CN212750406U - Test cable for intelligent test equipment of multi-station parallel chip sorting machine - Google Patents
Test cable for intelligent test equipment of multi-station parallel chip sorting machine Download PDFInfo
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- CN212750406U CN212750406U CN202021110123.8U CN202021110123U CN212750406U CN 212750406 U CN212750406 U CN 212750406U CN 202021110123 U CN202021110123 U CN 202021110123U CN 212750406 U CN212750406 U CN 212750406U
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Abstract
The utility model discloses a parallel chip sorter intelligent test cable of multistation, including the cable core of stranded, and the cable core of transposition is provided with first weaving layer outward, the cable core includes the heart yearn of stranded, and is provided with the second weaving layer outward of the heart yearn of transposition, the crowded restrictive coating that is wrapped up outward of second weaving layer, the heart yearn includes the conductor of stranded, the outer cladding of the conductor of transposition has micropore foaming insulating layer, just the colour diverse of every cable core in the first weaving layer. Through set up the cable core of stranded according to the test needs in nylon braided layer, utilize cable core structure size little, distributed capacitance is less than or equal to 80pF/m, flexible resistant buckling, wear-resisting, the good characteristic of oil resistance, solved many signal test cables and difficultly worn nylon braided sleeve pipe, the difficult problem that single signal test cable is difficult to discern, improved production efficiency simultaneously.
Description
Technical Field
The utility model relates to a test cable for intelligent test equipment of multi-station parallel chip sorting machine belongs to cable technical field.
Background
With the rapid development of the automatic intelligent industry in China and the development of intelligent manufacturing as everyday, the chip is the core of various intelligent equipment, and the sorting and testing of the full-automatic chip are particularly important. The utility model provides a test cable for intelligent test equipment of parallel chip sorter of multistation, is different from ordinary signal transmission cable, requires that the cable structure size is little, and distributed capacitance is low to and anti buckling is in order to satisfy the automation line and use. Belongs to a high-technology product with special application.
Common signal transmission cables in China are all insulated by polyethylene and sheathed by polyvinyl chloride. Under the condition of meeting the distributed capacitance of the cable, the structure size is larger. The full-automatic parallel test sorting machine is developed to 16 stations and 32 stations from the initial duplex computer, and even is developed to 64 stations, and each station needs to be connected with a test cable, so that the structure of the existing signal transmission test cable cannot meet the use requirement of equipment.
For a multi-station full-automatic parallel chip sorting machine, particularly a full-automatic multi-station parallel chip sorting machine with more than 8 stations, the cable is required to be circular, the structural size of the cable is small, the distributed capacitance is less than or equal to 80pF/m, and the cable is flexible, bending-resistant, wear-resistant and good in oil resistance. For cables for equipment in developed countries, a single signal test cable penetrates through a nylon sleeve, and the full-automatic parallel chip sorting machine with more than 8 stations is difficult to apply; with the development of the sorting machine, the existing 16-station and 32-station full-automatic parallel chip sorting machine is provided, and the existing inlet cable is difficult to meet the use requirement of equipment.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the technical problem that a test cable for multistation parallel chip sorter intelligent test equipment is provided, through weaving the in situ cable core that sets up the stranded according to the test needs at nylon, it is little to utilize cable core structure size, distributed capacitance is less than or equal to 80pF/m, flexible resistant buckling, it is wear-resisting, the characteristic that oil resistance is good, it is difficult to wear nylon braided sleeve pipe to have solved many signal test cables, single signal test cable is difficult to the difficult problem of discernment, production efficiency has been improved simultaneously.
In order to solve the technical problem, the utility model discloses the technical scheme who adopts is:
the utility model provides a test cable for multistation parallel chip sorter intelligent test equipment, includes the cable core of stranded, and is provided with first weaving layer outside the cable core of transposition, the cable core includes the heart yearn of stranded, and is provided with the second weaving layer outside the heart yearn of transposition, the crowded cladding of second weaving layer has the restrictive coating outward, the heart yearn includes the conductor of stranded, the outer cladding of conductor of transposition has micropore foaming insulating layer, just the colour diverse of every cable core in the first weaving layer.
The testing cable for the intelligent testing device of the multi-station parallel chip sorting machine is characterized in that: and 8 strands, 16 strands or 32 strands of twisted cable cores are arranged in the first woven layer.
The testing cable for the intelligent testing device of the multi-station parallel chip sorting machine is characterized in that: the diameter of a single wire of the conductor is not more than 0.12mm, the thickness of the micropore foaming insulating layer is 0.15mm-0.25mm, the thickness of the sheath layer is 0.25mm-0.35mm, the braided layer is formed by braiding a tinned copper wire conductor, and the outer diameter range of the tinned copper wire conductor is 0.08mm-0.10 mm.
The testing cable for the intelligent testing device of the multi-station parallel chip sorting machine is characterized in that: the material of the microcellular foaming insulating layer is FEP or PFA.
The testing cable for the intelligent testing device of the multi-station parallel chip sorting machine is characterized in that: the core wire comprises 19 strands of glued conductor and the conductor is a tin or silver plated conductor.
The testing cable for the intelligent testing device of the multi-station parallel chip sorting machine is characterized in that: the sheath layer is one of FEP, PFA or PVDF.
The testing cable for the intelligent testing device of the multi-station parallel chip sorting machine is characterized in that: the microporous foamed insulating layer is made of polypropylene, and the sheath layer is made of nylon.
The testing cable for the intelligent testing device of the multi-station parallel chip sorting machine is characterized in that: and the second braided layer is internally provided with three strands of stranded core wires.
The utility model has the advantages that: through twisting the stranded cable core, every cable core colour separation, nylon cover is woven outward to the cable core, and it is little to utilize cable core structure size, and distributed capacitance is less than or equal to 80pF/m, and flexible resistant buckling, wear-resisting, the good characteristic of oil resistance has solved the cable for the full-automatic parallel chip sorter intelligent test equipment more than 8 stations, is difficult to the poling, is difficult to discern, and the big difficult problem of structure size has improved production efficiency, has reduced manufacturing cost.
Drawings
FIG. 1 is a schematic structural view of a testing cable for a multi-station parallel chip sorter intelligent testing apparatus of the present invention;
fig. 2 is the utility model relates to a structure schematic diagram of test cable's cable core for multistation parallel chip sorter intelligent test equipment.
Detailed Description
The invention will be further described with reference to the accompanying drawings.
As shown in fig. 1 and 2, the test cable for the intelligent test device of the multi-station parallel chip sorting machine comprises a multi-stranded cable core 10, a first woven layer 20 is arranged outside the stranded cable core 10, the cable core 10 comprises a multi-stranded core wire, a second woven layer 33 is arranged outside the stranded core wire, a sheath layer 4 is extruded outside the second woven layer 33, the core wire comprises a multi-stranded conductor 1, a microporous foamed insulation layer 2 is coated outside the stranded conductor, and the color of each cable core 10 in the first woven layer 20 is different from that of each other cable core 10.
The cable core adopts many monofilament conductors 1 to carry out the transposition back cladding micropore foaming insulating layer 2 again, has not only guaranteed the bendability of cable, has certain flexibility, adopts micropore foaming insulating layer 2 to make the dielectric constant of cable under with the insulation thickness condition reduce moreover, makes the distributed capacitance value be less than 80pF/m between the conductor of transposition and the weaving layer, solves that the cable external diameter is little then distributed capacitance big, and the distributed capacitance is little then the cable external diameter big, the difficult problem of mutual restriction of contradiction. Then, the first weaving layer 20 is coated after the multi-strand cable cores are twisted according to needs, the color of each cable core is separated, the cable core structure size is small, the distributed capacitance is less than or equal to 80pF/m, and the characteristics of flexibility, bending resistance, wear resistance and good oil resistance are utilized, so that the problems that the cable for intelligent test equipment of a full-automatic parallel chip sorting machine with more than 8 stations is difficult to penetrate a pipe, identify and have large structure size are solved, the production efficiency is improved, and the production cost is reduced.
According to the test requirement, 8 strands, 16 strands or 32 strands of twisted cable cores 10 can be selected to be arranged in the first woven layer 20, and the test of the full-automatic parallel chip sorting machine with 8 stations, 16 stations and 32 stations is met respectively.
The diameter of a single wire of the conductor is not more than 0.12mm, the thickness of the micropore foaming insulating layer 2 is 0.15mm-0.25mm, the thickness of the sheath layer 4 is 0.25mm-0.35mm, the second braid layer 3 is formed by weaving a tinned copper wire conductor, and the outer diameter range of the tinned copper wire conductor is 0.08mm-0.10 mm. Through selecting the diameter of the appropriate monofilament conductor 1, the thickness of the micropore foaming insulating layer 2, the second weaving layer 3 and the sheath layer 4, the overall miniaturization design of the cable is realized, and the outer diameter of the low-capacitance test cable for the intelligent equipment is less than or equal to 3.2 mm.
When the stranded core wires are stranded by adopting conductors with the number of 1+6 x N, such as 7 strands, 13 strands, 19 strands, 25 strands and the like, the rounding degree is higher, wherein N is a natural number. In this embodiment, the core wire comprises 19 glued conductors 1, and the conductors are tinned or silvered conductors, which not only meet the requirements of cable roundness, but also meet the requirements of testing the cable in terms of performance. In this embodiment, three strands of twisted core wires are arranged in the braid layer 3, so that the roundness of the cable is ensured as much as possible on the premise of meeting the performance requirement of the cable.
The material of microcellular foamed insulating layer 2 is FEP or PFA, because FEP or PFA special insulating properties, can guarantee that microcellular foamed insulating layer 2's insulating nature is better, can effectively control the distribution capacitance value between conductor and the weaving layer.
The sheath layer 4 is one of FEP, PFA or PVDF, and a thin layer extrusion process is adopted, so that the cable has better wear resistance and oil resistance.
In order to reduce the cost, the microcellular foamed insulating layer 2 can also be polypropylene, and the sheath layer is made of nylon, so that the overall cost of the cable can be reduced by 20-30%, and the performance of the cable can basically meet the requirement of testing the cable.
To sum up, the utility model provides a pair of parallel chip sorter of multistation test cable for intelligent test equipment through weaving the in situ at nylon and set up the cable core of stranded transposition according to the test needs, utilizes cable core structure size little, and distributed capacitance is less than or equal to 80pF/m, and flexible resistant buckling is wear-resisting, the characteristic that oil resistance is good, has solved many signal test cable and has been difficult to wear nylon and weave the sleeve pipe, and single signal test cable is difficult to the difficult problem of discernment, has improved production efficiency simultaneously.
The foregoing illustrates and describes the principles, general features, and advantages of the present invention. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the foregoing embodiments and descriptions are provided only to illustrate the principles of the present invention without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (8)
1. The utility model provides a test cable for intelligent test equipment of parallel chip sorter of multistation which characterized in that: including cable core (10) of stranded, and the cable core (10) of stranded is provided with first weaving layer (20) outward, cable core (10) include the heart yearn of stranded, and the heart yearn of stranded is provided with second weaving layer (3) outward, second weaving layer (3) are crowded package outward and are had restrictive coating (4), the heart yearn includes conductor (1) of stranded, the outer cladding of conductor of stranded has micropore foaming insulating layer (2), just the colour diverse of every cable core (10) in first weaving layer (20).
2. The test cable for the intelligent test equipment of the multi-station parallel chip sorting machine according to claim 1, wherein: and the first braided layer (20) is internally provided with 8 strands, 16 strands or 32 strands of twisted cable cores (10).
3. The test cable for the intelligent test equipment of the multi-station parallel chip sorting machine according to claim 1, wherein: the diameter of a single wire of the conductor is not more than 0.12mm, the thickness of the micropore foaming insulating layer (2) is 0.15mm-0.25mm, the thickness of the sheath layer (4) is 0.25mm-0.35mm, the braided layer (3) is formed by braiding a tinned copper wire conductor, and the outer diameter range of the tinned copper wire conductor is 0.08mm-0.10 mm.
4. The test cable for the intelligent test equipment of the multi-station parallel chip sorting machine according to claim 1, wherein: the material of the microcellular foaming insulating layer (2) is FEP or PFA.
5. The test cable for the intelligent test equipment of the multi-station parallel chip sorting machine according to claim 1, wherein: the core comprises 19 strands of glued conductor (1) and the conductor is a tin or silver plated conductor.
6. The test cable for the intelligent test equipment of the multi-station parallel chip sorting machine according to claim 1, wherein: the sheath layer (4) is one of FEP, PFA or PVDF.
7. The test cable for the intelligent test equipment of the multi-station parallel chip sorting machine according to claim 1, wherein: the microporous foamed insulating layer (2) is made of polypropylene, and the sheath layer (4) is made of nylon.
8. The test cable for the intelligent test equipment of the multi-station parallel chip sorting machine according to claim 1, wherein: and three stranded core wires are arranged in the second braided layer (3).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202021110123.8U CN212750406U (en) | 2020-06-16 | 2020-06-16 | Test cable for intelligent test equipment of multi-station parallel chip sorting machine |
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CN202021110123.8U CN212750406U (en) | 2020-06-16 | 2020-06-16 | Test cable for intelligent test equipment of multi-station parallel chip sorting machine |
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CN212750406U true CN212750406U (en) | 2021-03-19 |
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CN202021110123.8U Active CN212750406U (en) | 2020-06-16 | 2020-06-16 | Test cable for intelligent test equipment of multi-station parallel chip sorting machine |
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2020
- 2020-06-16 CN CN202021110123.8U patent/CN212750406U/en active Active
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