CN212624030U - Novel PCIE signal consistency test tool - Google Patents

Novel PCIE signal consistency test tool Download PDF

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Publication number
CN212624030U
CN212624030U CN202021704170.5U CN202021704170U CN212624030U CN 212624030 U CN212624030 U CN 212624030U CN 202021704170 U CN202021704170 U CN 202021704170U CN 212624030 U CN212624030 U CN 212624030U
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outer ring
knob
guide head
pad
pcb
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CN202021704170.5U
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Chinese (zh)
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韦江涛
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Suzhou Inspur Intelligent Technology Co Ltd
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Suzhou Inspur Intelligent Technology Co Ltd
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Abstract

The utility model relates to a novel PCIE signal consistency test tool, including PCB board and golden finger, be connected with Rx outer loop and Tx outer loop on the PCB board, still be connected with Rx terminal and Tx terminal on the PCB board, Rx terminal and Tx terminal are connected with Rx outer loop, Tx outer loop electricity respectively; an Rx bonding pad and a Tx bonding pad are connected to the PCB board, and the Rx bonding pad and the Tx bonding pad are both electrically connected with the golden finger; a knob is rotatably connected above the Rx outer ring, the bottom surface of the knob is respectively connected with an Rx outer ring guide head and a Tx outer ring guide head, and the Rx outer ring guide head and the Tx outer ring guide head are respectively connected with the Tx outer ring and the Rx outer ring in a contact manner; the bottom surface of the knob is also connected with an Rx pad guide head and a Tx pad guide head, and the Rx pad guide head and the Tx pad guide head are respectively and electrically connected with an Rx outer ring guide head and an outer ring guide head. This instrument just can realize the test of the Data signal of each lane of PCIE, convenient to use through the rotation knob.

Description

Novel PCIE signal consistency test tool
Technical Field
The utility model relates to a PCIE equipment test field specifically is a novel PCIE signal uniformity testing tool.
Background
PCIE is a high-speed serial computer developed bus standard proposed by Intel, can realize point-to-point double-channel high-speed high-bandwidth data transmission, and has the advantages of high data transmission rate, strong anti-interference capability, long transmission distance, low power consumption and the like. One PCIE connection may be configured to a data bandwidth of x1, x2, x4, x8, x12, x 16. The PCIE link consists of bidirectional unidirectional differential links, the Lane consists of two differential signal pairs, one pair for receiving data Rx and the other pair for transmitting Tx, implemented as a transmit pair and a receive pair, and embeds a data Clock using an encoding scheme to achieve very high data rates. Until now, the PCIE has developed a transmission rate of 4.0 as high as 16Gb/s, and the signal consistency test of the PCIE becomes particularly important to ensure that no error occurs in the transmission and reception of high-speed transmission data.
At present, a main method for testing the consistency of transmission signals of PCIE is generally shown in fig. 1, where a CLB fixture is inserted into a PCIE signal slot of a motherboard to be tested, Clock and Data of link signals are introduced into an oscilloscope, and are analyzed by software, so as to finally obtain a signal quality eye diagram at a link terminal, i.e., at the PCIE slot.
Because the signal of each Lane needs to be verified in the PCIE test, Tx and Rx lanes need to be frequently switched, that is, the connection between the Data connection line and different connection holes on the CLB fixture is switched, which easily causes damage to the Data connection line (SMP cable) and the connection holes, and the connection between the connection holes and the SMP cable is a loose embedded structure and easily falls off during the test process.
Disclosure of Invention
For overcoming the above-mentioned problem that exists among the prior art, the utility model provides a novel PCIE signal uniformity testing tool only just can realize the test of the Data signal of each Lane of PCIE through rotatory knob, need not switch Tx and Rx Lane through frequently plugging SMP cable connector again, and it is more convenient to use.
The utility model discloses a realize through following technical scheme:
a novel PCIE signal consistency test tool comprises a PCB and a golden finger connected to the lower end of the PCB, wherein a plurality of Rx lane conductive contact blades and Tx lane conductive contact blades are arranged on the golden finger, an annular Rx outer ring and an annular Tx outer ring are respectively connected to the PCB, the Rx outer ring and the Tx outer ring are coaxially arranged, an Rx wiring terminal and a Tx wiring terminal are further connected to the PCB, the Rx wiring terminal is electrically connected with the Rx outer ring, and the Tx wiring terminal is electrically connected with the Tx outer ring; the PCB is connected with a plurality of Rx pads which are distributed along the axis of an Rx outer ring or a Tx outer ring in an equal radius mode, and the Rx pads are electrically connected with Rx lane conductive contact blades of golden fingers; the PCB is connected with a plurality of Tx bonding pads which are distributed along the axis of an Rx outer ring or a Tx outer ring in an equal radius mode, the number of the Tx bonding pads is the same as that of the Rx bonding pads, and the Tx bonding pads are electrically connected with Tx lane conductive contact pieces of golden fingers; the axis position of the Rx outer ring is rotatably connected with a knob, the bottom surface of the knob is respectively connected with an Rx outer ring guide head and a Tx outer ring guide head, the Rx outer ring guide head is in contact connection with the Rx outer ring, and the Tx outer ring guide head is in contact connection with the Tx outer ring; the bottom surface of the knob is also respectively connected with an Rx pad guide head and a Tx pad guide head, the Rx pad guide head is electrically connected with an Rx outer ring guide head, the Tx pad guide head is electrically connected with a Tx outer ring guide head, and the Rx pad guide head and the Rx pad, and the Tx pad guide head and the Tx pad can be respectively contacted and conducted by rotating the knob; the PCB is further connected with a Clock wiring terminal, and the Clock wiring terminal is electrically connected with the golden finger.
Preferably, the golden finger and the Rx bonding pad and the golden finger and the Tx bonding pad are connected through inner-layer wiring of the PCB.
Preferably, the Rx terminal and the Rx outer ring, and the Tx terminal and the Tx outer ring are connected through PCB inner layer routing.
Preferably, the Tx pads and Rx pads are each equiangularly distributed along the axis of the Rx outer ring.
Preferably, a coaxial number disc is arranged outside the Rx outer ring.
Preferably, the knob comprises a knob body and a knob column fixed at the lower end of the knob body, the knob column is coaxial with the axis of the Rx outer ring, and the knob column penetrates through the PCB and forms a rotatable connection with the PCB.
Preferably, the outer side of the knob column is connected with a knob pressing block, the lower end of the knob column is provided with an external thread, and the lower end of the knob column is connected with a nut.
Preferably, the material of the knob pressing block is rubber.
Preferably, the outer end of the knob body is provided with an indicating head.
Preferably, the material of the knob body is plastic.
The utility model has the advantages that:
1. only through the rotary knob, let pad lead head and pad contact, just can realize the test of the Data signal of every Lane of PCIE, need not switch Tx and Rx Lane through frequently plugging and unplugging SMP cable connection head again, it is more convenient to use.
2. The golden finger and the Rx pad, the golden finger and the Tx pad, the Rx wiring terminal and the Rx outer ring and the Tx wiring terminal and the Tx outer ring are connected through the PCB inner layer wiring, the wiring space is larger, and the structure capable of bypassing the PCB surface layer is connected with the pad.
3. The outer side of the Rx outer ring is provided with a coaxial digital disc, the number on the digital disc corresponds to each path of the Tx and Rx bonding pad, so that the sending of each lane of the PCIE and the recording of the quality of the received Data signal are more convenient, and a certain error-proof and leak-proof effect is achieved.
4. The knob pressing block is connected to the outer side of the knob column, the nut is connected to the lower end of the knob column, the knob can be fixed at a certain angle by screwing the nut, Data signals of the lane corresponding to the angle can be conveniently output, when another lane needs to be switched, only the locknut is needed, and then the angle corresponding to the other lane is adjusted.
5. The material of knob briquetting is rubber, damages PCB when avoiding screwing up the nut.
6. The outer end of knob body is equipped with the indicator head, when the indicator head aligns certain digit on the digital dish, Rx pad leads head, Tx pad and Tx pad with Rx pad and leads the head homoenergetic and accurately aligns, avoids aligning the inaccurate unable conduction test that leads to of angle.
7. The material of the knob body is plastics, avoids carrying the electricity to influence the test result on the operating personnel when operating personnel rotates the knob.
Drawings
The present invention will be further described with reference to the accompanying drawings.
Fig. 1 is a schematic diagram of a scheme for performing a PCIE signal consistency test by using a CLB fixture in the prior art.
Fig. 2 is a schematic view of the structure of the present invention.
Fig. 3 is a schematic view of a three-dimensional structure of the present invention.
Fig. 4 is a schematic perspective view of the present invention.
Fig. 5 is a schematic view of the structure of the middle knob according to the present invention.
Fig. 6 is a schematic perspective view of the middle knob according to the present invention.
In the figure, 1-golden finger, 10-main board, 11-CLB jig, 12-Data connecting line, 13-Clock connecting line, 14-oscilloscope, 15-PCIE slot, 2-PCB board, 3-knob, 31-knob body, 32-rotating column, 321-knob pressing block, 322-nut, 33-Rx outer ring guide head, 34-Rx pad guide head, 35-Tx outer ring guide head, 36-Tx pad guide head, 37-indicating head, 4-Rx outer ring, 41-Rx pad, 5-Tx outer ring, 51-Tx pad, 6-Clock binding post, 61-Rx binding post, 62-Tx binding post and 7-digital disk.
Detailed Description
In order to make the technical solution of the present invention better understood by those skilled in the art, the technical solution of the present invention will be further described with reference to the accompanying drawings.
As shown in fig. 1, in the prior art, a CLB fixture 11 is inserted into a PCIE slot 15 of a motherboard 10 to be tested, a signal of a link is led into an oscilloscope 14 through a Clock connection line 13 and a Data connection line 12, and is analyzed by software, so as to obtain a signal quality eye diagram at a link terminal of the link, that is, at the PCIE slot. In order to reduce the number of times of inserting and pulling the Data connecting line 12 on the CLB jig 11, refer to fig. 2 to 5, the utility model relates to a novel PCIE signal consistency test tool adopts rotatory knob to replace the plug.
The utility model relates to a novel PCIE signal uniformity testing tool, including PCB board 2 and the golden finger 1 of connection at PCB board 2 lower extreme, during golden finger 1 inserted mainboard 10's PCIE slot 15, the utility model discloses the PCIE with X16 was equipped with on the golden finger 1 and corresponds 16 pairs of Rx lane conductive contact piece and Tx lane conductive contact piece that send data end Tx lane and 16 pairs of receipt data end Rx lane, distributed respectively at the positive and negative of golden finger for the embodiment. Be connected with annular Rx outer loop 4 and Tx outer loop 5 on the PCB board 2 respectively, Rx outer loop 4 and Tx outer loop 5 coaxial arrangement, still be connected with Rx terminal 61 and Tx terminal 62 on the PCB board 2, Rx terminal 61 is connected with Rx outer loop 4 electricity, Tx terminal 62 is connected with Tx outer loop 5 electricity, specific connected mode is Rx terminal 61 and Rx outer loop 4, Tx terminal 62 all walks the line through the PCB inlayer with Tx outer loop 5 and is connected, wiring space is bigger, can bypass the structure on PCB top layer and be connected with the pad.
The PCB board 2 is connected with a plurality of Rx pads 41 and Tx pads 51 which are distributed along the axis of the Rx outer ring 4 or the Tx outer ring 5 in equal radius, the Rx pads 41 are electrically connected with Rx lane conductive contact pieces of the golden finger 1, the Tx pads 51 are electrically connected with Tx lane conductive contact pieces of the golden finger 1, and the specific connection mode is also PCB inner layer wiring connection; in this embodiment, the number of the Tx pads 51 is 16 as many as the number of the Rx pads 41, and the Tx pads 51 and the Rx pads 41 corresponding to the reference numerals are on the same angular line. On the PCB 2 are an RX outer ring 4, a Tx pad 51, a Tx outer ring 5, and an RX pad 41 in this order from the outside inward.
The axis position of the Rx outer ring 4 is rotatably connected with a knob 3, the bottom surface of the knob 3 is respectively connected with an Rx outer ring guide 33 and a Tx outer ring guide 35, the Rx outer ring guide 33 is in contact connection with the Rx outer ring 4, the Tx outer ring guide 35 is in contact connection with the Tx outer ring 5, and when the knob 3 is rotated, the Rx outer ring guide 33 and the Tx outer ring guide 35 are always in sliding contact with the Rx outer ring 4 and the Tx outer ring 5.
The bottom surface of the knob 3 is further connected with an Rx pad lead 34 and a Tx pad lead 36 respectively, the Rx pad lead 34 is electrically connected with the Rx outer ring lead 33, and the Tx pad lead 36 is electrically connected with the Tx outer ring lead 35, specifically, connected through a metal connecting sheet. The Rx pad guide head 34 and the Rx pad 41, and the Tx pad guide head 36 and the Tx pad 51 are respectively driven by the rotating knob 3 to be aligned, contacted and conducted, so that Rx lane passes through the Rx pad 41, the Rx pad guide head 34, the Rx outer ring guide head 33 and the Rx outer ring 4 from a golden finger in sequence to reach the Rx binding post 61, and is connected to the oscilloscope 14 through the Data connecting wire 12; also, Txlane from the golden finger passes successively through Tx pad 51, Tx pad lead 36, Tx outer ring lead 35, and Tx outer ring 5 to Tx post 62, and is connected to oscilloscope 14 through Data connection line 12. In the embodiment, the number of the bonding pads is 16, and signal testing of lane0-lane15 of Tx and Rx can be realized through rotation.
The coaxial digital disk 7 is arranged on the outer side of the Rx outer ring 4 and corresponds to Lane0-Lane15 of Tx and Rx, so that the sending of each Lane of PCIE and the recording of the quality of received Data signals are facilitated, and meanwhile, a certain error-proof and leak-proof effect is achieved. If the head 37 is pointed at 4 as indicated in FIG. 2, then tests of lane4 for Tx and Rx are represented.
The knob 3 comprises a knob body 31 and a knob column 32 fixed at the lower end of the knob body 31, the knob body 31 is made of insulating materials, specifically plastics, the knob column 32 is coaxial with the axis of the Rx outer ring 4, the knob column 32 penetrates through the PCB 2 and is rotatably connected with the PCB 2, and when the knob 3 is rotated, the knob rotates by taking the axis of the knob column 32 as the center. When each lane is tested, the knob 3 can easily rotate under the action of gravity in the test process, so that the pad guide head is separated from the pad, and accurate test data cannot be obtained.
In order to accurately indicate the indication head 37 at the outer end of the knob body 31 to the mark of the lane to be tested when each lane is tested, the knob 3 needs to be capable of rotating and fixing. Therefore, the outer side of the knob column 32 is connected with the knob pressing block 321, the lower end of the knob column 32 is provided with an external thread, and the lower end of the knob column 32 is connected with the nut 322. When the angle of the knob 3 needs to be adjusted, the locknut 322 is rotated to the Lane needing to be tested, when the indicating head 37 points to a certain mark of the digital disc 7, the Rx pad 41 of the mark is automatically contacted and conducted with the Rx pad guide head 34, the Tx pad 51 and the Tx pad guide head 36, the mark is connected to the oscilloscope 14 through a cable, a Data signal of Lane under the mark is output, then the nut 322 is screwed, the lower end of the knob pressing block 321 made of rubber is pressed on the PCB board 2, and the knob 3 can be fixed at the angle.
The PCB board 2 is also connected with a Clock terminal 6, the Clock terminal 6 is electrically connected with the golden finger 1, and specifically is connected through an inner layer of the PCB.
In the description of the present invention, the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "vertical", "horizontal", and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of describing the present invention, but do not require the present invention to be constructed or operated in a specific orientation, and therefore, cannot be construed as limiting the present invention. The terms "connected" and "connected" in the present invention are to be understood in a broad sense, and may be connected or detachably connected, for example; the terms may be directly connected or indirectly connected through intermediate components, and specific meanings of the terms may be understood as specific conditions by those skilled in the art.
The foregoing is a preferred embodiment of the present invention, and the description of the specific embodiments is only for better understanding of the idea of the present invention. To those skilled in the art, many modifications and equivalents may be made in accordance with the principles of the present invention and are deemed to fall within the scope of the invention.

Claims (10)

1. The utility model provides a novel PCIE signal consistency test instrument, includes PCB board (2) and connects golden finger (1) at PCB board (2) lower extreme, is equipped with a plurality of Rxlane conductive contact and Txlane conductive contact on golden finger (1), its characterized in that: the PCB (2) is respectively connected with an annular Rx outer ring (4) and an annular Tx outer ring (5), the Rx outer ring (4) and the Tx outer ring (5) are coaxially arranged, the PCB (2) is also connected with an Rx wiring terminal (61) and a Tx wiring terminal (62), the Rx wiring terminal (61) is electrically connected with the Rx outer ring (4), and the Tx wiring terminal (62) is electrically connected with the Tx outer ring (5); the PCB (2) is connected with a plurality of Rx pads (41) which are distributed along the axis of the Rx outer ring (4) or the Tx outer ring (5) in an equal radius mode, and the Rx pads (41) are electrically connected with Rx lane conductive contact pieces of the golden fingers (1); the PCB (2) is connected with a plurality of Tx bonding pads (51) which are distributed along the axis of the Rx outer ring (4) or the Tx outer ring (5) in an equal radius mode, the number of the Tx bonding pads (51) is the same as that of the Rx bonding pads (41), and the Tx bonding pads (51) are electrically connected with Tx lane conductive contact pieces of the golden finger (1); the axis position of the Rx outer ring (4) is rotatably connected with a knob (3), the bottom surface of the knob (3) is respectively connected with an Rx outer ring guide head (33) and a Tx outer ring guide head (35), the Rx outer ring guide head (33) is in contact connection with the Rx outer ring (4), and the Tx outer ring guide head (35) is in contact connection with the Tx outer ring (5); the bottom surface of the knob (3) is also respectively connected with an Rx pad guide head (34) and a Tx pad guide head (36), the Rx pad guide head (34) is electrically connected with an Rx outer ring guide head (33), the Tx pad guide head (36) is electrically connected with a Tx outer ring guide head (35), and the Rx pad guide head (34) can be respectively in contact conduction with an Rx pad (41) and the Tx pad guide head (36) and a Tx pad (51) by rotating the knob (3); the PCB board (2) is further connected with a Clock wiring terminal (6), and the Clock wiring terminal (6) is electrically connected with the golden finger (1).
2. The novel PCIE signal consistency test tool of claim 1, wherein: the golden finger (1) and the Rx bonding pad (41) and the golden finger (1) and the Tx bonding pad (51) are connected through inner-layer wiring of the PCB.
3. The novel PCIE signal consistency test tool of claim 2, wherein: the Rx terminal (61) and the Rx outer ring (4) as well as the Tx terminal (62) and the Tx outer ring (5) are connected through PCB inner layer wiring.
4. The novel PCIE signal consistency test tool of claim 3, wherein: the Tx pads (51) and the Rx pads (41) are both equiangularly distributed along the axis of the Rx outer ring (4).
5. The novel PCIE signal consistency test tool of claim 4, wherein: and a coaxial digital disc (7) is arranged on the outer side of the Rx outer ring (4).
6. The novel PCIE signal consistency test tool of claim 5, wherein: the knob (3) comprises a knob body (31) and a knob column (32) fixed to the lower end of the knob body (31), the knob column (32) is coaxial with the axis of the Rx outer ring (4), and the knob column (32) penetrates through the PCB (2) and is rotatably connected with the PCB (2).
7. The novel PCIE signal consistency test tool of claim 6, wherein: the outer side of the knob column (32) is connected with a knob pressing block (321), the lower end of the knob column (32) is provided with an external thread, and the lower end of the knob column (32) is connected with a nut (322).
8. The novel PCIE signal consistency test tool of claim 7, wherein: the knob pressing block (321) is made of rubber.
9. The novel PCIE signal consistency test tool of claim 8, wherein: an indicating head (37) is arranged at the outer end of the knob body (31).
10. The novel PCIE signal consistency test tool of claim 9, wherein: the knob body (31) is made of plastic.
CN202021704170.5U 2020-08-14 2020-08-14 Novel PCIE signal consistency test tool Active CN212624030U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202021704170.5U CN212624030U (en) 2020-08-14 2020-08-14 Novel PCIE signal consistency test tool

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202021704170.5U CN212624030U (en) 2020-08-14 2020-08-14 Novel PCIE signal consistency test tool

Publications (1)

Publication Number Publication Date
CN212624030U true CN212624030U (en) 2021-02-26

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Application Number Title Priority Date Filing Date
CN202021704170.5U Active CN212624030U (en) 2020-08-14 2020-08-14 Novel PCIE signal consistency test tool

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CN (1) CN212624030U (en)

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