CN212905257U - Test panel structure - Google Patents
Test panel structure Download PDFInfo
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- CN212905257U CN212905257U CN202021281104.1U CN202021281104U CN212905257U CN 212905257 U CN212905257 U CN 212905257U CN 202021281104 U CN202021281104 U CN 202021281104U CN 212905257 U CN212905257 U CN 212905257U
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Abstract
The utility model provides a test panel structure, test panel has test circuit, a serial communication port, test panel structure is still including inserting test circuit's control switch and with at least one test resistance that control switch connects, at least one test resistance connect in the pin that control switch corresponds, control switch control rather than a test resistance of connecting with test circuit connects the utility model discloses a test panel structure inserts test circuit through a test panel of control switch control, can realize the unified assembly of control switch and test resistance, effectual improvement production efficiency design benefit, the structure is succinct, and it is simple and convenient to make, and is with low costs, is suitable for extensive popularization and application.
Description
Technical Field
The utility model relates to a semiconductor package test technical field, in particular to product electrical property test technical field specifically indicates a test panel structure.
Background
In the semiconductor packaging test process, when the product is tested for electrical performance, a test station needs to be externally connected with a test panel, and a test circuit is arranged on the test panel.
However, when the number of the test stations is greater than or equal to two, due to the fact that the test panels of the test stations are designed to have the same appearance, the serious risk of connection errors of the test stations exists, the test stations cannot be classified corresponding to the test result information of the test stations, the risk of product missing test is caused, defective electrical properties flow out, and the defective electrical properties are delivered to customers.
The identification is distinguished to useful different colour outward appearances of current test station, but under the wrong condition of connection, test equipment can keep continuing test production, does not have any warning suggestion, relies on artificial management and control completely, has serious risk and leak.
Therefore, it is desirable to provide a test panel structure which can prevent a test station from being connected incorrectly, prevent a product from being subjected to a missing test risk, and ensure the product quality.
SUMMERY OF THE UTILITY MODEL
In order to overcome the shortcoming among the above-mentioned prior art, an object of the utility model is to provide a test panel structure, it can prevent to test station connection error, prevents that the product from appearing leaking and surveys the risk, guarantees product quality, is suitable for extensive popularization and application.
Another object of the utility model is to provide a test panel structure, its design benefit, the structure is succinct, makes portably, and is with low costs, is suitable for extensive popularization and application.
In order to achieve the above object, the utility model discloses a test panel structure, including the test panel, the test panel has test circuit, its characteristics are, the test panel structure is still including inserting test circuit's control switch and with at least one test resistance that control switch connects, at least one test resistance connect in the pin that control switch corresponds, control switch control rather than a test resistance of connecting with test circuit connects.
Preferably, the control switch and at least one test resistor connected thereto are connected in parallel to the test circuit.
Preferably, the control switch is a dial switch, and the dial switch is provided with a plurality of pins;
a plurality of test resistors are connected to the pins corresponding to the dial switches; and controlling one test resistor in the plurality of test resistors to be connected into the test circuit through the control switch.
Preferably, the number of the pins of the dial switch is 8;
4 test resistors are respectively connected to the pins corresponding to the dial switches;
and the pin part of the dial switch, which is not connected with the test resistor, is provided with a plug hole.
Preferably, the control switch is a rotary switch, and the rotary switch is provided with a plurality of pins;
the plurality of test resistors are connected to the pins corresponding to the knob switches; and one of the plurality of test resistors is controlled to be connected into the test circuit through the knob switch.
Preferably, the number of the pins of the knob switch is 8;
4 test resistors are respectively connected to the pins corresponding to the knob switches;
and the pin part of the knob switch, which is not connected with the test resistor, is provided with a plug hole.
Preferably, the test resistors are multiple, and the resistance values of the test resistors are all different.
Preferably, the control switch and the test resistor are arranged at an end of the test panel.
Preferably, the test panel further comprises a first test connection point and a second test connection point which are arranged at the end parts of the test panel;
the first test connection point is connected with one end of the control switch, which is far away from the test resistor;
the second test connection point is connected with one end, far away from the control switch, of the test resistor.
The beneficial effects of the utility model mainly lie in:
1. the utility model discloses a test panel structure includes test panel and test resistance, test panel has test circuit, test panel inserts test circuit through control switch control, during the use, the station passageway of the Load Board (test Load Board) that combines to correspond sets for the design, when connecting the mistake, the station passageway that the Load Board corresponds can't switch on, the tester can't provide the electric current that requires, the electric property test is carried out to the product to the voltage, the whole Fail of product test result, the product can't carry out normal test production, therefore, it can prevent test station connection error, prevent that the product from appearing the risk of missing the survey, guarantee product quality, be suitable for extensive popularization and application.
2. The utility model discloses a test panel structure includes test panel and test resistance, test panel has test circuit, test panel inserts test circuit through control switch control, during the use, the station passageway that combines the Load Board that corresponds sets for the design, when connecting the mistake, the station passageway that the Load Board corresponds can't switch on, the test instrument can't provide the required electric current, the electric performance test is carried out to the product to the voltage, the whole Fail of product test result, the product can't carry out normal test production, therefore, its design benefit, the structure is succinct, make portably, and is low in cost, be suitable for extensive popularization and application.
These and other objects, features and advantages of the present invention will become more fully apparent from the following detailed description, the accompanying drawings and the appended claims, wherein like reference numerals refer to corresponding parts throughout the several views, and wherein like reference numerals refer to like parts throughout the several views.
Drawings
Fig. 1 is a schematic top view of an embodiment of a test panel structure according to the present invention.
(symbol description)
20 testing the panel; 21 testing the circuit; 22 a control switch; 23 testing the resistance; 24, inserting the hole.
Detailed Description
In order to clearly understand the technical contents of the present invention, the following embodiments are specifically illustrated in detail.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.
Please refer to fig. 1, in an embodiment of the present invention, the test panel structure of the present invention includes a test panel 20, the test panel 20 has a test circuit 21, the test panel 20 further includes a control switch 22 connected to the test circuit 21 and at least one test resistor 23 connected to the control switch, the at least one test resistor 23 is connected to a pin corresponding to the control switch, and the control switch 22 controls the test resistor 23 connected to the control switch to be connected to the test circuit 21.
In an embodiment of the present invention, the control switch 22 and the testing resistor 23 are correspondingly welded in the testing circuit 21 of the testing panel 20.
The testing method comprises the steps that a control switch is used for selecting a testing resistor to be connected into a testing circuit, the connected testing resistor is used for marking a testing panel, a detection circuit connected with the corresponding testing resistor is designed at a testing load plate of a testing station, the detection circuit is used for detecting a voltage value or a current value corresponding to the testing resistor, whether the voltage value or the current value is consistent with a preset value or not is judged in an identifying mode, if yes, the testing panel corresponds to the testing station, the circuit is conducted, and a testing instrument of the testing station tests a product by using the testing circuit of the testing panel. If the judgment result is inconsistent, the test panel is not corresponding to the test station, the circuit is not conducted, the test instrument of the test station cannot provide required current and voltage to carry out electrical performance test on the product, and the test result fails, so that the error of a connecting line between the test panel and the test station can be effectively eliminated, and the risk of serious quality accidents caused by test leakage and outflow of the product can be avoided.
In one embodiment of the present invention, the control switch 22 and the at least one test resistor 23 connected thereto are connected in parallel in the test circuit 21.
In one embodiment of the present invention, the control switch 22 is a dial switch having a plurality of pins; the test resistors 23 are also multiple and connected to corresponding pins of the dial switch, and one test resistor 23 of the test resistors 23 is controlled by the dial switch to be connected into the test circuit 21. Specifically, the resistors are tested for one-to-one connection with the pins.
In the example shown in fig. 1, the number of pins of the dial switch is 8, the number of the test resistors 23 is 4, 4 test resistors 23 are connected to pins corresponding to the dial switch, a plug hole 24 is formed in a pin position of the dial switch, which is not connected with the test resistors, the plug hole 24 is used for providing an extended function for the use of a subsequent test panel, an electronic element can be directly plugged and connected to the plug hole 24, the electronic element is connected with the dial switch, and the electronic element is controlled to be connected into the test circuit 21 through the dial switch.
In one embodiment of the present invention, the control switch 22 is a rotary switch having a plurality of pins; the test resistors 23 are connected to corresponding pins of the rotary switch, and one of the test resistors 23 is controlled by the rotary switch to be connected to the test circuit 21.
In a preferred embodiment, the number of the pins of the knob switch is 8, that is, 8-gear selection is provided; the number of the test resistors 23 is 4, the test resistors are respectively connected to pins corresponding to the rotary switch, plug holes 24 are formed in the pins which are not connected with the test resistors on the rotary switch, the plug holes 24 are utilized to provide an expansion function for the use of a subsequent test panel, the plug holes 24 can be directly connected with electronic elements in a plug mode, the electronic elements in the plug mode are connected with the rotary switch, and the electronic elements are controlled to be connected into the test circuit 21 through the rotary switch.
In a specific embodiment of the present invention, the testing resistors 23 are plural, and the resistance values of the testing resistors are all different. The test resistors with different resistance values are connected into the corresponding test circuits of the test panel 20, and the corresponding test panel is identified by the test resistors with different resistance values, so that fool-proofing is realized, and risks and holes existing in artificial management and control are avoided.
The utility model discloses an among the test circuit that control switch and a plurality of test resistance together inserted test panel, utilize control switch to control a test resistance and insert test circuit, this kind of design can make test panel's production can the flow, and is standardized, unification, can accomplish the assembly of control switch and test resistance on various test panels at a station, realized the unified assembly of control switch and test resistance on the different test panels, and the production cost is reduced, and the production efficiency is improved.
In one embodiment of the present invention, the control switch 22 and the test resistor 23 are disposed at the end of the test panel 20. The control switch and the test resistor arranged at the end are conveniently connected with a test load board of the test station.
In one embodiment of the present invention, the test panel structure further comprises a first test connection point and a second test connection point disposed at the end of the test panel 20; the first test connection point is connected with one end of the control switch 22 far away from the test resistor 23; the second test connection point is connected to the end of the test resistor remote from the control switch 22. After the detection circuit on the test load board is correspondingly connected with the first test connection point and the second test connection point, the detection circuit is connected with the control switch 22 and the test resistor 23 in parallel, and the voltage values at the two ends of the test resistor 23 and the control switch 22 can be detected, so that the identification and judgment can be carried out.
The number of the test resistors 23 can be determined as required, please refer to fig. 1, in an embodiment of the present invention, the number of the test resistors 23 is 4.
During the use, the test panel that has the test resistance of different resistance values is connected with different test station one-to-one, combine the passageway of the test Load Board station that corresponds to set for the design, when the test worker is with the mistake, the connecting wire mistake, the station passageway that the Load Board corresponds can't switch on, the tester can't provide the electric current that requires, voltage carries out the electrical property test to the product, the product test result is whole to be failed, the product can't carry out normal test production, test station connecting wire mistake has thoroughly been eliminated, lead to the product to leak to survey, the outflow causes the risk of serious quality accident.
Therefore, adopt the utility model discloses, the test panel setting through different test station has the resistance of different resistance values, prevents test panel connection error, prevents that the product from appearing the risk of missing to survey.
To sum up, the utility model discloses a test panel structure can improve test probe life-span, and stable test yield improves production efficiency, design benefit, and the structure is succinct, and it is simple and convenient to make, and is with low costs, is suitable for extensive popularization and application.
Therefore, the purpose of the utility model is completely and effectively realized. The functional and structural principles of the present invention have been shown and described in the embodiments, and the embodiments may be modified without departing from the principles. Therefore, the present invention includes all modifications within the spirit and scope of the appended claims.
Claims (9)
1. The utility model provides a test panel structure, includes the test panel, the test panel has test circuit, its characterized in that, the test panel structure still including the access test circuit's control switch and with at least one test resistance that control switch connects, at least one test resistance connect in the pin that control switch corresponds, control switch control rather than a test resistance of connecting with test circuit connects.
2. The test panel structure of claim 1, wherein the control switch and at least one test resistor connected thereto are connected in parallel in the test circuit.
3. The test panel structure of claim 1, wherein the control switch is a dip switch, the dip switch having a plurality of pins;
a plurality of test resistors are connected to the pins corresponding to the dial switches; and controlling one test resistor in the plurality of test resistors to be connected into the test circuit through the dial switch.
4. The test panel structure of claim 3, wherein there are 8 pins of the dip switch;
4 test resistors are respectively connected to the pins corresponding to the dial switches;
and the pin part of the dial switch, which is not connected with the test resistor, is provided with a plug hole.
5. The test panel structure of claim 1, wherein the control switch is a rotary switch having a plurality of pins;
the plurality of test resistors are connected to the pins corresponding to the knob switches; and one of the plurality of test resistors is controlled to be connected into the test circuit through the knob switch.
6. The test panel structure of claim 5, wherein there are 8 pins of the rotary switch;
4 test resistors are respectively connected to the pins corresponding to the knob switches;
and the pin part of the knob switch, which is not connected with the test resistor, is provided with a plug hole.
7. The test panel structure of claim 1, wherein there are a plurality of test resistors, and the plurality of test resistors have different resistance values.
8. The test panel structure of claim 1, wherein the control switch and the test resistor are disposed at an end of the test panel.
9. The test panel structure of claim 1, further comprising first and second test connection points disposed at ends of the test panel;
the first test connection point is connected with one end of the control switch, which is far away from the test resistor;
the second test connection point is connected with one end, far away from the control switch, of the test resistor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021281104.1U CN212905257U (en) | 2020-07-02 | 2020-07-02 | Test panel structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021281104.1U CN212905257U (en) | 2020-07-02 | 2020-07-02 | Test panel structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212905257U true CN212905257U (en) | 2021-04-06 |
Family
ID=75282494
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021281104.1U Active CN212905257U (en) | 2020-07-02 | 2020-07-02 | Test panel structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN212905257U (en) |
-
2020
- 2020-07-02 CN CN202021281104.1U patent/CN212905257U/en active Active
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