CN211554224U - Automatic checking device for needle type use errors of ICT test probe - Google Patents

Abstract

The utility model provides a ICT test probe needle type error in use automatic check device, include: the inspection board can be placed above a circuit board carrier plate in the ICT test fixture and comprises a conductive plate and an insulating plate, wherein an inspection hole with the same size as the diameter of the shrinkage hole of the circuit board carrier plate is formed in the position, which is aligned with the through hole or the shrinkage hole of the circuit board carrier plate, of the insulating plate; and the detection module is connected with the plurality of test probes in the ICT test fixture, collects the on-off information of the plurality of test probes when the inspection board is placed above the circuit carrier board, compares the collected on-off information of the plurality of test probes with the program standard specification of each test probe respectively, generates a comparison result, and finally outputs the comparison result.

Description

Automatic checking device for needle type use errors of ICT test probe

Technical Field

The utility model relates to an inspection device, especially an ICT test probe needle type use mistake automatic check device.

Background

The ICT test (In-Circuit-Tester, namely, an automatic online Tester) is test equipment produced by PCBA (Printed-Circuit Board Assembly) which is necessary for modern electronic enterprises, has wide ICT application range, high measurement accuracy and clear indication of detected problems, and is very easy to handle PCBA with problems even though workers with general electronic technology levels handle PCBA with problems. By using the ICT, the production efficiency can be greatly improved, and the production cost can be reduced. The ICT test mainly detects the open circuit, short circuit and welding condition of all parts of the PCBA by the test probe contacting the test point distributed by the PCB layout, and can be divided into open circuit test, short circuit test, resistance test, capacitance test, diode test, triode test, field effect tube test, IC pin test and other general and special component neglected loading, wrong loading, parameter value deviation, welding spot connection welding, circuit board open short circuit and other faults, and accurately informs a user which component is the fault or which point the open short circuit is located.

However, in the maintenance process, the maintainer can easily misuse the patterned pins in the jig as the tool pins due to operation errors, so that the test pins prick the PCBA circuit of the plug-in capacitor, and short circuit occurs between the relevant test points and the site, thereby causing batch problems. In order to avoid the above errors, manual control has to be adopted before testing, but the manual control cannot prevent the problems from occurring 100% and the inspection efficiency is low.

In view of this, the utility model provides a wrong automatic check device is used to ICT test probe needle type, but its automatic check ICT test probe needle type avoids misusing the probe and the loss that produces and improved inspection efficiency greatly.

Disclosure of Invention

The utility model aims to solve the technical problem that an ICT test probe needle type uses wrong automatic check device is provided, but its automatic check ICT test probe needle type avoids the probe of misuse and the loss that produces has just improved inspection efficiency greatly.

In order to solve the technical problem, the utility model relates to a wrong automatic check device is used to ICT test probe needle type, it is applicable to an ICT test fixture, installs a plurality of test probe and a circuit board support plate in this ICT test fixture, and corresponding through-hole and shrinkage cavity are seted up to the test point type that this circuit board support plate corresponds a circuit board that awaits measuring, and this ICT test probe needle type wrong automatic check device includes:

the inspection plate can be placed above the circuit board carrier plate in the ICT test fixture and comprises a conductive plate and an insulating plate arranged below the conductive plate, and an inspection hole with the same size as the diameter of the shrinkage hole of the circuit board carrier plate is formed in the position, which is aligned with the through hole or the shrinkage hole of the circuit board carrier plate, of the insulating plate; and

a detection module connected with a plurality of test probes in the ICT test fixture, the detection module comprises a storage unit, an information collection unit, a processing unit and a data output unit, the storage unit is used for storing the program standard specification of each test probe in the ICT test fixture, the information collection unit, which is connected with a plurality of test probes in the ICT test fixture and is used for collecting the on-off information of the plurality of test probes when the inspection board is placed above the circuit carrier board, the processing unit is connected with the storage unit and the information collection unit and used for comparing the collected on-off information of the plurality of test probes with the program standard specification of each test probe respectively and generating a comparison result, and the data output unit is connected with the processing unit and used for outputting the comparison result.

Preferably, the conductive plate is a copper-clad plate.

Compared with the prior art, the utility model discloses an in putting into this ICT test fixture with this inspection board, this detection module collects switching on or breaking information of each test probe through this information collection unit, this processing unit compares this a plurality of test probes that will collect with the program standard specification of each test probe respectively and produces the contrast result, this data output unit, it is connected with this processing unit, a result is compared to the output, through this comparison, testing personnel can learn whether have test probe type to use the mistake, the purpose of automatic check ICT test probe needle type has been reached really, avoid the misuse probe and the loss that produces has just improved inspection efficiency greatly.

[ description of the drawings ]

Fig. 1 is the utility model relates to a structural sketch of circuit board support plate of inspection board and ICT test fixture of ICT test probe needle type use mistake automatic check device.

Fig. 2 is the utility model discloses a detection module of ICT test probe needle type use mistake automatic check device and ICT test fixture's test probe's electric connection square block schematic diagram.

[ detailed description ] embodiments

Please refer to fig. 1, the utility model provides an automatic checking device for usage errors of a needle type of an ICT test probe, which is suitable for an ICT test fixture 7, wherein a plurality of test probes and a circuit board carrier plate 71 are installed in the ICT test fixture 7, and a corresponding through hole 710 and a shrinkage hole 711 are provided on the test point type of a circuit board to be tested (not shown) corresponding to the circuit board carrier plate 71, the utility model discloses an automatic checking device for usage errors of a needle type of an ICT test probe comprises a check plate 1 and a detection module 2. In the present embodiment, the plurality of test probes are exemplified by a blade-shaped test probe 72 and a comb-shaped test probe 73.

The inspection board 1, which can be placed above the circuit board carrier 71 in the ICT test fixture 7, includes a conductive board 10 and an insulating board 11 disposed below the conductive board 10, where the position of the insulating board 11 aligned with the through hole 710 or the shrinkage hole 711 of the circuit board carrier 71 is provided with an inspection hole 110 having a diameter as large as that of the shrinkage hole 71 of the circuit board carrier 7, so that a knife-shaped probe can pass through the insulating board 11 to contact the conductive board 10, and a flower-shaped probe cannot pass through the inspection hole 110 and cannot contact the conductive board 10. In this embodiment, the conductive plate 10 is a copper clad plate.

The detection module 2 is connected to a plurality of test probes in the ICT test fixture 7, and the detection module 2 includes a storage unit 20, an information collection unit 21, a processing unit 22, and a data output unit 23. The storage unit 20 is used for storing the program standard specification, such as on or off, of each test probe in the ICT test fixture 7. The information collecting unit 21 is connected to the plurality of test probes in the ICT test fixture 7, and is configured to collect on/off information of the plurality of test probes. The processing unit 22 is connected to the storage unit 20 and the information collecting unit 21, and is configured to compare the collected on/off information of the plurality of test probes with the program standard specification of each test probe, and generate a comparison result. The data output unit 23 is connected to the processing unit 22 and is used for outputting the comparison result, so that a tester can know whether the test probe type is used incorrectly according to the comparison result. For example, assume that there are 20 test points in the ICT test fixture, wherein 10 test points are knife pins, and the remaining 10 test points are flower pins. Test point numbers <1,2, … … 10> are knife needle test points, <11,12 … … 20> are flower needle test points, the inspection board 1 is placed in the ICT test fixture, after the test module 2 tests, the <1,2, … … 10> should be short-circuited, other points should be disconnected, if the comparison result is not the above, it is indicated that the type of the test probe is used wrongly, a tester can replace the test probe with the wrong use type according to the comparison result, and therefore the use correctness of the probe can be ensured.

The above description is only for the specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art can easily think of the changes or substitutions within the technical scope of the present invention, and all should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (2)

1. The utility model provides a ICT test probe needle type uses wrong automatic check device, it is applicable to an ICT test fixture, installs a plurality of test probe and a circuit board support plate in this ICT test fixture, and corresponding through-hole and shrinkage cavity are seted up to the test point type that this circuit board support plate corresponds a circuit board that awaits measuring, its characterized in that includes:

the inspection plate can be placed above the circuit board carrier plate in the ICT test fixture and comprises a conductive plate and an insulating plate arranged below the conductive plate, and an inspection hole with the same size as the diameter of the shrinkage hole of the circuit board carrier plate is formed in the position, which is aligned with the through hole or the shrinkage hole of the circuit board carrier plate, of the insulating plate;

a detection module connected with a plurality of test probes in the ICT test fixture, the detection module comprises a storage unit, an information collection unit, a processing unit and a data output unit, the storage unit is used for storing the program standard specification of each test probe in the ICT test fixture, the information collection unit, which is connected with a plurality of test probes in the ICT test fixture and is used for collecting the on-off information of the plurality of test probes when the inspection board is placed above the circuit carrier board, the processing unit is connected with the storage unit and the information collection unit and used for comparing the collected on-off information of the plurality of test probes with the program standard specification of each test probe respectively and generating a comparison result, and the data output unit is connected with the processing unit and used for outputting the comparison result.

2. The ICT test probe needle type use error automatic checking device according to claim 1, characterized in that the conductive plate is a copper clad plate.

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