CN211603436U - Adjusting device for testing semiconductor - Google Patents
Adjusting device for testing semiconductor Download PDFInfo
- Publication number
- CN211603436U CN211603436U CN201922346594.2U CN201922346594U CN211603436U CN 211603436 U CN211603436 U CN 211603436U CN 201922346594 U CN201922346594 U CN 201922346594U CN 211603436 U CN211603436 U CN 211603436U
- Authority
- CN
- China
- Prior art keywords
- wall
- fixed
- bolts
- semiconductor
- adjusting device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses an adjusting device for test semiconductor, comprises a workbench, it has the rectangular channel to open on the top outer wall of workstation, be equipped with fixture on the relative both sides inner wall of rectangular channel, all bond on the all the other both sides inner walls of rectangular channel has the rubber pad, there is the mount pad through the bolt fastening on the top outer wall of workstation, rotates on the top inner wall of mount pad and pegs graft and have the fixed column, the connecting plate has been cup jointed on the circumference outer wall of fixed column, there are two diaphragms through the bolt fastening on the bottom outer wall of connecting plate, there is same slide rail through the bolt fastening on the relative one side outer wall of diaphragm, and sliding connection has the slider on one side outer wall of slide rail. The utility model discloses a handle can drive the fixed column and rotate, through removing slider and drop-down expanding spring, can remove the electrography to any position, is convenient for test convenient to use at the semiconductor of different regions to the distribution on the circuit board.
Description
Technical Field
The utility model relates to an adjusting device technical field especially relates to an adjusting device for test semiconductor.
Background
The semiconductor is a substance with conductivity between an insulator and a conductor, the conductivity of the semiconductor is easy to control, the semiconductor can be used as a component material for information processing, information can be processed by utilizing the conductivity change of the semiconductor, the semiconductor is often applied to computers, mobile phones, digital recorders and the like, and a regulating device for testing the semiconductor is required in the production process of the semiconductor.
Currently, the conditioning devices for testing semiconductors currently on the market have the following disadvantages in most cases during use: it is inconvenient to move the testing device to test the semiconductor circuit, and in summary, most of the existing adjusting devices for testing the semiconductor cannot be well matched with the actual requirement.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the defects in the prior art, and provides an adjusting device for testing a semiconductor.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a regulating device for testing semiconductors comprises a workbench, a rectangular groove is formed on the outer wall of the top of the workbench, the inner walls of two opposite sides of the rectangular groove are provided with clamping mechanisms, rubber pads are adhered on the inner walls of the other two sides of the rectangular groove, the outer wall of the top of the workbench is fixed with a mounting seat through a bolt, the inner wall of the top of the mounting seat is rotatably inserted with a fixing column, the outer wall of the circumference of the fixed column is sleeved with a connecting plate, the outer wall of the bottom of the connecting plate is fixed with two transverse plates through bolts, the outer wall of one side opposite to the transverse plate is fixed with the same slide rail through a bolt, the outer wall of one side of the slide rail is connected with a slide block in a sliding way, the test pencil is characterized in that an extension spring is fixed on the outer wall of the bottom of the sliding block through a bolt, a fixed block is welded on the outer wall of the bottom of the extension spring, and a pencil is fixed on the outer wall of the bottom of the fixed block through a bolt.
Furthermore, a control handle is fixedly connected to the outer wall of one side of the fixing block.
Furthermore, a handle is fixedly connected to the outer wall of one side of the fixing column.
Furthermore, fixture includes fixed plate and a plurality of spring board, and the spring board passes through the bolt fastening on one side inner wall of rectangular channel, and the fixed plate passes through the bolt fastening in the one end of spring board.
Furthermore, a soft pad is bonded on the outer wall of one side of the fixing plate.
Further, still include backup pad and light, backup pad fixed connection is in one side of workstation top outer wall, and the light passes through the bolt fastening and is close to the position at top in one side outer wall of backup pad.
The utility model has the advantages that:
1. through fixed column, slider and the expanding spring that sets up, can drive the fixed column through the handle and rotate, through removing slider and drop-down expanding spring, can remove the electrography to any position, be convenient for test convenient to use at the semiconductor in different regions to the distribution on the circuit board.
2. Through the spring plate, the fixed plate, the soft pad and the rubber pad which are arranged, the circuit board loaded with the semiconductor is clamped by the soft pad and the rubber pad from the periphery, and the circuit board is prevented from being damaged due to the fact that the circuit board is clamped by the hard clamp.
3. Through the light that sets up, can provide the illumination, make things convenient for going on of semiconductor test, the device convenient to use satisfies people's demand.
Drawings
Fig. 1 is a schematic top view of an embodiment 1 of a conditioning apparatus for testing a semiconductor according to the present invention;
fig. 2 is a schematic partial perspective view of an embodiment 1 of an adjusting apparatus for testing a semiconductor according to the present invention;
fig. 3 is a schematic top view of an embodiment 2 of an adjusting apparatus for testing a semiconductor according to the present invention.
In the figure: 1-workbench, 2-rectangular groove, 3-spring plate, 4-fixed plate, 5-rubber pad, 6-soft pad, 7-connecting plate, 8-fixed column, 9-mounting seat, 10-handle, 11-transverse plate, 12-slide rail, 13-slide block, 14-telescopic spring, 15-control handle, 16-fixed block, 17-electroprobe, 18-supporting plate and 19-illuminating lamp.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.
In the description of this patent, it is to be understood that the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on those shown in the drawings, and are used for convenience of description and simplicity of description, but do not indicate or imply that the referenced device or component must have a particular orientation, be constructed and operated in a particular orientation, and therefore are not to be considered limiting of the patent, and the terms "mounted", "disposed", "connected", "fixed", "screwed" and the like are to be construed broadly and may be fixedly connected, detachably connected, or integrally formed, for example; can be mechanically or electrically connected; they may be directly connected or indirectly connected through an intermediate, or they may be connected internally or in an interactive relationship with each other, and unless otherwise specifically limited, the specific meaning of the above terms in this patent will be understood by those skilled in the art according to the specific circumstances.
Example 1
Referring to fig. 1-2, an adjusting device for testing semiconductors comprises a workbench 1, a rectangular groove 2 is opened on the top outer wall of the workbench 1, clamping mechanisms are arranged on the two opposite side inner walls of the rectangular groove 2, rubber pads 5 are adhered on the other two side inner walls of the rectangular groove 2, a circuit board loaded with semiconductors is clamped by matching the clamping mechanisms and the rubber pads 5, then the circuit board is placed in the rectangular groove 2, a mounting seat 9 is fixed on the top outer wall of the workbench 1 through bolts, a fixed column 8 is inserted on the top inner wall of the mounting seat 9 in a rotating manner, a connecting plate 7 is sleeved on the circumferential outer wall of the fixed column 8, two transverse plates 11 are fixed on the bottom outer wall of the connecting plate 7 through bolts, the same slide rail 12 is fixed on the outer wall on one side opposite to the transverse plates 11 through bolts, a slide block 13 is connected on the outer wall on one side of the slide rail 12 in a sliding manner, and, a fixed block 16 is welded on the outer wall of the bottom of the extension spring 14, and an electroprobe 17 is fixed on the outer wall of the bottom of the fixed block 16 through a bolt.
The utility model discloses in, fixedly connected with control handle 15 on one side outer wall of fixed block 16, fixedly connected with handle 10 on one side outer wall of fixed column 8, then according to the position that the semiconductor distributes, the staff can hold handle 10 on one hand, hold control handle 15 on one hand, thereby adjust the angle of fixed column 8, change slider 13's position, drop-down expanding spring 14 makes electrography 17 and circuit board surperficial semiconductor carry out the centre gripping, thereby test, fixture includes fixed plate 4 and a plurality of spring board 3, spring board 3 passes through the bolt fastening on one side inner wall of rectangular channel 2, fixed plate 4 passes through the bolt fastening at the one end of spring board 3, it has cushion 6 to bond on one side outer wall of fixed plate 4.
The working principle is as follows: during the use, at first, utilize fixture and rubber pad 5 to cooperate and carry out the centre gripping to the circuit board that carries the semiconductor, utilize the compressive force of spring board 3 to carry out the centre gripping to the circuit board, then arrange rectangular channel 2 in, then according to the position that the semiconductor distributes, the staff can hold handle 10 on the one hand, hold control handle 15 on the other hand, thereby adjust the angle of fixed column 8, change slider 13's position, drop-down expanding spring 14 makes electrography 17 and circuit board surperficial semiconductor carry out the centre gripping, thereby test, because of fixed column 8, slider 13 and expanding spring 14 are all adjustable, make the electrography can remove to circuit board surperficial any position, be convenient for test the semiconductor that distributes in different regions, and is simple and convenient to use.
Example 2
Referring to fig. 3, an adjusting apparatus for testing a semiconductor, in this embodiment, compared with embodiment 1, further includes a supporting plate 18 and an illuminating lamp 19, the supporting plate 18 is fixedly connected to one side of the outer wall of the top of the worktable 1, and the illuminating lamp 19 is fixed to a position near the top of the outer wall of one side of the supporting plate 18 by bolts.
The working principle is as follows: when the semiconductor testing device is used, the illuminating lamp 19 is arranged on one side of the workbench 1, and the illuminating lamp 19 can provide illumination, so that semiconductor testing work is facilitated.
The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.
Claims (6)
1. An adjusting device for testing semiconductors comprises a workbench (1) and is characterized in that a rectangular groove (2) is formed in the outer wall of the top of the workbench (1), clamping mechanisms are arranged on the inner walls of two opposite sides of the rectangular groove (2), rubber pads (5) are bonded on the inner walls of the other two sides of the rectangular groove (2), an installation seat (9) is fixed on the outer wall of the top of the workbench (1) through bolts, a fixed column (8) is rotatably inserted into the inner wall of the top of the installation seat (9), a connecting plate (7) is sleeved on the outer wall of the circumference of the fixed column (8), two transverse plates (11) are fixed on the outer wall of the bottom of the connecting plate (7) through bolts, the outer wall of one opposite side of each transverse plate (11) is fixed with a same sliding rail (12) through bolts, and a sliding block (13) is slidably connected onto the outer wall of one side of each, the test pencil is characterized in that an extension spring (14) is fixed on the outer wall of the bottom of the sliding block (13) through a bolt, a fixing block (16) is welded on the outer wall of the bottom of the extension spring (14), and a test pencil (17) is fixed on the outer wall of the bottom of the fixing block (16) through a bolt.
2. The adjusting apparatus for testing semiconductors as claimed in claim 1, characterized in that a control knob (15) is fixedly connected to one side of the outer wall of the fixing block (16).
3. The adjusting device for testing semiconductors as claimed in claim 1, characterized in that a handle (10) is fixedly connected to the outer wall of one side of the fixing column (8).
4. The adjusting device for testing semiconductors as claimed in claim 1, characterized in that the clamping means comprise a fixing plate (4) and a plurality of spring plates (3), the spring plates (3) are fixed on one side of the inner wall of the rectangular groove (2) by bolts, and the fixing plate (4) is fixed on one end of the spring plates (3) by bolts.
5. A conditioner for testing semiconductors as claimed in claim 4, characterized in that a soft pad (6) is glued to the outer wall of one side of the fixing plate (4).
6. The adjusting device for testing semiconductors as claimed in claim 1 or 2, further comprising a support plate (18) and a lighting lamp (19), wherein the support plate (18) is fixedly connected to one side of the outer wall of the top of the worktable (1), and the lighting lamp (19) is fixed to the outer wall of one side of the support plate (18) near the top by bolts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922346594.2U CN211603436U (en) | 2019-12-24 | 2019-12-24 | Adjusting device for testing semiconductor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922346594.2U CN211603436U (en) | 2019-12-24 | 2019-12-24 | Adjusting device for testing semiconductor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211603436U true CN211603436U (en) | 2020-09-29 |
Family
ID=72594947
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922346594.2U Active CN211603436U (en) | 2019-12-24 | 2019-12-24 | Adjusting device for testing semiconductor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211603436U (en) |
-
2019
- 2019-12-24 CN CN201922346594.2U patent/CN211603436U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108776400B (en) | Portable electronic screen test fixture of angularly adjustable | |
| CN205438388U (en) | Magnet equipment pressing fixture | |
| CN207447778U (en) | A kind of take-off assembly of camera and the robot device for including it | |
| CN211619269U (en) | Electric element clamping device | |
| CN109845022A (en) | For checking the grip device of the quality of secondary cell | |
| CN208224316U (en) | A kind of onboard wireless charger test fixture | |
| CN211603436U (en) | Adjusting device for testing semiconductor | |
| CN108872832A (en) | A kind of ICT automatic aligning test machine | |
| CN110600786A (en) | Stacking assembly of battery module | |
| CN211728852U (en) | Heat dissipation module test clamping tool | |
| CN219064453U (en) | Display panel detection jig and equipment | |
| CN210789867U (en) | Car light circuit board detects and material loading erection equipment | |
| CN111031698A (en) | A fixed tool for repairing electronic equipment | |
| CN212761630U (en) | A anchor clamps for circuit board of LED lamp | |
| CN110778877B (en) | Payment intelligent terminal capable of adsorbing with desktop | |
| CN209015693U (en) | A kind of display module test fixture | |
| CN207845779U (en) | Substrate holds formula quartz boat under the arm automatically | |
| CN207835540U (en) | A kind of automobile-used handset bracket | |
| CN211615362U (en) | Clamping device | |
| CN214474615U (en) | Servo controller test tool platform | |
| CN205466066U (en) | Anchor clamps that installation thing to sit on was used | |
| CN213411730U (en) | Aerospace material processing fixing device | |
| CN216134732U (en) | Clamp for mounting and fixing circuit board | |
| CN216016180U (en) | Fixing base for power distribution cabinet | |
| CN217112684U (en) | Electric energy meter verification system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |