CN212275891U - Chip open/short circuit testing device - Google Patents
Chip open/short circuit testing device Download PDFInfo
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- CN212275891U CN212275891U CN202020748108.XU CN202020748108U CN212275891U CN 212275891 U CN212275891 U CN 212275891U CN 202020748108 U CN202020748108 U CN 202020748108U CN 212275891 U CN212275891 U CN 212275891U
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Abstract
The utility model provides a chip opens short circuit testing arrangement. The device comprises: the switch switching module (1) is connected to N pins to be tested of the chip (6), and N is an integer greater than 1; the control module (2) is connected to the switch switching module (1), and the switch switching module (1) is controlled to be sequentially connected with the N pins to be tested; and the constant current source module (3) is connected to the switch switching module (1) and provides test current for the pin to be tested which is connected with the switch switching module (1). The pins to be tested of the chip are sequentially connected through the switch switching module to carry out open-short circuit test, so that the test flexibility is improved, the open-short circuit test of all the pins can be automatically realized, and the manual operation cost is reduced.
Description
Technical Field
The utility model relates to a chip test technical field specifically, designs a chip open short circuit testing arrangement.
Background
In the field of chip testing, open short circuit testing is an essential test item. The open short test is used to detect whether a short or open circuit occurs between each pin of the chip and other pins, power supply, or ground. Generally, each pin of a chip is connected to a power supply VDD through a pull-up diode, connected to a ground VSS through a pull-down diode, and an open-short circuit test of the pin of the chip is realized by testing the pull-up diode and the pull-down diode. In the related art, the test equipment can only manually move the chip to test other pins after testing one pin, and the test flow is complicated. Therefore, how to automatically realize the open-short circuit test of all pins of the chip is a concern of researchers at present.
Disclosure of Invention
In view of the above problem, the utility model provides a chip opens short circuit testing arrangement is provided, utilizes the switch to switch over the module and puts through the pin that awaits measuring of chip in proper order in order to open the short circuit test, has improved the test flexibility to can realize the short circuit test of opening of all pins automatically, reduce the manual operation cost.
The utility model provides a chip open short circuit testing arrangement, the device includes: the switch switching module 1 is connected to N pins to be tested of the chip, and N is an integer greater than 1; the control module 2 is connected to the switch switching module 1 and controls the switch switching module 1 to sequentially switch on the N pins to be tested; and the constant current source module 3 is connected to the switch switching module 1 and provides test current for the pin to be tested which is switched on by the switch switching module 1.
Optionally, the switch switching module 1 includes a first switching module 11 and a second switching module 12, the control module 2 controls the first switching module 11 to sequentially switch on the pull-up diodes connected to the N pins to be tested, and the control module 2 controls the second switching module 12 to sequentially switch on the pull-down diodes connected to the N pins to be tested.
Optionally, the first switching module 11 is provided with a first reference circuit 11A, and the first reference circuit 11A provides a reference voltage for an open-short test of the pull-up diode; and/or the second switching module 12 is provided with a second reference circuit 12A, and the second reference circuit 12A provides a reference voltage for an open-short test of the pull-down diode.
Optionally, three pins of the first switching module 11 are respectively disconnected, grounded, and connected to an anode of a diode D1, and a cathode of the diode D1 is grounded to form the first reference circuit 11A; the three pins of the second switching module 12 are disconnected, grounded, and connected to the cathode of the diode D2, and the anode of the diode D2 is grounded, respectively, to form the second reference circuit 12A.
Optionally, the switch switching module 1 is provided with a third reference circuit 13, and the third reference circuit 13 provides a reference voltage for an open-short test of a pull-up diode and a pull-down diode connected to the N pins to be tested.
Optionally, the four pins of the switching module 1 are respectively disconnected, grounded, connected to the cathode of the diode D3, and connected to the anode of the diode D4, and the anode of the diode D3 and the cathode of the diode D4 are grounded.
Optionally, the control module 2 is further configured to generate an open-short test result of the chip according to the voltage of the pin to be tested, which is switched on by the switch switching module 1, and the reference voltage.
Optionally, the apparatus further comprises: and the analog-to-digital conversion module 4 is connected to the switch switching module 1 and the control module 2 so as to convert the analog quantity of the voltage of the pin to be tested, which is switched on by the switch switching module 1, into digital quantity and send the digital quantity to the control module 2.
Optionally, the apparatus further comprises: and the display module 5 is connected to the control module 2 to display the open-short circuit test result.
Optionally, the control module 2 is connected to the constant current source module 3 to control the magnitude and direction of the test current output by the constant current source module 3.
Drawings
Fig. 1 schematically shows a block diagram of a chip open/short circuit testing apparatus provided in accordance with an embodiment of the present invention;
fig. 2 schematically shows a block diagram of a switch switching module in an open-chip short-circuit testing apparatus according to an embodiment of the present invention;
fig. 3 schematically shows a block diagram of a switch switching module in an open-chip short-circuit testing apparatus according to another embodiment of the present invention.
Description of reference numerals:
1-a switch switching module; 11-a first switching module; 11A-a first reference circuit; 12-a second switching module; 12A-a second reference circuit; 13-a third reference circuit; 2-a control module; 3-a constant current source module; 4-an analog-to-digital conversion module; 5-a display module; 6-chip.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in detail with reference to the accompanying drawings.
Fig. 1 schematically shows a block diagram of a chip open/short circuit testing apparatus provided in an embodiment of the present invention. Referring to fig. 1, and fig. 2 and fig. 3, the chip open/short circuit testing apparatus in the present embodiment will be described in detail.
Referring to fig. 1, the chip open/short circuit testing apparatus includes a switch switching module 1, a control module 2, a constant current source module 3, an analog-to-digital conversion module 4, and a display module 5.
The switch switching module 1 is connected to N pins to be tested of the chip 6, where N is an integer greater than 1. Referring to fig. 2 and 3, the N pins to be tested of the chip 6 are pins B respectively1、B2、……、BNPin a of switch switching module 11、A2、……、ANAre respectively connected to pins B of the chip 61、B2、……、BN. Pin A1、A2、……、ANAnd pin B1、B2、……、BNAre in one-to-one correspondence.
The control module 2 is connected to the switch switching module 1, and the switch switching module 1 is controlled to sequentially switch on the N pins to be tested of the chip 6. Referring to fig. 2 and 3, the switch switching module 1 is provided with m selection pins C1、C2、……、CmTo realize 2mFunction of data selector of choice, 2mIs more than or equal to N. The control module 2 selects the pin C by changing1、C2、……、CmIs selected fromSelective turn-on pin A1、A2、……、ANOne pin a innN is more than or equal to 1 and less than or equal to N, so that the switched-on pin AnConnected pin B to be testednIs in the on state.
The output end of the constant current source module 3 is connected to the switch switching module 1 and is used for connecting the pin B to be tested of the switch switching module 1nA test current is provided. The constant current source module 3 is further connected to the control module 2, and the control module 2 controls the magnitude and direction of the test current output by the constant current source module 3, namely, controls the pin B to be tested flowing into the chip 6nThe magnitude and direction of the test current in (1). Specifically, referring to fig. 2 and 3, when testing the pin B to be testednPull-up diode (i.e. pin B to be tested) innA diode between the power supply VDD), the control module 2 controls the test current output by the constant current source module 3 to be a forward current; when testing the pin B to be testednPull-down diode (i.e. pin B to be tested)nA diode between the control module 2 and the ground VSS), the control module 2 controls the test current output by the constant current source module 3 to be a reverse current; the control module 2 also controls the magnitude of the test current output by the constant current source module 3 to change the driving capability of the pull-up diode and the pull-down diode. It can be understood that, when the chip is tested for open short circuit, the chip is not powered on, and the power supply VDD is 0V.
The analog-to-digital conversion module 4 is connected to the switch switching module 1 and the control module 2 to connect the pin B to be tested with the switch switching module 1nConverts the analog quantity of the voltage into a digital quantity, and transmits the converted digital quantity to the control module 2. The control module 2 switches on the pin B to be tested according to the switch switching module 1nThe voltage of (2) generates an open-short circuit test result of the chip 6, wherein the open-short circuit test result comprises a test result of each pin to be tested in the chip 6. To measure the pin B to be measured of the chip 6nFor example, if the pin B is to be testednIf the voltage of the pull-up diode is in a normal range, the pull-up diode is in a normal state, and if the pin B to be tested is in a normal statenThe voltage of the voltage tends to 0V, which indicates that the pull-up diode is short-circuited, if the pin B to be tested isnThe voltage of (d) is greater than a predetermined value, indicating that the pull-up diode is open. The preset value is, for example, 3V.
The display module 5 is connected to the control module 2 and is used for displaying the open-short circuit test result generated by the control module 2. The display module 5 displays, for example, "pin under test B1Normal "and" pin to be tested B2Pull-up diode open, "etc.
The utility model discloses an in the embodiment, switch switching module 1 is provided with third reference circuit 13, as shown in FIG. 2, third reference circuit 13 provides reference voltage for the short-circuit test of opening of pull-up diode and the pull-down diode that N pins that await measuring are connected, and at this moment, switch switching module 1 only by one 2mAnd a data selector for selecting one. Specifically, referring to fig. 2, the pin S1 of the switch switching module 1 is connected to the cathode of the diode D3, the pin S2 is connected to the anode of the diode D4, the pin S3 is grounded, the pin S4 is disconnected, the anode of the diode D3 is grounded, and the cathode of the diode D4 is grounded. Therefore, the voltages of the pins S1, S2, S3 and S4 are measured by the analog-to-digital conversion module 4 as the reference voltage for the chip open short circuit test, the voltage of the pin S1 is used as the reference voltage for the pull-down diode to normally work, the voltage of the pin S2 is used as the reference voltage for the pull-up diode to normally work, the voltage of the pin S3 is used as the short circuit reference voltage for the pull-up diode and the pull-down diode, and the voltage of the pin S4 is used as the open circuit reference voltage for the pull-up diode and the pull-down diode. When other parts (such as the constant current source module 3) in the chip open-short circuit testing device can not work normally, the reference voltage and the voltage of the pin to be tested are combined to judge whether the chip open-short circuit test is qualified or not, so that misjudgment is avoided, and the reliability and the accuracy of the chip open-short circuit test are improved.
When the switch-over module 1 is provided with the third reference circuit 13, the m selection pins C of the switch-over module 11、C2、……、CmFor connecting to pin A1、A2、……、ANOne of the pins S1, S2, S3 and S4, and m selection pins C1、C2、……、CmCan realize 2mFunction of the data selector of one, at this time, 2m≥N+4。
In another embodiment of the present invention, the switch switching module 1 includes a first switching dieThe switch switching module 1 comprises two switch switching modules 2, 11 and 12, wherein the control module 2 controls the first switching module 11 to sequentially switch on the pull-up diodes connected with the N pins to be tested, the control module 2 controls the second switching module 12 to sequentially switch on the pull-down diodes connected with the N pins to be tested, and at the moment, the switch switching module 1 is composed of two switch switching modules 2mThe data selector (i.e. the first switching module 11 and the second switching module 12) for selecting one. The first switching module 11 is provided with a first reference circuit 11A, and the first reference circuit 11A provides reference voltage for the open-short circuit test of the pull-up diode; the second switching module 12 is provided with a second reference circuit 12A, and the second reference circuit 12A provides a reference voltage for an open-short test of the pull-down diode. Referring to fig. 3, the pin S1 of the first switching module 11 is connected to the anode of the diode D1, the pin S2 of the first switching module 11 is grounded, the pin S3 of the first switching module 11 is disconnected, and the cathode of the diode D1 is grounded to form a first reference circuit 11A; the pin S1 of the second switching module 12 is connected to the cathode of the diode D2, the pin S2 of the second switching module 12 is grounded, the pin S3 of the second switching module 12 is disconnected, and the anode of the diode D2 is grounded to form the second reference circuit 12A. Specifically, when testing the pull-up diode in the chip 6, the control module 2 controls a pin a in the first switching module 11nIs turned on, thereby causing the pin A to be turned onnConnected pin B to be testednIn a switch-on state, the constant current source module 3 is controlled to output a forward current, and then the control module 2 outputs a forward current according to the reference voltage of the first reference circuit 11A and the pin B to be testednVoltage generation pin B to be testednOpen short circuit test results of the pull-up diode; when testing the pull-down diode in the chip 6, the control module 2 controls a pin A in the second switching module 12nIs turned on, thereby causing the pin A to be turned onnConnected pin B to be testednIn a connected state, the constant current source module 3 is controlled to output a reverse current, and then the control module 2 outputs a reverse current according to the reference voltage of the second reference circuit 12A and the pin B to be testednVoltage generation pin B to be testednAnd (5) testing the open and short circuit of the pull-down diode.
When the switch switching module 1 comprises the first switching module 11 and the second switching module 12, the first switching module 11 is providedWhen the first reference circuit 11A is disposed and the second switching module 12 is disposed with the second reference circuit 12A, m selection pins C in the first switching module 11 and the second switching module 12 are disposed1、C2、……、CmFor switching on its pin A1、A2、……、ANOne of the pins S1, S2 and S3, and m selection pins C1、C2、……、CmCan realize 2mFunction of the data selector of one, at this time, 2m≥N+3。
The control module 2 is further configured to generate an open-short test result of the chip 6 according to the voltage of the pin to be tested and the reference voltage, which are switched on by the switch switching module 1. Taking the chip open/short circuit testing apparatus shown in fig. 3 as an example, when testing the pull-up diode of the pin to be tested, if the voltage of the pin S1 in the first reference circuit 11A is within the normal range, the voltage of the pin S2 is 0V, and the voltage of the pin S3 is greater than a preset value, for example, 3V, the apparatus works normally, and then the open/short circuit testing result of the chip 6 is generated according to the voltage of the pin to be tested, otherwise, the apparatus works abnormally; when testing the pull-down diode of the pin to be tested, if the voltage of the pin S1 in the second reference circuit 12A is in the normal range, the voltage of the pin S2 is 0V, and the voltage of the pin S3 is greater than a preset value, for example, 3V, the device operates normally, and then an open/short circuit test result of the chip 6 is generated according to the voltage of the pin to be tested, otherwise, the device operates abnormally.
In this embodiment, when the chip open/short circuit testing apparatus works, the control module 2 initializes the switch switching module 1, the analog-to-digital conversion module 4, and the display module 5. Then, a reference circuit self-checking stage is entered, specifically, a self-checking process is described by taking the switch switching module 1 shown in fig. 2 as an example, the control module 2 controls the switch switching module 1 to gate the pins S1, S2, S3 and S4, correspondingly controls the direction of the test current output by the constant current source module 3, and sequentially tests the voltages of the gated pins S1, S2, S3 and S4, when the voltages of the pins S1 and S2 are within a normal range, the voltage of the pin S3 is 0, and the voltage of the pin S4 is greater than a preset value of 3V, it is indicated that the chip open-short circuit testing device normally operates, and the chip open-short circuit testing device can be tested, otherwise, it is indicated that the chip open-short circuit testing device does not normally operate, and the chip open-short circuit testing. Then, when the chip open/short circuit testing device works normally, the constant current source module 3 is controlled to output reverse test current, the switch switching module 1 is controlled to be connected with the pins to be tested of the chip 6 one by one, and after the pull-down diode tests of all the pins are completed, the constant current source module 3 is controlled to output forward test current, and the switch switching module 1 is controlled to be connected with the pins to be tested of the chip 6 one by one, so that the pull-up diode tests of all the pins are completed.
In the embodiment of the utility model, the pins to be tested of the chip are sequentially connected by the switch switching module in the chip open-short circuit testing device to carry out open-short circuit testing, so that the testing flexibility is improved, the open-short circuit testing of all pins can be automatically realized, and the manual operation cost is reduced; and the reference circuit is also utilized to provide reference voltage for the chip open-short circuit test, so that the chip open-short circuit test error caused by the failure of the device is prevented, and the test stability is improved.
While the invention has been shown and described with reference to certain exemplary embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims and their equivalents. Accordingly, the scope of the present invention should not be limited to the above-described embodiments, but should be defined not only by the appended claims, but also by equivalents thereof.
Claims (10)
1. A chip open short circuit test device, characterized in that the device comprises:
the switch switching module (1) is connected to N pins to be tested of the chip (6), and N is an integer greater than 1;
the control module (2) is connected to the switch switching module (1) and controls the switch switching module (1) to sequentially switch on the N pins to be tested;
and the constant current source module (3) is connected to the switch switching module (1) and provides test current for the pin to be tested which is connected with the switch switching module (1).
2. The chip open short circuit test device according to claim 1, wherein the switch switching module (1) comprises a first switching module (11) and a second switching module (12), the control module (2) controls the first switching module (11) to sequentially switch on the pull-up diodes connected to the N pins to be tested, and the control module (2) controls the second switching module (12) to sequentially switch on the pull-down diodes connected to the N pins to be tested.
3. The chip open-short circuit test device according to claim 2, wherein the first switching module (11) is provided with a first reference circuit (11A), the first reference circuit (11A) providing a reference voltage for the open-short circuit test of the pull-up diode; and/or the second switching module (12) is provided with a second reference circuit (12A), and the second reference circuit (12A) provides a reference voltage for the open-short test of the pull-down diode.
4. The chip open short circuit test device according to claim 3, wherein three pins of the first switching module (11) are respectively disconnected, grounded, and connected to the anode of a diode D1, and the cathode of the diode D1 is grounded to form the first reference circuit (11A); the three pins of the second switching module (12) are respectively disconnected, grounded, and connected to the cathode of a diode D2, and the anode of the diode D2 is grounded to form the second reference circuit (12A).
5. The chip open-short circuit test device according to claim 1, wherein the switch switching module (1) is provided with a third reference circuit (13), and the third reference circuit (13) provides a reference voltage for open-short circuit test of the pull-up diode and the pull-down diode connected with the N pins to be tested.
6. The device for testing the open/short circuit of the chip as claimed in claim 5, wherein the four pins of the switch switching module (1) are respectively disconnected, grounded, connected to the cathode of the diode D3, and connected to the anode of the diode D4, and the anode of the diode D3 and the cathode of the diode D4 are grounded.
7. The device for testing the open circuit and the short circuit of the chip according to any one of claims 3 to 6, wherein the control module (2) is further configured to generate an open circuit and short circuit test result of the chip (6) according to the voltage of the pin to be tested, which is switched on by the switch switching module (1), and the reference voltage.
8. The device for testing open/short circuit of chip as claimed in claim 7, further comprising:
the analog-to-digital conversion module (4) is connected to the switch switching module (1) and the control module (2) so as to convert the analog quantity of the voltage of the pin to be tested, which is switched on by the switch switching module (1), into digital quantity, and send the digital quantity to the control module (2).
9. The device for testing open/short circuit of chip as claimed in claim 7, further comprising:
and the display module (5) is connected to the control module (2) to display the open-short circuit test result.
10. The device for testing the open circuit and the short circuit of the chip as claimed in claim 1, wherein the control module (2) is connected to the constant current source module (3) to control the magnitude and the direction of the test current outputted by the constant current source module (3).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020748108.XU CN212275891U (en) | 2020-05-08 | 2020-05-08 | Chip open/short circuit testing device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202020748108.XU CN212275891U (en) | 2020-05-08 | 2020-05-08 | Chip open/short circuit testing device |
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| CN212275891U true CN212275891U (en) | 2021-01-01 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220334169A1 (en) * | 2019-06-04 | 2022-10-20 | Qualtec Co., Ltd. | Semiconductor Component Test Device and Method of Testing Semiconductor Components |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220334169A1 (en) * | 2019-06-04 | 2022-10-20 | Qualtec Co., Ltd. | Semiconductor Component Test Device and Method of Testing Semiconductor Components |
| US11994551B2 (en) * | 2019-06-04 | 2024-05-28 | Qualtec Co., Ltd. | Semiconductor component test device and method of testing semiconductor components |
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