CN212807910U

CN212807910U - High-precision low-temperature impact test device

Info

Publication number: CN212807910U
Application number: CN202021704861.5U
Authority: CN
Inventors: 李鹏程; 朱淑范; 张星; 李志艳; 张磊
Original assignee: Tangshan Shouxin Municipal Engineering Testing Co ltd
Current assignee: Tangshan Shouxin Municipal Engineering Testing Co ltd
Priority date: 2020-08-15
Filing date: 2020-08-15
Publication date: 2021-03-26
Anticipated expiration: 2030-08-15

Abstract

The utility model relates to a high accuracy low temperature impact test device relates to impact test's field, including the bottom plate, the bottom plate top is equipped with the roof, is equipped with between roof and the bottom plate and dashes the piece, dashes a fixed surface and has the connecting rod, and the roof is run through to the connecting rod upper end, and the side threaded connection of roof has the second that runs through the roof lateral wall and support tight connecting rod to support tight pole, is equipped with on the roof to fix a position the sample, makes the sample be located towards the locating component under the piece. This application has the effect of the regulation sample of being convenient for high accuracy under to the drift.

Description

High-precision low-temperature impact test device

Technical Field

The application relates to the field of impact tests, in particular to a high-precision low-temperature impact test device.

Background

At present, most electric wires or cables for power and communication are laid in the ground, and a cable tube is a hollow conduit for protecting the electric wires or cables. As a protective tube for a cable, a tube body itself needs to withstand high strength and impact force, and on the other hand, a cable tube inevitably suffers collision during handling and transportation, and the tube is also required to have high impact resistance.

The traditional Chinese patent with publication number CN202453257U discloses an impact resistance testing machine for cable tubes, which comprises a bottom plate, a punch, two guide rods, a heavy hammer positioning disc, a follow-up plate, a positioning rod and a top plate, wherein the two guide rods are respectively and vertically arranged on two sides of the bottom plate, the upper ends of the two guide rods are connected with the top plate horizontally arranged, the follow-up plate is movably sleeved on the two guide rods through two vertical through holes and is fastened on the two guide rods through puller bolts, the heavy hammer positioning disc is fixed at the center of the bottom surface of the follow-up plate, the positioning rod vertically penetrates through holes in the centers of the top plate, the follow-up plate and the heavy hammer positioning disc, the upper end of the positioning rod is fixed on the top plate, the punch is fixed at the lower end of the positioning rod. The weight positioning plate holds the weight. When the impact testing machine works, a sample to be impacted is placed at the middle position of the bottom plate, the punch is enabled to tightly press the sample on the bottom plate, the heavy hammer positioning plate is controlled to release the heavy hammer, and the heavy hammer falls down to impact the punch so as to apply impact force to the sample.

With respect to the related art in the above, the inventors thought that when the punch is required to press the sample, the sample needs to be manually adjusted to be directly below the punch, and there is a drawback that the precision of the movement of the sample is not high and the sample is not conveniently moved to be directly below the punch.

Disclosure of Invention

To facilitate high precision adjustment of the sample to just below the punch. The application provides a high accuracy low temperature impact test device.

The application provides a high accuracy low temperature impact test device adopts following technical scheme:

the utility model provides a high accuracy low temperature impact test device, includes the bottom plate, and the bottom plate top is equipped with the roof, is equipped with between roof and the bottom plate and dashes the piece, dashes a fixed surface and has the connecting rod, and the roof is run through to the connecting rod upper end, and the side threaded connection of roof has the second that runs through the roof lateral wall and support tight connecting rod to support tight pole, is equipped with on the roof to fix a position, make the sample be located towards the locating component under the piece to the sample.

By adopting the technical scheme, when the sample processing device works, a sample is placed on the upper surface of the bottom plate, then the positioning assembly is controlled to enable the sample to be located under the punching block, then the second abutting rod is rotated to enable the second abutting rod to be separated from the connecting rod, then the connecting rod and the punching block move towards the direction close to the bottom plate until the punching block abuts against the sample, and then the second abutting rod is rotated to enable the second abutting rod to abut against the connecting rod; the positioning assembly enables the sample to be moved to the position right below the punching block with high precision, so that when the punching block descends to abut against the sample, the punching block is easy to align with the sample, the sample does not need to be moved for many times manually until the punching block abuts against the sample, and labor is saved.

Preferably, the positioning assembly comprises a pair of positioning plates which are respectively same in distance with the punch, a guide groove penetrating through the bottom plate is formed in the upper surface of the bottom plate, a bidirectional screw rod is arranged below the bottom plate, and the lower end of each positioning plate penetrates through the guide groove and is in threaded connection with the bidirectional screw rod.

Through adopting above-mentioned technical scheme, when rotating two-way lead screw, two-way lead screw rotates and drives a pair of locating plate and move along the guide way in opposite directions or deviate from each other, and the guide way plays the effect of direction for the motion of locating plate, and a pair of locating plate moves in opposite directions and presss from both sides tight sample until a pair of locating plate, and the sample is located under the ram this moment, and the operation is comparatively simple.

Preferably, the bidirectional screw rod is connected with a limiting assembly for limiting the rotation of the bidirectional screw rod.

Through adopting above-mentioned technical scheme, when the locating plate presss from both sides tight sample, in order to prevent that two-way lead screw from rotating and probably lead to the emergence of sample emergence displacement condition, when a pair of locating plate presss from both sides tight sample, control restriction subassembly restriction two-way lead screw rotates.

Preferably, the limiting assembly comprises a rotating disc fixed at one end of a bidirectional screw, a plurality of inserting holes are formed in the side face of the rotating disc, a through hole is formed in the upper surface of the top plate, a pin rod is inserted in the through hole, and the lower end of the pin rod extends out of the through hole and is inserted into one of the inserting holes.

By adopting the technical scheme, when the bidirectional screw rod needs to be rotated, the pin rod is pulled in the direction away from the plug hole, so that the pin rod is separated from the plug hole, and the bidirectional screw rod can be rotated; when a pair of locating plate presss from both sides tight sample, to the direction removal pin rod that is close to the spliced eye, make pin rod and the spliced eye nearest apart from the pin rod peg graft, two-way lead screw is difficult to rotate this moment, reduces the sample and takes place the possibility of displacement, easy operation.

Preferably, a pair of guide posts is fixedly connected between the top plate and the bottom plate, a support plate is arranged between the top plate and the bottom plate, the pair of guide posts respectively penetrates through two ends of the support plate, a pair of first abutting rods which penetrate through the side wall of the support plate and respectively abut against the pair of guide posts is in threaded connection with the side surface of the support plate, the connecting rod penetrates through the support plate, the punching block is located below the support plate, an impact disc is arranged on the lower surface of the support plate, the connecting rod penetrates through the impact disc, and a locking assembly which locks the support plate and the impact.

By adopting the technical scheme, after the punching block abuts against the sample, the locking assembly is controlled to enable the impact disc to be separated from the supporting plate and fall towards the direction close to the punching block, and the impact disc impacts the punching block to enable the sample to be impacted, so that the test is completed; when the impact force that needs the difference strikes the sample, rotate first support pole and make it break away from the guide post, remove the backup pad to the direction that is close to or keeps away from the bottom plate afterwards, the backup pad removes to drive locking Assembly and strikes the dish and to being close to or keeping away from the direction motion of bottom plate, so when strikeing the dish from the high whereabouts impact ram of difference, the impact force that strikes the dish and give impact ram and sample is different.

Preferably, the locking subassembly includes a pair of mounting panel of backup pad side fixed, rotates between a pair of mounting panel and is connected with the dwang, and the last fixed surface of backup pad has the fixed block, and the side that the fixed block is close to the dwang is fixed with the spring, and the one end that the fixed block was kept away from to the spring is fixed with the upper end of dwang, and the lower extreme of dwang supports tightly under the effort of spring and strikes the dish.

Through adopting above-mentioned technical scheme, when needs strike the dish and strike towards the piece, to keeping away from the lower extreme that strikes the direction pulling dwang of dish, make the dwang keep away from and strike the dish, strike the dish and can follow the direction whereabouts of connecting rod and strike towards the piece this moment, when the dwang needs with the backup pad locking, make the lower extreme of dwang support tightly under the effort of spring and strike the side of dish, so the operation that the dish was strikeed in the locking is comparatively simple.

Preferably, one end of the rotating rod, which is close to the impact disc, is bent towards the direction close to the impact disc to form a bent part, and the bent part contacts with the lower surface of the impact disc.

Through adopting above-mentioned technical scheme, the lower surface that the kink contact was strikeed the dish gives and strikes a dish holding power for what the dwang was more stable supports tightly to support and strikes the dish.

Preferably, one end of the pin rod close to the plug hole gradually shrinks towards the direction close to the plug hole.

By adopting the technical scheme, the pin rod can be aligned to the plug hole more easily, and the pin rod and the plug hole can be conveniently plugged.

In summary, the present application includes at least one of the following beneficial technical effects:

1. the positioning assembly enables the sample to be moved to the position right below the punching block with high precision, so that when the punching block descends to abut against the sample, the punching block is easy to align with the sample, the sample does not need to be moved for many times manually until the punching block abuts against the sample, and labor is saved;

2. when the pair of positioning plates clamp the sample, the pin rod is moved towards the direction close to the inserting hole, so that the pin rod is inserted into the inserting hole closest to the pin rod, the bidirectional screw rod is difficult to rotate at the moment, the possibility of displacement of the sample is reduced, and the operation is simple;

3. when the dwang needs to lock with the backup pad, make the lower extreme of dwang support tightly under the effort of spring and strike the side of dish, the operation of dish is strikeed to locking like this is comparatively simple.

Drawings

FIG. 1 is a schematic view of the overall structure of the experimental apparatus according to the embodiment.

FIG. 2 is a schematic diagram of a locking assembly according to an embodiment.

FIG. 3 is a schematic structural diagram of an embodiment embodying a positioning assembly.

FIG. 4 is a schematic diagram of an embodiment embodying a pin bar configuration.

Description of reference numerals: 1. a top plate; 11. a second abutment bar; 2. a support plate; 21. a guide post; 22. a first abutment bar; 3. a base plate; 31. supporting legs; 4. a connecting rod; 41. punching a block; 42. an impact disk; 5. a locking assembly; 51. a fixing plate; 52. mounting a plate; 53. rotating the rod; 531. a bending section; 54. a fixed block; 55. a spring; 56. a transition plate; 57. connecting ropes; 6. a positioning assembly; 61. positioning a plate; 62. a guide groove; 63. a bidirectional lead screw; 64. a support block; 65. rotating the disc; 66. a hand-held lever; 7. a restraining component; 71. inserting holes; 72. a through hole; 73. a pin rod.

Detailed Description

The present application is described in further detail below with reference to figures 1-4.

The embodiment of the application discloses high accuracy low temperature impact test device. Referring to fig. 1, the testing apparatus includes a top plate 1, a supporting plate 2 and a bottom plate 3 which are sequentially arranged from top to bottom, four supporting legs 31 are fixedly connected to the lower surface of the bottom plate 3, and the four supporting legs 31 are respectively located at the positions of four corners of the bottom plate 3. A pair of vertically arranged guide posts 21 are fixedly connected between the top plate 1 and the bottom plate 3, and the pair of guide posts 21 respectively penetrate through two ends of the supporting plate 2. The side surface of the supporting plate 2 is in threaded connection with a pair of first abutting rods 22, and the pair of first abutting rods 22 respectively penetrate through the side wall of the supporting plate 2 and respectively abut against the pair of guide posts 21.

Referring to fig. 1, the middle of the top plate 1 is connected with a connecting rod 4, the connecting rod 4 vertically and downwardly penetrates through the top plate 1 and the supporting plate 2 in sequence, and one end of the connecting rod 4 far away from the top plate 1 is fixedly connected with a punching block 41. One side of the top plate 1 is in threaded connection with a second abutting rod 11, and the second abutting rod 11 penetrates through the side wall of the top plate 1 and abuts against the connecting rod 4.

An impact disc 42 is arranged between the support plate 2 and the punch block 41, and the connecting rod 4 penetrates through the impact disc 42 to enable the impact disc 42 to vertically slide along the connecting rod 4. A locking assembly 5 is attached to the support plate 2 to lock the support plate 2 to the striking plate 42.

Referring to fig. 1, in operation, the second abutting rod 11 is rotated to separate from the connecting rod 4, then the connecting rod 4 and the punching block 41 are moved in a direction away from the bottom plate 3, the sample is prevented from being placed on the bottom plate 3, the punching block 41 is moved in a direction close to the bottom plate 3, the punching block 41 abuts against the sample, and then the second abutting rod 11 is rotated to abut against the connecting rod 4. The locking assembly 5 is then controlled to drop the impact plate 42 away from the support plate 2 in a direction approaching the punch 41, and the impact plate 42 impacts the punch 41 to subject the sample to the impact force.

When different impact forces are required to impact a sample, the first abutting rod 22 is rotated to be separated from the guide column 21, and then the supporting plate 2 is moved towards or away from the bottom plate 3, and the supporting plate 2 is moved to drive the locking assembly 5 and the impact disc 42 to move towards or away from the bottom plate 3, so that when the impact disc 42 falls down from different heights to impact the impact ram 41, the impact forces given to the impact ram 41 and the sample by the impact disc 42 are different.

When the impact force given to the sample needs to be increased, the support plate 2 is moved in a direction away from the bottom plate 3, and when the impact force given to the sample needs to be decreased, the support plate 2 is moved in a direction closer to the bottom plate 3.

Referring to fig. 2, the locking assembly 5 includes a fixing plate 51 fixedly connected to one side of the support plate 2, a pair of mounting plates 52 fixedly connected to one side of the fixing plate 51 away from the support plate 2, and a rotating rod 53 rotatably connected between the pair of mounting plates 52. The upper surface of the supporting plate 2 is fixedly connected with a fixing block 54, a spring 55 is arranged between the fixing block 54 and the rotating rod 53, two ends of the spring 55 are respectively and fixedly connected with the rotating rod 53 and the fixing block 54, and when the spring 55 is free from external force, the lower end of the rotating rod 53 abuts against the impact disc 42.

One end of the pair of mounting plates 52 far away from the fixed plate 51 is fixedly connected with the same transition plate 56, one side of the rotating rod 53 far away from the support plate 2 is fixedly connected with a connecting rope 57, the connecting rope 57 is located at the lower end of the rotating rod 53, and one end of the connecting rope 57 far away from the rotating rod 53 penetrates through the transition plate 56. When the connecting rope 57 is pulled in a direction away from the support plate 2, the connecting rope 57 drives the lower end of the rotating rod 53 to rotate in a direction away from the impact disc 42 until the rotating rod 53 is separated from the impact disc 42, and the impact disc 42 is descended by the self gravity to impact the impact block 41 (see fig. 1).

Referring to fig. 2, the lower end of the rotating lever 53 is bent toward the impact disk 42 to form a bent portion 531, and the bent portion 531 contacts the lower surface of the impact disk 42 to give a supporting force to the impact disk 42, so that the rotating lever 53 more stably abuts against the impact disk 42.

Referring to fig. 3, the bottom plate 3 is connected with a positioning assembly 6 for positioning the sample, and the positioning assembly 6 enables the sample to be positioned under the punch block 41, so that the punch block 41 descends to abut against the sample, the punch block 41 is easy to align with the sample, and the sample does not need to be moved for many times manually until the punch block 41 abuts against the sample.

Referring to fig. 3, the positioning assembly 6 includes a pair of positioning plates 61, the pair of positioning plates 61 are respectively spaced the same distance from the punch block 41, a guide groove 62 penetrating through the bottom plate 3 is formed in the upper surface of the bottom plate 3, a bidirectional screw 63 is disposed below the bottom plate 3, the lower ends of the pair of positioning plates 61 penetrate through the guide groove 62, the pair of positioning plates 61 are penetrated by the bidirectional screw 63, and the positioning plates 61 are in threaded connection with the bidirectional screw 63. A pair of supporting blocks 64 is fixedly connected to the lower surface of the bottom plate 3, and the pair of supporting blocks 64 are respectively rotatably connected to two ends of the bidirectional screw 63.

When the bidirectional screw 63 is rotated, the bidirectional screw 63 rotates to drive the pair of positioning plates 61 to move towards or away from each other along the guide grooves 62. The sample is placed on the upper surface of the bottom plate 3 and is positioned between the pair of positioning plates 61, the bidirectional screw 63 is rotated to enable the pair of positioning plates 61 to move oppositely to clamp the sample, and the sample is positioned under the punch block 41 when the sample is clamped, so that the sample is pushed by the pair of positioning plates 61 to move to the punch block 41 with high precision, and time and labor are saved.

Referring to fig. 3, the bidirectional screw 63 is connected to a restricting unit 7 for restricting the rotation of the bidirectional screw 63. One end of the bidirectional screw 63 penetrates through the supporting block 64 and is fixedly connected with a rotating disc 65, one surface, far away from the bidirectional screw 63, of the rotating disc 65 is fixedly connected with a holding rod 66, and the holding rod 66 is located at a position, close to the edge, of the rotating disc 65.

The limiting assembly 7 comprises a plurality of inserting holes 71 formed in the arc side face of the rotating disc 65, a through hole 72 penetrating through the bottom plate 3 is formed in the upper surface of the bottom plate 3, a pin rod 73 is inserted into the through hole 72, the lower end of the pin rod 73 extends out of the through hole 72 and is inserted into one of the inserting holes 71, and at the moment, the bidirectional screw 63 is difficult to rotate. When the bidirectional screw 63 needs to be rotated, the pin rod 73 is pulled in a direction away from the rotating disc 65, so that the pin rod 73 is separated from the insertion hole 71, at the moment, the holding rod 66 is rotated, and the rotating disc 65 and the bidirectional screw 63 can be driven to rotate by rotating the holding rod 66.

Referring to fig. 3 and 4, one end of the pin rod 73 near the insertion hole 71 is gradually contracted toward the insertion hole 71, so that the pin rod 73 is more easily aligned with the insertion hole 71, and the pin rod 73 is easily inserted into the insertion hole 71.

The implementation principle of the high-precision low-temperature impact test device in the embodiment of the application is as follows: when the sample clamping device works, a sample is placed on the upper surface of the bottom plate 3 and is positioned between the pair of positioning plates 61, then the pin rod 73 is pulled towards the direction far away from the rotating disc 65 until the pin rod 73 is separated from the inserting hole 71, then the holding rod 66 is rotated, the holding rod 66 rotates to drive the rotating disc 65 and the bidirectional screw 63 to rotate, and the bidirectional screw 63 rotates to drive the pair of positioning plates 61 to move oppositely to clamp the sample;

then, the second abutting rod 11 is rotated to enable the second abutting plate to be separated from the connecting rod 4, then the punching block 41 is moved towards the direction close to the bottom plate 3 to enable the punching block 41 to abut against the sample, and then the second abutting rod 11 is rotated to enable the second abutting rod 11 to abut against the connecting rod 4;

the connecting rope 57 is pulled in the direction away from the supporting plate 2, the connecting rope 57 drives the lower end of the rotating rod 53 to rotate in the direction away from the impact disc 42 until the rotating rod 53 is separated from the impact disc 42, and at the moment, the impact disc 42 is descended by the gravity of the impact disc 42 to impact the impact block 41, so that the test is completed.

The above embodiments are preferred embodiments of the present application, and the protection scope of the present application is not limited by the above embodiments, so: all equivalent changes made according to the structure, shape and principle of the present application shall be covered by the protection scope of the present application.

Claims

1. The utility model provides a high accuracy low temperature impact test device which characterized in that: including bottom plate (3), bottom plate (3) top is equipped with roof (1), be equipped with between roof (1) and bottom plate (3) towards piece (41), towards piece (41) upper surface fixed with connecting rod (4), roof (1) is run through to connecting rod (4) upper end, the side threaded connection of roof (1) has second that runs through roof (1) lateral wall and support tight connecting rod (4) to support tight pole (11), be equipped with on roof (1) and fix a position the sample, make the sample be located towards locating component (6) under piece (41).

2. A high precision low temperature impact test apparatus according to claim 1, wherein: the positioning assembly (6) comprises a pair of positioning plates (61) which are respectively same in distance with the punch block (41), the upper surface of the bottom plate (3) is provided with a guide groove (62) penetrating through the bottom plate (3), a bidirectional screw rod (63) is arranged below the bottom plate (3), and the lower end of each positioning plate (61) respectively penetrates through the guide groove (62) and is in threaded connection with the bidirectional screw rod (63).

3. A high precision low temperature impact test apparatus according to claim 2, wherein: the bidirectional screw (63) is connected with a limiting component (7) for limiting the rotation of the bidirectional screw (63).

4. A high precision low temperature impact test apparatus according to claim 3, wherein: the limiting assembly (7) comprises a rotating disc (65) with one fixed end of a bidirectional screw (63), a plurality of inserting holes (71) are formed in the side face of the rotating disc (65), a through hole (72) is formed in the upper surface of the top plate (1), a pin rod (73) is inserted in the through hole (72), and the lower end of the pin rod (73) extends out of the through hole (72) and is inserted into one of the inserting holes (71).

5. A high precision low temperature impact test apparatus according to claim 1, wherein: a pair of guide posts (21) are fixedly connected between the top plate (1) and the bottom plate (3), a supporting plate (2) is arranged between the top plate (1) and the bottom plate (3), the pair of guide posts (21) penetrate through two ends of the supporting plate (2) respectively, a pair of first abutting rods (22) which penetrate through the side wall of the supporting plate (2) and abut against the pair of guide posts (21) respectively are in threaded connection with the side surface of the supporting plate (2), a connecting rod (4) penetrates through the supporting plate (2) and a punching block (41) and is located below the supporting plate (2), an impact disc (42) is arranged on the lower surface of the supporting plate (2), the connecting rod (4) penetrates through the impact disc (42), and a locking assembly (5) which locks the supporting plate (2) and the impact disc (42).

6. A high accuracy low temperature impact test device according to claim 5, characterized in that: locking Assembly (5) are including a pair of mounting panel (52) of backup pad (2) side fixed, rotate between a pair of mounting panel (52) and be connected with dwang (53), the last fixed surface of backup pad (2) has fixed block (54), a side that fixed block (54) are close to dwang (53) is fixed with spring (55), the one end that fixed block (54) were kept away from in spring (55) is fixed with the upper end of dwang (53), the lower extreme of dwang (53) supports under the effort of spring (55) and tightly strikes dish (42).

7. A high accuracy low temperature impact test device according to claim 6, characterized in that: one end of the rotating rod (53) close to the impact disc (42) is bent to the direction close to the impact disc (42) to form a bent part (531), and the bent part (531) is in contact with the lower surface of the impact disc (42).

8. A high accuracy low temperature impact test device according to claim 4, characterized in that: one end of the pin rod (73) close to the plug hole (71) is gradually contracted towards the direction close to the plug hole (71).