CN211603437U

CN211603437U - Semiconductor static testing device

Info

Publication number: CN211603437U
Application number: CN201922346618.4U
Authority: CN
Inventors: 范彩凤
Original assignee: Shanghai Beizhen Electronic Technology Co ltd
Current assignee: Shanghai Beizhen Electronic Technology Co ltd
Priority date: 2019-12-24
Filing date: 2019-12-24
Publication date: 2020-09-29
Anticipated expiration: 2029-12-24

Abstract

The utility model discloses a semiconductor static testing arrangement, be connected with the base of the static test rifle body and tool support including the upper end, tool support upper end is connected with the tool extension board, it has a plurality of holes of placing to cut on the tool extension board, cut on the tool support have a plurality ofly and place the corresponding standing groove in hole, and the standing groove with place the hole and be linked together, be connected with the sheetmetal in the standing groove, and be connected with the wire between a plurality of sheetmetals, tool extension board upside is equipped with removable cover, the removable cover lower extreme is connected with the slider, tool extension board upper end cut have with slider assorted fixed plate, removable cover is L type apron, the inner wall connection that the standing hole was kept away from to the fixed plate has extension spring. The utility model discloses simple structure, convenient operation can keep placing the inboard cleanness of hole to guarantee the good contact between semiconductor's pin and the sheetmetal, in addition, can guarantee that semiconductor's pin stabilizes the contact sheetmetal, improve efficiency of software testing and the test accuracy.

Description

Semiconductor static testing device

Technical Field

The utility model relates to an electrostatic testing device technical field especially relates to a semiconductor electrostatic testing device.

Background

The prior testing method is that a testing device is manually held, and the long-term detection can cause fatigue of personnel and influence the testing progress and result. The patent of No. CN206339600U discloses a positioning device of an electrostatic gun, which comprises a base, a gun head support, a spiral rod and a rocking wheel, wherein the base is L-shaped, the spiral rod is fixed on the base and is arranged in parallel with the first end of the base, the rocking wheel is arranged on the spiral rod, one end of the gun head support is connected with the spiral rod, the other end of the gun head support is used for placing the electrostatic gun, and the height of the gun head support can be adjusted by manually adjusting the rocking wheel. This patent mainly can be to the adjustment from top to bottom of static rifle, can be compatible different locating place demands at different size terminals, but this patent can't realize the removal regulation on the plane, can see out from the drawing of this patent simultaneously, and the rifle head of static rifle is vertical direction, is difficult for like this detecting

For improving above-mentioned problem, chinese patent authorizes No. CN208207141U and discloses a semiconductor static testing arrangement, including static test rifle, adjustment mechanism and base, adjustment mechanism installs on the base, and install static test rifle on the adjustment mechanism, adjustment mechanism includes first slip table cylinder, second slip table cylinder and support frame, first slip table cylinder is installed on the base, and first slip table cylinder top installs second slip table cylinder, the support frame is installed in second slip table cylinder top, and the support frame top is provided with static test rifle, the inconvenient technical problem of handheld check out test set detection among the prior art has been solved.

When the testing device is used, the pins of the semiconductor need to be kept to be in close contact with the metal sheet, otherwise, poor contact is caused, but the device is not provided with a dustproof structure at the pin inserting and placing part of the semiconductor, so that dust is easily accumulated at the pin inserting and placing part of the semiconductor, and poor contact between the pins of the semiconductor and the metal sheet is caused.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the defects existing in the prior art and providing a semiconductor static testing device.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides a semiconductor static testing arrangement, includes that the upper end is connected with the base of static test rifle body and tool support, tool support upper end is connected with the tool extension board, it has a plurality of holes of placing to cut on the tool extension board, cut on the tool support have a plurality ofly and place the corresponding standing groove in hole, and the standing groove with place the hole and be linked together, be connected with the sheetmetal in the standing groove, and be connected with the wire between a plurality of sheetmetals, and the free end ground connection of wire, tool extension board upside is equipped with removable cover, the removable cover lower extreme is connected with the slider, tool extension board upper end is cut chisel have with slider assorted fixed plate.

Preferably, the movable cover plate is an L-shaped cover plate.

Preferably, the movable cover plate is provided with a screw hole, and a locking bolt is connected in the screw hole.

Preferably, the inner wall of the fixing plate, which is far away from the placing hole, is connected with an extension spring, and the other end of the extension spring is connected with the sliding block.

Preferably, the upper end of the jig support plate is connected with a fixing plate, and the fixing plate is positioned on one side of the placing hole, which is far away from the movable cover plate.

Preferably, the magnetic attraction pieces are connected to the ends, close to each other, of the movable cover plate and the fixed plate, and the magnetic attraction pieces are soft magnetic attraction pieces.

Preferably, the lower end of the metal sheet is connected with a compression spring, and the lower end of the compression spring is fixedly connected with the inner bottom end of the placing groove.

Compared with the prior art, the utility model provides a semiconductor static testing arrangement possesses following beneficial effect:

1. through removable cover, extension spring and the locking bolt that sets up, after the test, locate the hole upside with removable cover stable lid, play better dustproof effect, guarantee to place the inboard cleanness in hole to guarantee the good contact between semiconductor's pin and the sheetmetal.

2. The fixed plate and the one end that is close to each other at removable cover and fixed plate through the setting connect the magnetism and inhale the piece, and fixed plate and removable cover can protect jointly and insert the semiconductor of placing in the hole, prevent the unexpected book loss of semiconductor, and the magnetism on the removable cover is inhaled the piece and is inhaled the piece magnetism with the magnetism on the fixed plate and inhale mutually and inhale, guarantees that removable cover stable cover locates and places the hole upside.

3. Through connecting compression spring at the sheetmetal lower extreme, and compression spring lower extreme and standing groove bottom end welding, the semiconductor that awaits measuring is placed and is being placed the hole, and the pin contact of semiconductor extrudees the sheetmetal downwards, and compression spring compression can guarantee that the pin of semiconductor stabilizes the contact sheetmetal, improves efficiency of software testing and test accuracy.

The part that does not relate to among the device all is the same with prior art or can adopt prior art to realize, the utility model discloses simple structure, convenient operation can keep placing the inboard cleanness in hole to guarantee the good contact between semiconductor's pin and the sheetmetal, in addition, can guarantee that semiconductor's pin stabilizes the contact sheetmetal, improves efficiency of software testing and the test accuracy.

Drawings

Fig. 1 is a schematic view of an overall structure of a semiconductor static testing device according to the present invention in a state where a placing hole is not covered;

fig. 2 is a schematic view of an overall structure of the semiconductor static testing device according to the present invention in a state of covering the placement hole;

fig. 3 is the utility model provides a semiconductor static testing arrangement lid closes the side structure sketch map under placing the hole state.

In the figure: the device comprises a base 1, a static test gun body 2, a jig support 3, a jig support 4, a jig support plate 5, a placing hole 6, a placing groove 7, a metal sheet 7, a movable cover plate 8, a tension spring 9, a fixing plate 10, a magnetic attraction sheet 11, a locking bolt 12, a compression spring 13 and a lead 14.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

In the description of this patent, it is noted that unless otherwise specifically stated or limited, the terms "mounted," "connected," and "disposed" are to be construed broadly and can include, for example, fixedly connected, disposed, detachably connected, disposed, or integrally connected and disposed. The specific meaning of the above terms in this patent may be understood by those of ordinary skill in the art as appropriate.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Example 1

Referring to fig. 1-3, a semiconductor static test device, including the upper end install static test rifle body 2 and base 1 of tool support 3, tool support 3 upper end welding or have tool extension board 4 through bolted connection, a plurality of holes 5 of placing are dug on the tool extension board 4, a plurality of standing grooves 6 corresponding with holes 5 of placing are dug on the tool support 3, and standing grooves 6 and holes 5 are linked together, it has sheetmetal 7 to splice in the standing groove 6, and the welding has wire 14 between a plurality of sheetmetals 7, and the free end ground connection of wire 14, tool extension board 4 upside is equipped with removable cover 8, removable cover 8 is the L type apron, the welding of removable cover 8 lower extreme has the slider, tool extension board 4 upper end is dug has fixed plate 10 with slider assorted.

The utility model discloses in, it has the screw to cut on the removable cover 8, and is connected with locking bolt 12 in the screw, stabilizes fixed removable cover 8.

Wherein, the fixed plate 10 is kept away from the inner wall welding of placing hole 5 and is had extension spring 9, and extension spring 9's the other end and slider welding, and when opening removable cover 8, extension spring 9 can take removable cover 8 automatic re-setting.

Wherein, the welding of tool extension board 4 upper end has fixed plate 10, and fixed plate 10 is located and places hole 5 and keep away from the one side of removable cover 8, and fixed plate 10 and removable cover 8 can protect jointly and insert the semiconductor of placing in the hole 5, prevent the unexpected damage of semiconductor.

Wherein, the one end that removable cover 8 and fixed plate 10 are close to each other all is glued and is had magnetism to inhale piece 11, and magnetism inhales piece 11 and is inhaled the piece for soft-magnetic, and the magnetism on the removable cover 8 is inhaled piece 11 and the magnetism on the fixed plate 10 and is inhaled piece 11 magnetism and inhale mutually, guarantees that removable cover 8 stable cover locates and places 5 upsides of hole.

The working principle is as follows: an operator places a semiconductor to be tested in the placing hole 5, leads pins of the semiconductor to be contacted with the metal sheet 7, and starts the electrostatic testing gun body 2 to carry out electrostatic testing on the semiconductor; after the test, unscrew locking bolt 12, promote removable cover 8, extension spring 9 is tensile, and the piece is inhaled to magnetism 11 magnetism on the piece is inhaled on 11 and the fixed plate 10 of inhaling of magnetism on the removable cover 8, and two magnetism inhale the piece between 11 suction and be greater than extension spring 9's elasticity, guarantee that removable cover 8 stable cover locates places hole 5 upside, open in order to prevent that removable cover 8 is unexpected, can screw up locking bolt 12, fixed removable cover 8.

Example 2

Referring to fig. 3, in this embodiment, compared with embodiment 1, a compression spring 13 is welded to the lower end of a metal sheet 7, the lower end of the compression spring 13 is welded to the bottom end of a placing slot 6, and an insulating layer is wrapped on the surface of the compression spring 13.

The working principle is as follows: the semiconductor to be tested is placed in the placing hole 5, the pins of the semiconductor are contacted with and downwards press the metal sheet 7, the compression spring 13 is compressed, the pins of the semiconductor can be ensured to be stably contacted with the metal sheet 7, and the testing efficiency and the testing accuracy are improved.

It should be further noted that the electrical control method used in this document is automatically controlled by a controller and powered by an external power source, and the control circuit of the controller can be implemented by simple programming by those skilled in the art, which belongs to the common knowledge in the art, and this application mainly serves to protect the mechanical device, so the control method and the circuit connection are not explained in detail in this application.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. A semiconductor static test device comprises a base (1) with the upper end connected with a static test gun body (2) and a jig support (3), it is characterized in that the upper end of the jig support (3) is connected with a jig support plate (4), a plurality of placing holes (5) are drilled on the jig support plate (4), a plurality of placing grooves (6) corresponding to the placing holes (5) are drilled on the jig support (3), the placing groove (6) is communicated with the placing hole (5), a metal sheet (7) is connected in the placing groove (6), and a lead (14) is connected between the plurality of metal sheets (7), and the free end of the lead (14) is grounded, a movable cover plate (8) is arranged on the upper side of the jig support plate (4), the lower end of the movable cover plate (8) is connected with a slide block, the upper end of the jig support plate (4) is provided with a fixing plate (10) matched with the sliding block in a chiseled mode.

2. A semiconductor static test device according to claim 1, characterized in that the movable cover plate (8) is an L-shaped cover plate.

3. The electrostatic testing device for semiconductors as claimed in claim 2, wherein the movable cover plate (8) is provided with a screw hole, and a locking bolt (12) is connected to the screw hole.

4. A semiconductor static electricity testing device according to claim 3, characterized in that an extension spring (9) is connected to the inner wall of the fixing plate (10) away from the placing hole (5), and the other end of the extension spring (9) is connected to the slider.

5. The semiconductor static test device according to claim 4, characterized in that a fixing plate (10) is connected to the upper end of the jig support plate (4), and the fixing plate (10) is located on one side of the placing hole (5) far away from the movable cover plate (8).

6. The static electricity testing device for the semiconductor, as recited in claim 5, characterized in that the magnetic attraction pieces (11) are connected to the ends of the movable cover plate (8) and the fixed plate (10) close to each other, and the magnetic attraction pieces (11) are soft magnetic attraction pieces.

7. The semiconductor static electricity testing device according to any one of claims 1 to 6, characterized in that a compression spring (13) is connected to the lower end of the metal sheet (7), and the lower end of the compression spring (13) is fixedly connected with the inner bottom end of the placing groove (6).