CN213091821U - Wire needle flip test module jig - Google Patents

Wire needle flip test module jig Download PDF

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Publication number
CN213091821U
CN213091821U CN202022239794.0U CN202022239794U CN213091821U CN 213091821 U CN213091821 U CN 213091821U CN 202022239794 U CN202022239794 U CN 202022239794U CN 213091821 U CN213091821 U CN 213091821U
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detection
chip
base
detection module
seat
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CN202022239794.0U
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陈恩环
张卡
钞金龙
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Suzhou Shangshihao Precision Machinery Technology Co ltd
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Suzhou Shangshihao Precision Machinery Technology Co ltd
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Abstract

The utility model discloses a line needle flip test module tool, including base, grip slipper, detection device and the fixed disk device that is used for fixed chip, fixed disk device connects on the base, and detection device includes elasticity support plate, flexible post and the detection module that is used for detecting the chip, and elasticity support plate and detection module rotate through the rotation axis to be connected, and flexible post connects in the bottom surface of elasticity support plate, and the bottom of flexible post is connected on the base; the clamping seat is connected to the base and comprises an installation seat and a movable clamping block, the movable clamping block is rotatably connected with the installation seat through a torsion spring shaft, the detection module is connected with a pressing block, and when the detection module detects a chip, the pressing block is connected with the movable clamping block in a clamping manner; the device adopts a structure of rotating firstly and then pressing downwards, so that the detection needle vertically descends in the wall of the test hole after being in place to complete the test, and the chip is not damaged in the test process.

Description

Wire needle flip test module jig
Technical Field
The utility model relates to a chip detects technical field, concretely relates to line needle flip test module tool.
Background
The manufacturing process of semiconductor devices can be roughly divided into wafer fabrication, wafer test, packaging and final test, wherein circuits and electronic devices (such as transistors, capacitors, logic switches, etc.) are fabricated on a wafer, after the fabrication, the wafer is turned into a grid of chips, and then the chips are tested, usually including voltage, current, timing and function.
In the prior art, a chip is usually tested by using a test module with a probe, the chip needs to be fixed in the test process, and then the probe is inserted into a test hole in the chip to complete the test of the chip. The chip schematic is shown in fig. 1. The existing test module can cause the contact between the probe and the test hole wall of the chip during testing, and the chip can be damaged under the condition. In addition, the service life of the probe is relatively short.
Disclosure of Invention
An object of the utility model is to provide a line needle flip test module tool to can damage the problem of chip in the testing process that leads to among the solution prior art.
In order to achieve the purpose, the utility model is realized by adopting the following technical scheme:
the wire needle flip test module jig comprises a base, a clamping seat, a detection device and a fixed disc device for fixing a chip, wherein the fixed disc device is connected to the base;
the clamping seat is connected on the base, the clamping seat includes mount pad and activity fixture block, the activity fixture block with the mount pad is rotated through the torsional spring axle and is connected, be connected with the briquetting on the detection module, when detecting the module and detecting the chip, the briquetting with activity fixture block connects.
Furthermore, the clamping seats and the pressing blocks are two in number, the clamping seats are symmetrically connected to the two sides of the elastic support plate, and the pressing blocks are symmetrically connected to the two sides of the detection module.
Furthermore, the shape of the elastic support plate is U-shaped, a mounting groove is arranged on the base and is located in the U-shaped groove of the elastic support plate, and the fixing disc device is connected in the mounting groove.
Further, the fixed disk device comprises a carrier disk and a limiting seat, the limiting seat is connected to the top surface of the carrier disk, and the limiting seat is used for placing a chip.
Further, the carrier disc is connected with a magnet, and the magnet is located in the limiting seat.
Further, the detection module comprises a thread needle detection head and a detection mounting plate, and the detection end of the thread needle detection head is connected to the bottom surface of the detection mounting plate.
Furthermore, the bottom surface of the detection mounting plate is connected with a guide pillar, the carrier plate is connected with a guide pillar seat, and the guide pillar is telescopically connected in the guide pillar seat.
According to the above technical scheme, the embodiment of the utility model has following effect at least:
1. when the device is used for detecting a chip, the detection module is turned to the elastic support plate, then the detection module is pressed downwards, so that the pressing block connected to the detection module is clamped in the movable clamping block to complete the detection of the chip, and the structure of rotating and then pressing downwards ensures that the detection pin vertically descends in the wall of the test hole after being in place to complete the test, thereby ensuring that the chip cannot be damaged in the test process;
2. the clamping seat and the pressing block of the device are designed to be two, so that the stability of fixing after the detection module rotates and presses down is ensured;
3. the limiting seat arranged on the carrier plate can effectively limit the position of the chip in sequence from left to right, the magnet is arranged in the limiting seat, the magnet can attract the chip, and the limiting and fixing effects on the chip are guaranteed;
4. the detection needle of this device adopts the line needle to detect the head, compares traditional probe line needle and detects the life of head more for a long time.
Drawings
FIG. 1 is a schematic diagram of a chip in the prior art;
FIG. 2 is a schematic view of the overall structure of an embodiment of the present invention;
FIG. 3 is a schematic diagram of a detection module according to an embodiment of the present invention;
fig. 4 is a schematic view of a detection head device according to an embodiment of the present invention;
fig. 5 is a schematic view of a specific structure of a detection module according to an embodiment of the present invention.
Wherein: 1. a base; 2. a fixed disk device; 3. a clamping seat; 4. a detection device; 21. a carrier plate; 22. a limiting seat; 23. a magnet; 24. a guide post seat; 31. a mounting seat; 32. a movable clamping block; 41. an elastic carrier plate; 42. a detection module; 43. a rotating shaft; 44. a telescopic column; 45. briquetting; 421. detecting the mounting plate; 422. a thread needle detection head; 423. and (6) a guide pillar.
Detailed Description
In order to make the technical means, creation features, achievement purposes and functions of the present invention easy to understand, the present invention is further described below with reference to the following embodiments.
It should be noted that, in the description of the present invention, the terms "front", "rear", "left", "right", "upper", "lower", "inner", "outer", etc. indicate the directions or positional relationships based on the directions or positional relationships shown in the drawings, and are only for convenience of description of the present invention but do not require the present invention to be constructed and operated in a specific direction, and thus, should not be construed as limiting the present invention. As used in the description of the present invention, the terms "front," "back," "left," "right," "up," "down" and "in" refer to directions in the drawings, and the terms "inner" and "outer" refer to directions toward and away from, respectively, the geometric center of a particular component.
As shown in fig. 1 to 5, the wire needle flip test module fixture includes a base 1, a holder 3, a detection device 4 and a fixed disk device 2 for fixing a chip, the fixed disk device 2 is connected to the base 1, the detection device 4 includes an elastic carrier plate 41, a telescopic column 44 and a detection module 42 for detecting a chip, the elastic carrier plate 41 and the detection module 42 are rotatably connected through a rotating shaft 43, the telescopic column 44 is connected to a bottom surface of the elastic carrier plate 41, and a bottom end of the telescopic column 44 is connected to the base 1; grip slipper 3 is connected on base 1, and grip slipper 3 includes mount pad 31 and activity fixture block 32, and activity fixture block 32 and mount pad 31 rotate through the torsion spring axle to be connected, are connected with briquetting 45 on the detection module 42, and when detection module 42 detected the chip, briquetting 45 and activity fixture block 32 block were connected.
When the device is used for detecting the chip, the detection module is turned to the elastic support plate, then the detection module is pressed downwards, so that the pressing block connected to the detection module is clamped in the movable clamping block to complete the detection of the chip, the structure which rotates firstly and then presses downwards enables the detection needle to vertically descend in the wall of the test hole after being in place to complete the test, and the chip is prevented from being damaged in the test process.
Specifically, the base 1 has a structure as shown in fig. 5, a top surface of the base 1 is rectangular, and clamping seats 3 are fixed to left and right sides of the top surface through screws. Two 3 symmetry settings of grip slipper, grip slipper 3 include mount pad 31 and activity fixture block 32, and mount pad 31 passes through the screw connection at base 1's top surface, and activity fixture block 32 is connected through pivot and mount pad 31, is equipped with the torsional spring in the pivot. When the torsion spring is in a natural state, the movable fixture block 32 is perpendicular to the top surface of the base 1, and the clamping plate protruding inwards from the movable fixture block 32 is parallel to the top surface of the base 1.
Be equipped with the mounting groove on the base 1, the mounting groove is located between the grip slipper 3 of both sides, and fixed disk device 2 installs in the mounting groove. The fixing disc device 2 comprises a carrier disc 21, the carrier disc 21 is in a cuboid shape, and the carrier disc 21 is fixed in the mounting groove through screws. The height of the carrier plate 21 is less than the depth of the mounting groove, i.e. the level of the top surface of the carrier plate is lower than the level of the top surface of the base 1. The carrier plate 21 is provided with a limiting seat 22, an area for placing a chip is formed between the limiting seats 22, and the chip is placed in the limiting seat 22. The motion of fore-and-aft direction about spacing seat 22 can restrict the chip, prevents the chip and removes in order to guarantee the chip, has still set up magnet 23 in spacing seat 22, and the chip is placed in spacing seat 22, and magnet actuation chip, the better fixed of having guaranteed the chip.
The top surface of the base 1 is connected with a detecting device 4, and specifically, as shown in fig. 2 to 5, the detecting device 4 includes an elastic carrier 41 and a detecting module 42. The bottom surface of the elastic carrier plate 41 is connected with four telescopic columns 44, the bottom ends of the telescopic columns 44 and the top surface of the base 1 are connected with the elastic carrier plate 41, and the elastic carrier plate 41 can vertically lift on the base 1 along the telescopic columns 44. The elastic carrier 41 and the detection module 42 are connected through a rotating shaft 43, a torsion spring is arranged on the rotating shaft 43, and when the torsion spring is in a natural state, the detection module 42 and the elastic carrier 41 are in an open state.
The detection module 42 comprises a detection seat above and a detection mounting plate 421 on the bottom surface of the detection seat, and the thread needle detection head 422 is located in the detection seat and penetrates through the bottom surface of the detection mounting plate 421. During operation, rotate detection module 42, make the top surface that detects mounting panel 421 on the detection module 42 and base parallel, then push down detection module 42, the line needle in the detection module 42 at this moment detects the head 422 and inserts to the test hole of chip, accomplishes the test of chip.
In this embodiment, in order to ensure that the wire needle detection head 422 can enter the test hole of the chip when the detection module 42 descends, two guide posts 423 are installed on the bottom surface of the detection mounting plate 421 in the detection module 42, and two guide post seats 24 are installed on the top surface of the carrier plate 21. When the detection module 42 rotates and presses down, the guide post is inserted into the guide post seat 24 first, so that the guide effect is achieved, and the detection accuracy is guaranteed.
In this embodiment, the detecting device 4 further includes pressing blocks 45, the pressing blocks 45 are symmetrically disposed on the left and right sides of the detecting module 42, and when the detecting module 42 detects a chip, the pressing blocks 45 rotate and descend into the movable latching blocks 32, and are engaged with the movable latching blocks 32. After the detection is finished, the movable clamping block 32 is pulled outwards, the movable clamping block 32 is disconnected with the pressing block 45, and the detection module 42 resets under the action of the torsion spring on the rotating shaft 43 and the action of the telescopic column 44.
It will be appreciated by those skilled in the art that the invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The embodiments disclosed above are therefore to be considered in all respects as illustrative and not restrictive. All changes which come within the scope of the invention or which are equivalent to the scope of the invention are embraced by the invention.

Claims (7)

1. The wire needle flip test module jig is characterized by comprising a base (1), a clamping seat (3), a detection device (4) and a fixed disc device (2) for fixing a chip, wherein the fixed disc device (2) is connected to the base (1), the detection device (4) comprises an elastic carrier plate (41), a telescopic column (44) and a detection module (42) for detecting the chip, the elastic carrier plate (41) and the detection module (42) are rotatably connected through a rotating shaft (43), the telescopic column (44) is connected to the bottom surface of the elastic carrier plate (41), and the bottom end of the telescopic column (44) is connected to the base (1);
grip slipper (3) are connected on base (1), grip slipper (3) are including mount pad (31) and activity fixture block (32), activity fixture block (32) with mount pad (31) rotate through the torsion spring axle and connect, be connected with briquetting (45) on detecting module (42), when detecting module (42) and detecting the chip, briquetting (45) with activity fixture block (32) block is connected.
2. The wire needle flip test module jig according to claim 1, wherein there are two clamping seats (3) and two pressing blocks (45), two clamping seats (3) are symmetrically connected to two sides of the elastic carrier plate (41), and two pressing blocks (45) are symmetrically connected to two sides of the detection module (42).
3. The tool of claim 1, wherein the elastic carrier (41) is U-shaped, the base (1) has a mounting groove, the mounting groove is located in the U-shaped groove of the elastic carrier (41), and the fixing plate device (2) is connected in the mounting groove.
4. The wire needle flip test module jig according to claim 1, wherein the fixed disc device (2) comprises a carrier disc (21) and a limiting seat (22), the limiting seat (22) is connected to the top surface of the carrier disc (21), and the limiting seat (22) is used for placing a chip.
5. The wire needle flip test module jig according to claim 4, wherein a magnet (23) is connected to the carrier plate (21), and the magnet (23) is located in the limiting seat (22).
6. The wire needle flip test module jig according to claim 4, wherein the detection module (42) comprises a wire needle detection head (422) and a detection mounting plate (421), and a detection end of the wire needle detection head (422) is connected to a bottom surface of the detection mounting plate (421).
7. The wire needle flip test module jig according to claim 6, wherein a guide post (423) is connected to a bottom surface of the detection mounting plate (421), a guide post seat (24) is connected to the carrier plate (21), and the guide post (423) is telescopically connected in the guide post seat (24).
CN202022239794.0U 2020-10-10 2020-10-10 Wire needle flip test module jig Active CN213091821U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202022239794.0U CN213091821U (en) 2020-10-10 2020-10-10 Wire needle flip test module jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202022239794.0U CN213091821U (en) 2020-10-10 2020-10-10 Wire needle flip test module jig

Publications (1)

Publication Number Publication Date
CN213091821U true CN213091821U (en) 2021-04-30

Family

ID=75613169

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202022239794.0U Active CN213091821U (en) 2020-10-10 2020-10-10 Wire needle flip test module jig

Country Status (1)

Country Link
CN (1) CN213091821U (en)

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