CN212622721U

CN212622721U - Test head and differential probe

Info

Publication number: CN212622721U
Application number: CN202020382042.7U
Authority: CN
Inventors: 梅阳阳
Original assignee: Shanghai Wentai Information Technology Co Ltd
Current assignee: Shanghai Wentai Information Technology Co Ltd
Priority date: 2020-03-24
Filing date: 2020-03-24
Publication date: 2021-02-26
Anticipated expiration: 2030-03-24

Abstract

The utility model provides a test head, which comprises a sucker, a conductive coating coated on the inner wall of the sucker and a lead fixedly connected to the sucker and electrically connected with the conductive coating; the sucker is used for being attached to the element to be tested, and the conductive coating is connected to the test point in an abutting mode. The utility model provides a test head, easy operation, test are stable and safe and reliable. The utility model provides a differential probe, including two the test head, with fixed input is connected to two test head plugs and input fixed connection's input.

Description

Test head and differential probe

[ technical field ] A method for producing a semiconductor device

The utility model relates to a test technical field especially relates to a test head and difference probe.

[ background of the invention ]

When an oscilloscope is used in a laboratory to measure signals, the signal capturing time length is sometimes required. Long-time signal grabbing (such as one hour), the mode of using the hand probe to measure is not very suitable at this moment, and not only the operating personnel is tired easily, keeps an action for a long time and avoids the laxity and causes inaccurate measurement. The front end of a probe in the prior art is usually tested in a clamp clamping or electric welding mode, and other interference is introduced into a wire connected with a clamp in the clamp clamping mode to influence signal quality, such as signal rising and falling edges, overshoot and the like; the electric welding operation is complicated and the circuit board is easily damaged by the heating of the soldering iron.

Accordingly, there is a need for a new test head and differential probe head that overcomes the above-mentioned deficiencies.

[ Utility model ] content

The utility model aims at providing an easy operation, stable and safe and reliable's of test head and difference probe.

In order to achieve the above object, the present invention provides a test head, which comprises a suction cup, a conductive coating coated on an inner wall of the suction cup, and a wire fixedly connected to the suction cup and electrically connected to the conductive coating; the sucking disc adsorbs on the component to be measured and the conducting coating butt connects in the test point.

In a preferred embodiment, the suction cup is a non-conductive plastic suction cup.

In a preferred embodiment, the conductive coating is a graphene coating.

In a preferred embodiment, a plug is fixedly connected to one end of the lead wire, which is far away from the suction cup.

This the utility model provides a differential probe, including two as in any one above embodiment the test head, with two test head plugs connect fixed input and input fixed connection's output.

In a preferred embodiment, the input terminal includes a positive interface and a negative interface, the test head connected to the positive interface is used for connecting an electrical signal of a test point, and the test head connected to the negative interface is used for connecting a reference ground.

In a preferred embodiment, one end of the output end, which is far away from the input end, is connected with an oscilloscope in a plugging and unplugging manner.

The utility model provides a test head and a differential probe, which are adsorbed on a component to be tested through the sucking disc to realize the fixation with the component to be tested; the inner wall of the sucker is coated with the conductive coating, so that the lead can be electrically connected with the point to be measured through the lead coating. The utility model provides a test head, easy operation, test are stable and safe and reliable.

[ description of the drawings ]

Fig. 1 is a schematic view of a test probe provided by the present invention.

Fig. 2 is a schematic diagram of a differential probe provided by the present invention.

[ detailed description ] embodiments

In order to make the objects, technical solutions and advantageous technical effects of the present invention more clearly understood, the present invention is further described in detail with reference to the accompanying drawings and the following detailed description. It should be understood that the detailed description and specific examples, while indicating the present invention, are given by way of illustration only and not by way of limitation.

Referring to fig. 1, the present invention provides a test head 100, which includes a suction cup 10, a conductive coating 20 coated on an inner wall of the suction cup 10, and a wire 30 fixedly connected to the suction cup 10 and electrically connected to the conductive coating 20. The suction cup 10 is used for being adsorbed on a component to be tested, and the conductive coating 20 is connected to the test point in an abutting mode. The sucking disc 10 is adsorbed on the element to be measured, on one hand, the sucking disc is firmly fixed with the element to be measured under the condition of not damaging the element to be measured, and on the other hand, the sucking disc is convenient to be quickly detached from the element to be measured; the conductive coating 20 is connected in abutment with the test points, ensuring that the conductive coating 20 is electrically connected to the test points.

In this embodiment, the suction cup 10 is a non-conductive plastic suction cup, which is used to isolate the interference of the wire 20 to the point to be measured, and is convenient for adsorption and fixation.

The conductive coating 20 is a graphene coating. The graphene is light and thin, high in strength and high in conductivity, and the conductive coating 20 is made of graphene, so that the test head 100 is thin in thickness, light in weight and sensitive in test.

The end of the wire 30 far from the suction cup 10 is fixedly connected with a plug 31 for facilitating the plug connection of the desired differential probe.

The utility model provides a test head 100, which is adsorbed on the element to be tested through a sucker 10 to realize the fixation with the element to be tested; the conductive coating 20 is coated on the inner wall of the sucker 10, so that the lead 30 can be electrically connected with a point to be measured through the lead coating 20. The utility model provides a test head, easy operation, test are stable and safe and reliable.

Referring to fig. 2, the present invention further provides a differential probe 200, which includes two test heads 100, an input end 201 connected to the two test heads 100 by plugging, and an output end 202 fixedly connected to the input end 201.

The input terminal 201 includes a positive interface 2011 and a negative interface 2012, the test head 100 connected to the positive interface 2011 is used for connecting an electrical signal of the test point, and the test head 100 connected to the negative interface 2012 is used for connecting to a reference ground. In this embodiment, the positive electrode 2011 and the negative electrode 2012 are USB female terminals, and the plug 31 in the test head 100 is a USB male terminal plug, which facilitates replacement and maintenance of the test head 100.

The end of the output end 202 far away from the input end 201 is connected with an oscilloscope in a plugging and unplugging manner and is used for outputting signals to the oscilloscope.

The invention is not limited solely to that described in the specification and the embodiments, and additional advantages and modifications will readily occur to those skilled in the art, and it is not intended to be limited to the specific details, representative apparatus, and illustrative examples shown and described herein, without departing from the spirit and scope of the general concept as defined by the appended claims and their equivalents.

Claims

1. A test head, characterized by: the conductive coating is coated on the inner wall of the sucker, and a wire is fixedly connected to the sucker and electrically connected with the conductive coating; the sucking disc is used for adsorbing on the component to be measured and the conductive coating butt is connected in the test point.

2. The test head of claim 1, wherein: the sucking disc is the plastic sucking disc that does not electrically conduct.

3. The test head of claim 1, wherein: the conductive coating is a graphene coating.

4. The test head of claim 1, wherein: one end of the wire, which is far away from the sucker, is fixedly connected with a plug.

5. A differential probe, characterized by: the test head comprises two test heads according to any one of claims 1 to 4, an input end fixedly connected with the two test heads in a plugging and unplugging manner, and an output end fixedly connected with the input end.

6. The differential probe of claim 5, wherein: the input end comprises an anode interface and a cathode interface, the test head connected with the anode interface is used for connecting an electric signal of the test point, and the test head connected with the cathode interface is used for connecting a reference ground.

7. The differential probe of claim 5, wherein: and one end of the output end, which is far away from the input end, is connected with the oscilloscope in a plugging and unplugging manner.