CN212031659U

CN212031659U - Defective product testing arrangement is used in integrated circuit board production

Info

Publication number: CN212031659U
Application number: CN202020173929.5U
Authority: CN
Inventors: 查根清; 程薇薇
Original assignee: Xiamen Jingxing Electronic Materials Co ltd
Current assignee: Xiamen Jingxing Electronic Materials Co ltd
Priority date: 2020-02-17
Filing date: 2020-02-17
Publication date: 2020-11-27
Anticipated expiration: 2030-02-17

Abstract

The utility model discloses a wastrel testing arrangement is used in integrated circuit board production, including device main part, universal meter, connection probe, wire and connecting clamp, the downside of device main part is fixed with the work main part, and the junction of work main part and device main part is connected with the activity main part through the connecting pin axle, first spout has been seted up in the activity main part, and the internal connection of first spout has the stopper, the inboard of stopper is fixed with the slide bar, and the first bolt in outside installation back of stopper, the second spout has been seted up on the slide bar, and the internal connection of second spout has the sliding block, the inside of sliding block is fixed with connection probe. This defective goods testing arrangement is used in integrated circuit board production can change the operating position of connecting probe, makes connecting probe can the fixed point location work to conveniently carry out test work to integrated circuit board in batches, can enough guarantee integrated circuit board's efficiency of software testing, can improve this testing arrangement's availability factor again.

Description

Defective product testing arrangement is used in integrated circuit board production

Technical Field

The utility model relates to an integrated circuit board production technical field specifically is a defective products testing arrangement is used in integrated circuit board production.

Background

The integrated circuit board is a carrier for loading the integrated circuit, the integrated circuit board is used in various electrical equipment at present, in the production process of the integrated circuit board, the detection work is indispensable in order to eliminate defective products, and although the use of some testing equipment is common at present, some problems still exist.

For example, some test devices are complicated to use and have a long test time for the integrated circuit board, so that the test work of the integrated circuit board cannot be completed quickly, the use efficiency of the test device can be reduced, and the use value of the test device cannot be embodied.

We have proposed a defective product testing apparatus for integrated circuit board production in order to solve the problems set forth above.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a wastrel testing arrangement is used in integrated circuit board production to solve the problem of the unable quick completion integrated circuit board's of testing arrangement test work on some the existing markets that above-mentioned background art provided.

In order to achieve the above object, the utility model provides a following technical scheme: a defective product testing device for integrated circuit board production comprises a device body, a universal meter, a connecting probe, a lead and a connecting clamp, wherein the universal meter is installed on the device body, a working body is fixed on the lower side of the device body, the joint of the working body and the device body is connected with a movable body through a connecting pin shaft, a stop plate is arranged at the outer end of the movable body, a first sliding groove is formed in the movable body, a limiting block is connected inside the first sliding groove, a sliding rod is fixed on the inner side of the limiting block, a first bolt is installed on the outer side of the limiting block, a second sliding groove is formed in the sliding rod, a sliding block is connected inside the second sliding groove, the connecting probe is fixed inside the sliding block, a second bolt is installed on the lower side of the sliding block, and the lower end of the connecting probe is connected with the lead through the connecting clamp, and wire electric connection has the universal meter, the fly leaf is installed to the rear side of device main part.

Preferably, the multimeter is electrically connected with the connection probe through a wire, and the wire is detachably connected with the connection probe through a connection clamp.

Preferably, the working body and the device body are of an integrated structure, and the upper side of the working body is of a groove-shaped structure.

Preferably, the movable main body forms a turnover structure on the device main body through a connecting pin shaft, and the size of the movable main body is smaller than the size of the upper side of the working main body.

Preferably, the two ends of the sliding rod are connected with the first sliding groove through the limiting blocks to form a sliding structure on the movable main body, the limiting blocks are four-edge columns, and the width of the limiting blocks is equal to that of the first sliding groove.

Preferably, the embedded swing joint of sliding block is in the second spout on the slide bar, and connects the fixed setting of probe on the sliding block to the upper end protrusion activity main part upper flank 2mm of connecting the probe.

Compared with the prior art, the beneficial effects of the utility model are that: the defective product testing device for producing the integrated circuit board;

(1) the movable main body is provided with the sliding rod, the sliding block and the connecting probe are arranged on the sliding rod, and the connecting probe is connected with the universal meter through a wire, so that the working position of the connecting probe can be changed, the connecting probe can be positioned at a fixed point, the testing work of batch integrated circuit boards is facilitated, the testing efficiency of the integrated circuit boards can be ensured, and the use efficiency of the testing device can be improved;

(2) the connecting pin shaft is arranged between the movable main body and the device main body, so that the movable main body can be turned over, the testing device is convenient to operate, and the use efficiency of the testing device is improved.

Drawings

FIG. 1 is a schematic view of the overall structure of the present invention;

FIG. 2 is a schematic side sectional view of the present invention;

fig. 3 is a schematic top view of the sliding rod of the present invention;

FIG. 4 is a schematic view of the structure of the joint between the movable body and the sliding rod of the present invention;

fig. 5 is the schematic structural diagram of the joint between the sliding rod and the sliding block of the present invention.

In the figure: 1. a device main body; 2. a universal meter; 3. a working body; 4. connecting a pin shaft; 5. a movable body; 6. a stop plate; 7. a first chute; 8. a slide bar; 9. a first bolt; 10. a slider; 11. connecting a probe; 12. a second bolt; 13. a wire; 14. a movable plate; 15. a limiting block; 16. a second chute; 17. and (4) connecting clips.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-5, the present invention provides a technical solution: a defective product testing device for integrated circuit board production comprises a device body 1, a universal meter 2, a working body 3, a connecting pin shaft 4, a movable body 5, a baffle plate 6, a first chute 7, a sliding rod 8, a first bolt 9, a sliding block 10, a connecting probe 11, a second bolt 12, a lead 13, a movable plate 14, a limiting block 15, a second chute 16 and a connecting clamp 17, wherein the universal meter 2 is installed on the device body 1, the working body 3 is fixed on the lower side of the device body 1, the connecting part of the working body 3 and the device body 1 is connected with the movable body 5 through the connecting pin shaft 4, the baffle plate 6 is arranged at the outer end of the movable body 5, the first chute 7 is arranged on the movable body 5, the limiting block 15 is connected inside the first chute 7, the sliding rod 8 is fixed on the inner side of the limiting block 15, and the first bolt 9 is installed on the outer side of the limiting block 15, the slide bar 8 is provided with a second sliding groove 16, the inside of the second sliding groove 16 is connected with a sliding block 10, a connecting probe 11 is fixed inside the sliding block 10, a second bolt 12 is installed on the lower side of the sliding block 10, the lower end of the connecting probe 11 is connected with a wire 13 through a connecting clamp 17, the wire 13 is electrically connected with a universal meter 2, and a movable plate 14 is installed on the rear side of the device body 1.

Multimeter 2 is through being electric connection between wire 13 and the connection probe 11, and wire 13 passes through connecting clamp 17 and is connected for dismantling between the connection probe 11, guarantees the normal course of operation of this testing arrangement, has also improved the working property of connection probe 11.

Work main part 3 and device main part 1 are the integral structure, and the upside of work main part 3 is recess column structure, guarantees the holistic steadiness of device, also conveniently operates movable main part 5 simultaneously.

The movable main body 5 forms a turnover structure on the device main body 1 through the connecting pin shaft 4, and the size of the movable main body 5 is smaller than the size of the upper side of the working main body 3, so that the stable working state of the movable main body 5 on the working main body 3 is ensured, and the use efficiency of the movable main body 5 is also improved.

The connection that the both ends of slide bar 8 pass through stopper 15 and first spout 7 constitutes sliding structure on activity main part 5, and stopper 15 is the stupefied post of four to stopper 15's width equals the width of first spout 7, has guaranteed the stable active state of slide bar 8, has improved slide bar 8's work efficiency.

The embedded swing joint of sliding block 10 is in the second spout 16 on slide bar 8, and connects probe 11 and fix and set up on sliding block 10 to connect probe 11's upper end protrusion activity main part 5 upper flank 2mm, guaranteed the stable active state of sliding block 10, also can guarantee the normal contact connection between connection probe 11 and the integrated circuit board.

The working principle is as follows: when the defective product testing device for the production of the integrated circuit board is used, firstly, according to the figure 1, the testing device needs to be stably placed at a working place, then, the position of the connecting probe 11 of the testing device is adjusted according to the pin position tested on the integrated circuit board, and the testing work can be normally carried out only if the connecting probe 11 corresponds to the pin position tested on the integrated circuit board;

firstly, according to fig. 2-5, the sliding rod 8 is made to stably slide on the movable body 5 through the limiting block 15 and the first sliding groove 7, then the working position of the connection probe 11 can be determined through the sliding of the sliding block 10 in the second sliding groove 16 on the sliding rod 8, and then the positions of the sliding rod 8 and the sliding block 10 are fixed through the first bolt 9 and the second bolt 12, so that the connection probe 11 can stably work;

then, the movable main body 5 is turned upwards through the connecting pin shaft 4, the lead 13 on the multimeter 2 is connected to the lower end of the connecting probe 11 through the connecting clamp 17, then the movable main body 5 is laid flat, finally, the integrated circuit board to be tested is placed on the upper side of the movable main body 5, and the placing position of the integrated circuit board is limited under the action of the baffle plate 6, so that the testing pins on the integrated circuit board can be connected with the connecting probe 11, and the testing work of the integrated circuit board is completed quickly;

the use of the test device is completed and details not described in detail herein, such as multimeter 2, connection probes 11, wires 13, and connector clips 17, are well known to those skilled in the art.

Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments or portions thereof without departing from the spirit and scope of the invention.

Claims

1. The utility model provides a wastrel testing arrangement is used in integrated circuit board production, includes device main part (1), universal meter (2), coupling probe (11), wire (13) and connecting clip (17), its characterized in that: the universal meter is characterized in that a universal meter (2) is installed on the device main body (1), a working main body (3) is fixed on the lower side of the device main body (1), the joint of the working main body (3) and the device main body (1) is connected with a movable main body (5) through a connecting pin shaft (4), a stop plate (6) is arranged at the outer end of the movable main body (5), a first sliding groove (7) is formed in the movable main body (5), a limiting block (15) is connected to the inside of the first sliding groove (7), a sliding rod (8) is fixed on the inner side of the limiting block (15), a rear first bolt (9) is installed on the outer side of the limiting block (15), a second sliding groove (16) is formed in the sliding rod (8), a sliding block (10) is connected to the inside of the second sliding groove (16), a connecting probe (11) is fixed inside the sliding block (10), and a second bolt (12) is installed on, the lower extreme of connecting probe (11) is connected with wire (13) through connecting clamp (17), and wire (13) electric connection has universal meter (2), fly leaf (14) are installed to the rear side of device main part (1).

2. The defective product testing device for integrated circuit board production according to claim 1, wherein: multimeter (2) are through being electric connection between wire (13) and connection probe (11), and wire (13) are through connecting clamp (17) and connect for dismantling the connection between probe (11).

3. The defective product testing device for integrated circuit board production according to claim 1, wherein: the working main body (3) and the device main body (1) are of an integrated structure, and the upper side of the working main body (3) is of a groove-shaped structure.

4. The defective product testing device for integrated circuit board production according to claim 1, wherein: the movable main body (5) forms a turnover structure on the device main body (1) through a connecting pin shaft (4), and the size of the movable main body (5) is smaller than that of the upper side of the working main body (3).

5. The defective product testing device for integrated circuit board production according to claim 1, wherein: the two ends of the sliding rod (8) are connected with the first sliding groove (7) through the limiting blocks (15) to form a sliding structure on the movable main body (5), the limiting blocks (15) are four-edge columns, and the width of the limiting blocks (15) is equal to that of the first sliding groove (7).

6. The defective product testing device for integrated circuit board production according to claim 1, wherein: the sliding block (10) is movably connected in a second sliding groove (16) on the sliding rod (8) in an embedded mode, the connecting probe (11) is fixedly arranged on the sliding block (10), and the upper end of the connecting probe (11) protrudes out of the upper side face of the movable main body (5) by 2 mm.