CN213042128U - Realize automatic testing arrangement of terminal high low temperature performance - Google Patents
Realize automatic testing arrangement of terminal high low temperature performance Download PDFInfo
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- CN213042128U CN213042128U CN202022607753.2U CN202022607753U CN213042128U CN 213042128 U CN213042128 U CN 213042128U CN 202022607753 U CN202022607753 U CN 202022607753U CN 213042128 U CN213042128 U CN 213042128U
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Abstract
The utility model relates to a terminal test field, in particular to realize automatic testing arrangement of terminal high low temperature performance. The testing device comprises an instrument system for sending an instruction, a switching interface tool for transmitting the instruction, a single chip microcomputer for analyzing the instruction and outputting high and low levels, a USB line, a control relay for controlling the on-off of the USB line and a tested terminal, wherein the instrument system is connected with the single chip microcomputer through the switching interface tool, the instrument system is connected with the control relay through the USB line, the single chip microcomputer is connected with the control relay and outputs signals to the control relay, and the control relay is connected with the terminal and outputs signals to the terminal. The testing device develops the automatic testing device for the high-low voltage performance of the terminal by combining international mainstream testing equipment aiming at the testing requirements of all standards even including 5G terminal limit environment, can greatly save the testing cost and effectively improve the testing efficiency.
Description
Technical Field
The utility model relates to a terminal test field, in particular to realize automatic testing arrangement of terminal high low temperature performance.
Background
In recent years, with the continuous development of mobile communication technology and the diversification of user requirements, multimedia technology and mobile internet application are rapidly developed, so that the popularization rate of mobile intelligent terminals is promoted to be higher and higher, and meanwhile, the quality problems of the terminals are more and more concerned by people. When the 2G/3G/4G/5G terminal is authenticated, many test cases require testing under extreme environments, such as high-temperature high-pressure, high-temperature low-pressure, low-temperature high-pressure and low-temperature low-pressure environments. Generally, a mobile phone terminal and a test computer need to be connected through a USB to realize automatic test, but when a high-voltage and low-voltage case is tested, if the USB connection is kept all the time, the voltage of the terminal is influenced, and the accuracy of a test result is further influenced. One of the previous solutions is a manual on-off test, but there are many test cases for repeated on-off in a terminal performance test, and part of the tests need to be performed in a limit environment of low temperature of-10 ℃ or high temperature of 55 ℃, which is very inconvenient for manual operation and low in efficiency. The other method is to automatically power on and power off the terminal through a power supply matched with the test system, but only part of instruments are matched with corresponding test power supplies, and a lot of terminals are started very slowly during testing, so that a lot of test time is consumed.
SUMMERY OF THE UTILITY MODEL
The utility model provides a realize automatic testing arrangement of terminal high low temperature performance aims at solving current terminal test function singleness, cost height, pertinence not strong, the problem of operation complicacy.
The utility model provides a realize automatic testing arrangement of terminal high low temperature performance, including the switching mouth instrument, the analytic instruction of the instrument system of giving instruction, transmission instruction and output high low level singlechip, USB line, the control relay of control USB line break-make, the terminal of being tested, instrument system passes through switching mouth instrument connection singlechip, instrument system passes through USB line connection control relay, singlechip connection control relay is to its output signal, control relay connection terminal is to its output signal.
As a further improvement of the utility model, the instrumentation includes instrument end, system end, COM port, the COM port sets up on the system end, the instrument end passes through COM port connected system end.
As a further improvement, the instrument end is equipped with the human-computer interface and the electric human-computer interface command of discernment instrument system simulator and converts it into the instrument automation software of terminal AT or adb instruction that awaits measuring.
As a further improvement of the utility model, the system end is equipped with the system end software that receives AT or adb instruction and send control command for the singlechip.
As a further improvement of the present invention, the COM port is a virtual COM port, and the virtual COM port connects and establishes communication between the meter automation software and the system side software.
As a further improvement, the system end is connected with the singlechip through a switching port tool, and the system end is connected with the control relay through a USB line.
As a further improvement, the testing device comprises a first power supply and a second power supply, wherein the first power supply passes through a power adapter or a USB serial port connection singlechip, and the second power supply is connected with a terminal.
As a further improvement, the switching port tool is a USB switching port tool.
As a further improvement of the utility model, the singlechip is the STM32 singlechip.
The utility model has the advantages that: the testing device develops the automatic testing device for the high-low voltage performance of the terminal by combining international mainstream testing equipment aiming at the testing requirements of all standards even including 5G terminal limit environment, can greatly save the testing cost and effectively improve the testing efficiency.
Drawings
FIG. 1 is a block diagram of a testing device according to the present invention;
FIG. 2 is a first logic diagram of the test apparatus of the present invention;
fig. 3 is a second logic relationship diagram of the testing device of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments.
The device is the only automatic testing device aiming at the performance of the 2G/3G/4G/5G terminal under the limit environment at present, realizes the full automation of high-low voltage performance testing based on the on-off of a relay control USB line, reduces the manual intervention and effectively improves the testing efficiency. As shown in fig. 1, the utility model discloses a realize automatic testing arrangement of terminal high low temperature performance, including the instrumentation 1 of giving instruction, transmission instruction's switching interface instrument 2, the singlechip 3 of analytic instruction and output high low level, the USB line, the control relay 4 of control USB line break-make, the terminal 5 of being tested, instrumentation 1 passes through switching interface instrument 2 and connects singlechip 3, instrumentation 1 passes through USB line connection control relay 4, 3 connection control relays 4 of singlechip are and to its output signal, 4 connection terminal 5 of control relay are and to its output signal.
The meter system 1 comprises a meter end 11, a system end 12 and a COM port 13, wherein the COM port 13 is arranged on the system end 12, and the meter end 11 is connected with the system end 12 through the COM port 13.
The meter end 11 is provided with meter automation software, the meter automation software can identify Man Machine Interface (MMI) and Electrical Man Machine Interface (EMMI) commands of RS232-C or TCP/IP ports of the meter system simulator, and convert them into specific AT or adb commands of a sample to be tested (Device Under Test, DUT), where the AT or adb commands are commands applied to connection and communication between the terminal Device and PC application.
The COM port 13 is a virtual COM port: a virtual COM port is installed on a system computer and used for communication between instrument automation software and system end software.
The system end 12 is provided with system end software, the system end software receives an AT or adb instruction from the instrument automation software through a virtual COM port, and after the system end software receives the AT or adb instruction, the system end software can send a control instruction to an STM32 single chip microcomputer through a USB-to-serial port tool to open a control relay 4 to enable a USB line to be communicated on one hand, and can send the AT or adb instruction to a tested terminal 5 through the communicated USB line on the other hand.
The switching port tool 2 is a USB switching serial port tool, one end of the switching port tool is connected with the system end 12, the other end of the switching port tool is connected with the STM32 single chip microcomputer, and the switching port tool is used for transmitting a control instruction sent by system end software to the STM32 single chip microcomputer. After the USB-to-serial port tool is inserted into a USB port of a system, a COM port 13 can be generated on a system end, and system end software sends a related startup and shutdown character string instruction to an STM32 single chip microcomputer through the generated COM port 13.
The control relay 4 is an electric control device, and is an automatic switch which uses small current to control large current to operate. One end of the control relay 4 is connected with an IO port of the STM32 singlechip, the other end of the control relay is connected with a power line of a USB line, and the STM32 singlechip receives a control instruction and controls the relay 4 to control the connection of the USB line; when the STM32 singlechip has not received the control command, control relay 4 control USB line disconnection to prevent influencing the stability of the terminal 5 voltage of being surveyed.
The testing device comprises a first power supply and a second power supply 6, wherein the first power supply is connected with the singlechip 3 through a power adapter or a USB serial port, the second power supply 6 is connected with a terminal 5, and the second power supply 6 is a direct-current power supply. The terminal 5 is directly powered by a direct current power supply, and the singlechip 3 is connected to the power supply through a power adapter or a USB serial port.
The terminal 5 provides high voltage or low voltage by a direct current power supply, is connected with the system end 12 through a USB line, the system can generate a COM port 13 after installation and driving, when the USB line is in a connected state, the terminal 5 to be tested can receive an AT or adb instruction sent by system end software, and under the general condition, the normal pressure of the terminal 5 is 3.8V, the low voltage is 3.5V, and the high voltage is 4.2V.
The logic relation of the 2/3/4/5G terminal high-low voltage performance automatic test process is as shown in fig. 2 and 3, system end software is opened, whether debugging can receive an MMI instruction issued by an instrument end or not is judged, then a USB serial-to-serial port tool, an STM32 single chip microcomputer, a control relay 4, a USB line and a terminal 5 are sequentially connected, a power adapter or a USB serial port is connected to supply power to the STM32 single chip microcomputer, and a power supply is connected to supply power to the terminal 5. The instrument end 11 runs a test case, when the instrument issues an AT or adb instruction, the USB line is communicated, and the terminal 5 receives and executes the instruction; when no AT/adb instruction exists in the test process, the USB line is disconnected, the voltage of the terminal 5 is not affected, and the automatic test of the whole process is realized.
The device is used for realizing the automatic performance test in the terminal limit environment, the hardware comprises a USB-to-serial port tool, an STM32 single chip microcomputer and a control relay 4, and the software comprises system end software and the like.
In the process of realizing the automatic test of the test case in the high-low voltage limit environment, the influence of the USB line connection on the terminal voltage is reduced as much as possible. After the instrument control software starts the high-low voltage performance test of the 2/3/4/5G mobile communication terminal, when the system end software receives an MMI instruction of a startup and shutdown, the communication of the USB line can be realized through the hardware device. Otherwise the USB line will remain open to prevent effects on the termination voltage. Therefore, the automatic test of high and low temperature performance can be realized on the premise of ensuring the terminal voltage stability.
The system end software of the device is easy to operate, the hardware is convenient to connect, the automatic test of the high and low temperature performance can be realized, the operation is stable, the test efficiency can be greatly improved, the labor cost is saved, the automatic test of the high and low temperature performance is independent of the instrument matching power supply, and the test convenience is realized. Meanwhile, the automatic test function can be stably realized in the limit environment of high temperature of-55 ℃ or low temperature of-10 ℃ and the like in the temperature control box.
The device has been tested and evaluated in the aspect of 2/3/4/5G communication terminal performance tests, including high-temperature high-pressure, high-temperature low-pressure, low-temperature high-pressure, low-temperature low-pressure and other limited environments. Firstly, the device is adopted to carry out the comparison of related tests and manual tests, the result consistency is good, and the requirements on repeatability and stability are met. The automatic running time and the manual testing time of the system under the same testing task are counted, and the result proves that the device can obviously improve the testing efficiency. The conclusion is drawn that the device is the only device which aims at realizing the high-low voltage performance test scheme under the limit environment of all standard (2G/3G/4G/5G) communication terminals at present, has complete functions and excellent performance, and is convenient to operate.
The foregoing is a more detailed description of the present invention, taken in conjunction with the specific preferred embodiments thereof, and it is not intended that the invention be limited to the specific embodiments shown and described. To the utility model belongs to the technical field of ordinary technical personnel, do not deviate from the utility model discloses under the prerequisite of design, can also make a plurality of simple deductions or replacement, all should regard as belonging to the utility model discloses a protection scope.
Claims (9)
1. The utility model provides a realize automatic testing arrangement of terminal high low temperature performance which characterized in that, is including the instrument system of sending the instruction, the switching interface instrument of transmission instruction, the singlechip of analysis instruction and output high low level, USB line, the control relay of control USB line break-make, the terminal under test, instrument system passes through switching interface instrument and connects the singlechip, instrument system passes through USB line connection control relay, the singlechip connects the control relay and to its output signal, control relay connection terminal and to its output signal.
2. The device for realizing automation of high and low temperature performances of the terminal according to claim 1, wherein the meter system comprises a meter end, a system end and a COM port, the COM port is arranged on the system end, and the meter end is connected with the system end through the COM port.
3. The device for realizing the automation of the high and low temperature performance of the terminal according to claim 2, wherein the meter end is provided with meter automation software for recognizing the human-machine interface and the electric human-machine interface commands of the meter system simulator and converting the commands into AT or adb commands of the terminal to be tested.
4. The device for realizing the automation of the high and low temperature performances of the terminal as claimed in claim 3, wherein the system end is provided with system end software for receiving AT or adb commands and sending control commands to the single chip microcomputer.
5. The testing device for realizing automation of high and low temperature performances of the terminal according to claim 4, wherein the COM port is a virtual COM port, and the virtual COM port is connected with and establishes communication between meter automation software and system end software.
6. The test device for realizing the automation of the high and low temperature performance of the terminal according to claim 2, wherein the system end is connected with the single chip microcomputer through a switching port tool, and the system end is connected with the control relay through a USB wire.
7. The device for realizing the automation of the high and low temperature performance of the terminal according to claim 1, comprising a first power supply and a second power supply, wherein the first power supply is connected with the singlechip through a power adapter or a USB serial port, and the second power supply is connected with the terminal.
8. The device for realizing automation of high and low temperature performances of the terminal as claimed in claim 1, wherein the switching port tool is a USB switching port tool.
9. The test device for realizing automation of high and low temperature performances of the terminal according to claim 1, wherein the single chip microcomputer is an STM32 single chip microcomputer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022607753.2U CN213042128U (en) | 2020-11-11 | 2020-11-11 | Realize automatic testing arrangement of terminal high low temperature performance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022607753.2U CN213042128U (en) | 2020-11-11 | 2020-11-11 | Realize automatic testing arrangement of terminal high low temperature performance |
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| Publication Number | Publication Date |
|---|---|
| CN213042128U true CN213042128U (en) | 2021-04-23 |
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| CN202022607753.2U Active CN213042128U (en) | 2020-11-11 | 2020-11-11 | Realize automatic testing arrangement of terminal high low temperature performance |
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