CN211741127U - Glow wire testing machine convenient to centre gripping - Google Patents
Glow wire testing machine convenient to centre gripping Download PDFInfo
- Publication number
- CN211741127U CN211741127U CN201922348413.XU CN201922348413U CN211741127U CN 211741127 U CN211741127 U CN 211741127U CN 201922348413 U CN201922348413 U CN 201922348413U CN 211741127 U CN211741127 U CN 211741127U
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- Prior art keywords
- frame
- anchor clamps
- fixing
- clamp
- clamping
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- Expired - Fee Related
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- 238000012360 testing method Methods 0.000 title claims abstract description 25
- 238000002474 experimental method Methods 0.000 abstract description 10
- 238000009434 installation Methods 0.000 abstract description 6
- 238000013461 design Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 4
- 239000007787 solid Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
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Abstract
The utility model provides a glowing filament testing machine convenient to centre gripping, includes quick-witted case and anchor clamps frame, the upper end of machine case is fixed with the air exit, and the lower extreme of machine case is provided with the area universal wheel of stopping, the inboard middle-end of machine case is provided with the observation window, and the inside of machine case is fixed with the laboratory bench, the right-hand member of laboratory bench is connected with electrically conductive pillar, and electrically conductive pillar's upper end is connected with the glowing filament, the anchor clamps frame sets up in the middle part upper end of laboratory bench, and the right side outward appearance wall of anchor clamps frame is connected with fixed frame, the inside of anchor clamps frame is provided with the card. This glowing filament testing machine convenient to centre gripping is provided with the sample wafer anchor clamps to be provided with a plurality of fixed orifices on the sample wafer anchor clamps, such design is convenient for adjust centre gripping scope and position according to the size of sample wafer, compares in anchor clamps on the market, and so not only mounting structure is simple, and the installation rate is fast, and can provide the required stability of experiment equally.
Description
Technical Field
The utility model relates to a testing machine technical field specifically is a glowing filament testing machine convenient to centre gripping.
Background
The parts of insulating materials or other solid combustible materials which are easy to spread flame in the equipment can be ignited by a glow wire or a glow element, under certain conditions, such as fault current flowing through a lead wire, element overload and poor contact, certain elements reach a certain temperature to ignite the parts nearby, and a glow wire tester evaluates the ignition risk of thermal stress caused by heat sources such as the glow element or overload resistor in a short time by using a simulation technology, and is suitable for electrical and electronic equipment and the elements and parts thereof, and is also suitable for solid electrical insulating materials or other solid combustible materials.
The glowing filament testing machine sample wafer clamping structure on the market is complex, when the experiment is carried out, the sample wafer installation speed is slow, the experiment process is influenced, and the application range of the clamping structure is small.
Disclosure of Invention
An object of the utility model is to provide a glowing filament testing machine convenient to centre gripping to the glowing filament testing machine sample wafer clamping structure who provides in solving above-mentioned background art is complicated, when experimenting, sample wafer installation rate is slow, influences the experiment process, and the little problem of clamping structure application scope.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a glowing filament testing machine convenient to centre gripping, includes quick-witted case and anchor clamps frame, the upper end of machine case is fixed with the air exit, and the lower extreme of machine case is provided with the area universal wheel of stopping, the inboard middle-end of machine case is provided with the observation window, and the inside of machine case is fixed with the laboratory bench, the right-hand member of laboratory bench is connected with electrically conductive pillar, and electrically conductive pillar's upper end is connected with the glowing filament, the anchor clamps frame sets up in the middle part upper end of laboratory bench, and the right side outward appearance wall of anchor clamps frame is connected with fixed frame, the inside of anchor clamps frame is provided with the card.
Preferably, the clamp frame comprises a sample clamp and a fixing hole, the sample clamp is arranged in the clamp frame, and the fixing hole is formed in the sample clamp.
Preferably, the fixing holes are distributed at equal intervals, and the sample clamp is of a hollow structure.
Preferably, the fixed frame comprises a telescopic frame, a fixed rod and a clamping groove, the telescopic frame is arranged inside the fixed frame, the fixed rod is connected to the outer side of the fixed frame, and the clamping groove is formed in the fixed rod.
Preferably, the number of the telescopic frames and the number of the fixed rods are four, and the telescopic frames and the fixed rods are symmetrical about the central point of the fixed frame.
Preferably, the card and the clamp frame form a movable connection, and the external shape structure of the card is matched with the internal shape structure of the sample clamp.
Compared with the prior art, the beneficial effects of the utility model are that:
1. the glowing filament testing machine convenient to clamp is provided with the sample wafer clamp, and the sample wafer clamp is provided with the plurality of fixing holes, so that the clamping range and the clamping position can be conveniently adjusted according to the size of the sample wafer, and compared with the clamp on the market, the glowing filament testing machine convenient to clamp is simple in mounting structure and high in mounting speed, and can also provide the stability required by the experiment;
2. the frames of the fixing frame are combined by adopting the telescopic frames, the length of any side of the fixing frame can be adjusted by the structure, when the fixing frame faces experimental sample sheets with different shapes, the shape of the experimental sample sheets can be met by adjusting the telescopic frames, the application range of the device is greatly improved, and the profile connection formed between the telescopic frames and the experimental sample sheets enables the fixing structure to be more stable;
3. in order to satisfy the effect that the device can reach quick centre gripping, so for pin junction between fixed orifices and the dead lever, for making pin junction stable, the card sets up inside the sample wafer anchor clamps, and the draw-in groove can be gone into to the card, can avoid dead lever and sample wafer anchor clamps to drop appearing in the centre gripping process.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the structure of the clamping device of the present invention;
FIG. 3 is a schematic view of the card structure of the present invention;
fig. 4 is a schematic view of the structure of the fixing rod of the present invention.
In the figure: 1. a chassis; 2. an air outlet; 3. universal wheels with brakes; 4. an observation window; 5. a laboratory bench; 6. a conductive pillar; 7. a glow wire; 8. a clamp frame; 801. a sample wafer clamp; 802. a fixing hole; 9. a fixing frame; 901. a telescoping frame; 902. fixing the rod; 903. a card slot; 10. a card; 11. and (4) a pin.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-4, the present invention provides a technical solution: a glowing filament testing machine convenient for clamping comprises a case 1, an air outlet 2, universal wheels 3 with brakes, an observation window 4, a test bench 5, a conductive support 6, a glowing filament 7, a clamp frame 8, a sample clamp 801, a fixing hole 802, a fixing frame 9, a telescopic frame 901, a fixing rod 902, a clamping groove 903, a card 10 and a pin 11, wherein the air outlet 2 is fixed at the upper end of the case 1, the lower end of the case 1 is provided with a universal wheel 3 with a brake, the middle end of the inner side of the case 1 is provided with an observation window 4, and the inner part of the case 1 is fixed with an experiment table 5, the right end of the experiment table 5 is connected with a conductive support 6, the upper end of the conductive support 6 is connected with a glow wire 7, a clamp frame 8 is arranged at the upper end of the middle part of the experiment table 5, the outer wall of the right side of the clamp frame 8 is connected with a fixing frame 9, a clamping piece 10 is arranged inside the clamp frame 8, and a pin 11 is fixed at the upper end of the clamping piece 10;
the fixture frame 8 comprises the sample wafer fixture 801 and the fixing holes 802, the sample wafer fixture 801 is arranged inside the fixture frame 8, the fixing holes 802 are arranged inside the sample wafer fixture 801, the fixing holes 802 are distributed at equal intervals, the interior of the sample wafer fixture 801 is of a hollow structure, the glow wire testing machine convenient to clamp is provided with the sample wafer fixture 801, the sample wafer fixture 801 is provided with the fixing holes 802, the design facilitates the adjustment of the clamping range and position according to the size of the sample wafer, and compared with fixtures on the market, the glow wire testing machine convenient to clamp is simple in installation structure and high in installation speed and can also provide stability required by experiments;
the fixing frame 9 comprises a telescopic frame 901, fixing rods 902 and clamping grooves 903, the telescopic frame 901 is arranged inside the fixing frame 9, the fixing rods 902 are connected to the outer side of the fixing frame 9, the clamping grooves 903 are formed in the fixing rods 902, the four telescopic frames 901 and the four fixing rods 902 are arranged, the telescopic frames 901 and the fixing rods 902 are symmetrical about the central point of the fixing frame 9, the frames of the fixing frame 9 are combined by adopting the telescopic frames 901, the length of any side of the fixing frame 9 can be adjusted by the aid of the structure, when the fixing frame is used for experimental sample sheets with different shapes, the shape of the experimental sample sheets can be met by adjusting the telescopic frames 901, the application range of the device is greatly improved, and the fixing structure is more stable due to molded surface connection formed between the telescopic frames 901 and the experimental sample;
the card 10 and the clamp frame 8 are movably connected, the external shape structure of the card 10 is matched with the internal shape structure of the sample wafer clamp 801, and in order to meet the requirement that the device can achieve the effect of rapid clamping, pin connection is formed between the fixing hole 802 and the fixing rod 902, in order to enable the pin connection to be stable, the card 10 is arranged inside the sample wafer clamp 801, the card 10 can be clamped into the clamping groove 903, and the phenomenon that the fixing rod 902 and the sample wafer clamp 801 fall off in the clamping process can be avoided.
The working principle is as follows: for the glowing filament testing machine convenient for clamping, firstly, an experimental sample is installed in a fixing frame 9, the shape structure of the fixing frame 9 is matched with the shape structure of the experimental sample by adjusting a telescopic frame 901, then a fixing rod 902 is clamped in a fixing hole 802, a sample clamp 801 is connected with the fixing frame 9, after the experimental sample is tightly attached to the sample clamp 801, a card 10 is pushed, the card 10 is clamped in a clamping groove 903, and a pin 11 is clamped in a clamp frame 8, so that the stable connection between the fixing frame 9 and the sample clamp 801 is ensured, the separation of the experimental sample from the sample clamp 801 during glowing filament test is prevented, and thus, the installation of the experimental sample is completed, compared with the glowing filament testing machine in the market, the glowing filament testing machine has a complex clamping structure and no adjustable structure, the clamping stability can not be kept the same when the experimental samples in different shapes are clamped, and the experimental result is influenced, after experimental sample piece centre gripping was accomplished, start the device, make 6 circular telegrams of conductive support and heating glowing filament 7, after glowing filament 7 heats the uniform temperature, make anchor clamps frame 8 slowly be close to glowing filament 7, then through the change of 4 observation test sample pieces of observation window, after the experiment was accomplished, through exhaust outlet 2 with quick-witted incasement 1 exhaust can, accomplish the whole glowing filament testing machine's of centre gripping of being convenient for use like this.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides a glowing filament testing machine convenient to centre gripping, includes quick-witted case (1) and anchor clamps frame (8), its characterized in that: the utility model discloses a test bench, including quick-witted case (1), the upper end of quick-witted case (1) is fixed with air exit (2), and the lower extreme of quick-witted case (1) is provided with the area universal wheel (3) of stopping, the inboard middle-end of quick-witted case (1) is provided with observation window (4), and the inside of quick-witted case (1) is fixed with laboratory bench (5), the right-hand member of laboratory bench (5) is connected with electrically conductive pillar (6), and the upper end of electrically conductive pillar (6) is connected with glow wire (7), anchor clamps frame (8) set up in the middle part upper end of laboratory bench (5), and the right side outward appearance wall of anchor clamps frame (8) is connected with fixed frame (9), the inside of anchor clamps frame (8) is provided with card (.
2. The glow wire tester convenient for clamping as claimed in claim 1, wherein: the clamp frame (8) comprises a sample clamp (801) and a fixing hole (802), the sample clamp (801) is arranged inside the clamp frame (8), and the fixing hole (802) is arranged inside the sample clamp (801).
3. The glow wire tester convenient for clamping as claimed in claim 2, wherein: the fixing holes (802) are distributed at equal intervals, and the sample clamp (801) is hollow.
4. The glow wire tester convenient for clamping as claimed in claim 1, wherein: the fixing frame (9) comprises a telescopic frame (901), a fixing rod (902) and a clamping groove (903), the telescopic frame (901) is arranged inside the fixing frame (9), the fixing rod (902) is connected to the outer side of the fixing frame (9), and the clamping groove (903) is formed inside the fixing rod (902).
5. The glow wire tester facilitating clamping of the test strip of claim 4, wherein: the number of the telescopic frames (901) and the number of the fixing rods (902) are four, and the telescopic frames (901) and the fixing rods (902) are symmetrical about the center point of the fixing frame (9).
6. The glow wire tester convenient for clamping as claimed in claim 1, wherein: the card (10) is movably connected with the clamp frame (8), and the external shape structure of the card (10) is matched with the internal shape structure of the sample clamp (801).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922348413.XU CN211741127U (en) | 2019-12-24 | 2019-12-24 | Glow wire testing machine convenient to centre gripping |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922348413.XU CN211741127U (en) | 2019-12-24 | 2019-12-24 | Glow wire testing machine convenient to centre gripping |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211741127U true CN211741127U (en) | 2020-10-23 |
Family
ID=72869398
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922348413.XU Expired - Fee Related CN211741127U (en) | 2019-12-24 | 2019-12-24 | Glow wire testing machine convenient to centre gripping |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211741127U (en) |
-
2019
- 2019-12-24 CN CN201922348413.XU patent/CN211741127U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20201023 |