CN211696676U - Rotary spectral imaging-polarization measurement system - Google Patents
Rotary spectral imaging-polarization measurement system Download PDFInfo
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Abstract
The utility model discloses a rotary spectral imaging-polarization measurement system, which comprises a polarization module, an imaging spectral module and a photosensitive chip; the polarization module changes the polarization state of the reflected light of the object to be measured by rotating the polarizer and the wave plate; the imaging spectrum module diffracts and splits light reflected by a linear area corresponding to the slit of the object to be measured, and the light splitting and diffracting light is shot by the photosensitive chip; the electric rotating platform controls the rotation angle of the imaging spectrum module to rotate, the object to be detected is scanned and imaged in a rotating mode, and a two-dimensional image and one-dimensional spectrum information of the object to be detected are obtained. The utility model discloses a combine together imaging spectrum and polarization imaging, can obtain the determinand piece polarization information under continuous wavelength channel, overcome the obvious limitation that traditional type muller matrix polarization imaging technique can only form images under the single wave band.
Description
Technical Field
The utility model relates to a rotation type spectral imaging-polarization measurement system.
Background
At present, an imaging spectrometer is based on a multi-channel spectrum technology, integrates optical imaging and spectrum measurement, and can simultaneously acquire image information and corresponding spectrum information of a target. The imaging spectrometer can analyze, measure and process the structure and the components of a substance, has the advantages of high analysis precision, wide measurement range and the like, and is widely applied to the fields of petroleum, materials, agriculture, geological exploration, biochemistry, medical sanitation, environmental protection, safety detection and the like. At present, imaging spectrometers are classified into a sweep imaging spectrometer, a broom-pushing imaging spectrometer and a staring imaging spectrometer according to their scanning modes. The sweep type is also called a sweep type or an optical scanning type, and information of each target wavelength band is received by a line detector. The mechanical device is complex and heavy. The push broom type utilizes the surface detector to receive the information of target wave bands, the space required by push broom is large, the requirement on the precision of a push broom platform is high, and a mechanical device is complex. The staring type hyperspectral imaging utilizes the one-to-one correspondence of the pixels of the area array detector and the target elements in the system observation range and utilizes the light splitting modes such as an acousto-optic tunable filter, a gradient filter and the like to split light. The image information and the spectrum information of the target cannot be extracted simultaneously, the post data processing is difficult, the spatial resolution is limited, and the number of spectrum channels is limited. Compared with the hyperspectral imaging modes, the rotating imaging spectrometer integrates the push-broom high spatial and spectral resolution, and the coaxial rotating mode avoids the defects of the push-broom hyperspectral imaging mode.
With the development of imaging technology, besides the hyperspectral imaging mode, the application of polarization imaging in imaging technology is gradually and widely valued, the method for measuring the polarization degree and the polarization angle information reflected by a target by utilizing a polarization imaging detection method can effectively make up the defects of the traditional imaging, solve the problem that the traditional photometry is difficult to solve in target identification, and obtain a high-precision result. Before and after the light irradiates the surface of the object, the polarization state of the light can change regularly. Using the Stokes parameter (S)0，S1，S2，S3)TTo represent various polarization states of a monochromatic planar light wave, the relationship between the S component (i.e., y-direction) amplitude ES and the P component (i.e., x-direction) amplitude EP of the electric vector of light and the phase difference and 4 Stokes parameters is as follows (1):
in the formula: s0Is the total intensity of the light wave; s1Is the light intensity difference between the linearly polarized light component in the x direction and the linearly polarized light component in the y direction of the light wave; s2The light intensity difference between the linearly polarized light component of the light wave in the pi/4 direction and the linearly polarized light component in the-pi/4 direction is obtained; s3The light intensity difference between the right-handed polarized light component and the left-handed polarized light component of the light wave.
The stokes vector can be measured using a rotating polarizer measurement: the incident light passes through a phase retarder, namely a wave plate, then passes through an analyzer, and the Stokes matrix can be obtained through 4 intensity graphs with different polarization directions.
The polarization characteristic parameter can be calculated by the Stokes vector: the polarization degree, the polarization angle and the ellipsometry are respectively expressed as the following formulas (2), (3) and (4):
degree of polarization:
polarization angle:
ellipsometry:
the stokes vector of the light reflected in the polarization state after impinging on the surface of the object is equal to the product of the mueller coefficient matrix and the stokes vector of the light before impinging on the surface of the object. Expressed in stokes vectors
S′＝M*S (5)
In the formula: s is the Stokes vector of the incident light; s' is the Stokes vector of the reflected light; the M is a Mueller matrix, and the Mueller matrix can be easily solved by measuring the Stokes vectors of incident light and reflected light, wherein the M is an intermediate variable. However, according to the foregoing, S and S' are both a set of 1 × 4 vectors. The mueller matrix M is thus a set of 4 × 4 coefficient matrices, i.e.:
therefore, 4 groups of polarized light with different polarization states are adopted to irradiate the surface of the object to be measured, that is, 4 groups of different S and S' can be obtained, so that 16 elements of the Mueller matrix M can be solved. Therefore, the equation is established by adding the wave plate W2 and the wave plate W3, and the mueller matrix M can be obtained by combining the equation with the S obtained by the incidence of the polarized light. The transmission characteristics of polarization are: bidirectional attenuation, polarization-dependent intensity attenuation characteristics; phase retardation, polarization dependent phase change property; depolarization indicates the property of converting polarized light into unpolarized light. The depolarization characteristic has important significance in the discussion of polarization, and the influence of a target object and a background on the polarization state of incident light can be well expressed. Since the mueller matrix can be simply decomposed into 4 parts: (1) in 16 elements of the mueller matrix, M00 embodies the transmission and scattering capabilities of the target object to incident light and the intensity of reflected light, namely, the intensity characteristics; (2) m01, M02 and M03 respectively show horizontal, vertical and circular polarization bidirectional attenuation capability of a target on incident light, namely bidirectional attenuation characteristics; (3) m10, M20 and M30 embody the polarizing capability of the target on the unpolarized light of the incident light; (4) the remaining nine elements exhibit the depolarization and phase-finding capabilities of the target for incident light, i.e., depolarization and phase-retardation characteristics.
However, the existing traditional mueller matrix measurement technology can only perform polarization imaging analysis on an object to be measured under the irradiation of a single-wavelength light source, and multi-band auxiliary imaging analysis is needed for polarization detection of a sample, so that the traditional mueller matrix polarization imaging technology has the limitation of single-band imaging.
Disclosure of Invention
In order to overcome the not enough of prior art of present above, the utility model provides a rotation type spectral imaging-polarization measurement system, this measurement system can not only the rotary scanning obtain the image information and the spectral information of the object that awaits measuring simultaneously, and the rotation through its polarization component can record the stokes vector and the muller matrix polarization information of the object that awaits measuring under continuous wavelength simultaneously, can obtain the object two-dimensional image information that awaits measuring, one-dimensional spectral information and one-dimensional polarization information.
The utility model provides a technical scheme that its technical problem adopted as follows:
a rotary spectral imaging-polarization measurement system mainly comprises a polarization module, an imaging spectral module and a photosensitive chip. The polarization module changes the state of the azimuth angle of the polaroid by rotation under the condition of no active light source so as to obtain four corresponding intensity images with different polarization states, namely two-dimensional light intensity values, and the Stokes vector of the target to be detected can be obtained based on the Stokes vector calculation principle, so that the polarization degree, the polarization angle and the polarization ellipse ratio of the target to be detected can be calculated; when the polarization module has an active light source, different intensity images of corresponding polarization states can be obtained by changing the angle states of the polaroid and the wave plate through rotation, and the Mueller matrix polarization information of the target to be measured can be calculated based on the Muller matrix calculation principle. The imaging spectrum module diffracts and splits light reflected by the linear region corresponding to the slit of the object to be measured, and the light splitting and diffracting light is shot by the photosensitive chip. The imaging spectrum module is rotationally controlled in azimuth angle through the electric rotating platform so as to realize rotary scanning imaging of the object to be detected, two-dimensional images and one-dimensional spectrum information of the object to be detected can be obtained, and under the rotation matching of the polarization module, the system can obtain Stokes vectors and Mueller matrix polarization information of the object to be detected under a continuous wavelength channel.
When the rotary spectral imaging-polarization measurement system is used for detecting an object to be detected, when no active light source is detected (namely no rotary polarization module is used), polarization images of reflected light of the object in different states can be obtained through the angle rotation matching of the polarization plate and the wave plate in the polarization module, the Stokes vector of the object is obtained, and the polarization information of the object to be detected is obtained.
When the rotary spectral imaging-polarization measurement system is used for detecting an object to be detected, and an active light source is used for detection (namely a rotary polarization module), the polarization module comprises a light source, a rotary polarization module and a rotary polarization detection module which are sequentially arranged along a light path.
The light source can be white light, ultraviolet, infrared and other light sources.
The rotary polarization module comprises a polarizing film and a wave plate which are sequentially arranged along a light path, and white light is polarized into linearly polarized light after passing through the polarizing film; the polaroid and the wave plate are both arranged in an electric rotating table, and the rotation angle of the electric rotating table is controlled by a computer to shoot 16 groups of different polarization images.
The wave plate is an achromatic wave plate.
The electric rotating platform can enable the system (the polarizing module, the analyzing module and the imaging spectrum system) mounted on the rotating platform to rotate around the axis.
The rotary polarization detection module comprises a wave plate and a polaroid which are sequentially arranged along a light path, and the rotation angle of the rotary polarization detection module is controlled by the electric rotating platform so as to control the directions of the extinction axis and the fast and slow axes of the polaroid. Light enters the imaging spectrum module after passing through the rotating polarizing module.
The imaging spectrum module consists of five elements, namely an imaging lens, a slit, a lens group, an optical wedge and a grating.
When the rotary spectral imaging-polarization measurement system is used for measuring an object to be measured, the imaging spectral module needs to rotate for a circle to complete scanning imaging every time the angle states of the polaroid and the wave plate are changed by rotation.
The beneficial effects of the utility model are that, can obtain the rotation of awaiting measuring object two-dimensional image information and one-dimensional spectral information at the rotatory scanning of imaging spectrum module, through electric rotating platform control polarization module and polarization detection module, can measure the stokes vector and the muller matrix of the object that awaits measuring, further analysis can calculate and obtain polarization characteristic parameter: the polarization degree, the polarization angle and the polarization ellipse ratio can obtain the structural information which can not be provided by the traditional optical measurement method. And by combining the imaging spectrum with the polarization imaging, the polarization information of the object piece to be detected under the continuous wavelength channel can be obtained, and the obvious limitation that the traditional Mueller matrix polarization imaging technology can only image under a single waveband is overcome.
Drawings
FIG. 1 is a schematic diagram of embodiment 1 (active light source) of a rotating spectral imaging-polarization measurement system;
FIG. 2 is a schematic diagram of embodiment 2 (without an active light source) of a rotating spectral imaging-polarization measurement system;
in the figure, the device comprises a polarization module 1, an imaging spectrum module 2, a photosensitive chip 3, a light source 4, a rotary polarization module 5, a rotary polarization analysis module 6, a first polarizing film 7-1, a second polarizing film 7-2, a first wave plate 8-1, a second wave plate 8-2, a first electric rotating platform 9-1, a second electric rotating platform 9-2, a third electric rotating platform 9-3, a fourth electric rotating platform 9-4, a fifth electric rotating platform 9-5, an imaging lens 10, a slit 11, a first lens group 12-1, a second lens group 12-2, a first optical wedge 13-1, a second optical wedge 13-2 and a grating 14.
Detailed Description
The invention will be further explained with reference to the drawings and examples.
Example 1
A rotary spectral imaging-polarization measurement system (active light source) mainly comprises a polarization module, an imaging spectral module and a photosensitive chip. And the polarization module can obtain intensity images with different corresponding polarization states, namely two-dimensional light intensity values, by changing the orientation angle states of the polarizer and the wave plate through rotation, and calculates to obtain a Stokes vector and a Muller matrix of the target to be detected based on the Stokes vector and Muller matrix calculation principle. The imaging spectrum module diffracts and splits light reflected by the linear region corresponding to the slit of the object to be measured, and the light splitting and diffracting light is shot by the photosensitive chip. The rotation angle of the imaging spectrum module is controlled by the electric rotating platform so as to realize the rotary scanning imaging of the object to be detected, and the three-dimensional map of the object to be detected can be obtained.
As shown in fig. 1, the polarization module 1 is composed of a light source 4, a rotating polarization module 5, and a rotating polarization analysis module 6.
The rotating polarization module 5 comprises a first polarizer 7-1 and a first wave plate 8-1 which are sequentially arranged along a light path, and white light is polarized into linearly polarized light after passing through the first polarizer 7-1; the first polarizer 7-1 and the first wave plate 8-1 are respectively installed in the first electric rotating table 9-1 and the second electric rotating table 9-2, and the rotation angle of the electric rotating tables can be controlled by a computer to shoot images in different polarization states.
The rotation polarization analysis module 6 comprises a second wave plate 8-2 and a second polaroid 7-2 which are sequentially arranged along a light path, and the rotation angles of the rotation polarization analysis module and the second polaroid are respectively controlled by a fourth electric rotating table 9-4 and a third electric rotating table 9-3 so as to control the extinction axis and the fast and slow axis directions of the polaroids to shoot images in different polarization states. The light enters the imaging spectrum module 2 after passing through the rotary polarizing module 4.
The first wave plate 8-1 and the second wave plate 8-2 are achromatic quarter wave plates.
The azimuth angle combination of the first polarizer 7-1, the second polarizer 7-2, the first wave plate 8-1 and the second wave plate 8-2 is controlled to shoot 16 different polarization images, wherein 16 angle combination states are shown in the following table:
watch 1
After 16 different polarization states are measured, the specific calculation principle of the Mueller matrix can adopt a calculation scheme shown in the document Mueller matrix image acquisition and processing, and a formula can be obtained (for convenience, the first polarizing plate 7-1 is β, and the first wave plate 8-1 is gamma)2The second polarizer 7-2 is theta, and the second wave plate 8-2 is gamma1。
β＝γ2＝0° θ＝γ1＝0°′I(1)＝(m11+m12)+(m21+m22)
θ＝γ1＝45°′I(2)＝(m11+m12)+(m31+m32)
θ＝γ1＝90°′I(3)＝(m11+m12)-(m21+m22)
β＝γ2＝90° θ＝γ1＝0°′I(5)＝(m11-m12)+(m21-m22)
θ＝γ1＝45°′I(6)＝(m11-m12)+(m31-m32)
θ＝γ1＝90°′I(7)＝(m11-m12)-(m21-m22)
β＝γ2＝45°
θ＝γ1＝0°′I(9)＝(m11+m13)+(m21+m23)
θ＝γ1＝45°′I(10)＝(m11+m13)+(m31+m33)
θ＝γ1＝90°′I(11)＝(m11+m13)-(m21+m23)
(7)
The upper left 9 Mueller matrix elements can be measured by the above 9 equations:
θ＝0°，γ1＝45°’
β＝γ2＝0°’I(4)＝(m11+m12)+cosφ1(m21+m22)+sinφ1((m41+m42)
β＝γ2＝90°’I(8)＝(m11-m12)+cosφ1(m21-m22)+sinφ1((m41-m42)
β＝γ2＝457(12)＝(m11+m13)+cosφ1(m21+m23)+sinφ1(m41+m43)
β-0°，γ2-45°
θ＝0°，γ1＝45° (9)
the above I (1) to I (16) are two-dimensional light intensity values phi imaged by the system respectively rotating and scanning the object for 16 times under different polarization states1φ2The phase difference of the selected wavelength passing through the first wave plate 8-1 and the second wave plate 8-2, respectively. The muller matrix of the object to be measured is calculated by solving the equation set by the formula as follows:
by analyzing the Mueller matrix of the object to be detected, a series of polarization information such as dichroism, phase delay, depolarization degree and the like of the detection surface of the object to be detected can be obtained.
The imaging spectrum module 2 comprises an imaging lens 10, a slit 11, a first lens group 12-1, a first optical wedge 13-1, a grating 14, a second optical wedge 13-2 and a second lens group 12-2. After passing through the imaging lens 10, the image corresponding to the linear region of the object to be measured is imaged at the position of the slit 11. After passing through the slit 11, the image light is collimated by the first lens group 12-1, sequentially passes through the first optical wedge 13-1, the grating 14, the second optical wedge 13-2 module, and is focused on the photosensitive chip 3 by the second lens group 12-2. And the fifth electric rotating platform 9-5 is used for controlling the rotation angle of the imaging spectrum module to realize the rotary scanning imaging of the object to be detected.
The electric rotating platform is provided with a middle opening, so that the systems (the polarizing module, the polarization analyzing module and the imaging spectrum system) arranged on the rotating platform can rotate around the axis. In the scanning process, the imaging spectrum module 2 of the fifth electric rotating platform 9-5 rotates along the normal direction of the system, the photosensitive chip 3 simultaneously rotates around the shaft, so that the scanning imaging of the shaft rotation is realized, and the Mueller matrix polarization module does not rotate under the control of the fifth electric rotating platform 9-5 in the process.
Example 2
The present invention will be further explained with reference to fig. 2 and example 2.
As shown in fig. 2, a rotary spectral imaging-polarization measurement system (without active light source) mainly includes three parts, namely a polarization module 1, an imaging spectral module 2, and a photosensitive chip 3. The polarization module 1 changes the state of the azimuth angle of the polaroid by rotation to obtain four corresponding intensity images with different polarization states, namely two-dimensional light intensity values, and the Stokes vector of the target to be detected can be obtained by computer data processing based on the Stokes vector calculation principle. The imaging spectrum module 2 diffracts and splits light reflected by the linear region corresponding to the slit of the object to be measured, and the light splitting and diffracting light is shot by the photosensitive chip 3. The rotation angle of the imaging spectrum module is controlled by the electric rotating platform so as to realize the rotary scanning imaging of the object to be detected, and the three-dimensional map of the object to be detected can be obtained.
The polarization module 1 comprises a second wave plate 8-2 and a second polaroid 7-2 which are sequentially arranged along the light path, and the rotation angles of the second wave plate and the second polaroid are controlled by a fourth electric rotating table 9-4 and a third electric rotating table 9-3 respectively so as to control the extinction axis direction of the polaroid and shoot images in different polarization states. Light enters the imaging spectrum module 2 after passing through the polarization module 1.
The second wave plate 8-2 is an achromatic quarter wave plate.
The rotation changes the azimuth angle of the second polaroid 7-2 to shoot four different polarization images, when the Stokes vector is measured, the rotation angle of the second polaroid 7-2 is always selected to be the combination of azimuth angles of 0 degree, 45 degrees, 90 degrees and 135 degrees, the second wave plate 8-2 keeps the azimuth angle of 0 degree, and the four polarization images in different polarization states are obtained to obtain two-dimensional light intensity values of the polarization images. Based on the literature, "research on target enhancement technology based on polarization imaging", the stokes vector of the target object can be calculated by using the following formula:
further, the polarization characteristic parameter can be calculated by the Stokes vector: the degree of polarization, the angle of polarization and the ellipsometry are given by the following formula: degree of polarization:
polarization angle:
ellipsometry:
the imaging spectrum module 2 sequentially comprises an imaging lens 10, a slit 11, a first lens group 12-1, a first optical wedge 13-1, a grating 14, a second optical wedge 13-2 and a second lens group 12-2. After passing through the imaging lens 10, the image corresponding to the linear region of the object to be measured is imaged at the position of the slit 11. After passing through the slit 11, the image light is collimated by the second lens group 12-2, sequentially passes through the first optical wedge 13-1, the grating 14, the second optical wedge 13-2 module, and is focused on the photosensitive chip 3 by the second lens group 12-2. And the fifth electric rotating platform 9-5 is used for controlling the rotation angle of the imaging spectrum module to realize the rotary scanning imaging of the object to be detected.
The electric rotating platform 9 is provided with a hole in the middle, so that the system (the polarization module and the imaging spectrum system) arranged on the rotating platform can rotate around the axis. In the scanning process, the imaging spectrum module 2 is controlled by the fifth electric rotating platform 9-5 to rotate along the normal direction of the system, the photosensitive chip 3 simultaneously rotates around the shaft, so that the scanning imaging of the rotating shaft is realized, and the polarization module 1 does not rotate under the control of the fifth electric rotating platform 9-5 in the process.
The embodiments in the above description can be further combined or replaced, and the embodiments are only described as preferred embodiments of the present invention, and do not limit the concept and scope of the present invention, and various changes and modifications made to the technical solution of the present invention by those skilled in the art without departing from the design concept of the present invention belong to the protection scope of the present invention. The scope of the invention is given by the appended claims and any equivalents thereof.
Claims (8)
1. A rotary spectral imaging-polarization measurement system is characterized by comprising a polarization module, an imaging spectral module and a photosensitive chip; the polarization module changes the polarization state of the reflected light of the object to be measured by rotating the polarizer and the wave plate; the imaging spectrum module diffracts and splits light reflected by a linear area corresponding to the slit of the object to be measured, and the light splitting and diffracting light is shot by the photosensitive chip; the electric rotating platform controls the rotation angle of the imaging spectrum module to rotate, the object to be detected is scanned and imaged in a rotating mode, and a two-dimensional image and one-dimensional spectrum information of the object to be detected are obtained.
2. The rotating spectral imaging-polarization measurement system according to claim 1, wherein when active light source is used for detection, the polarization module comprises a light source, a rotating polarization module and a rotating polarization detection module, which are sequentially arranged along a light path, wherein light emitted by the light source is incident on the surface of the object to be measured after passing through the rotating polarization module, and reflected light enters the rotating polarization detection module; the light source comprises a white light source, an ultraviolet light source and an infrared light source.
3. The rotating spectral imaging-polarization measurement system according to claim 1, wherein the polarization module comprises a rotating polarization module, and the rotation changes the orientation angle state of the polarizer when no active light source is detected, so as to obtain four corresponding intensity images with different polarization states, i.e. two-dimensional light intensity values.
4. The rotating spectral imaging-polarization measurement system according to claim 2, wherein the rotating polarization module comprises a polarizer and a wave plate sequentially arranged along the optical path, wherein the polarizer and the wave plate are respectively installed in the electric rotating platform.
5. The rotating spectral imaging-polarization measurement system of claim 4, wherein the waveplate is an achromatic waveplate.
6. A rotational spectroscopic imaging-polarization measurement system of claim 4, wherein the motorized rotation stage controls the system mounted on the rotation stage to rotate about an axis.
7. The rotating spectral imaging-polarization measuring system according to claim 2, wherein the rotating polarization analyzing module comprises a wave plate and a polarizer sequentially arranged along the optical path, the rotation angles of the wave plate and the polarizer are respectively controlled by the electric rotating platform, and the reflected light enters the imaging spectral module after passing through the rotating polarization analyzing module.
8. The rotating spectral imaging-polarization measurement system of claim 1, wherein the imaging spectral module comprises an imaging lens, a slit, a first lens group, a first optical wedge, a grating, a second optical wedge, and a second lens group.
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| CN111272282A (en) * | 2020-01-19 | 2020-06-12 | 浙江大学 | Rotary spectral imaging-polarization measurement system |
| CN115855259A (en) * | 2023-02-28 | 2023-03-28 | 长春理工大学 | Multispectral polarization imaging device and method based on stacked polarizer array |
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| CN103134592B (en) * | 2013-01-31 | 2015-11-04 | 华中科技大学 | A kind of transmission type Mueller matrix spectrum ellipsometer and measuring method thereof |
| CN104792416A (en) * | 2015-04-10 | 2015-07-22 | 中国科学院光电研究院 | Push-broom complete-polarization high-spectral integrated imaging unit |
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| CN109186770A (en) * | 2018-09-04 | 2019-01-11 | 中国科学院光电研究院 | A kind of multi-functional hemisphere sky polarized imaging system |
| CN109696712A (en) * | 2019-01-23 | 2019-04-30 | 聊城大学 | A kind of Underwater Target Detection system of polarization imaging measurement |
| CN211696676U (en) * | 2020-01-19 | 2020-10-16 | 浙江大学 | Rotary spectral imaging-polarization measurement system |
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| CN111272282A (en) * | 2020-01-19 | 2020-06-12 | 浙江大学 | Rotary spectral imaging-polarization measurement system |
| CN115855259A (en) * | 2023-02-28 | 2023-03-28 | 长春理工大学 | Multispectral polarization imaging device and method based on stacked polarizer array |
| CN115855259B (en) * | 2023-02-28 | 2023-05-05 | 长春理工大学 | Multispectral polarization imaging device and multispectral polarization imaging method based on stacked polaroid array |
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