CN213240347U

CN213240347U - Single-layer capacitor test board and test equipment

Info

Publication number: CN213240347U
Application number: CN202021962109.0U
Authority: CN
Inventors: 杨应俊; 韦日文; 刘振辉; 周业强
Original assignee: Silicon Electric Semiconductor Equipment Shenzhen Co ltd
Current assignee: Silicon Electric Semiconductor Equipment Shenzhen Co ltd
Priority date: 2020-09-10
Filing date: 2020-09-10
Publication date: 2021-05-18
Anticipated expiration: 2030-09-10

Abstract

The utility model discloses an individual layer electric capacity testboard and test equipment. The single-layer capacitor test board comprises a placing part, wherein the placing part comprises a placing block provided with a placing surface, the placing surface is provided with an adsorption hole, the single-layer capacitor is fixed on the placing surface through the adsorption hole, and the placing block is electrically connected to a first electrode of the single-layer capacitor. The single-layer capacitor is convenient to fix and test, and the testing efficiency of the single-layer capacitor is improved.

Description

Single-layer capacitor test board and test equipment

Technical Field

The utility model relates to a single-layer capacitor test platform and test equipment.

Background

The single-layer capacitor adopts a manual testing mode, so that the efficiency is low and the single-layer capacitor is easy to damage; it is not favorable to increase the yield of the single-layer capacitor.

SUMMERY OF THE UTILITY MODEL

For at least part solution above-mentioned technical problem, the utility model provides an individual layer electric capacity testboard and test equipment.

The technical scheme of the utility model is that: a single-layer capacitor test board comprises a placement part and a single-layer capacitor, wherein the placement part comprises a placement block provided with a placement surface, the placement surface is provided with an adsorption hole, the single-layer capacitor is fixed on the placement surface through the adsorption hole, and the placement block is electrically connected to a first electrode of the single-layer capacitor.

Furthermore, the object placing block is of an integrated conductive structure.

Furthermore, the object placing surface is arranged horizontally.

Furthermore, the placing part also comprises an insulating connecting part, a first supporting part, a second supporting part and a bottom plate;

the object placing block is connected to the insulating connecting part; and the air passage of the adsorption hole penetrates through the insulation connecting part; the air duct inlet on the insulating connecting part is positioned between the first supporting part and the second supporting part;

the placing part is connected to the bottom plate through the first supporting part and the second supporting part, and the first supporting part and the second supporting part are uniformly arranged along an axis perpendicular to the center of the adsorption hole.

Further, the bottom plate is connected to the frame through a plane motion mechanism; the plane motion mechanism comprises a plane motion mechanism body,

an X-direction moving part connected with the bottom plate;

the Y-direction moving part is connected to the X-direction moving part through the first linear driving part, and the Y-direction moving part is connected to the rack through the second linear driving part.

Furthermore, the X-direction moving part further comprises a rotating part and a rotary driving part connected with the rotating part, and the rotating part is connected with the bottom plate.

Furthermore, the single-layer capacitor test bench further comprises a test needle seat, the test needle seat is used for being electrically connected with the second electrode of the single-layer capacitor, and the test needle seat and the object placing block jointly complete the test of the single-layer capacitor.

Furthermore, the single-layer capacitor test bench further comprises a support frame, the support frame is connected to the rack in a vertical movement mode, and the test needle seat is installed on the support frame.

Further, the test needle seat comprises a test probe electrically connected with the test needle seat, and the test probe is right corresponding to the adsorption hole; the tail end of the test probe, which is used for stopping the single-layer capacitor, is a sphere.

A single-layer capacitance test device comprises the single-layer capacitance test bench.

The beneficial effects of the utility model reside in that: the single-layer capacitor is convenient to fix and test, and the testing efficiency of the single-layer capacitor is improved.

Drawings

FIG. 1 is a schematic structural view of a single-layer capacitor test board of the present invention;

FIG. 2 is a schematic view of the structure of the placement portion of the present invention;

FIG. 3 is an enlarged view of a portion of FIG. 2;

FIG. 4 is a schematic view of the structure of the object-placing block of the present invention;

FIG. 5 is a schematic view of an object-placing block adsorbing a single-layer capacitor;

FIG. 6 is a schematic diagram of a single layer capacitor;

fig. 7 is a schematic view of the plane movement mechanism of the present invention;

fig. 8 is a schematic view of the X-direction moving portion of the present invention.

Detailed Description

In order to facilitate the understanding of the technical solutions of the present invention for those skilled in the art, the technical solutions of the present invention will be described in further detail with reference to specific embodiments.

As shown in fig. 6, the single-layer capacitor 101 is a sheet-like device in which the first electrode 101a and the second electrode 101b are separated from each other, and the first electrode 101a can be positioned by being adsorbed by vacuum, and the second electrode 101b can be subjected to a needle insertion test, so that the single-layer capacitor 101 is not turned over to affect the test.

As shown in fig. 1, fig. 2, fig. 3, fig. 4, and fig. 5, in a single-layer capacitor testing table 100, a placing portion 20 includes a placing block 21 having a placing surface 211, the placing portion 20 is used for placing and positioning a single-layer capacitor 101, and the placing surface 211 is used for attaching and positioning the single-layer capacitor 101, so as to enhance the positioning stability of the single-layer capacitor 101;

the storage surface 211 is provided with an adsorption hole 212, the single-layer capacitor 101 is fixed on the storage surface 211 through the adsorption hole 212, and the adsorption hole 212 is connected with vacuum for adsorbing and adhering the single-layer capacitor 101 to the storage surface 211;

the object placing block 21 is electrically connected to the first electrode 101a of the single-layer capacitor 101, that is, the object placing surface 211 is simultaneously used as an electrode to be electrically connected to the single-layer capacitor 101, so that the electrical connection and the test of the single-layer capacitor 101 are conveniently realized.

Adopt above-mentioned technical scheme: the single-layer capacitor 101 is fixed and electrically connected through vacuum, so that the single-layer capacitor 101 is fixed conveniently and reliably before being tested, and the testing efficiency of the single-layer capacitor 101 is improved.

As shown in fig. 2, fig. 3 and fig. 4, the object placing block 21 is an integral conductive structure, that is, only the single-layer capacitor 101 needs to be fixed on the object placing surface 211 in an absorbing manner, and the first electrodes 101a of the single-layer capacitor 101 are necessarily electrically connected.

Adopt above-mentioned technical scheme: the electric connection scheme of the first electrode 101a of the single-layer capacitor 101 is simplified, so that the first electrode 101a is ensured to be safely and reliably electrically connected.

As shown in fig. 2, fig. 3 and fig. 4, the object plane 211 is horizontally disposed, that is, the single-layer capacitor 101 is fixed by suction along a horizontal plane, so as to prevent the single-layer capacitor 101 from sliding and affecting the test.

Adopt above-mentioned technical scheme: the single-layer capacitor 101 is horizontally placed for testing, so that the influence on the test caused by movement due to uneven stress during the test can be prevented; meanwhile, the horizontal test of the single-layer capacitor 101 facilitates ensuring the motion adjustment of the second electrode 101b side electrical connection along the vertical direction.

As shown in fig. 2, the placement portion 20 further includes an insulating connection portion 31, a first support portion 41, a second support portion 42, and a bottom plate 32;

the object placing block 21 is connected to the insulating connecting portion 31, that is, the insulating connecting portion 31 and the object placing block 21 are arranged in an insulating manner, so that the influence of the insulating connecting portion 31 on the object placing block 21 is reduced, and the test of the single-layer capacitor 101 is finally influenced; the air passage of the adsorption hole 212 penetrates through the insulating connecting part 31, and the air passage of the adsorption hole 212 penetrates through the insulating connecting part 31, so that the space around the object placing block 21 occupied by the air passage of the adsorption hole 212 is reduced, the placing part 20 is convenient to compact in structure, and the influence on the single-layer capacitor 101 test is reduced; the gas duct inlet on the insulating connecting portion 31 is located between the first support portion 41 and the second support portion 42;

place portion 20 and connect in bottom plate 32 through first supporting part 41 and second supporting part 42, and first supporting part 41 and second supporting part 42 evenly set up along the axis at perpendicular to absorption hole 212 center, make the individual layer electric capacity 101 of test be located between the holding position of first supporting part 41 and second supporting part 42, and be close to the intermediate position, when being convenient for guarantee to exert the force test to individual layer electric capacity 101, first supporting part 41 and second supporting part 42 atress are even, thereby it influences the test to individual layer electric capacity 101 to reduce first supporting part 41 and second supporting part 42 because of the inhomogeneous insulating connecting portion 31 that arouses of atress warp.

Adopt above-mentioned technical scheme: the first supporting part 41 and the second supporting part 42 are stressed uniformly during testing, and the influence of the position change of the placement part 20 on the testing of the single-layer capacitor 101 is reduced.

As shown in fig. 1 and 7, the bottom plate 32 is connected to the frame 60 through the plane movement mechanism 50, and is used for controlling the plane movement of the bottom plate 32, and indirectly controlling the plane movement of the object 21; the planar motion mechanism 50 includes a planar motion mechanism,

an X-direction moving part 51 connected with the bottom plate 32, wherein the movement of the X-direction moving part 51 can drive the bottom plate 32 to move;

a Y-direction moving unit 52 connected to the X-direction moving unit 51 by a first linear driving unit 501, the first linear driving unit 501 being capable of moving the X-direction moving unit 51 in the X direction with respect to the Y-direction moving unit 52; the Y-direction moving portion 52 is connected to the frame 60 by a second linear driving portion 502, and the second linear driving portion 502 can move the Y-direction moving portion 52 in the Y direction with respect to the frame 60. (see fig. 7) the X-direction is perpendicular to the Y-direction, and of course, those skilled in the art can set the X-direction to be non-parallel to the Y-direction and can equally implement the solution of the present invention

Adopt the technical scheme of the utility model: the position of the opposite object block 21 in the X direction can be adjusted by adjusting the first linear driving portion 501, and the position of the opposite object block 21 in the Y direction can be adjusted by adjusting the second linear driving portion 502, so that the position of the opposite object block 21 in a plane parallel to the X direction and the Y direction can be adjusted by adjusting the first linear driving portion 501 and/or the second linear driving portion 502, and the single-layer capacitor 101 placed on the object block 21 can be adjusted to a test position conveniently.

As shown in fig. 1, 7 and 8, the X-direction moving unit 51 further includes a rotating unit 511 and a rotation driving unit 512 connected thereto, wherein the rotating unit 511 is connected to the base plate 32 to realize rotation adjustment of the object 21; when the single-layer capacitor 101 cannot be tested due to a large deflection angle, the angle of the object block 21 is adjusted by the rotation driving unit 512.

Adopt above-mentioned technical scheme: the angle adjustment of the object 21 is realized, so that the angle adjustment of the tested single-layer capacitor 101 is realized, and the testing accuracy of the single-layer capacitor 101 is improved.

As shown in fig. 1, the single-layer capacitor test bench 100 further includes a test pin socket 70, the test pin socket 70 is used for electrically connecting with the second electrode 101b of the single-layer capacitor 101, the test pin socket 70 and the object placing block 21 together complete the test of the single-layer capacitor 101, and on the premise that the object placing block 21 is electrically connected to the first electrode 101a, the test pin socket 70 and the second electrode 101b are electrically connected to the single-layer capacitor 101, so as to meet the test requirement of the single-layer capacitor 101.

Adopt above-mentioned technical scheme: the electric connection of the single-layer capacitor 101 is realized, the test is completed, the automatic test of the single-layer capacitor 101 is completed, and the test efficiency is improved.

As shown in fig. 1, the single-layer capacitor test bench 100 further includes a support frame 80, the support frame 80 is connected to the rack 60 in a vertical movement manner, the test pin socket 70 is installed on the support frame 80, that is, the support frame 80 can realize the movement adjustment of the test pin socket 70 along the vertical direction, so that the test pin socket 70 can stop the electric connection movement/the control of the far movement relative to the single-layer capacitor 101, and the single-layer capacitor 101 can be conveniently taken and placed by the placement block 21.

As shown in fig. 1, the test socket 70 includes electrically connected test probes 71, and the test probes 71 are opposite to the adsorption holes 212, so as to ensure that the test probes 71 can stop against and be electrically connected to the single-layer capacitor 101; the tail end of the test probe 71, which abuts against the single-layer capacitor 101, is a sphere, so that the pin mark of the test probe 71, which abuts against the single-layer capacitor 101, is reduced, and the test probe 71 is prevented from damaging the single-layer capacitor 101.

As shown in fig. 1, fig. 2, fig. 3, fig. 4, fig. 5, fig. 6, fig. 7 and fig. 8, a single-layer capacitor testing apparatus includes the single-layer capacitor testing table 100, and will the utility model discloses a single-layer capacitor testing table 100 is applied to single-layer capacitor testing apparatus, realizes the automatic test of single-layer capacitor testing apparatus to single-layer capacitor.

The above is the preferred embodiment of the present invention, and is not used to limit the protection scope of the present invention. It should be recognized that non-inventive variations and modifications to the disclosed embodiments, as understood by those skilled in the art, are intended to be included within the scope of the present invention as claimed and claimed.

Claims

1. A single-layer capacitance test bench is characterized in that: the placing part (20) comprises an object placing block (21) provided with an object placing surface (211), the object placing surface (211) is provided with an adsorption hole (212), the single-layer capacitor (101) is fixed on the object placing surface (211) through the adsorption hole (212), and the object placing block (21) is electrically connected with a first electrode (101 a) of the single-layer capacitor (101).

2. The single layer capacitive test bed of claim 1, wherein: the object placing block (21) is of an integrated conductive structure.

3. The single layer capacitive test bed of claim 1, wherein: the object placing surface (211) is horizontally arranged.

4. The single layer capacitive test bed of claim 1, wherein: the placing part (20) further comprises an insulating connecting part (31), a first supporting part (41), a second supporting part (42) and a bottom plate (32);

the object placing block (21) is connected to the insulating connecting part (31); and the air passage of the adsorption hole (212) penetrates the insulation connection part (31); the air duct inlet on the insulating connecting part (31) is positioned between the first supporting part (41) and the second supporting part (42);

the placing part (20) is connected to the bottom plate (32) through a first supporting part (41) and a second supporting part (42), and the first supporting part (41) and the second supporting part (42) are uniformly arranged along an axis perpendicular to the center of the adsorption hole (212).

5. The single layer capacitive test bed of claim 4, wherein: the bottom plate (32) is connected to a frame (60) through a plane motion mechanism (50); the planar motion mechanism (50) comprises,

an X-direction moving part (51) connected to the base plate (32);

and a Y-direction moving part (52) connected to the X-direction moving part (51) through a first linear driving part (501), wherein the Y-direction moving part (52) is connected to the frame (60) through a second linear driving part (502).

6. The single layer capacitive test bed of claim 5, wherein: the X-direction moving part (51) further comprises a rotating part (511) and a rotary driving part (512) connected with the rotating part, and the rotating part (511) is connected with the bottom plate (32).

7. The single layer capacitive test bed of claim 1, wherein: the single-layer capacitor test bench (100) further comprises a test pin base (70), the test pin base (70) is used for being electrically connected with a second electrode (101 b) of the single-layer capacitor (101), and the test pin base (70) and the object placing block (21) jointly complete the test on the single-layer capacitor (101).

8. The single layer capacitive test bed of claim 7, wherein: the single-layer capacitance test bench (100) further comprises a support frame (80), the support frame (80) is connected to the rack (60) in a vertical movement mode, and the test needle base (70) is installed on the support frame (80).

9. The single layer capacitive test bed of claim 8, wherein: the test needle seat (70) comprises a test probe (71) which is electrically connected, and the test probe (71) is opposite to the adsorption hole (212); the tail end of the test probe (71) which abuts against the single-layer capacitor (101) is a sphere.

10. A single layer capacitance test apparatus, characterized by: the single layer capacitance test rig comprising a single layer capacitance test bed (100) of any of claims 1-9.