CN211505715U

CN211505715U - Electrified environment testing tool

Info

Publication number: CN211505715U
Application number: CN201921327962.2U
Authority: CN
Inventors: 刘伟; 肖海兵
Original assignee: Nanchang OFilm Biometric Identification Technology Co Ltd
Current assignee: Ofilm Microelectronics Technology Co ltd; Jiangxi OMS Microelectronics Co Ltd
Priority date: 2019-08-15
Filing date: 2019-08-15
Publication date: 2020-09-15
Anticipated expiration: 2029-08-15

Abstract

The utility model relates to a circular telegram environmental test frock, include: the probe testing device comprises a positioning mounting plate, a probe conducting piece and a guiding assembly, wherein a positioning groove for accommodating a product to be tested is formed in the positioning mounting plate; the probe conduction piece is arranged on the positioning installation plate, and one end of the probe conduction piece can be in contact connection with the electric connection end of the product to be tested; the guide assembly comprises a conducting end and a connecting end, the conducting end is connected with the other end of the probe conducting piece, the connecting end is used for being electrically connected with the detection instrument, and the guide assembly is used for enabling the detection instrument to be electrically connected with the electric connecting end of a product to be tested through the probe conducting piece. The utility model can detect various types by utilizing a single tool, does not need to prepare a plurality of tools corresponding to different test items, and saves the detection cost; when the same product is detected for multiple items, the product to be detected does not need to be disassembled and assembled, and the connection with different detection equipment is convenient; the electric connection end of the product to be tested cannot be damaged by touch, and the possibility of damage to the product is reduced.

Description

Electrified environment testing tool

Technical Field

The utility model relates to a test field especially relates to circular telegram environmental test frock.

Background

In the photoelectric industry, product performance testing is the core requirement for ensuring product quality, and the stability and accuracy of testing are ensured by testing equipment and a testing jig. Therefore, selecting or designing a reliable tooling device to ensure the product quality and the production efficiency is the highest pursuit of domestic and foreign enterprises.

At present, the electrifying and environment testing device of the photoelectric product is mainly tested by utilizing a self-made jig which is mainly machined from aluminum alloy or plastic materials, the product is fixed on the jig during testing, and a lead is manually contacted with the positive electrode and the negative electrode of the product during electrifying so as to connect the product into an instrument, thereby achieving the purpose of testing. However, the existing jig only plays a role of fixing a product, and each test needs one jig, so that great troubles are brought to frequent disassembly and assembly of the product and connection with different test devices; the required detection jigs are large in quantity, high in cost and troublesome to manage. In addition, during the power-on test, the golden finger of the product needs to be frequently touched manually, so that the product is easily damaged or scrapped. Therefore, a test fixture with strong applicability, simple operation and cost saving is needed to be designed and manufactured.

SUMMERY OF THE UTILITY MODEL

Therefore, it is necessary to provide a tool for testing an energization environment, which is suitable for various kinds of tests, and has a troublesome operation and a high test cost.

The utility model provides an circular telegram environment test fixture, circular telegram environment test fixture include:

the positioning mounting plate is provided with a positioning groove for accommodating a product to be tested;

the probe conduction piece is arranged on the positioning installation plate and corresponds to the electric connection end of the product to be tested, and one end of the probe conduction piece is used for being in contact connection with the electric connection end of the product to be tested;

the guide assembly comprises a conducting end and a connecting end, the conducting end is connected with the other end of the probe conducting piece, the connecting end is used for being electrically connected with a detection instrument, the guide assembly is used for passing through the probe conducting piece so that the detection instrument is electrically connected with the electric connecting end of a product to be tested, and the detection instrument is used for testing the power-on environment of the product to be tested.

The product to be detected is placed into the positioning groove, the electric connection end of the product to be detected is connected with one end of the probe conduction piece, the other end of the probe conduction piece is connected with the conduction end of the guide assembly, the detection instrument, the guide assembly, the probe conduction piece and the detection circuit where the product to be detected is located form a passage, and the detection instrument is opened to detect the correlation performance of the product to be detected. After one project is detected, the connection between the guide assembly and the probe conduction piece is disconnected, the conduction end of the guide assembly of the second detection instrument is connected with the probe conduction piece, the connection between the second detection instrument and a product to be detected can be realized, the detection of corresponding performance can be carried out by opening the second detection instrument, and the like, and various types of detection can be carried out on the product to be detected.

Above-mentioned circular telegram environmental test frock has following beneficial technological effect at least:

the detection of various types can be carried out by utilizing a single tool, and a plurality of tools do not need to be prepared corresponding to different test items, so that the detection cost is saved; and when the same product is subjected to multiple item detection, the product to be detected does not need to be disassembled and assembled, the connection with different detection equipment is convenient, and the operation is simple.

The probe conduction piece is in direct contact with the product in a contact connection mode, and the connection reliability of the probe conduction piece, the product to be tested and the guide assembly can be guaranteed. Compared with the traditional test method of directly pressing the test pen at the electric connection end (golden finger) of the product or welding the lead on the product, the test method has the advantages of simple connection form and quicker connection and disconnection operation.

In one embodiment, the front surface of the positioning mounting plate is provided with a mounting groove corresponding to the electrical connection end of the product to be tested, the mounting groove is communicated with the positioning groove, and the probe conducting piece is arranged in the mounting groove.

In one of them embodiment, probe conduction spare include probe and circumference parcel in be used for fixing on the probe the solid fixed body of probe, the solid fixed body is installed in the mounting groove, the both ends of probe expose respectively solid fixed body surface, just the one end of probe with the electricity connection end of the product of awaiting measuring is connected, the other end with the end connection that switches on of guide subassembly.

In one embodiment, the fixing body includes a first fixing plate and a second fixing plate, the first fixing plate and the second fixing plate are spliced together, the first fixing plate and the second fixing plate are correspondingly provided with accommodating through holes for penetrating and fixing probes, and two ends of the probes are respectively exposed out of two end faces of the first fixing plate and the second fixing plate, which are opposite to each other.

In one embodiment, the first fixing plate and the second fixing plate are connected in a splicing manner through connecting holes correspondingly formed in the first fixing plate and the second fixing plate, one side of the first fixing plate, which is far away from the second fixing plate, comprises a first platform and a second platform, the first platform and the second platform form a step-type structure with different heights, and the height of the first platform is greater than that of the second platform; the accommodating through hole on the first fixing plate is arranged on the first platform, and the connecting hole on the first fixing plate is arranged on the second platform; and/or

The side, far away from the first fixing plate, of the second fixing plate comprises a third platform and a fourth platform, the third platform and the fourth platform form a step type structure with different heights, and the height of the third platform is larger than that of the fourth platform; the accommodating through hole in the second fixing plate is formed in the third platform, and the connecting hole in the second fixing plate is formed in the fourth platform.

In one embodiment, the two ends of the probe are respectively elastic contact heads.

In one embodiment, the positioning groove penetrates through the front surface and the back surface of the positioning mounting plate, and a limiting step is arranged at a position, close to the front surface of the positioning mounting plate, of the positioning groove and used for limiting and fixing a product to be detected.

In one embodiment, the guiding assembly includes a guide wire and a printed circuit board connected to one end of the guide wire, the other end of the probe conduction element is connected to a connection pin of the printed circuit board, and the other end of the guide wire is electrically connected to the detection instrument.

In one embodiment, the printed circuit board is fixed on the positioning and mounting plate through a connector.

In one embodiment, the positioning installation plate is provided with:

the assembling groove is arranged on one side of the mounting groove, which is far away from the positioning groove, corresponds to the mounting groove in position and is used for accommodating a printed circuit board;

and the wiring groove is arranged on the side edge of the assembling groove and communicated with the assembling groove, and is used for laying a guide wire led out from the printed circuit board.

In one embodiment, the positioning mounting plate has a front surface formed with a pick-and-place slot communicating with the positioning slot, and the pick-and-place slot is adjacent to and penetrates through at least one inner side surface of the positioning slot.

In one embodiment, the positioning grooves, the probe conductors and the guide assemblies are provided in a plurality, and the positioning grooves, the probe conductors and the guide assemblies are arranged in a one-to-one correspondence manner.

Drawings

Fig. 1 is a schematic perspective assembly view of a power-on environment testing tool according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of a back side structure of the testing tool for testing the power-on environment shown in FIG. 1;

FIG. 3 is an exploded view of a probe conducting element in the energization environment testing fixture shown in FIG. 1;

FIG. 4 is a front view of a probe conductor in the energization environment testing fixture shown in FIG. 1;

FIG. 5 is a schematic view of a guide assembly in the energization environment testing fixture shown in FIG. 1;

FIG. 6 is a schematic cross-sectional view of a product to be tested being placed in a positioning groove on the surface of the testing fixture for testing environment shown in FIG. 1.

In the drawing, 100. a positioning mounting plate, 110. a positioning groove, 111. a limiting step, 112. a taking and placing step, 120. an assembling groove, 130. a wiring groove, 140. a mounting groove, 200. a probe conducting piece, 210. a probe, 220. a fixing body, 221. a first fixing plate, 222. a second fixing plate, 223. a connecting hole, 300. a guiding component, 310. a guiding wire, 320. a printed circuit board, 321. a connecting piece, 400. a product to be tested.

Detailed Description

The present invention will be further explained with reference to the accompanying drawings.

In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the accompanying drawings. The preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Those of ordinary skill in the art will recognize that variations and modifications of the various embodiments described herein can be made without departing from the scope of the invention, which is defined by the appended claims. Moreover, descriptions of well-known functions and constructions may be omitted for clarity and conciseness.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present; when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

As shown in fig. 1, fig. 2 and fig. 6, the utility model discloses an embodiment provides an energizing environment testing tool, include: the probe testing device comprises a positioning mounting plate 100, a probe conducting piece 200 and a guide assembly 300, wherein the positioning mounting plate 100 comprises a first surface and a second surface which are arranged in a reverse manner, the first surface is taken as a front surface, the second surface is taken as a back surface, and the front surface of the positioning mounting plate 100 is provided with a positioning groove 110 for accommodating a product 400 to be tested; the probe conduction piece 200 is arranged on the positioning mounting plate 100 corresponding to the electric connection end of the product to be tested 400, and one end of the probe conduction piece 200 can be in contact connection with the electric connection end of the product to be tested 400; the guide assembly 300 comprises a conducting end and a connecting end, the conducting end is connected with the other end of the probe conducting piece 200, the connecting end is electrically connected with the detection instrument, the guide assembly 300 is used for passing through the probe conducting piece 200 to enable the detection instrument to be electrically connected with the electric connecting end of the product 400 to be tested, and the detection instrument can test the product to be tested.

The electrical connection terminals of the product 400 to be tested are typically pins of an electronic component, such as gold fingers of the product, which are electrical connection pins for connecting the product to other devices, such as a motherboard, a chassis, etc., and are used for "plug-in connection" on the product, and the product is called a "gold finger" because a thin layer of gold, english "bonding finger", is plated on the copper foil nickel plating layer.

In operation, referring to fig. 6, the product 400 to be tested is placed in the positioning groove 110, at this time, the electrical connection end of the product 400 to be tested is connected to one end of the probe conducting piece 200, the other end of the probe conducting piece 200 is connected to the conduction end of the guiding assembly 300, the detecting instrument, the guiding assembly 300, the probe conducting piece 200 and the detecting circuit where the product 400 to be tested is located form a passage, and the detecting instrument is opened to detect the correlation performance of the product 400 to be tested. After one project detection is finished, the guide assembly 300 is disconnected from the probe conduction piece 200, the conduction end of the guide assembly 300 of the second detection instrument is connected with the probe conduction piece 200, the second detection instrument can be connected with a product to be detected, the second detection instrument can be opened to detect corresponding performance, and by analogy, detection of various projects can be performed only by preparing one tool, a plurality of tools do not need to be prepared corresponding to different test projects, and the detection cost is saved. The position of the product to be detected is always fixed in the process of detecting multiple items of the same product, and the detection device is convenient to connect with different detection devices and simple to operate.

The probe conduction piece 200 is in direct contact with the product in the form of contact connection, and can ensure the connection reliability with the product 400 to be tested and the guide assembly 300. Compared with the traditional test method of directly pressing the test pen at the electric connection end of the product or welding the lead on the product, the test method has the advantages that the connection form is simple, and the connection and disconnection operations are quicker; and the electrical connection end of the product to be tested 400 is not damaged by pressing, welding or touching by human hands, thereby reducing the risk of damage and even rejection of the product.

In some embodiments, the front surface of the positioning mounting plate 100 is provided with a mounting groove 140 corresponding to the electrical connection end of the product to be tested 400, the mounting groove 140 is communicated with the positioning groove 110, and the probe conduction member 200 is disposed in the mounting groove 140. Specifically, the product 400 to be tested may be inserted into the positioning groove 110 in a shape corresponding to the contour of the positioning groove 110, or may be directly inserted into the positioning groove 110 from the elastic limit notch of the positioning groove 110 to be positioned. When the electrical connection end of the product 400 to be tested is arranged at one side close to the bottom of the positioning groove 110, the mounting groove 140 is arranged at the bottom of the positioning groove 110 in a way of communicating with the positioning groove 110; when the electrical connection end of the product 400 to be tested is close to one side of the groove wall of the positioning groove 110, the mounting groove 140 is communicated with the positioning groove 110 and is arranged close to the groove wall of the positioning groove 110, and the probe conduction piece 200 is arranged in the mounting groove 140, so that the probe conduction piece 200 is conveniently in contact connection with the electrical connection end of the product 400 to be tested in the positioning groove 110; the positioning installation plate 100 can be neatly arranged as a whole, and the installation groove 140 has a good protection effect on the probe conduction member 200. It is understood that, in other embodiments, the probe conduction member 200 may be fixed in other manners, for example, the probe conduction member 200 may be directly fixed on the surface of the positioning mounting plate 100, specifically, when the electrical connection end of the product 400 to be tested inserted into the positioning groove 110 exposes out of the notch of the positioning groove 110, the probe conduction member 200 may be directly disposed on the front surface of the positioning mounting plate 100, and at this time, the contact connection can be realized only by making one end of the probe conduction member 200 correspond to the electrical connection end of the product 400 to be tested, and the normal implementation of the present invention is not affected, which is not limited herein.

Referring to fig. 4, in some embodiments, the probe conductor 200 includes a probe 210 and a fixture 220 circumferentially wrapped on the probe 210 for fixing the probe 210, and two ends of the probe 210 are respectively exposed on the surface of the fixture 220. The fixing body 220 is installed in the installation groove 140, and meanwhile, the fixing body 220 circumferentially wraps the probe 210, so that the probe 210 can be fixed, and necessary protection can be provided for the probe 210, the probe 210 is prevented from being accidentally damaged, one end of the probe 210 is connected with an electric connection end of a product 400 to be tested, and the other end of the probe 210 is connected with a conduction end of the guide assembly 300. In other embodiments, the probe conducting element 200 may be directly the probe 210, and the probe 210 may be directly fixed on the positioning and mounting plate 100 without affecting the normal implementation of the embodiment, which is not limited herein. In addition, when there are a plurality of electrical connection terminals (pins, such as gold fingers) of the product to be tested 400, there may be a plurality of the probes 210 and the guide assemblies 300 corresponding to the number of the electrical connection terminals of the product.

Referring to fig. 3 and 4, in some embodiments, the fixing body 220 includes a first fixing plate 221 and a second fixing plate 222, the first fixing plate 221 and the second fixing plate 222 are spliced together, the first fixing plate 221 and the second fixing plate 222 are correspondingly provided with receiving through holes for penetrating and fixing the probe 210, and two ends of the probe 210 are respectively exposed out of end surfaces of the first fixing plate 221 and the second fixing plate 222. Specifically, the probe 210 can be tightly fitted with the receiving through hole to prevent the probe 210 from being removed from the receiving through hole; or, the part of the probe 210 in the accommodating through hole may be an elastic structure, and the elastic material covered on the surface of the elastic structure has a larger friction coefficient, so that when the elastic material contacts with the inner wall of the accommodating through hole, a larger friction force can be generated between the elastic material and the inner wall of the accommodating through hole, and the probe 210 can be effectively prevented from sliding along the accommodating through hole, thereby preventing the probe 210 from slipping from the accommodating through hole. The first fixing plate 221 and the second fixing plate 222 can be connected together through a quick connection part, for example, a quick connection part such as a flat head bolt can sequentially pass through a connection hole 223 pre-formed in the first fixing plate 221 and the second fixing plate 222 to connect the first fixing plate 221 and the second fixing plate 222 together, the probe 210 can be protected and fixed by the first fixing plate 221 and the second fixing plate 222 which are spliced, the assembly is easy, specifically, the first fixing plate 221 and the second fixing plate 222 are disassembled when the disassembly is needed, and then the probe 210 is taken out, so that the disassembly and the part replacement of the probe 210 are facilitated.

In some embodiments, a side of the first fixing plate 221 away from the second fixing plate 222 includes a first platform and a second platform, the first platform and the second platform form a stepped structure with different heights, and the height of the first platform is greater than that of the second platform; the accommodating through hole of the first fixing plate 221 is arranged on the first platform, and the connecting hole 223 of the first fixing plate 221 is arranged on the second platform; and/or

The side of the second fixing plate 222 away from the first fixing plate 221 includes a third platform and a fourth platform, the third platform and the fourth platform form a stepped structure with different heights, and the height of the third platform is greater than that of the fourth platform; the receiving through hole of the second fixing plate 222 is formed on the third platform, and the connection hole 223 of the second fixing plate 222 is formed on the fourth platform. That is, the first fixing plate and the second fixing plate can form a step structure with different heights, or the two fixing plates can form step structures arranged in a back-to-back manner. The fixing body 220 is embedded and installed in the installation groove 140 by adopting the structure; and the connection hole 223 of the first fixing plate 221 is formed in the second platform with a lower height, so that the quick connection parts such as the connection bolt passing through the connection holes 223 of the first fixing plate 221 and the second fixing plate 222 can be hidden, and the surface exposed out of the positioning mounting plate 100 can be prevented from interfering with other components.

In some embodiments, the two ends of the probe 210 are elastic contacts respectively. The elastic contact head of the probe 210 can be respectively in contact connection with the electric connection end of the product 400 to be tested and the conduction end of the guide assembly 300, the connection stability is good, the reliability of contact conduction of the probe 210 with the product 400 to be tested and the guide assembly 300 is well guaranteed, and the friction damage to the electric connection end of the product 400 to be tested can be avoided. In other embodiments, the two ends of the probe 210 may be hard metal contacts, which do not affect the normal implementation of the embodiment and are not limited herein.

Referring to fig. 6, in some embodiments, the probe conductor 200 is adjacent to the positioning groove 110. After the installation arrangement mode is adopted, the positions of the probe conduction piece 200 and the positioning groove 110 are adjacent to each other, so that the probe conduction piece 200 is conveniently in contact connection with the electric connection end of the product 400 to be tested in the positioning groove 110. It is understood that in other embodiments, the probe transmitter 200 may be disposed at a position away from the positioning groove 110, and the normal implementation and function of the present invention are not limited thereto.

With continued reference to fig. 6, in some embodiments, the positioning groove 110 penetrates the front and back sides of the positioning mounting plate 100, and the positioning groove 110 is provided with a limiting step 111 at a position near the front side of the positioning mounting plate 100 for positioning the product to be detected. When the positioning device is used specifically, a product 400 to be tested is placed on the limiting step 111 and can be limited and fixed, and the positioning groove 110 is arranged to penetrate through two sides of the positioning mounting plate 100, so that the overall weight of the positioning mounting plate 100 can be reduced.

Referring to fig. 1, 2, 5 and 6, in some embodiments, the guide assembly 300 includes a guide wire 310 and a printed circuit board 320 connected to one end of the guide wire 310, the other end of the probe conduction member 200 is connected to a connection pin of the printed circuit board 320, and the other end of the guide wire 310 is electrically connected to the inspection instrument.

By adopting the arrangement mode, the guide wire 310 is connected with the probe conduction piece 200 through the printed circuit board 320, the installation mode is more standard, the condition that the connection state is unstable due to the direct connection of the guide wire 310 and the probe conduction piece 200 can be avoided, and the continuous conduction of the detection circuit and the normal implementation of the detection step are ensured. In other embodiments, the guiding assembly 300 may only include the guiding wire 310, and the two ends of the guiding wire 310 are connected to the other end of the probe conduction element 200 and the detecting instrument, respectively, without affecting the normal operation of the present invention.

In some embodiments, the end of the guiding wire 310 may be connected to the printed circuit board 320 by various methods, such as welding or gluing, without limitation.

Referring to fig. 1, in some embodiments, a printed circuit board 320 is secured to the positioning mounting plate 100 by connectors 321. Specifically, the connecting element 321 may be a bolt, a screw, or a buckle, and the printed circuit board 320 may be fixed on the front surface or the back surface of the positioning and mounting plate 100, for example, when the electrical connection end of the product 400 to be tested placed in the positioning groove 110 is exposed out of the notch of the positioning groove 110, the probe conducting element 200 and the printed circuit board 320 may be fixed on the front surface of the positioning and mounting plate 100, such that one end of the probe conducting element 200 is connected to the electrical connection end of the product 400 to be tested, and the other end is connected to the connection pin of the printed circuit board 320, which is not limited herein.

Referring to fig. 2, in some embodiments, the positioning and mounting plate 100 is provided with an assembly groove 120 and a routing groove 130 on the back side. The assembly groove 120 corresponds to the position of the mounting groove 140 and is disposed on a side of the mounting groove 140 away from the positioning groove 110, the assembly groove 120 is used for accommodating the printed circuit board 320, the wire routing groove 130 is disposed on a side of the assembly groove 120 and is communicated with the assembly groove 120, and the wire routing groove 130 is used for routing the guide wire 310. Because the wiring groove 130 is designed on the surface of the tool, each guide wire 310 for testing is arranged in the wiring groove 130, and the cross short circuit between the circuits can be avoided; the surface of the tool is simpler, and the wiring is more attractive. As shown in fig. 2, the assembly groove 120 and the routing groove 130 can be disposed on the back of the positioning mounting plate 100, so as to ensure that the front of the positioning mounting plate 100 is neater.

Referring to fig. 1, in some embodiments, the positioning mounting plate 100 has a front surface formed with a pick-and-place slot 112 communicating with the positioning slot 110, and the pick-and-place slot 112 is adjacent to and penetrates at least one inner side surface of the positioning slot 110. In this embodiment, the number of the taking and placing slots 112 is two, and the taking and placing slots 112 respectively penetrate through two opposite inner side surfaces of the positioning slot 110, and the outline of the opening of the taking and placing slot 112 is an arc shape, such as an arc shape, preferably a semicircular arc. In this embodiment, the openings of the two picking and placing grooves 112 on the inner side surface of the positioning groove 110 are arranged opposite to each other, and when the two sides of the product 400 to be tested are pinched by two fingers to place the product 400 to be tested in the positioning groove 110, the finger ends can be placed in the picking and placing grooves 112, so that the product 400 to be tested can be placed in place; when the product 400 to be tested needs to be taken down, the two fingers are respectively arranged in the two taking and placing grooves 112 and pinch the corresponding side edges, so that the product 400 to be tested can be taken out from the positioning groove 110, the taking and placing of the product are facilitated, and the operation success rate is high.

Referring to fig. 1, in some embodiments, there are a plurality of positioning grooves 110, probe conductors 200, and guide members 300, and the positioning grooves 110 are disposed in one-to-one correspondence with the probe conductors 200 and the guide members 300. The arrangement of the positioning grooves 110 can be in various forms, for example, the positioning grooves 110 can be arranged in an array, the routing grooves 130 corresponding to the positioning grooves 110 in the same row can also be communicated, and at the moment, the guide lines 310 can be led out from the same routing groove 130, so that the surface of the tool is more neat and regular, and the routing is more attractive. It is understood that the plurality of positioning slots 110 may have other arrangements, which are not listed here. The positioning slot 110 may also be designed in different shapes to accommodate different products 400 to be tested. Specifically, in actual operation, each guide assembly 300 can be connected to different detection instruments respectively, the same product to be detected can be placed into different positioning grooves 110 respectively and can be in contact connection with different probe conduction pieces 200, different detection circuits are conducted to carry out various detection operations, the trouble of disassembling and replacing the guide assemblies 300 is omitted, the operation of carrying out different types of detection on the same product is simpler, the speed is higher, and the efficiency is higher; the guide assembly 300 is always in a stable position, and different guide assemblies 300 do not need to be repeatedly disassembled and replaced, so that the probability of looseness or damage caused by multiple times of assembly and disassembly is reduced. Besides the use method, a plurality of products to be detected can be respectively placed in different positioning grooves 110, and the required types of tests can be simultaneously carried out on the plurality of products to be detected, so that the detection time of the same batch of products is directly shortened, and the detection efficiency of the same batch of products is improved.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.

Claims

1. The utility model provides an circular telegram environment test fixture which characterized in that, circular telegram environment test fixture include:

2. The energization environment testing tool of claim 1, wherein a mounting groove is formed in the front surface of the positioning mounting plate corresponding to the electrical connection end of the product to be tested, the mounting groove is communicated with the positioning groove, and the probe conducting piece is arranged in the mounting groove.

3. The energized environment testing tool of claim 2, wherein the probe conducting piece comprises a probe and a fixing body circumferentially wrapped on the probe and used for fixing the probe, the fixing body is installed in the installation groove, two ends of the probe are respectively exposed out of the surface of the fixing body, one end of the probe is connected with an electric connection end of a to-be-tested product, and the other end of the probe is connected with a conduction end of the guide assembly.

4. The energized environment testing tool according to claim 3, wherein the fixing body comprises a first fixing plate and a second fixing plate, the first fixing plate and the second fixing plate are spliced together, the first fixing plate and the second fixing plate are correspondingly provided with accommodating through holes for fixing probes in a penetrating manner, and two ends of the probes are respectively exposed out of two end faces of the first fixing plate and two end faces of the second fixing plate, which are opposite to each other.

5. The energization environment testing tool according to claim 4, wherein the first fixing plate and the second fixing plate are connected in a splicing manner through correspondingly arranged connecting holes, one side of the first fixing plate, which is far away from the second fixing plate, comprises a first platform and a second platform, the first platform and the second platform form a stepped structure with different heights, and the height of the first platform is greater than that of the second platform; the accommodating through hole on the first fixing plate is arranged on the first platform, and the connecting hole on the first fixing plate is arranged on the second platform; and/or

6. The energized environment testing tool of claim 3, wherein two ends of the probe are respectively elastic contact heads.

7. The energized environment testing tool of claim 1, wherein the positioning groove penetrates through the front surface and the back surface of the positioning mounting plate, and a limiting step is arranged at a position of the positioning groove close to the front surface of the positioning mounting plate for limiting and fixing a product to be tested.

8. The energized environment testing tool according to any one of claims 2 to 7, wherein the guide assembly includes a guide wire and a printed circuit board connected to one end of the guide wire, the other end of the probe conduction member is connected to a connection pin of the printed circuit board, and the other end of the guide wire is electrically connected to the detection instrument.

9. The energized environment testing tool of claim 8, wherein the printed circuit board is fixed on the positioning mounting plate by a connector.

10. An electrified environment testing tool according to any one of claims 2-6, wherein the positioning mounting plate is provided with:

11. An energized environment testing tool according to any one of claims 1 to 7, wherein a pick-and-place groove communicated with the positioning groove is formed in the front surface of the positioning mounting plate, and the pick-and-place groove is adjacent to and penetrates through at least one inner side surface of the positioning groove.

12. The energized environment testing tool of any one of claims 1 to 7, wherein the number of the positioning grooves, the probe conductors, and the guide assemblies is multiple, and the positioning grooves are arranged in one-to-one correspondence with the probe conductors and the guide assemblies.