CN212060353U - Novel test needle assembly based on LED test - Google Patents
Novel test needle assembly based on LED test Download PDFInfo
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- CN212060353U CN212060353U CN201922497225.3U CN201922497225U CN212060353U CN 212060353 U CN212060353 U CN 212060353U CN 201922497225 U CN201922497225 U CN 201922497225U CN 212060353 U CN212060353 U CN 212060353U
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Abstract
The utility model discloses a novel test needle assembly based on LED test, relating to the technical field of test devices; the test device comprises a test needle base, a lead PCB, a press pin and a test spring plate; the longitudinal section of the test needle base is L-shaped, a strip-shaped groove is formed in the outer surface of one end of the test needle base, the press needle is limited in the strip-shaped groove, an expansion spring is arranged in the press needle, the tail end of the expansion spring is fixed on the test needle base, and the top end of the press needle extends out of the strip-shaped groove; the testing elastic sheet comprises a testing end, a connecting end and a limiting end, wherein the testing end and the connecting end form an inverted U-shaped structure, and the connecting end penetrates through the testing needle stand and is electrically connected with the lead PCB; the limiting end is connected to the top of the inverted U-shaped structure and fixed to the other end of the test needle base, and the test end of the test elastic sheet is located on one side of the top end of the pressing needle; the utility model has the advantages that: the telescopic movement is realized by means of the deformation of the testing elastic sheet, and the testing accuracy is improved.
Description
Technical Field
The utility model relates to a semiconductor package device tests technical field, more specifically says, the utility model relates to a novel test needle subassembly based on LED test.
Background
The existing electronic component products all involve the process of detecting the relevant electrical parameters or optical parameters under the condition of switching on the power supply in the production process, and generally adopt a test probe to make the test probe contact with a tested point of the electronic product and realize electrical connection.
The structure of a test probe device among the prior art is shown in fig. 1, including test needle file 1, test needle 2, tucking 3 and apron 4, test needle 2 and tucking 3 all set up in test needle file 1, apron 4 lid is on test needle 2 and tucking 3, and test needle 2 and tucking 3 inside all is provided with spring 5, relies on spring 5's shrink, realizes testing needle 2 and tucking 3's elevating movement in the test process. The shrinkage of the test needle 2 mainly depends on the acting force of the spring 5, the test needle with the structure is easy to wear, the area of a contact point of an electronic component is required to be large, otherwise, poor contact causes inaccurate voltage test, and Kelvin electrical property test is not easy to realize.
SUMMERY OF THE UTILITY MODEL
In order to overcome the not enough of prior art, the utility model provides a novel test needle subassembly based on LED test through the test shell fragment with by the test point contact, relies on the deformation of test shell fragment self to realize concertina movement, avoids weighing wounded to the product, improves the test rate of accuracy.
The utility model provides a technical scheme that its technical problem adopted is: a novel test needle assembly based on LED testing, the improvement comprising: the test device comprises a test needle base, a lead PCB, a press pin and a test spring plate;
the longitudinal section of the test needle base is L-shaped, a strip-shaped groove is formed in the outer surface of one end of the test needle base, the press needle is limited in the strip-shaped groove, an expansion spring is arranged in the press needle, the tail end of the expansion spring is fixed on the test needle base, and the top end of the press needle extends out of the strip-shaped groove;
the testing elastic sheet comprises a testing end, a connecting end and a limiting end, wherein the testing end and the connecting end form an inverted U-shaped structure, and the connecting end penetrates through the testing needle stand and is electrically connected with the lead PCB; the limiting end is connected to the top of the inverted U-shaped structure and fixed to the other end of the test needle base, and the test end of the test elastic sheet is located on one side of the top end of the pressing needle.
In the structure, a vertical plate is arranged on the outer surface of the other end of the test needle base, a group of two overlapped test elastic pieces are respectively arranged on two sides of the vertical plate, the limiting end of each test elastic piece is fixed on the vertical plate, and the top end of the pressing needle is positioned between the two groups of test elastic pieces.
In the structure, the insulating material is arranged between the overlapped testing elastic sheets, and the contact position of each testing elastic sheet and the tested point is provided with the conductive material.
In the structure, two sides of the vertical plate are respectively provided with a pressing plate, the pressing plates are fixed on the vertical plate through bolts, and the limiting plate of the testing elastic sheet is fixed between the pressing plates and the vertical plate.
In the structure, a test needle cover plate is fixedly arranged below the test needle seat and covers the strip-shaped groove.
In the structure, the test needle base is provided with a through hole for the connecting end to pass through.
The utility model has the advantages that: the utility model discloses a test needle subassembly relies on the resilience force of test shell fragment self, uses the back for a long time at the test shell fragment, also can not appear the condition that elasticity changes, has consequently improved the stability of test, relies on the deformation realization concertina movement of test shell fragment self, avoids the long-time use of prior art spring and leads to the test needle and by the condition of test point contact failure to improve the test rate of accuracy.
Drawings
Fig. 1 is a schematic structural diagram of a test probe apparatus in the prior art.
Fig. 2 is a schematic structural diagram of a novel test needle assembly based on LED test according to the present invention.
Fig. 3 is an exploded schematic view of the novel test needle assembly based on LED test of the present invention.
Detailed Description
The present invention will be further explained with reference to the drawings and examples.
The conception, the specific structure, and the technical effects produced by the present invention will be clearly and completely described below in conjunction with the embodiments and the accompanying drawings to fully understand the objects, the features, and the effects of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all embodiments, and other embodiments obtained by those skilled in the art without inventive labor based on the embodiments of the present invention all belong to the protection scope of the present invention. In addition, all the connection/connection relations referred to in the patent do not mean that the components are directly connected, but mean that a better connection structure can be formed by adding or reducing connection auxiliary components according to specific implementation conditions. The utility model discloses each technical feature in the creation can the interactive combination under the prerequisite that does not contradict conflict each other.
Referring to fig. 2 and 3, the utility model discloses a novel test needle assembly based on LED test, specifically, the novel test needle assembly based on LED test comprises a test needle base 10, a lead PCB 20, a test needle cover plate 30, a press pin 40 and a test spring plate 50; the longitudinal section of the test needle seat 10 is L-shaped, as shown in fig. 2, a strip-shaped groove is formed in the outer surface of one end of the test needle seat 10, the press needle 40 is limited in the strip-shaped groove, an extension spring 401 is arranged in the press needle 40, the tail end of the extension spring 401 is fixed on the test needle seat 10, and the top end of the press needle 40 extends out of the strip-shaped groove; a test needle cover plate 30 is fixedly arranged below the test needle seat 10, and the test needle cover plate 30 covers the strip-shaped groove, so that the press needle 40 can realize telescopic motion in the strip-shaped groove; furthermore, as shown in fig. 3, the test spring 50 includes a test end 501, a connection end 502 and a limiting end 503, the test end 501 and the connection end 502 form an inverted U-shaped structure, the connection end 502 penetrates through the test socket 10 and is electrically connected to the lead PCB 20, in this embodiment, a through hole for the connection end 502 to penetrate through is formed in the test socket 10. The limiting end 503 is connected to the top of the inverted U-shaped structure, the limiting end 503 is fixed to the other end of the test needle holder 10, and the testing end 501 of the testing elastic sheet 50 is located on one side of the top end of the pressing pin 40.
In the above embodiment, the outer surface of the other end of the test needle holder 10 is provided with a vertical plate 101, two sides of the vertical plate 101 are respectively provided with one group of two overlapped test spring pieces 50, the limiting end 503 of each test spring piece 50 is fixed on the vertical plate 101, the top end of the pressing pin 40 is located between the two groups of test spring pieces 50, as shown in fig. 3, the limiting end 503 of each test spring piece 50 is provided with a plurality of locking holes, and the test spring pieces are fixed on the vertical plate 101 after being locked with screws; in addition, two sides of the vertical plate 101 are respectively provided with a pressing plate 102, the pressing plates 102 are fixed on the vertical plate 101 through bolts, and the limiting plate of the testing elastic sheet 50 is fixed between the pressing plate 102 and the vertical plate 101.
Through the structure, in the process of testing the electronic product, the testing end 501 of the testing elastic sheet 50 is contacted with the tested point, because the testing end 501 and the connecting end 502 form an inverted U-shaped structure, the testing end 501 has certain elasticity, at the moment, the testing end 501 contracts under the action of the elasticity of the testing end 501, meanwhile, the pressing pin 40 also contracts, because the connecting end 502 is electrically connected with the lead PCB 20, the tested point is electrically connected with the lead PCB 20 through the effect of the testing elastic sheet 50, so as to realize the detection of the product, and because how to detect the product through the circuit belongs to the category of the prior art, detailed description is not needed in the embodiment. This kind of test needle subassembly relies on the resilience force of test shell fragment 50 self, uses the back for a long time at test shell fragment 50, also can not appear the condition that elasticity changes, has consequently improved the stability of test, relies on the deformation realization concertina movement of test shell fragment 50 self, avoids weighing wounded to the product, improves the test rate of accuracy.
In addition, because the two sides of the vertical plate 101 are respectively provided with one group of two overlapped test elastic sheets 50, in the test process, when any group of elastic sheets is conducted with a tested point, the product can be detected, and the adaptability of the test needle assembly is improved to adapt to various tested points with different sizes. In the embodiment, the insulating material is insulating paint to realize insulation between adjacent test spring plates 50, a conductive material is arranged at a contact position between each test spring plate and a tested point, and the electrical conduction between the tested point and the test spring plate is realized through the conductive material, which is tungsten steel in the embodiment. The test shrapnel with the structure can realize the test of test points with very small area, and in the embodiment, the test needle assembly can realize the test of the contact position with the area less than 0.045 square millimeter.
While the preferred embodiments of the present invention have been described, the present invention is not limited to the above embodiments, and those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present invention, and such equivalent modifications or substitutions are intended to be included within the scope of the present invention as defined by the appended claims.
Claims (6)
1. A novel test needle subassembly based on LED test which characterized in that: the test device comprises a test needle base, a lead PCB, a press pin and a test spring plate;
the longitudinal section of the test needle base is L-shaped, a strip-shaped groove is formed in the outer surface of one end of the test needle base, the press needle is limited in the strip-shaped groove, an expansion spring is arranged in the press needle, the tail end of the expansion spring is fixed on the test needle base, and the top end of the press needle extends out of the strip-shaped groove;
the testing elastic sheet comprises a testing end, a connecting end and a limiting end, wherein the testing end and the connecting end form an inverted U-shaped structure, and the connecting end penetrates through the testing needle stand and is electrically connected with the lead PCB; the limiting end is connected to the top of the inverted U-shaped structure and fixed to the other end of the test needle base, and the test end of the test elastic sheet is located on one side of the top end of the pressing needle.
2. The new LED test based test needle assembly of claim 1, wherein: the outer surface of the other end of the test needle base is provided with a vertical plate, two sides of the vertical plate are respectively provided with a group of two overlapped test elastic pieces, the limiting end of each test elastic piece is fixed on the vertical plate, and the top end of the pressing needle is positioned between the two groups of test elastic pieces.
3. The new LED test based test needle assembly of claim 2, wherein: the two sides of the vertical plate are respectively provided with a pressing plate, the pressing plates are fixed on the vertical plate through bolts, and the limiting plate of the testing elastic sheet is fixed between the pressing plates and the vertical plate.
4. The new LED test based test needle assembly of claim 2, wherein: and an insulating material is arranged between the overlapped testing elastic sheets, and a conductive material is arranged at the contact position of each testing elastic sheet and the tested point.
5. The new LED test based test needle assembly of claim 1, wherein: and a test needle cover plate is fixedly arranged below the test needle seat and covers the strip-shaped groove.
6. The new LED test based test needle assembly of claim 1, wherein: the test needle base is provided with a through hole for the connecting end to pass through.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922497225.3U CN212060353U (en) | 2019-12-31 | 2019-12-31 | Novel test needle assembly based on LED test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922497225.3U CN212060353U (en) | 2019-12-31 | 2019-12-31 | Novel test needle assembly based on LED test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212060353U true CN212060353U (en) | 2020-12-01 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922497225.3U Active CN212060353U (en) | 2019-12-31 | 2019-12-31 | Novel test needle assembly based on LED test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN212060353U (en) |
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2019
- 2019-12-31 CN CN201922497225.3U patent/CN212060353U/en active Active
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