fracture analysis steel plate sample holder | |
| CN215299176U (en) | Scanning electron microscope sample stage | |
| CN216094899U (en) | Bearing ring car processing profile detection device | |
| CN209658130U (en) | A kind of sample platform of scanning electronic microscope | |
| CN213022929U (en) | Metal sample clamping device is thrown in machinery | |
| CN108426769A (en) | A kind of metal material micro tensile specimen Mechanics Performance Testing device | |
| Yuan et al. | Measurements of GDL properties for quality control in fuel cell mass production line | |
| CN220306207U (en) | Scanning electron microscope sample stage for magnetic block/sheet sample | |
| CN114112737B (en) | Drop hammer impact clamp with variable sample size, variable impact point and variable boundary conditions | |
| CN217483397U (en) | Ball height measuring device is pressed from both sides to ball separator both sides | |
| CN113310788A (en) | Rubber material's biaxial stretching clamping device and sample | |
| CN207021232U (en) | A kind of sample platform of scanning electronic microscope with self-locking clamp structure | |
| CN217443212U (en) | Steel sheet scanning electron microscope sample clamping device | |
| CN210467756U (en) | Height and width limiting device for rapid sample introduction of scanning electron microscope | |
| CN217914668U (en) | Mechanical auxiliary clamp for polishing machine | |
| CN213054470U (en) | Auxiliary tool for bolt metallographic detection |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 314000 buildings 1 and 2, No. 325, Kanghe Road, Gaozhao street, Xiuzhou District, Jiaxing City, Zhejiang Province Patentee after: Jiaxing atlas Technology Research Institute Co.,Ltd. Address before: Room 1505-8, building 1, Jiaxing photovoltaic technology innovation park, 1288 Kanghe Road, Gaozhao street, Xiuzhou District, Jiaxing City, Zhejiang Province, 314000 Patentee before: Jiaxing atlas Photovoltaic Technology Co., Ltd |
|
| CP03 | Change of name, title or address |