CN211826337U - Integrated circuit tester connectivity detection system - Google Patents
Integrated circuit tester connectivity detection system Download PDFInfo
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- CN211826337U CN211826337U CN201921998126.7U CN201921998126U CN211826337U CN 211826337 U CN211826337 U CN 211826337U CN 201921998126 U CN201921998126 U CN 201921998126U CN 211826337 U CN211826337 U CN 211826337U
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Abstract
The utility model discloses an integrated circuit test machine connectivity detecting system, including interface circuit, inside is provided with the test circuit of a plurality of connection test machine passageways, test circuit includes: the protection circuit is used for clamping the voltage of the circuit to be tested in a proper voltage range; the circuit to be tested is used for accessing the standard diode for the connectivity test; the open circuit comparison circuit is used for comparing the voltage during open circuit and displaying the voltage by a signal lamp; the short circuit comparison circuit is used for voltage comparison and signal lamp display during short circuit; switch on the comparison circuit for voltage comparison and signal lamp display when switching on, through the utility model discloses can realize the test to integrated circuit in batches, it is nimble more convenient to test, can be used to in the integrated circuit test.
Description
Technical Field
The utility model relates to an integrated circuit, in particular to integrated circuit test machine.
Background
The integrated circuit test is often used in the chip production industry, because the hardware that the signal of telecommunication connecting channel relates to is many, and the link is long, and the phenomenon that the connectivity is not good at certain node often takes place in the actual test production link: slight defect shows that the contact impedance of the whole channel is too high, which can cause certain test misslaughter and yield loss; this puts high demands on the test system in the SETUP link of the product; only with good and stable SETUP quality can the subsequent production be ensured to be smooth; the method in the prior art comprises the following two steps of 1) using a Cal board of the original factory to carry out connectivity confirmation, but the Cal board can only diagnose the problem of a Tester test board card layer, the consumed time is usually more than 30 minutes, and the intermediate connecting circuit from the test board card to a to-be-tested product cannot be detected; 2) the addition of the DC/CR detection item in the test program sometimes fails to clarify whether the test object itself is abnormal or a certain section of the connection circuit is abnormal, and the addition of the DC & CR item in the mass production program also causes the extension of the test time and the waste of the cost.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing an integrated circuit test machine connectivity detecting system for the integrated circuit test is nimble more convenient.
The purpose of the utility model is realized like this: an integrated circuit tester connectivity detection system, includes interface circuit, the inside test circuit who is provided with a plurality of connection tester passageways that is provided with, test circuit includes:
the protection circuit is used for clamping the voltage of the circuit to be tested in a proper voltage range;
the circuit to be tested is used for accessing the standard diode for the connectivity test;
the open circuit comparison circuit is used for comparing the voltage during open circuit and displaying the voltage by a signal lamp;
the short circuit comparison circuit is used for voltage comparison and signal lamp display during short circuit;
and the conduction comparison circuit is used for voltage comparison and signal lamp display during conduction.
As a further limitation of the present invention, the open circuit comparison circuit, the short circuit comparison circuit, the conducting comparison circuit select four operational amplifiers LM324, wherein the comparison amplifier LM324-01 is used for the open circuit comparison circuit, the comparison amplifier LM324-02 and the comparison amplifier LM324-03 are used for conducting the comparison circuit, the comparison amplifier LM324-04 is used for the short circuit comparison circuit, the positive electrode of the four operational amplifiers LM324 is connected to the +5V power supply, and the negative electrode is grounded;
the open-circuit comparison circuit comprises a comparison amplifier LM324-01, wherein the input positive electrode of the comparison amplifier LM324-01 is connected with a circuit to be tested, the input negative electrode is divided into three paths, the three paths are respectively grounded through a resistor R1, connected with the input positive electrode of the comparison amplifier LM324-02 and connected with a +5V power supply through a second resistor, the output end of the comparison amplifier LM324-01 is connected with the base electrode of a triode Q1, the emitter electrode of the triode Q1 is connected with the +5V power supply through a resistor R3 and a light emitting diode LED1, and the collector electrode of the triode Q1 is grounded;
the conduction comparison circuit comprises a comparison amplifier LM324-02 and a comparison amplifier LM324-03, wherein the input cathode of the comparison amplifier LM324-02 is connected with a circuit to be tested, the output end of the comparison amplifier LM324-02 is connected with the base electrode of a triode Q2, the emitter of a triode Q2 is connected with a +5V power supply through a resistor R4 and a light emitting diode LED2, the collector of the triode Q2 is grounded, the input anode of the comparison amplifier LM324-03 is connected with a circuit to be tested, the input cathode of the comparison amplifier LM324-03 is connected with the input anode of the comparison amplifier LM324-04, and the output end of the comparison amplifier LM324-03 is connected with the base electrode of a triode Q36;
the short-circuit comparison circuit comprises a comparison amplifier LM324-04, the input anode of the comparison amplifier LM324-04 is grounded through a resistor R5 and is connected with a +5V power supply through a resistor R6, the input cathode of the comparison amplifier LM324-04 is connected with a circuit to be tested, the output end of the comparison amplifier LM324-04 is connected with the base electrode of a triode Q3, the emitter of the triode Q3 is connected with the +5V power supply through a resistor R7 and a light-emitting diode LED3, and the collector of the triode Q3 is grounded.
As the utility model discloses a further inject, each circuit channel that awaits measuring keeps somewhere a Pogo copper foil solder joint, is connected with the Pogo pin of test machine passageway.
As a further limitation of the present invention, the protection circuit is composed of diode D1, diode D2, diode D1 positive ground, diode D1 negative pole connects diode D2 positive pole, diode D2 negative pole connects +5V power, and the electrical contact between diode D1 and diode D2 connects interface circuit, connects the circuit of treating simultaneously.
As the utility model discloses a further inject, the voltage clamp system of protection circuit to be measured is between-0.7V ~5.7V, the passing voltage of circuit to be measured is about 0.6~ 0.7V.
The working principle of the utility model is as follows:
1) when the circuit is tested in an open circuit mode, current of-100 uA is extracted from a corresponding channel at the end of a tester, voltage V0 is generated at the end of a circuit to be tested at the moment, V0 is connected to the input anode of a comparison amplifier LM324-01, the input cathode of the LM324-01 is connected to a 1V constant voltage (the 1V voltage is obtained by dividing 5V Vcc through a resistor R1 and a resistor R2), if V0 is larger than 1V, 5V voltage is output by the LM324-01, a triode is driven to be conducted by Q1, R3 is a current-limiting resistor, an LED1 light-emitting diode is lighted in red, and the red light shows that the current channel is abnormally connected and an open circuit is generated;
2) during short-circuit test, current of-100 uA is extracted from a corresponding channel at the end of a tester, and at the moment, voltage V0 is generated at the end of a circuit to be tested, and V0 is connected to the input negative electrode of the comparison amplifier LM 324-04; the input anode of the LM324-04 is connected with a constant voltage of 0.2V (the 0.2V voltage is obtained by dividing 5V Vcc by a resistor R5+ a resistor R6), if V0 is less than 0.2V, the LM324-04 outputs 5V voltage, a Q3 drives a triode to be conducted, R7 is a current-limiting resistor, an LED3 is lighted in pink, and the light is lighted to indicate that the current channel is abnormally connected and a short circuit occurs;
3) the current of 100uA is extracted from a corresponding channel at the end of the tester, the voltage V0 is generated at the end of the circuit to be tested, the V0 is simultaneously connected with the input cathode of the comparison amplifier LM324-02 and the input anode of the LM324-03, the input anode of the LM324-02 is connected with a 1V constant voltage, and the input cathode of the LM324-03 is connected with a 0.2V constant voltage; if 0.2V < V0<1V, 5V voltage is output by the LM324-02 and the LM324-03, the triode is driven to be conducted by the Q2, the R4 is a current-limiting resistor, the LED2 is lighted in green, and the lighting of the green light indicates that the current channel is normally connected.
Compared with the prior art, the beneficial effects of the utility model reside in that, through the utility model discloses can realize the test to integrated circuit in batches, it is nimble more convenient to test.
Drawings
Fig. 1 is a schematic circuit diagram of the present invention.
Fig. 2 is a schematic view of the interface of the testing system of the present invention.
Fig. 3 is a schematic view showing a state during a test of the present invention.
Fig. 4 is a schematic diagram of the display state during the test of the present invention.
Fig. 5 is a third schematic view of the display state during the test of the present invention.
Detailed Description
As shown in fig. 1, the system for detecting the connectivity of an integrated circuit tester comprises an interface circuit, a plurality of test circuits connected with tester channels are arranged inside the interface circuit, a Pogo copper foil welding spot is reserved in each circuit channel to be tested of the interface circuit and is connected with a Pogo pin of the tester channel, and the test circuits comprise:
the protection circuit is used for clamping the voltage of the circuit to be tested within a proper voltage range, and consists of a diode D1 and a diode D2, wherein the anode of the diode D1 is grounded, the cathode of the diode D1 is connected with the anode of the diode D2, the cathode of the diode D2 is connected with a +5V power supply, the electrical contact point between the diode D1 and the diode D2 is connected with an interface circuit and is simultaneously connected with the circuit to be tested, and the protection circuit clamps the voltage of the circuit to be tested between-0.7V and 5.7V;
the circuit to be tested is used for being connected into the standard diode for connectivity test, and the passing voltage of the circuit to be tested is about 0.6-0.7V;
the open-circuit comparison circuit is used for comparing voltages during open circuit and displaying signal lamps, the open-circuit comparison circuit, the short-circuit comparison circuit and the conducting comparison circuit select four operational amplifiers LM324, wherein the comparison amplifier LM324-01 is used for the open-circuit comparison circuit, the comparison amplifier LM324-02 and the comparison amplifier LM324-03 are used for conducting the comparison circuit, the comparison amplifier LM324-04 is used for the short-circuit comparison circuit, the positive electrode of the four operational amplifiers LM324 is connected with a +5V power supply, and the negative electrode of the four operational amplifiers LM324 is grounded;
the short-circuit comparison circuit is used for voltage comparison and signal lamp display during short circuit, and comprises a comparison amplifier LM324-04, wherein the input anode of the comparison amplifier LM324-04 is grounded through a resistor R5 and is connected with a +5V power supply through a resistor R6, the input cathode of the comparison amplifier LM324-04 is connected with a circuit to be tested, the output end of the comparison amplifier LM324-04 is connected with a base electrode of a triode Q3, an emitter electrode of the triode Q3 is connected with the +5V power supply through a resistor R7 and a light emitting diode LED3, and a collector electrode of the triode Q3 is grounded;
the conduction comparison circuit is used for voltage comparison and signal lamp display during conduction, and comprises a comparison amplifier LM324-02 and a comparison amplifier LM324-03, wherein the input negative electrode of the comparison amplifier LM324-02 is connected with a circuit to be tested, the output end of the comparison amplifier LM324-02 is connected with the base electrode of a triode Q2, the emitter electrode of a triode Q2 is connected with a +5V power supply through a resistor R4 and a light emitting diode LED2, the collector electrode of the triode Q2 is grounded, the input positive electrode of the comparison amplifier LM324-03 is connected with the circuit to be tested, the input negative electrode of the comparison amplifier LM324-03 is connected with the input positive electrode of the comparison amplifier LM324-04, and the output end of the comparison amplifier LM324-03 is connected with.
As shown in fig. 2, the UI development interface of the testing machine provides a DC-SETUP button on the main interface, and clicking the button can call out a DC-SETUP main interface DCSETUP interface which mainly includes four areas of measurement result dynamic display/measurement parameter setting/DATALOG dynamic display/execution button, so as to perform manual/automatic DC and CR measurement, and save the measurement result as a file, and control the testing machine to perform connectivity test on the testing circuit through the button, which only needs 30 seconds to complete the test.
The three diagrams shown in FIGS. 3-5 are typical pictures of Open Show/First pin Contact/Full pin Contact during DC SETUP.
The present invention is not limited to the above embodiments, and based on the technical solutions disclosed in the present invention, those skilled in the art can make some replacements and transformations for some technical features without creative labor according to the disclosed technical contents, and these replacements and transformations are all within the protection scope of the present invention.
Claims (5)
1. The utility model provides an integrated circuit test machine connectivity detecting system which characterized in that, includes interface circuit, and inside is provided with a plurality of test circuit of connecting the test machine passageway, test circuit includes:
the protection circuit is used for clamping the voltage of the circuit to be tested in a proper voltage range;
the circuit to be tested is used for accessing the standard diode for the connectivity test;
the open circuit comparison circuit is used for comparing the voltage during open circuit and displaying the voltage by a signal lamp;
the short circuit comparison circuit is used for voltage comparison and signal lamp display during short circuit;
and the conduction comparison circuit is used for voltage comparison and signal lamp display during conduction.
2. The system of claim 1, wherein the open-circuit comparator, the short-circuit comparator, and the conducting comparator select four operational amplifiers LM324, wherein the comparator LM324-01 is used for the open-circuit comparator, the comparator LM324-02 and the comparator LM324-03 are used for conducting the comparator, the comparator LM324-04 is used for the short-circuit comparator, the positive electrode of the four operational amplifiers LM324 is connected to the +5V power supply, and the negative electrode is grounded;
the open-circuit comparison circuit comprises a comparison amplifier LM324-01, wherein the input positive electrode of the comparison amplifier LM324-01 is connected with a circuit to be tested, the input negative electrode is divided into three paths, the three paths are respectively grounded through a resistor R1, connected with the input positive electrode of the comparison amplifier LM324-02 and connected with a +5V power supply through a second resistor, the output end of the comparison amplifier LM324-01 is connected with the base electrode of a triode Q1, the emitter electrode of the triode Q1 is connected with the +5V power supply through a resistor R3 and a light emitting diode LED1, and the collector electrode of the triode Q1 is grounded;
the conduction comparison circuit comprises a comparison amplifier LM324-02 and a comparison amplifier LM324-03, wherein the input cathode of the comparison amplifier LM324-02 is connected with a circuit to be tested, the output end of the comparison amplifier LM324-02 is connected with the base electrode of a triode Q2, the emitter of a triode Q2 is connected with a +5V power supply through a resistor R4 and a light emitting diode LED2, the collector of the triode Q2 is grounded, the input anode of the comparison amplifier LM324-03 is connected with a circuit to be tested, the input cathode of the comparison amplifier LM324-03 is connected with the input anode of the comparison amplifier LM324-04, and the output end of the comparison amplifier LM324-03 is connected with the base electrode of a triode Q36;
the short-circuit comparison circuit comprises a comparison amplifier LM324-04, the input anode of the comparison amplifier LM324-04 is grounded through a resistor R5 and is connected with a +5V power supply through a resistor R6, the input cathode of the comparison amplifier LM324-04 is connected with a circuit to be tested, the output end of the comparison amplifier LM324-04 is connected with the base electrode of a triode Q3, the emitter of the triode Q3 is connected with the +5V power supply through a resistor R7 and a light-emitting diode LED3, and the collector of the triode Q3 is grounded.
3. The system of claim 2, wherein each circuit channel under test of the interface circuit has one Pogo copper foil pad reserved for connection to a Pogo pin of a tester channel.
4. The system as claimed in claim 3, wherein the protection circuit is composed of a diode D1 and a diode D2, the anode of the diode D1 is grounded, the cathode of the diode D1 is connected with the anode of the diode D2, the cathode of the diode D2 is connected with a +5V power supply, and the electrical contact point between the diode D1 and the diode D2 is connected with an interface circuit and a circuit to be tested.
5. The system of claim 4, wherein the protection circuit clamps a voltage of the circuit under test between-0.7V and 5.7V, and a pass voltage of the circuit under test is about 0.6V to 0.7V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921998126.7U CN211826337U (en) | 2019-11-19 | 2019-11-19 | Integrated circuit tester connectivity detection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921998126.7U CN211826337U (en) | 2019-11-19 | 2019-11-19 | Integrated circuit tester connectivity detection system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211826337U true CN211826337U (en) | 2020-10-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921998126.7U Active CN211826337U (en) | 2019-11-19 | 2019-11-19 | Integrated circuit tester connectivity detection system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211826337U (en) |
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2019
- 2019-11-19 CN CN201921998126.7U patent/CN211826337U/en active Active
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