CN211905577U

CN211905577U - Chip test probe device

Info

Publication number: CN211905577U
Application number: CN201921847126.7U
Authority: CN
Inventors: 张振峰; 杨国良; 邱德明
Original assignee: Wuhan Shengweixin Technology Co ltd
Current assignee: Wuhan Shengweixin Technology Co ltd
Priority date: 2019-10-30
Filing date: 2019-10-30
Publication date: 2020-11-10
Anticipated expiration: 2029-10-30

Abstract

The utility model discloses a chip test probe device, including base, step motor and guide bar, there is step motor base upper end one side through bolted connection, step motor's transmission output has the lead screw through the key-type connection, lead screw one side be provided with the base is pegged graft the guide bar, sliding connection has the lifter plate on the guide bar. Has the advantages that: the utility model discloses a set up step motor, lead screw, guide bar and lifter plate, make the probe circuit board go up and down fast, and then make test probe can be fast with the chip contact, improve efficiency of software testing, through setting up probe circuit board and fixed block, make many survey probes of accessible of device carry out the multiple spot test to the chip, efficiency of software testing is higher, very practical.

Description

Chip test probe device

Technical Field

The utility model relates to a chip testing technology field, concretely relates to chip testing probe device.

Background

Chip (chip) is a way to miniaturize circuits (mainly including semiconductor devices and also including passive components) in electronics, and is often manufactured on the surface of a semiconductor wafer, the mass production capacity and reliability of integrated circuits, and the modular approach of circuit design ensures that standardized integrated circuits are quickly adopted to replace the design of discrete transistors, so that chips with low cost and high performance are gradually applied more and more widely, and the chips need to be tested by using test probes in the manufacturing process to ensure that the quality of the chips meets the production requirements.

When the existing chip test probe device is used for testing a chip, the probe moving efficiency is lower, so that the testing efficiency of the device is lower, the existing chip test probe device is difficult to carry out multi-point test on the chip, the testing efficiency is lower, and the practicability is insufficient.

SUMMERY OF THE UTILITY MODEL

Technical problem to be solved

In order to overcome the defects of the prior art, the chip testing probe device is provided, and the problems that when the existing chip testing probe device is used for testing a chip, the probe moving efficiency is low, and the testing efficiency of the device is low are solved.

(II) technical scheme

The utility model discloses a following technical scheme realizes: the utility model provides a chip test probe device, including base, step motor and guide bar, there is step motor base upper end one side through bolted connection, step motor's transmission output has the lead screw through the key-type connection, lead screw one side be provided with the base is pegged graft the guide bar, sliding connection has the lifter plate on the guide bar.

Further, base upper end middle part shaping has the slide rail, be provided with the IPT cap pole in the slide rail, IPT cap pole upper end is provided with the chip, base upper end four corners department is provided with the bracing piece, the upper end of the support bar is provided with the roof, lifter plate lower extreme middle part is provided with the probe circuit board, probe circuit board lower extreme middle part is provided with the fixed block, the fixed block lower extreme is provided with test probe.

By adopting the technical scheme, the stepping motor can drive the screw rod to rotate when working, and the screw rod is in threaded connection with the lifting plate, so that the lifting plate can be lifted under the assistance of the guide rod when the screw rod rotates, and the probe circuit board can also be lifted.

Furthermore, the screw rod is connected with the top plate through a bearing, and the screw rod is connected with the lifting plate through threads.

Further, the guide bar with the roof is pegged graft, the IPT cap pole with slide rail sliding connection, the chip with the overlap joint of IPT cap pole.

By adopting the technical scheme, the IPT cap rod can be pushed by a feeding mechanism or other equipment to move on the sliding rail.

Furthermore, the supporting rod is welded with the base, and the supporting rod is welded with the top plate.

Further, the probe circuit board is connected with the lifting plate through screws.

By adopting the technical scheme, the probe circuit board can be lifted synchronously with the lifting plate, so that the test probe can also be lifted synchronously with the lifting plate.

Furthermore, the fixed block is bonded with the probe circuit board and the test probe, and the test probe is welded with the probe circuit board.

By adopting the technical scheme, the quantity of the test probes can be set according to test requirements, when the IPT cap rod carries a chip to move to the time of the lower part of the probe circuit board, the stepping motor works to drive the lifting plate to move downwards so that the test probes are in contact with the chip, and therefore the test probes can carry out multi-point test on the chip and are very efficient.

(III) advantageous effects

Compared with the prior art, the utility model, following beneficial effect has:

1. in order to solve the problem that the prior chip testing probe device has lower probe moving efficiency and lower testing efficiency when testing a chip, the utility model can quickly lift a probe circuit board by arranging a stepping motor, a lead screw, a guide rod and a lifting plate, so that a testing probe can be quickly contacted with the chip, thereby improving the testing efficiency;

2. for solving current chip test probe device and being difficult to carry out the multiple spot test to the chip, the lower problem of efficiency of software testing, the utility model discloses a set up probe circuit board and fixed block, make many test probes of accessible of device carry out the multiple spot test to the chip, efficiency of software testing is higher, very practical.

Drawings

Fig. 1 is a schematic structural diagram of a chip test probe apparatus according to the present invention;

fig. 2 is a schematic diagram of a connection relationship between a lifting plate and a probe circuit board in a chip testing probe apparatus according to the present invention;

fig. 3 is a bottom view of a probe circuit board in a chip test probe apparatus according to the present invention.

The reference numerals are explained below:

1. a base; 2. a stepping motor; 3. a screw rod; 4. a guide bar; 5. a lifting plate; 6. a slide rail; 7. an IPT cap stem; 8. a chip; 9. a support bar; 10. a top plate; 11. a probe circuit board; 12. a fixed block; 13. and (6) testing the probe.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

As shown in fig. 1-3, the chip testing probe apparatus in this embodiment includes a base 1, a stepping motor 2 and a guide rod 4, the stepping motor 2 is connected to one side of the upper end of the base 1 through a bolt, the transmission output end of the stepping motor 2 is connected to a lead screw 3 through a key, the guide rod 4 inserted into the base 1 is arranged on one side of the lead screw 3, a lifting plate 5 is slidably connected to the guide rod 4, a slide rail 6 is formed at the middle of the upper end of the base 1, an IPT cap rod 7 is arranged in the slide rail 6, a chip 8 is arranged at the upper end of the IPT cap rod 7, support rods 9 are arranged at four corners of the upper end of the base 1, a top plate 10 is arranged at the upper end of the support rods 9, a probe circuit board 11 is arranged at the middle of the lower end of the lifting plate 5, a fixed block 12, because the screw rod 3 is connected with the lifting plate 5 through the screw thread, when the screw rod 3 rotates, the lifting plate 5 can be lifted under the assistance of the guide rod 4, so that the probe circuit board 11 can also be lifted, the screw rod 3 is connected with the top plate 10 through the bearing, the screw rod 3 is connected with the lifting plate 5 through the screw thread, the guide rod 4 is spliced with the top plate 10, the IPT cap rod 7 is connected with the slide rail 6 in a sliding way, the chip 8 is lapped with the IPT cap rod 7, the IPT cap rod 7 can be pushed by a feeding mechanism or other equipment to move on the slide rail 6, the support rod 9 is welded with the base 1, the support rod 9 is welded with the top plate 10, the probe circuit board 11 is connected with the lifting plate 5 through the screw, the probe circuit board 11 and the lifting plate 5 can be lifted synchronously, so that the test probe 13 can be lifted synchronously with the lifting plate 5, the fixed block 12 is bonded with the probe circuit board, the quantity of test probe 13 can set up as required according to the test, and when IPT hated rod 7 carried chip 8 and moved to probe circuit board 11 below, step motor 2 work drove lifter plate 5 through lead screw 3 and moves down, makes test probe 13 and chip 8 contact, and test probe 13 can carry out the multiple spot test to chip 8 like this, and is very high-efficient.

As shown in fig. 1-3, in this embodiment, the stepping motor 2 can drive the lead screw 3 to rotate during operation, and since the lead screw 3 is connected with the lifting plate 5 through threads, when the lead screw 3 rotates, the lifting plate 5 can lift with the aid of the guide rod 4, so that the probe circuit board 11 can also lift, and the test probe 13 can be rapidly contacted with the chip 8, which is very efficient.

As shown in fig. 1 to fig. 3, in this embodiment, the probe circuit board 11 and the fixing block are arranged, so that the device can perform multi-point testing on the chip 8 through a plurality of testing probes 13 at a time, and the efficiency is higher and the device is very practical.

The specific implementation process of this embodiment is as follows: the device uses external power supply, and be controlled by external equipment, IPT cap pole 7 can be promoted by feeding mechanism or other equipment and remove on slide rail 6, when IPT cap pole 7 carries chip 8 and removes to probe circuit board 11 below, step motor 2 work drives lead screw 3 and rotates, because lead screw 3 passes through threaded connection with lifter plate 5, when lead screw 3 rotates like this, lifter plate 5 can go up and down under the assistance of guide bar 4, probe circuit board 11 also can go up and down like this, make test probe 13 and chip 8 contact, test probe 13 can carry out the multiple spot test to chip 8 like this, and is very high-efficient.

The above-described embodiments are merely illustrative of the preferred embodiments of the present invention and are not intended to limit the spirit and scope of the present invention. Without departing from the design concept of the present invention, various modifications and improvements made by the technical solution of the present invention by those skilled in the art should fall into the protection scope of the present invention, and the technical contents claimed by the present invention have been fully recorded in the claims.

Claims

1. A chip test probe device is characterized in that: including base (1), step motor (2) and guide bar (4), there is one side base (1) upper end through bolted connection step motor (2), the transmission output of step motor (2) has lead screw (3) through the key-type connection, lead screw (3) one side be provided with base (1) is pegged graft guide bar (4), sliding connection has lifter plate (5) on guide bar (4).

2. The chip test probe apparatus according to claim 1, wherein: base (1) upper end middle part shaping has slide rail (6), be provided with IPT cap pole (7) in slide rail (6), IPT cap pole (7) upper end is provided with chip (8), base (1) upper end four corners department is provided with bracing piece (9), bracing piece (9) upper end is provided with roof (10), lifter plate (5) lower extreme middle part is provided with probe circuit board (11), probe circuit board (11) lower extreme middle part is provided with fixed block (12), fixed block (12) lower extreme is provided with test probe (13).

3. The chip test probe apparatus of claim 2, wherein: the screw rod (3) is connected with the top plate (10) through a bearing, and the screw rod (3) is connected with the lifting plate (5) through threads.

4. The chip test probe apparatus of claim 3, wherein: the guide rod (4) is connected with the top plate (10) in an inserting mode, the IPT cap rod (7) is connected with the sliding rail (6) in a sliding mode, and the chip (8) is connected with the IPT cap rod (7) in an overlapping mode.

5. The chip test probe apparatus of claim 4, wherein: the supporting rod (9) is welded with the base (1), and the supporting rod (9) is welded with the top plate (10).

6. The chip test probe apparatus of claim 5, wherein: the probe circuit board (11) is connected with the lifting plate (5) through screws.

7. The chip test probe apparatus of claim 6, wherein: the fixed block (12) is bonded with the probe circuit board (11) and the test probe (13), and the test probe (13) is welded with the probe circuit board (11).