CN211785099U - Diffuse reflection spectrum measurement sample rack for spectrometer of integrating sphere detector - Google Patents
Diffuse reflection spectrum measurement sample rack for spectrometer of integrating sphere detector Download PDFInfo
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- CN211785099U CN211785099U CN202020196089.4U CN202020196089U CN211785099U CN 211785099 U CN211785099 U CN 211785099U CN 202020196089 U CN202020196089 U CN 202020196089U CN 211785099 U CN211785099 U CN 211785099U
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- 238000005259 measurement Methods 0.000 title claims abstract description 20
- 238000001228 spectrum Methods 0.000 title abstract description 10
- 238000000926 separation method Methods 0.000 claims abstract description 23
- 238000001055 reflectance spectroscopy Methods 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 10
- 239000011248 coating agent Substances 0.000 claims description 7
- 238000000576 coating method Methods 0.000 claims description 7
- 230000000903 blocking effect Effects 0.000 claims description 2
- 238000012360 testing method Methods 0.000 abstract description 14
- 238000009434 installation Methods 0.000 abstract description 2
- 230000003595 spectral effect Effects 0.000 description 6
- 239000011521 glass Substances 0.000 description 4
- 239000007787 solid Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- -1 polytetrafluoroethylene Polymers 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 239000002390 adhesive tape Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
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Abstract
The utility model relates to a diffuse reflection spectrum measurement sample holder for an integrating sphere detector spectrometer, which comprises a baffle, a bracket and a nut; the separation blade passes through the opening part of support and inserts the support and fixed, and the sample is put into the through-hole position department at separation blade center, and the test of diffuse reflection spectrum can be carried out to the fixed sample of tight nut through turning round to the screw in nut. The utility model overcomes sample size is less than the difficulty that can not test or can not the accurate test that the total mark ball sample side reflection of light mouth size brought, and the accessible changes the separation blade of different through-hole sizes in order to adapt to not unidimensional sample. The utility model discloses simple structure, installation are easy, convenient operation.
Description
Technical Field
The utility model belongs to the technical field of the diffuse reflection spectral detection, concretely relates to diffuse reflection spectral measurement sample holder for taking integrating sphere detector spectrum appearance is particularly useful for the sample holder of the ultraviolet visible near infrared spectrophotometer who disposes the integrating sphere.
Background
The spectrophotometer system is not limited to detecting liquid samples, but is also essential to testing solid samples. However, due to the size and shape of the solid sample, the size of the light spot of the light beam passing through the solid sample may change, and even may shift and scatter, if the scattered light directly enters the detector, the scattered light may easily hit different positions of the detector, and due to the great difference in sensitivity of different positions of the detector to the light intensity, the accuracy of the detection result may be reduced and high noise may be caused. The integrating sphere can homogenize scattered light, and the shape and the position of a light beam received by a photoelectric surface of the detector are almost consistent every time, so that the testing precision is improved, and many ultraviolet-visible near-infrared spectrophotometers are provided with an integrating sphere detector system at present.
The integrating sphere is a hollow sphere coated with diffuse reflection materials inside, the outside is generally of a metal shell structure, and a plurality of test holes are formed in the central horizontal line of the shell. According to different specifications of the integrating sphere, the test hole has two designs, namely a four-opening design and a two-opening design, the four-opening integrating sphere is commonly designed into two groups of windows, each group comprises two light openings, one light inlet and one light reflecting opening, one group of windows is used as a sample light beam, and the other group of windows is used as a reference light beam. Regardless of the design specification, when diffuse reflectance spectroscopy is performed, a sample needs to be placed at the sample-side light-reflecting port.
The reflecting port of the integrating sphere is usually larger, the diameter of the reflecting port of the existing ultraviolet visible near-infrared spectrophotometer in our laboratory is a round hole of 2 cm, and the reflecting port of some integrating spheres reaches 4 cm, but in the actual experimental process, many samples cannot be prepared to be large, some samples are extremely small in size and even irregular in shape, so that some samples cannot be tested; some samples and the glass slides are placed at the reflecting ports at the sides of the samples for testing after being adhered to the glass slides by double faced adhesive tapes for fixing, so that light beams can be emitted out of the integrating sphere through the glass slides and cannot be integrated with the integrating sphere, and in addition, the information of the glass slides is included in the sample information, so that the obtained test result is not accurate.
Disclosure of Invention
In order to solve the technical problem, the utility model provides a diffuse reflection spectral measurement sample frame for integrating sphere detector spectrum appearance, the separation blade of this sample frame select with the same material of integrating sphere internal coating (for example polytetrafluoroethylene), and be the through-hole in the middle of the separation blade, can select the separation blade of corresponding through-hole according to the size of test sample, place the sample in separation blade through-hole department, fix the back through nut screw in support with the sample and test, so the utility model discloses can satisfy the diffuse reflection spectral test demand of not unidimensional, shape sample.
In order to achieve the above object, the utility model provides a diffuse reflection spectrum measurement sample holder for integrating sphere detector spectrometer, which comprises a baffle plate, a bracket and a nut; the material of the baffle sheet is consistent with that of the inner coating of the integrating sphere, the baffle sheet comprises a sample placing layer and a convex layer, the convex layer is arranged on one side of the sample placing layer, a baffle sheet through hole is arranged in the center of the baffle sheet, the center of the bracket is provided with a threaded hole, a middle layer through hole and a lower layer through hole from top to bottom, the threaded hole is matched with the nut, the lower layer through hole is matched with the convex layer, the baffle sheet is placed in the bracket through the threaded hole, the sample placing layer is arranged in the middle layer through hole, the convex layer is clamped in the lower layer through hole to realize the positioning and fixing of the baffle sheet, the sample is placed on the sample placing layer, the nut is screwed into a threaded hole of the support to compress a sample for fixing, the size of the lower-layer through hole is larger than that of the integrating sphere sample side reflecting opening (the length of the narrowest part of the lower-layer through hole is larger than the diameter of the integrating sphere sample side reflecting opening), and the size of the threaded hole is larger than that of the middle-layer through hole.
The sample placing layer is nested in the middle layer through hole, and the size and the thickness of the middle layer through hole are not smaller than those of the sample placing layer.
The sample is a regular sheet, block or a formed body obtained by tabletting powder, and is arranged on the sample placing layer through a straight threaded hole on the upper layer of the bracket.
In order to facilitate the separation blade to be packed into and taken out from the bracket, the utility model discloses still provide following scheme simultaneously: a diffuse reflection spectrum measurement sample holder for an integrating sphere detector spectrometer comprises a baffle plate, a support and a nut; the separation blade material is unanimous with the interior coating material of integrating sphere, and the separation blade includes that the sample places layer and protruding layer, and the protruding layer is located the sample and is placed one side on layer, and the separation blade center is equipped with the separation blade through-hole, support center department top-down is equipped with screw hole, middle level through-hole and lower floor's through-hole, the screw hole cooperatees with the nut, be equipped with the opening on the lateral wall of middle level through-hole, lower floor's through-hole cooperatees with protruding layer, the separation blade is put into the support through the opening in, and the sample is placed the layer and is arranged the middle level through-hole in, and protruding layer card goes into the lower floor through-hole, realizes the location and the fixed of separation blade, and the sample is placed on.
The sample placing layer is nested in the middle layer through hole, the size of the middle layer through hole is not smaller than that of the sample placing layer, and the thickness of the middle layer through hole is larger than the sum of the thicknesses of the sample placing layer and the protruding layer.
The sample is a sheet, a block or a formed body obtained by tabletting powder, the sample can be inserted into the middle layer opening according to the size or is arranged on the sample placing layer through the straight threaded hole on the upper layer of the bracket, and the baffle through hole is shielded (the size of the sample is larger than that of the baffle through hole), for example, the sample with regular shape is arranged on the sample placing layer through the straight threaded hole on the upper layer of the bracket, and the sample with irregular shape is inserted into the middle layer opening and is arranged on the sample placing layer.
Preferably, the size of the threaded hole is smaller than that of the middle-layer through hole, so that the size of the sample frame can be reduced, the overall weight is reduced, and the support is more favorably fixed during testing.
The perimeter of the side wall of the middle layer through hole, which is not provided with the opening, is less than half of the perimeter of the side wall of the middle layer through hole, so that a separation blade can be conveniently inserted.
The utility model discloses in two kinds of schemes, the size and the thickness on protruding layer are the same with the size and the thickness of lower floor's through-hole.
The baffle through hole penetrates through the centers of the sample placing layer and the protruding layer.
The separation blade through-hole is cylinder or cuboid or square, middle level through-hole and lower floor's through-hole are cylinder or cuboid or square, the structure of sample placement layer and protruding layer changes along with the change of middle level through-hole and lower floor's through-hole respectively.
The support is cylindrical, cuboid or cubic.
The nut comprises a screw cap and a stud, and vertical stripes are arranged on the outer surface of the screw cap; the front end of the stud is a thread which is matched with a threaded hole on the upper layer of the bracket, and the length of the thread is longer than the depth of the threaded hole on the upper layer of the bracket.
The beneficial effects of the utility model are that the utility model provides a diffuse reflection spectral measurement sample frame for integrating sphere detector spectrum appearance, sample are arranged in the sample and are placed the layer after, and the separation blade can cover integrating sphere sample side reflection of light mouth completely with the sample, and the material of separation blade is the same with the inside coating material of integrating sphere, so and original integrating sphere formation integration, can realize that the size is less than the diffuse reflection spectral's of integrating sphere reflection of light mouth size sample accurate measurement. Through changing the separation blade of different through-hole sizes, can satisfy the test of different size and shape samples, and this support simple structure, installation are easy, convenient operation.
Drawings
FIG. 1 is a structural diagram of the present invention
FIG. 2 is a cross-sectional view of the present invention;
fig. 3 is an isometric view, a bottom view and a side view of a baffle plate of the present invention;
fig. 4 is an isometric view, a cross-sectional view, a bottom view, a side view, and a top view of a bracket according to the present invention;
fig. 5 is an isometric view, a bottom view, and a side view of the nut of the present invention;
wherein, 1 is the sample and places the layer, 2 is protruding layer, 3 is the nut, 4 are the separation blade through-hole, 5 are the screw hole, 6 are middle level through-hole, 7 are lower floor's through-hole, 8 are the spiral shell lid, 9 are the double-screw bolt.
Detailed Description
Example 1
As shown in fig. 1-5, a diffuse reflection spectrum measurement sample holder for an integrating sphere detector spectrometer comprises a baffle plate, a bracket with a cylindrical shape and a nut 3; the baffle is made of polytetrafluoroethylene and is consistent with a coating material in an integrating sphere of an ultraviolet-visible near-infrared spectrophotometer, the baffle comprises a sample placing layer 1 and a protruding layer 2, the protruding layer 2 is arranged on one side of the sample placing layer 1, the sample placing layer 1 and the protruding layer 2 are of coaxial cylindrical structures with different radiuses, a baffle through hole 4 is formed in the center of the baffle, the baffle through hole 4 penetrates through the centers of the sample placing layer 1 and the protruding layer 2, the baffle through hole 4 is a cylinder, and the thickness of the baffle through hole is 1 mm; a threaded hole 5, a middle layer through hole 6 and a lower layer through hole 7 are formed in the center of the support from top to bottom, the threaded hole 5 is a straight threaded hole of a filament, the threaded hole 5 is matched with a nut 3, the outer surface of the threaded hole is designed to be a circumferential vertical stripe, an opening is formed in the side wall of the middle layer through hole 6, the lower layer through hole 7 is matched with the protruding layer 2, the size and the thickness of the protruding layer 2 are the same as those of the lower layer through hole 7, the baffle is placed in the support through the opening, the sample placing layer 1 is nested in the middle layer through hole 6, the protruding layer 2 is clamped in the lower layer through hole 7, positioning and fixing of the baffle are achieved, the sample is placed on the sample placing layer 1 and shields the baffle through hole 4; the middle layer through hole 6 and the lower layer through hole 7 are cylinders, the diameter of the lower layer through hole 7 is larger than the diameter of the integrating sphere sample side reflecting opening, the diameter of the threaded hole 5 is smaller than the diameter of the middle layer through hole 7, so that the fixing of the support is facilitated, the circumference of the non-open side wall of the middle layer through hole 6 is smaller than half of the circumference of the side wall of the middle layer through hole, so that a blocking piece can be conveniently inserted, the diameter of the middle layer through hole 6 is not smaller than the diameter of the sample placing layer 1, and the thickness of the middle layer through hole 6 is larger than the sum of the thicknesses of. The nut 3 comprises a screw cap 8 and a stud 9, the screw cap 8 is a cylinder, the diameter of the cylinder is the same as the outer diameter of the support, and the outer surface of the cylinder is designed with vertical stripes to increase the roughness; the lower end of the stud 9 is provided with a thread, and the length of the thread is larger than the depth of the threaded hole 5 on the upper layer of the bracket.
Claims (10)
1. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer, characterized by: comprises a baffle plate, a bracket and a nut (3); the material of the baffle is consistent with that of the inner coating of the integrating sphere, the baffle comprises a sample placing layer (1) and a convex layer (2), the convex layer (2) is arranged on one side of the sample placing layer (1), and a baffle through hole (4) is formed in the center of the baffle; support center department top-down is equipped with screw hole (5), middle level through-hole (6) and lower floor's through-hole (7), screw hole (5) cooperate with nut (3), lower floor's through-hole (7) cooperate with protruding layer (2), the separation blade is put into the support through screw hole (5) in, and middle level through-hole (6) are arranged in to layer (1) is placed to the sample, and protruding layer (2) card is gone into lower floor's through-hole (7), and the sample is placed on layer (1) is placed to the sample, nut (3) screw in screw hole (5) compress tightly the sample and fix, the size of lower floor's through-hole (7) is greater than the size of integrating sphere sample side reflection of light mouth, the size of screw hole (5) is greater than the.
2. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer as claimed in claim 1 wherein: the sample placing layer (1) is nested in the middle layer through hole (6), and the size and the thickness of the middle layer through hole (6) are not smaller than those of the sample placing layer (1).
3. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer, characterized by: comprises a baffle plate, a bracket and a nut (3); the material of the baffle is consistent with that of the inner coating of the integrating sphere, the baffle comprises a sample placing layer (1) and a convex layer (2), the convex layer (2) is arranged on one side of the sample placing layer (1), and a baffle through hole (4) is formed in the center of the baffle; support center department top-down is equipped with screw hole (5), middle level through-hole (6) and lower floor's through-hole (7), screw hole (5) cooperate with nut (3), be equipped with the opening on the lateral wall of middle level through-hole (6), lower floor's through-hole (7) cooperate with protruding layer (2), the separation blade is put into the support through the opening in, and the sample is placed layer (1) and is arranged middle level through-hole (6) in, and protruding layer (2) card goes into lower floor's through-hole (7), and the sample is placed on layer (1) is placed to the sample, nut (3) screw in screw hole (5) compress tightly the sample and fix, the size of lower floor's through-hole (7) is greater than the size of.
4. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer as claimed in claim 3 wherein: the size of the threaded hole (5) is smaller than that of the middle layer through hole (6).
5. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer as claimed in claim 3 wherein: the perimeter of the non-open side wall of the middle layer through hole (6) is less than half of the perimeter of the side wall of the middle layer through hole (6), so that a blocking piece can be conveniently inserted.
6. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer as claimed in claim 3 wherein: the sample placing layer (1) is nested in the middle layer through hole (6), and the size of the middle layer through hole (6) is not smaller than that of the sample placing layer (1); the thickness of the middle layer through hole (6) is larger than the sum of the thicknesses of the sample placing layer (1) and the protruding layer (2).
7. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer as claimed in any one of claims 1 to 6 wherein: the size and the thickness of the protruding layer (2) are the same as those of the lower-layer through hole (7).
8. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer as claimed in any one of claims 1 to 6 wherein: the baffle through hole (4) penetrates through the centers of the sample placing layer (1) and the protruding layer (2).
9. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer as claimed in any one of claims 1 to 6 wherein: separation blade through-hole (4) are cylinder or cuboid or square, middle level through-hole (6) and lower floor through-hole (7) are cylinder or cuboid or square, the structure of sample placement layer (1) and protruding layer (2) changes along with the change of middle level through-hole (6) and lower floor through-hole (7) respectively.
10. A diffuse reflectance spectroscopy measurement sample holder for an integrating sphere detector spectrometer as claimed in any one of claims 1 to 6 wherein: the nut (3) comprises a screw cap (8) and a stud (9), and vertical stripes are arranged on the outer surface of the screw cap (8); the length of the thread on the stud (9) is longer than the depth of the threaded hole (5) of the bracket.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020196089.4U CN211785099U (en) | 2020-02-23 | 2020-02-23 | Diffuse reflection spectrum measurement sample rack for spectrometer of integrating sphere detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020196089.4U CN211785099U (en) | 2020-02-23 | 2020-02-23 | Diffuse reflection spectrum measurement sample rack for spectrometer of integrating sphere detector |
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| Publication Number | Publication Date |
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| CN211785099U true CN211785099U (en) | 2020-10-27 |
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| CN202020196089.4U Active CN211785099U (en) | 2020-02-23 | 2020-02-23 | Diffuse reflection spectrum measurement sample rack for spectrometer of integrating sphere detector |
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