CN212907097U

CN212907097U - Test system for SSD module

Info

Publication number: CN212907097U
Application number: CN202021494177.9U
Authority: CN
Inventors: 袁广东
Original assignee: Shenzhen Jetio Technology Co ltd
Current assignee: Shenzhen Jetio Technology Co ltd
Priority date: 2020-07-23
Filing date: 2020-07-23
Publication date: 2021-04-06
Anticipated expiration: 2030-07-23

Abstract

The utility model discloses a test system for SSD module, ICT connecting plate, test server including test box, bar code scanning rifle, digital collection box, the ICT machine that is used for connecting the producer, the test box includes the host computer and is provided with the test rack of needle bed, the utility model discloses can cover all test items of SSD module, the mill enlarges the productivity, only need dispose simultaneously many can, and can use on the automatic line of mill, cooperation robotic arm installation awaits measuring product to the needle bed, can unmanned automatic test, test server is uploaded automatically to the test result, is convenient for preserve, avoids losing of human error and data, tests different products, only need to change the test rack can, other parts do not need redevelopment.

Description

Test system for SSD module

Technical Field

The utility model relates to a solid state dish technical field especially relates to a test system for SSD module.

Background

At present, Solid State Disk (SSD) modules are produced in a plurality of testing links, namely open-short circuit testing before electrification, voltage testing after electrification, burning testing of firmware on a board, signal function testing of connectors on the board, product function testing and the like. Many factory test items are divided into different work stations for testing, and each work station needs to use corresponding special software, hardware, test fixture and test flow. Therefore, management confusion of the test work station is caused, the collection and arrangement of test data are very complicated, a large amount of equipment, manpower and time are wasted, errors are easy to occur, test items are omitted, and the problem that data collection is difficult is solved.

SUMMERY OF THE UTILITY MODEL

The to-be-solved technical problem of the utility model lies in, to the above-mentioned defect of prior art, a test system for SSD module is provided.

The utility model provides a technical scheme that its technical problem adopted is: the testing system for the SSD module comprises a testing box, a bar code scanning gun, a digital collecting box and a testing server, wherein the testing box comprises a host and a testing rack provided with a needle bed;

the first USB port of the host is connected with the corresponding probe of the test rack through a USB special cable, a USB and JTAG adapter and a JTAG cable in sequence, the second USB port of the host is connected with the corresponding probe of the test rack through the USB special cable, the USB and UART adapter and the UART cable in sequence, the third USB port of the host is connected with the corresponding probe of the test rack through the USB special cable, the USB and ISCP adapter and the ISCP cable in sequence, the first GPIO port of the host is connected with the corresponding probe of the test rack through a GPIO special cable, a GPIO and I2C adapter and an I2C cable in sequence, the fourth USB port or the first RJ45 interface of the host is connected with the digital acquisition box, the digital acquisition box is connected with the probe which may need to acquire signals on the test rack through a cable, the fifth USB port of the host is connected with a bar code scanning gun, and the second RJ45 interface of the host is connected with the test server, the PCIE interface of the host is connected with a product to be tested which is arranged on the needle bed through a PCIE cable, and the host is used for sending the scanning result of the bar code scanning gun to the test server to execute the corresponding test item and uploading the test result to the test server.

Preferably, the digital collection box includes an analog switch group and a digital multimeter, the digital multimeter is connected to the host, the digital multimeter is connected to each switch in the analog switch group, each switch in the analog switch group is connected to a probe which may need to collect signals on the test rack, and the digital multimeter is used for selecting a corresponding switch in the analog switch group to be turned on according to signal control of the host to measure signals, and returning measured results to the host.

Preferably, the test box further comprises a power switch for controlling power access and a power indicator lamp for indicating power access, the power switch is connected with the second GPIO port of the host, and the power indicator lamp is connected with the third GPIO port of the host.

Preferably, the system further comprises an ICT machine of the manufacturer and an ICT connecting plate used for connecting the ICT machine of the manufacturer, and the corresponding probes on the test rack are connected with the ICT connecting plate through wires.

The utility model discloses a test system for SSD module has following beneficial effect: the utility model discloses can cover all test items of SSD module, the mill enlarges the productivity, only need dispose simultaneously many can, can use on the automatic line of mill in addition, cooperation robotic arm installation product to needle bed that awaits measuring, can unmanned automatic test, test server is uploaded automatically to the test result, is convenient for preserve, avoids losing of human error and data, tests different products, only need to change the test frame can, other parts do not need redevelopment.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts:

fig. 1 is a schematic structural diagram of a test system for SSD module of the present invention.

Detailed Description

In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. Exemplary embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete. It should be understood that the embodiments and specific features in the embodiments of the present invention are described in detail in the present application, but not limited to the present application, and the technical features in the embodiments and specific features in the embodiments of the present invention can be combined with each other without conflict.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.

The terms including ordinal numbers such as "first", "second", and the like used in the present specification may be used to describe various components, but the components are not limited by the terms. These terms are used only for the purpose of distinguishing one constituent element from other constituent elements. For example, a first component may be named a second component, and similarly, a second component may also be named a first component, without departing from the scope of the present invention.

Referring to fig. 1, the test system for the SSD module of the present embodiment includes a test box 1, a barcode scanning gun 3, a digital collection box 2, an ICT machine 6 of a manufacturer, an ICT connection board 4 for connecting the ICT machine 6 of the manufacturer, and a test server 4.

The test box 1 comprises a host 11 and a test rack 12 provided with a needle bed, and a product 7 to be tested is arranged on the needle bed through a manipulator on a factory automation line. The digital collection box 2 comprises an analog switch group 22 and a digital multimeter 21, wherein the analog switch group 22 comprises a plurality of analog switches.

Referring to fig. 1, a first USB port of the host 11 is connected to a corresponding probe of the test rack 12 through a USB dedicated cable, a USB and JTAG adaptor, and a JTAG cable in sequence, a second USB port of the host 11 is connected to a corresponding probe of the test rack 12 through a USB dedicated cable, a USB and UART adaptor, and a UART cable in sequence, a third USB port of the host 11 is connected to a corresponding probe of the test rack 12 through a USB dedicated cable, a USB and ISCP adaptor, and an ISCP cable in sequence, and a first GPIO port of the host 11 is connected to a corresponding probe of the test rack 12 through a GPIO dedicated cable, a GPIO and I2C adaptor, and an I2C cable in sequence. When the product 7 to be tested is in different test items, the corresponding test signals are different, and the connection of the test signals ensures that various test signals of the product 7 to be tested reach the host 11.

Further, a fourth USB port or a first RJ45 interface of the host 11 is connected to the digital collection box 2, and the digital collection box 2 is connected to a probe of the test rack 12 via a cable, which may be required to collect signals. Specifically, the digital multimeter 21 is connected to a fourth USB port or a first RJ45 interface of the host 11, the digital multimeter 21 is connected to each switch in the analog switch group 22, each switch in the analog switch group 22 is connected to a probe that may need to collect signals on the test rack 12, and the digital multimeter 21 is configured to select a corresponding switch in the analog switch group 22 to be turned on according to signal control of the host 11, so as to measure a response signal of a product to be measured, and return a measured result to the host. Different test items and different product pins needing test voltage, so the digital multimeter 21 can select a specific test pin of the product 7 to be tested for testing by selecting the analog switch connected with the probe according to the indication of the host 11. In the prior art, the multimeter test is also to manually connect the multimeter to a product to be tested, in this embodiment, the host gives the digital multimeter 21 the probe information of the voltage to be tested in the test item, and the digital multimeter 21 can control the corresponding analog switch to be switched on according to the probe information and test the probe voltage.

The fifth USB port of the host 11 is connected to the barcode scanning gun 3, the second RJ45 interface of the host 11 is connected to the test server 4, the PCIE interface of the host 11 is connected to the product 7 to be tested mounted on the needle bed through a PCIE cable, and the host 11 is configured to send the scanning result of the barcode scanning gun 3 to the test server 4 to execute the corresponding test item, and upload the test result to the test server 4.

Wherein, the corresponding probe on the test rack 12 is connected with the ICT connecting plate 4 through a wire. When ICT testing is needed, an ICT machine 6 needs to be connected with the ICT connecting plate 4, and when ICT testing is not needed, the ICT connecting plate 4 does not need to be connected into the testing box 1.

Preferably, the test box 1 further includes a power switch for controlling power access and a power indicator for indicating power access, the power switch is connected to a second GPIO port of the host 11 (the second GPIO port is a power supply port of the host 11 and is connected to a power supply, the power switch is connected in series in a connection path between the second GPIO port and the power supply), and the power indicator is connected to a third GPIO port of the host 11. The test box 1 comprises a box body, the host 11 and the test rack 12 are positioned in the box body, an interface needing to be connected with an external structure is exposed, and the power switch and the power indicator lamp are arranged on a front panel of the box body.

The utility model discloses a test procedure is: the manipulator installs the product 7 to be tested on the needle bed of the testing frame 12; the test box 1 is powered on by pressing a power switch; scanning the sequence code of the product 7 to be tested by using the bar code scanning gun 3, and uploading the sequence code to the test server 4 by using the host 11; the test server 4 downloads a corresponding test program to the host 11 according to the sequence code; the host 11 executes the test according to the test program; the host 11 uploads the test result to the test server 4 for storage.

It is understood that the prior art has incorporated each specific test program separately into a specific test rig, all tested independently. The utility model discloses a with the serial number of various products 7 that await measuring and the test program that corresponds prestore to test server 4. It should be noted that the method and program related to the present invention are only conventional adaptive applications in the prior art, and the present invention is not directed to the method and program itself, but the hardware structure composition and the connection relationship between the hardware structure composition and the program itself, which means that the present invention relates to a method and program, but does not include the improvement proposed to the program itself. The present invention is described for better illustration of the method and procedure for better understanding of the present invention.

While the embodiments of the present invention have been described with reference to the accompanying drawings, the present invention is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many modifications may be made by one skilled in the art without departing from the spirit and scope of the present invention as defined in the appended claims.

Claims

1. A test system for an SSD module is characterized by comprising a test box, a bar code scanning gun, a digital acquisition box and a test server, wherein the test box comprises a host and a test rack provided with a needle bed;

2. The test system for the SSD module as set forth in claim 1, wherein the digital collection box comprises an analog switch group and a digital multimeter, the digital multimeter is connected to the host, the digital multimeter is connected to each switch in the analog switch group, each switch in the analog switch group is connected to a probe on the test rack, the probe may need to collect signals, and the digital multimeter is configured to select a corresponding switch in the analog switch group to be turned on according to signal control of the host to measure signals, and transmit measured results back to the host.

3. The test system for the SSD module of claim 1, wherein the test box further comprises a power switch for controlling power access and a power indicator light for indicating power access, the power switch is connected with the second GPIO port of the host, and the power indicator light is connected with the third GPIO port of the host.

4. The test system for the SSD module of claim 1, the system further comprising a manufacturer's ICT machine and an ICT connection board for connecting the manufacturer's ICT machine, the corresponding probes on the test rack being connected to the ICT connection board by wires.